The 11th International Colloquium on Scanning Probe Microscopy

 

Atagawa Heights, Shizuoka, Japan, 2003.12.11-13

 

organized by

Thin Film and Surface Physics Division of Japan Society of Applied Physics

 

sponsored by

Japan Society of Applied Physics

 


11-Dec 12-Dec 13-Dec
  Session5 (8:00-9:55) Session9 (8:00-10:15)
8:00-8:35 S5-1 (S-Invited) 8:00-8:35 S9-1 (S-Invited)
8:35-9:10 S5-2 (S-Invited) 8:35-9:00 S9-2 (Invited)
9:10-9:25 S5-3 9:00-9:15 S9-3
9:25-9:40 S5-4 9:15-9:30 S9-4
9:40-9:55 S5-5 9:30-9:45 S9-5
Break(9:55-10:10) 9:45-10:00 S9-6
Session6 (10:10-12:10) 10:00-10:15 S9-7
10:10-10:25 S6-1 Break(10:15-10:30)
10:25-10:40 S6-2 Session10 (10:30-12:55)
10:40-10:55 S6-3 10:30-10:55 S10-1 (Invited)
10:55-11:10 S6-4 10:55-11:10 S10-2
11:10-11:25 S6-5 11:10-11:25 S10-3
11:25-11:40 S6-6 11:25-11:40 S10-4
11:40-11:55 S6-7 11:40-11:55 S10-5
Registration(13:00-14:00) 11:55-12:10 S6-8 11:55-12:10 S10-6
Opening(14:00-14:05) Lunch(12:10-13:15) 12:10-12:25 S10-7
Session1 (14:00-15:50) Session7 (13:15-15:30) 12:25-12:40 S10-8
14:05-14:40 S1-1 (S-Invited) 13:15-13:40 S7-1(Invited) 12:40-12:55 S10-9
14:40-15:05 S1-2(invited) 13:40-13:55 S7-2 Closing(12:55-13:00)
15:05-15:20 S1-3 13:55-14:10 S7-3  
15:20-15:35 S1-4 14:10-14:25 S7-4
15:35-15:50 S1-5 14:25-14:40 S7-5
Break(15:50-16:05) 14:40-14:55 S7-6
Session2 (16:05-17:15) 14:55-15:30 S7-7(S-Invited)
16:05-16:30 S2-1(invited) Break(15:30-15:50)
16:30-16:45 S2-2 Session8 (15:50-17:40)
16:45-17:00 S2-3 15:50-16:15 S8-1(Invited)
17:00-17:15 S2-4 16:15-16:40 S8-2(Invited)
Session3 (17:15-18:05)
Exhibitor's Presentation		 16:40-16:55 S8-3
16:55-17:10 S8-4
Dinner(18:15-19:30) 17:10-17:25 S8-5
Session4 (19:30-21:30)
Poster		 17:25-17:40 S8-6
Banquet(19:30- )

December 11 (Thursday)

13:00-14:00    Registration

14:00-14:05    Opening    (H. Asahi)

14:05-15:50    Session 1    (D. Bonnell)

ORAL: INVITED-S (30+5min), INVITED (20+5min), GENERAL (10+5min)

S1-1 (INVITED-S)

Hierarchical Organization of Nanowire Arrays for Integrated Nanosystems

D. Whang, S. Jin and C. M. Lieber  (Harvard Univ.)

S1-2 (INVITED)

Novel Scanning Probe Techniques for Micro/Nano-Fabrication Tools

F. Iwata and A. Sasaki  (Shizuoka Univ.)

S1-3

Nano-Scale Modification of Electrical and Magnetic Properties on Fe3O4 Thin Film by AFM Lithography

M. Hirooka1, H. Tanaka1, 2, R. Li1 and T. kawai1  (1Osaka Univ., 2JST)

S1-4

Observation and Manipulation of Nano Structures Formed by Rigid Rod-Like Polymers

