Exhibitors (as of Nov 27)

For any inquiries or requests regarding exhibitions at the conference, please contact the Organizing Committee.

Agilent Technologies
Asylum Technology
FUJI IMVAC, INC.
JEOL Ltd.
Nihon Veeco K.K.
OLYMPUS CORPORATION
Omicron Nanotechnology Japan
Research Institute of Biomolecule Metrology Co.,Ltd.
SHIMADZU CORPORATION
SII NanoTechnology Inc.
Tec Corporation
Tomoe Engineering Co., Ltd
UNISOKU Co.,Ltd.

• Agilent Technologies

  Exhibition:	High resolution SPM Agilent Series 5500 New products Scanning Microwave Microscope on Agilent 5400/5600 AFM
  Short presentation:
  	Introduction of new SPM functions by Agilent Technologies --Scanning Impedance/Capacitance Microscope, Onepass KFM and so on
  Contact:	Chie Goto Nano Measurement Sales Materials Science Solution Unit Life Science and Chemical Analysis Group < chie_goto@agilent.com>
  Address:	9-1, Takakura-cho, Hachioji-shi, Tokyo 192-8510, Japan
  Tel/Fax:	+81-42-656-7832 / +81-42-656-7840
  Url:	http://www.agilent.co.jp/

  
  
• Asylum Technology

  Exhibition:	Innovatively capable and unspeakable "AFM" by Asylum
  Short presentation:
  	"Decoding the Nanoworld" by Asylum AFM
  Contact:	Haruo Takami < support@asylumtec.co.jp>
  Address:	20-12, Yushima 3-chome, Bunkyo-ku, Tokyo 113-0034, Japan
  Tel/Fax:	+81-3-5812-9801 / +81-3-5812-9802
  Url:	http://www.asylumtec.co.jp/

  
  
• FUJI IMVAC, INC.

  Exhibition:	Pencil-type scanning probe microscope for combined instuments
  Short presentation:
  	Pencil-type scanning probe microscope for combined instruments
  Contact:	Hideki Saito < saitou@fuji-imvac.co.jp>
  Address:	6-18 Higashi-machi, Isogo, Yokohama 235-0005, Japan
  Tel/Fax:	+81-45-755-2261 / +81-45-755-2282
  Url:	http://fuji-imvac.co.jp/

  
  
• JEOL Ltd.

  Exhibition:	JEOL SPM
  Short presentation:
  	Recent topics of JEOL SPM
  Contact:	Keiichi Nakamoto < nakamoto@jeol.co.jp>
  Address:	1-2 Musashino 3-Chome Akishima Tokyo 196-8558 JAPAN
  Tel/Fax:	+81-42-542-2249 / +81-42-542-1924
  Url:	http://www.jeol.co.jp/

  
  
• Nihon Veeco K.K.

  Exhibition:	New SPM technology from Veeco
  Short presentation:
  	HarmoniX(TM) ~Real-time Nanoscale Mechanical Property Mapping~
  Contact:	Ms. Mayumi Misawa < mayumi-m@veeco.co.jp>
  Address:	5-6-10 Tsukiji Chuou-ku, Tokyo 104-0045, Japan
  Tel/Fax:	+81-3-3549-3183 / +81-3-3549-3175
  Url:	http://www.veeco.co.jp/ http://www.veeco.com/

  
  
• OLYMPUS CORPORATION

  Exhibition:	MICRO CANTILEVER
  Short presentation:
  	The New Product Campaign
  Contact:	Takaaki Takenobu < takaaki_takenobu@ot.olympus.co.jp>
  Address:	2-3 Kuboyama-cho, Hachioji-shi, Tokyo 192-8512, Japan
  Tel/Fax:	+81-42-691-7403 / +81-42-691-7509
  Url:	http://www.olympus.co.jp/probe/

  
  
• Omicron Nanotechnology Japan

  Exhibition:	Omicron Nanotechnology Japan, LT-STM (Low Temperature - STM)
  Short presentation:
  	Omicron Nanotechnology Japan, LT-STM (Low Temperature - STM)
  Contact:	Hitoshi Tomizuka < h.tomizuka@omicron.jp >
  Address:	5-30-15-403 Kamata, Ota-ku, Tokyo 144-0052, Japan
  Tel/Fax:	+81-3-6661-0850 / +81-3-6661-0855
  Url:	http://www.omicron.jp/

  
  
• Research Institute of Biomolecule Metrology Co.,Ltd.