K. Furukawa, H. Nakashima, K. Ajito, Y. Kashimura, W. Hu and K. Torimitsu  (NTT Corporation)

S1-5

Orientation Control of Molecular Chains in Polymers Using AFM

K. Kimura, K. Kobayashi, H. Yamada, T. Horiuchi, K. Ishida and K. Matsushige  (Kyoto Univ.)

15:50-16:05    Break

16:05-17:15    Session 2    (T. Matsumoto)

S2-1 (INVITED)

Organic Synthesis for Molecular Nano-Science

T. Ogawa  (IMS)

S2-2

Surface-State Conduction of Medium-Sized Nanowires

K. Kobayashi  (Ochanomizu Univ.)

S2-3

Measuring Molecular Conductivities Using Nano-Gap Electrodes

Y. Naitoh and W. Mizutani  (AIST)

S2-4

A Practical Method for Evaluating Single-Molecule Conductivity Using Conducting Probe Atomic Force Microscopy

H. Azehara1, T. -T. Liang1, 2, T. Ishida1, Y. Naitoh1, W. Mizutani1  (1AIST, 2NEDO)

17:15-18:05    Session 3  (M. Kageshima)  -- Exhibitorqｫﾔ Presentation --

1.  Unisoku Co.,Ltd.

    The Introduction of the New Scanning Probe

2.  JEOL Ltd

    Introduction of JEOL SPM's

3.  NIHON VEECO K.K.

    New Products and Technology of Veeco SPMs

4.  Tec Corporation

    Swiss High-Tech for Surface Inspection

5.  ULVAC-PHIq`Inc.qｱｰmicronq_Nanotechnologyq_Gmbhqｳ�/p>

    News for Nanotechnology

6.  Research Institute of Biomolecule Metrology Co., Ltd.

    Unparalleled Ever Quantitative AFM with As High As 0.1% Linearity

7.  TOYOTA TSUSHO CORPORATION

    Atomic Force Microscope with Improved Scan -- Accuracy, Scan Speed, and Optical Vision

8.  DAIKEN CHEMICAL CO., LTD

    Application of Carbon-Nanotube Cantilever

9.  Seiko Instruments Inc

    New SPM model "E-Sweep" in controlled environments

10. SHIMADZU CORPORATION

    Some Novel Techniques of Ambient/Environmental SPM

18:15-19:30    Dinner

19:30-21:30    Session 4  (K. Nakajima, O. Takeuchi)  -- Poster Session --

POSTER: width=90cm, height=100cm
 See here for the list of the poster presentations.

 

December 12 (Friday)

8:00-9:55        Session 5    (H. Yamada)

S5-1 (INVITED-S)

SPM at Lower Forces and Ultra-High Speeds

M. Miles  (Univ. of Bristol)

S5-2 (INVITED-S)

Force Microscopy Investigations of Molecules on Insulators

E. Meyer, L. Nony, R. Bennewitz, O. Pfeiffer, E. Gnecco and A. Socoliuc  (Univ. of Basel)

S5-3

STM Observation of Apparent Molecular Motion Induced by Electric Fields Change of Bipyridine Derivatives in Self-Assembled Monolayers

T. Ishida, E. Koyama, H. Tokuhisa, A. Belaissoui, Y. Nagawa, M. Nakano, W. Mizutani and M. Kanesato (AIST)

S5-4

AFM Comparison of DNA Adsorption onto Various Substrates

Z. Xiao, M. Xu, T. Ohgi and D. Fujita  (NIMS)

S5-5

In-situ AFM Observation of the Desorption Process in Monomolecular Organic Layers

Y. Miyamoto, T. Nemoto, H. Kurata and S. Isoda  (Kyoto Universit)

9:55-10:10      Break

10:10-12:10    Session 6    (M. Miles)

S6-1

Kelvin Probe Force Microscope Observation of Na Adatoms on TiO2 (110)

A. Sasahara, H. Uetsuka and H. Onishi  (KAST)

S6-2

Atomic Contrast Change in Noncontact AFM Images by Changing Bias Voltage Between a Tip and a Sample

T. Arai1, 2 and M. Tomitori1  (1JAIST, 2JST)

S6-3

Two-Dimensional Cluster Arrays on Quantum Pb Islands

H. Y. Lin1, 2, Y. P. Chiu1, 3, C. S. Chang1, Y. W. Chen 2, and T. T. Tsong1  (1Academia Sinica, 2National Central Univ., 3National Taiwan Normal Univ.)

S6-4

Shape Transition in the Initial Growth of Titanium Silicide Clusters on Si(111)-7x7

H. F. Hsu, H. C. Hsu, T. F. Chiang and L. J. Chen  (National Tsing Hua Univ.)

S6-5

Deposition of SAMs with Carboxyl Groups on Si (111) Surfaces Using 10-Undecenoic Acid

Y. J. Li, R. Tero, T. Nagasawa, T. Nagata and T. Urisu  (Okazaki National Research Institutes)

S6-6

Atomic Processes at Solid/Liquid Interfaces Observed by STM

K. Itaya  (Tohoku Univ.)

S6-7

In Situ Scanning Tunneling Microscopy of Electrochemical Deposition of Mercury Films on a Well-Ordered Iridium (111) Electrode

S. -L. Yau1, 2, K. Itaya1, 3 and Y. -S. Yang2  (1JST, 2National central Univ., 3Tohuku Univ.)

S6-8

Structural Change in Initially Adsorbed Layers of Stearic Acid at Liquid/Solid Interface

D. Takajo, T. Nemoto and S. Isoda  (Kyoto Univ.)

12:10-13:15    Lunch

13:15-15:30    Session 7    (K. Kobayashi)

S7-1 (INVITED)

Key Issues of Nanotribology for Successful Nanofabrication- From Basis to C60 Molecular Bearings

N. Sasaki1, 2 and K. Miura3  (1Seikei Univ., 2JST, 3Aichi Univ. of Education)

S7-2

Friction and Pull-off Forces on Submicron-Size Asperity Measured under High Vacuum Conditions

Y. Ando  (AIST)

S7-3

The Relationship between the Surface Adsorbed Structure and Frictional Property of Phthalocyanine Derivatives

K. Miyake1, T. Ikeda2, Y. Hori2, M. Asakawa2, T. Shimizu2, T. Ishida1, Y. Ando1, and S. Sasaki1  (1 IMSE, AIST, 2 NARC, AIST)

S7-4

Scanning Torque Microscopy (SQTM)

T. Mizoguchi  (Gakushuin Univ.)

S7-5

Dynamic Lateral Force Microscopy with True Atomic Resolution

S. Kawai, D. Kobayashi, S. Kitamura, S. Meguro, and H. Kawakatsu  (Univ. of Tokyo)

S7-6

Atomically Resolved Imaging of Si (111) 7x7 and NaCl (001) Using the qPlus Sensor with Pure Vibrational Detection

M. Wittmann, A. Feltz, T. Berghaus and J. Schuler  (Omicron NanoTechnology GmbH)

S7-7 (INVITED-S)

Update on Asia Pacific Nanotechnology R&D and Commercialization Efforts

L. Liu  (NanoGlobe Inc. Japan)

15:30-15:50    Break

15:50-17:40    Session 8    (D. Whang)

S8-1 (INVITED)

Nanotechnology Research in Hokkaido Univ. Bottom-up Strategy and Self-Organization

M. Shimomura  (Hokkaido Univ.)

S8-2 (INVITED)

Nano-Level Analytical and Evaluation Techniques Essential to the Development of ULSI

O. Ueda  (Fujitsu Laboratories Ltd.)

S8-3

Local Discharging of Carriers at Nanometer Scale Defects in Gate SiO2 Thin Films Observed by Conducting Atomic Force Microscopy

A. Seko, Y. Watanabe, H. Kondo, A. Sakai, S. Zaima and Y. Yasuda  (Nagoya Univ.)

S8-4

Local Detection of Photocurrent of InAs Wire by Conductive AFM Tip

H. Masuda1, M. Takeuchi2 and T. Takahashi1  (1Univ. of Tokyo, 2RIKEN)

S8-5

Size Dependence of Surface Potential on InAs Dots Studied by Kelvin Probe Force Microscopy