  Exhibition:	High-Speed AFM Nano Live Vision Low-Budget AFM Multi-Probe AFM
  Short presentation:
  	High-Speed AFM Nano Live Vision
  Contact:	Yuuta IWAZAKI < insts-sales@ribm.co.jp>
  Address:	807-133 Enokido, Tsukuba, Ibaraki 305-0853, Japan
  Tel/Fax:	+81-29-839-4611 / +81-29-839-4612
  Url:	http://www.ribm.co.jp/

  
  
• SHIMADZU CORPORATION

  Exhibition:	A New SPM Equipment SPM-9600 Model
  Short presentation:
  	A New SPM Equipment and its related technique.
  Contact:	Marketing Department Analytical & Measuring Instruments Division < surface2@group.shimadzu.co.jp>
  Address:	1, Nishinokyo-Kuwabaracho, Nakagyo-ku, Kyoto 604-8511, Japan
  Tel/Fax:	+81-75-823-1468 / +81-75-823-1380
  Url:	http://www.shimadzu.co.jp/surface/products/sol/sp_index.html http://www.shimadzu.com/products/lab/surface/spmd.html

  
  
• SII NanoTechnology Inc.

  Exhibition:	Introduce for SPM and FIB nano processing system
  Short presentation:
  	Introduce for SPM and FIB nano processing system
  Contact:	Hideyuki Takamori < hideyuki.takamori@siint.co.jp>
  Address:	2-15-5 Shintomi, Chuou-ku, Tokyo 104-0041, Japan
  Tel/Fax:	+81-3-6280-0070 / +81-3-6280-0073
  Url:	http://www.siint.com/

  
  
• Tec Corporation

  Exhibition:	Nanonis SPM Control System/Oscillation Controller OC4-Station/Dual-OC4 Nanosurf easyPLL plus/Nanite AFM Set for OEM Ferrovac Wobblestick manipulator/Linear-Rotary Feedthrough/Sample Transporter Ultra compact LT-STM/AFM Head Probes and related parts for SPM UHV and Analysis Products
  Short presentation:
  	Tec's handling products
  Contact:	Keigo Matsuda < matsuda@t-e-c.co.jp>
  Address:	7-19-26-311 Oizumigakuen-cho, Nerima-ku, Tokyo 178-0061, Japan
  Tel/Fax:	+81-3-5935-1060 / +81-3-5935-1070
  Url:	http://www.kagaku.com/tec/ http://www.nanonis.com/ http://www.nanosurf.com/ http://www.ferrovac.com/

  
  
• Tomoe Engineering Co., Ltd

  Exhibition:	Nanonics Multi Probe NSOM/SPM system Nanoanalytics QFM-Module for advanced dynamic force microscopy Teamnanotec AFM Cantilever Nanotools HDC(High Dence Carbon) Cantilever Innovative Solutions Bulgaria AFM Cantilever Novascan Chemical Modification Cantilever SmartTip AFM Cantilever Nascatec AFM Cantilever Picocal SThM module
  Short presentation:
  	Tomoe's Cantilevers
  Contact:	Akifumi Kobayashi < nanotech@tomo-e.co.jp>
  Address:	12th Floor, Art Village Osaki Central Tower, 2-2, Osaki 1-chome, Shinagawa-ku, Tokyo 141-0032, Japan
  Tel/Fax:	+81-3-5435-6516 / +81-3-5435-0071
  Url:	http://www.tomo-e.co.jp/

  
  
• UNISOKU Co.,Ltd.

  Exhibition:	UHV Scanning Probe Microscope
  Short presentation:
  	Introduction of New UHV Scanning Probe Microscope
  Contact:	Toshiaki Nagamura < toshiaki@unisoku.co.jp>
  Address:	2-4-3, KASUGANO, HIRAKATA, OSAKA 573-0131, JAPAN
  Tel/Fax:	+81-72-858-6456 / +81-72-859-5655
  Url:	http://www.unisoku.co.jp/ http://www.unisoku.com/