S. Ono and T. Takahashi  (Univ. of Tokyo)

S8-6

First-Principles Analysis of the Effects of Tip Atomic Species on Apparent Barrier Height

H. Totsuka1, 3, S. Furuya2, 3 and S. Watanabe2, 3  (1Nihon Univ., 2Univ. of Tokyo, 3JST)

19:30-              Banquet

December 13 (Saturday)

8:00-10:15      Session 9    (E. Meyer)

S9-1 (INVITED-S)

Multiple Modulation SPM for the Study of Defect Mediated Phenomena in Nanostructures

D. Bonnell  (Univ. of Pennsylvania)

S9-2 (INVITED)

Scanning Probe-Based Chemical Conversion of Organic Monolayers

H. Sugimura  (Nagoya Univ.)

S9-3

Resistance of a Single Atomic Step Studied by STS and Independently Driven Four-Tip STM

I. Matsuda, M. Ueno, T. Hirahara, J. Sugawa, R. Hobara and S. Hasegawa  (Univ. of Tokyo)

S9-4

Magnetic Field Observation Around a Current Flow by Magnetic Force Microscopy

D. Saida and T. Takahashi  (Univ. of Tokyo)

S9-5

Noise Elimination in Force Microscope Using Optical Lever Deflection Method

S. Fujisawa  (AIST)

S9-6

New FM Detection Techniques for Scanning Probe Microscopy

D. Kobayashi1, S. Kawai2 and H. Kawakatsu2  (1JST, 2Univ. of Tokyo)

S9-7

Advanced Nanoscale Metrology with AFM

J. Kwon, Y. -S. Kim, M. Hyun, K. Yoon, S. -M. Lee, and S. -I. Park  (PSIA corp.)

10:15-10:30    Break

10:30-12:55    Session 10    (H. Onishi)

S10-1 (INVITED)

Development of a New Millikelvin Scanning Tunneling Microscope

H. Fukuyama, H. Kambara and T. Matsui  (Univ. of Tokyo)

S10-2

Resolution Enhancement of Bio-Materials by Carbon Nanotube Atomic Force Microscopy Probe

Y. C. Chang1, 2, C. S. Chang1, D. C. Wang2, M. Y. Wu3, T. -Y. Fu3, and T. T. Tsong1  (1Academia Sinica, 2National Yunlin Univ. of Science & Technology, 3National Taiwan Normal Univ.)

S10-3

Scanning Probe Microscope Tip with Carbon Nanotube Truss

S. Akita1 and Y. Nakayama1, 2  (1Osaka Prefecture Univ., 2Osaka Univ.)

S10-4

Nano Resolution Imaging Using a Near-Field Scanning Microwave Microscope

K. Lee1, S. Kim1, H. Kim1, Y. Yang1 and B. Friedman2  (1Sogang Univ., 2Sam Houston State Univ.)

S10-5

Photoresponse of Titanium Dioxide Surface at Atomic Scale: Site for Visible Light Absorption

M. Komiyama and Y. –J. Li  (Yamanashi Univ.)

S10-6

Investigations of Nanoparticles by SNOM Combined with KFM Using a PZT Microfabricated Cantilever

N. Satoh1, 2, K. Kobayashi, S. Watanabe2, T. Fujii2, H. Yamada1 and K. Matsushige1  (1Kyoto Univ., 2Nikon Corporation)

S10-7

Electrical Conductivity of Cytochrome c on a Promoter-Modified Substrate

T. Matsumoto, M. Kataoka and T. Kawai  (Osaka Univ.)

S10-8

Dynamic Force Spectroscopy on a Single Polymer Chain

Y. Sakai1, K. Nakajima2, M. Hara3, K. Ito1, and T. Nishi2  (1Univ. of Tokyo., 2Tokyo Institute of Technology, 3RIKEN)

S10-9

Single Force Microscopy of Green Fluorescent Protein

T. Wang1, 3, K. Nakajima1, Y. Sakai2 and M. Hara1, 3  (1Tokyo Institute of Technology, 2Univ. of Tokyo, 3RIKEN)

12:55-13:00    Closing

December 11, Session 4  (K. Nakajima, O. Takeuchi)  -- Poster session –  (19:30-21:30)

POSTER: width=90cm, height=100cm

1.  Growth of Carbon Nanostructures on Ferritin-Adsorbed Si Substrates

M. Yoshimura and K. Ueda  (Toyota Technological Institute)

2.  Surface Structures of Clean and Oxidized Nb(100) Studied by STM

B. An1, L. Zhang1, M. Wen1, S. Fukuyama1, K. Yokogawa1 and M. Yoshimura2  (1AIST, 2Toyota Technological Institute)

3.  Interaction of Hydrogen with Nb(100) Surface Studied by STM

B. An1, L. Zhang1, M. Wen1, S. Fukuyama1, K. Yokogawa1 and M. Yoshimura2  (1AIST, 2Toyota Technological Institute)

4.  Adsorbate-Induced Step Rearrangement in Si Surfaces

M. Yoshimura, H. Shibata, T. An, K. Ojima and K. Ueda  (Toyota Technological Institute)

5.  Initial Growth Process of Si(001)-8xn-Ga Structure

S. Hara, K. Hujii, H. Torii, K. Irokawa, H. I. Fujishiro, H. Miki and A. Kawazu  (Tokyo Univ. of Science)

6.  Effects of Elevated Si Substrate Temperature on the Initial Growth of Titanium Silicides on Si(111)-7x7

H. C. Hsu, H. F. Hsu and L. J. Chen  (National Tsing Hua Univ.)

7.  Surface Structure Induced by High-Temperature Be Deposition onto GaAs(001)

H. Oigawa, Y. Okada, E. Matsuyama and H. Shigekawa  (Univ. of Tsukuba)

8.  Symmetric and Asymmetric Potassium Chains on GaAs(110)

N. Ishida1, H. Oka1, A. Subagyo2, K. Sueoka1, 2, K. Mukasa1, 2  (1Hokkaido Univ., 2CREST, JST)

9.  Evaluation of Device Configurations of 0.1 µm MOSFETs by Scanning Tunneling Microscopy

W. Doi1, S. Hasegawa1, T. Okui2, H. Nakashima3, and H. Asahi1  (1Osaka Univ., 2AIST, 3Hyogo Univ.)

10.  Surface Potential Measurements of Carbon Nanotube FETs Connected to Various Electrodes Investigated by Kelvin-Probe Force Microscopy

Y. Miyato, K. Kobayashi, T. Horiuchi, H. Yamada and K. Matsushige  (Kyoto Univ.)

11.  The Design of an All-Metal Probe for Scanning Capacitance Microscopy

Y. Naitou and N. Ookubo  (NEC Corporation)

12.  Detection of Stress-Induced Defects in Gate SiO2 Films by Conducting Atomic Force Microscopy

Y. Watanabe1, 2, A. Seko2, H. Kondo2, A. Sakai2, S. Zaima2 and Y. Yasuda2 (1Toyota Central R&D Labs., Inc. 2Nagoya Univ.)

13.  Cross-Sectional STM Study of Five-Layer Asymmetric Coupled Quantum Well (FACQW) Grown by Migration Enhanced Epitaxy (MEE)

J. –H. Noh1, S. Hasegawa2, T. Suzuki1, T. Arakawa1, K. Tada3, H. Asahi2  (1Yokohama National Univ., 2Osaka Univ., 3Kanazawa Institute of Technology)

14.  Energy Barrier for Dimer Flipping at the Si (001)- and Ge (001)-2x1 Surfaces in External Electric Field

J. Nakamura and A. Natori  (The Univ. of Electro-Communications)

15.  Atomic-Scale Control of Surface Reconstruction on Ge (001) by Scanning Tunneling Microscope at 80K

Y. Takagi, K. Nakatsuji, M. Yamada and F. Komori  (Univ. of Tokyo)

16.  Tip-Sample Interactions Causing the Apparent Si(100) Low Temperature Phases

S. Yoshida, O. Takeuchi and H. Shigekawa  (Univ. of Tsukuba)

17.  Investigation of Kr Adsorption Process on Si (100) at Cryogenic Temperature

T. Kimura, S. Yoshida, O. Takeuchi and H. Shigekawa  (Univ. of Tsukuba)

18.  STM/STS Study of Alkali Halide Films

M. Katayama, H. Inoue, M. Kiguchi and K. Saiki  (Univ. of Tokyo)

19.  Temperature Effect on the Oxygen Adsorbed Si(111)-7x7 SurfaceSTM Image

Y. Konishi, S. Yoshida, O. Takeuchi and H. Shigekawa  (Univ. of Tsukuba)

20.  Acetylene Molecules Adsorbed on Cu(111) Surface at Low Temperature Studied by Scanning tunneling  Microscopy

Y. Konishi1, Y. Sainoo2, M. Kawai2, S. Yoshida1, O. Takeuchi1 and H. Shigekawa1 (1Univ. of Tsukuba, 2RIKEN)

21.  Single Molecule Reaction Induced by the Inelastic Tunneling Electron: STM-IETS Study of Formate Molecule Absorbed on Ni (100)

S. Katano, Y. Kagata, Y. Kim and M. Kawai (RIKEN)

22.  STM Observation of Electron Standing Waves on Au (111) Film with a Superconducting Tip

M. Xu, Z. Xiao, M. Kitahara and D. Fujita  (NIMS)

23.  Sub-nm Resolutions Scanning Tunneling Spectroscopy Magnetic Imaging of Fe/Mn/Fe(001) Multilayer  Film

T. Mizoguchi1, T.K. Yamada2, A.L. Vazquez de Parga3, M.M.J. Bischoff2 and H. van Kempen2  (1Gakushuin Univ., 2Univ. of Nijmegen, 3Universidad Autonoma de Madrid)

24.  High-Tc SQUID Probe Microscope

T. Kondo and H. Itozaki  (NIMS)

25.  Local Barrier Height of Ir Nanoparticles on a TiO2 (110)-(1x2) Surface

Y. Maeda  (AIST)

26.  Local Tunneling Barrier Height Studies of Thermal Treated CO and O2 Covered Pt (100) Surfaces

A. Sinsarp, K. Miya, Y. Yamada, M. Sasaki and S. Yamamoto  (Univ. of Tsukuba)

27.  STM-BH Imaging of Subsurface Dopant Atoms on Hydrogen-Terminated Si(111)

K. Kobayashi, S. Kurokawa, and A. Sakai  (Kyoto Univ.)

28.  Sample Bias Voltage Dependence of Local Density of States Image of a Defect Induced by Oxidation of Si (111) Surface

N. Horiguchi, M. Kondo, Y. Kasai, K. Onishi and M. Miyao  (Muroran Institute of Technology)

29.  The Observation of Surface Polarization Distribution Using Temperature Controlled Scanning Nonlinear Dielectric Microscopy

K. Ohara and Y. Cho  (Tohoku Univ.)

30.  Femtosecond Time Resolution of Scanning Tunnel Microscopy Realized by Shaken-Pulse-Pair-Excitation Method

M. Aoyama, O. Takeuchi and H. Shigekawa  (Univ. of Tsukuba)

31.  Electrical Property of the Carbon Nanotube Probes Fixed by Low Melting Point Alloy

A. Ando1, H. Abe1, T. Shimizu1, Y. Nakayama2 and H. Tokumoto3  (1AIST, 2Osaka Prefecture Univ., 3Hokkaido Univ.)

32.  Pico-Gram Mass Sensor Using Piezo Resistive Cantilever

H. Sone and S. Hosaka  (Gunma Univ.)

33.  Dynamic Mode AFM in Liquids for Biological Samples

T. Okajima and H. Tokumoto  (Hokkaido Univ.)

34.  Wide Range Scanning Probe Microscope for Visualization of Biomaterials on Sub-Millimeter Range

T. Mizutani, Y. Ohmori, H. Haga and K. Kawabata  (Hokkaido Univ.)

35.  Visual-Nanobiology by Scanning Near-Field Optical/Atomic Force Microscopy

T. Yoshino, D. Fukushi, M. Shichiri, T. Matsuto, S. Sugiyama, S. Hagiwara, K. Akazawa, T. Ushiki and
T. Ohtani  (National Food Research Institute)

36.  Development of Confocal Laser Scanning Microscope / Atomic Force Microscope

T. Kodama, H. Ohtani, H. Arakawa and A. Ikai  (Tokyo Institute of Technology)

37.  Silicon Tip Cantilevers for Force Curve Analysis with Resonance of 20 kHz in Water

M. Kitazawa, A. Toda and A. Yagi  (OLYMPUS CORPORATION)

38.  Dual Bias Modulation Method for Scanning Tunneling Spectroscopy

M. Muranaka and T. Takahashi  (Institute of Industrial Science)

39.  Proposal for an Assembly Method for Nanoelectromechanical Devices on Microcantilevers Using Focused Ion Beam Technology

M. Nagase and H. Namatsu  (NTT Corporation)

40.  Optical Excitation of Cantilever in Liquid

T. Nakazawa, T. Mutsuo, Y. Hoshi and H. Kawakatsu  (Univ. of Tokyo)

41.  qｭｯanopianoqｯ�- an Array of Cantilevers for Optical Excitation and Measurement

Y. Hoshi1, T. Nakazawa1, T. Mutsuo1, S. Kawai1, D. Kobayashi2, H. Toshiyoshi1, and H. Kawakatsu1  (1Univ. of Tokyo, 2JST)

42.  Observation of Self-Assembled Monolayer by Using Lateral Resonance of the Cantilever

Y. Hoshi1, S. Kawai1, D. Kobayashi2, J. -G. Kim1, Y. -H. Cho1, S. Takeuchi1, B. -J. Kim1, and H. Kawakatsu1  (1Univ. of Tokyo, 2 JST)

43.  A Low Temperature Ultra-High Vacuum Dynamic Force Microscopy with Heterodyne Laser Doppler Interferometry

S. Kawai1, D. Kobayashi2, S. Meguro3, and H. Kawakatsu1  (1Univ. of Tokyo, 2JST, 3Neoark Corporation)

44.  Making Fine Atomic Force Microscopy for 200,000 yen Each -a Student Project-

T. Mutsuo, T. Nakazawa, T. Niino, A. Yamamoto, B. Kim, Y. Hoshi, K. Ikeda and H. Kawakatsu  (Univ. of Tokyo)

45.  High-Resolution Imaging by Non-Contact AFM Using FM Mode

K. Suzuki, S. Kitamura and T. Sato  (JEOL Ltd.)

46.  Unstable Adsorption of Oxygen on Si (111)7x7 Observed by Noncontact Atomic Force Microscopy

K. Shirai, R. Nishi, I. Yi, Y. Seino and S. Morita  (Osaka Univ.)

47.  Non-Contact AFM Image of MoO3 (010)

S. Suzuki, Y. Ohminami, T. Tsutsumi, M. M. Shoaib, K. Asakura  (Hokkaido Univ.)

48.  NC-AFM Observation on GaAs (110) Surface with Tip-Sample Relaxation

N. Uehara1, H. Hosoi2, K. Sueoka1 and K. Mukasa1  (1Hokkaido Univ., 2Innovation Plaza Hokkaido)

49.  Submolecular-Resolution Studies on Metal-Phthalocyanines by NC-AFM

T. Yoda, T. Ichii, T. Fukuma, K. Kobayashi, H. Yamada and K. Matsushige  (Kyoto Univ.)

50.  NC-AFM Investigations of Phase-separated Alkanethiol Self-assembled Monolayers with Different Head Groups

T. Ichii, T. Fukuma, K. Kobayashi, H. Yamada and K. Matsushige  (Kyoto Univ.)

51.  Variable-Temperature Measurements of Energy Dissipation in NC-AFM Imaging of Ferroelectric Polymer Thin Films

T. Fukuma, K. Kimura, K. Kobayashi, H. Yamada and K. Matsuhsige (Kyoto Univ.)

52.  Measuring Electrical Conductivity of Molecules with Nano-Gap Electrodes

Y. Otsuka, Y. Naitoh, T. Matsumoto, W. Mizutani, H. Tabata and T. Kawai  (Osaka Univ.)

53.  DNA-Templated Assembly of Gold Nanoparticles

F. Yamada, Y. Otsuka, T. Matsumoto, H. Tanaka and T. Kawai  (Osaka Univ.)

54.  Alignment of Au Nano-Particle on HOPG surface

K. Ojima1, 2, K. Adachi1, 2, K. Yamada2, T. Matsumoto1, 2 and T. Kawai1, 2 (1JST, 2Osaka Univ.)

55.  Controlled Formation of 1-D Parallel and 2-D Crossed DNA Nanowires on Surfaces

H. Nakao1, H. Shiigi2, T. Yoshino1, S. Sugiyama1 and T. Ohtani1 (1NFRI, 2Research Institute of Advanced Science & Technology)

56.  Placing Single Polymer Chains onto H-Terminated Si(100) Surfaces

Y. Terada, B. -K. Choi, S. Heike, M. Fujimori, and T. Hashizume  (Hitachi, Ltd.)

57.  Observation of Removal of an Fmoc Protecting Group by Scanning Tunneling Microscopy

Y. Okamoto, H. Kudo, K.J. Kwak, M. Fujihira  (Tokyo Institute of Technology)

58.  Analysis of Absorbed Organic Molecules in Low Temperature UHV STM

T. Kishimoto, Y. Yamamoto, Y. Miyatake, H. Mizuno, T Sasaki and T. Nagamura  (UNISOKU Co.,Ltd)

59.  DNA-nanoFISH Method Using SNOM/AFM - Direct Gene Detection on DNA Molecule in Nano-Meter Scale -

T. Ohtani1, J. M. Kim1, 2, T. Yoshino1, H. Nakao1, M. Sasou1, S. Shigeru1, T. Hirose1, 3 and H. Muramatsu4 (1NFRI, 2Osaka Univ., 3JAERI, 4Tokyo Univ. of Technology)

60.  Discrimination of Escherichia coli Ribosomal Subunits by Atomic Force Microscopy

T. Matsuura1, K. Kobayashi1, H. Tanaka2, T. Matsumoto2 and T. Kawai2  (1Shimadzu Corporation, 2Osaka Univ..)

61.  Etch Figure Observation on Protein Crystals with Atomic Force Microscopy

H. Hondoh and T. Nakada  (Ritsumeikan Univ.)

62.  Elastic Self-Assembling Lipid Microtubules Based on Cyclobolaphile That Mimics Archaeal Membrane Lipid

M. Shibakami, R. Goto, and K. Miyawaki  (AIST)

63.  Use of in situ Electrochemical Atomic Force Microscopy (EC-AFM) to Monitor Cathode Surface Reaction in Organic Electrolyte

R. Vidu, F. T. Quinlan and P. Stroeve  (Univ. of California)

64.  Adlayers of S and SCN on Cu Single Crystal Electrodes in KOH Solution

J. Inukai and K. Itaya  (Tohoku Univ.)

65.  Nanorheology on Polymeric Surfaces and Nano-Bridges

K. Nakajima, K. Kaneko, M. Komura and T. Nishi  (Tokyo Institute of Technology)

66.  Surface Potential Images of Lithographic Patterns on The 1,7-Octadien Monolayer Covalently Linked to Silicon

S. –H. Lee, N. Saito, H. Sugimura and O. Takai  (Nagoya Univ.)

67.  Accurate Measurement of Potential Landscape of Molecular Bond

T. Miyakoshi, D. Cho, O. Takeuchi and H. Shigekawa  (Univ. of Tsukuba)

68.  Quartz Sensor for High Speed Noncontact Atomic Force Microscopy in Liquid

M. Kageshima, S.P. Jarvis and T. .H. Oosterkamp  (Fukuoka Institute of Technology)

69.  Single Molecular Force Measurements between Virus and its Receptor

Y. Hirata1, M. Kageshima2, T. Sakai3, T. Inoue1 and M. Ohuchi3 (1AIST, 2Fukuoka Institute of Technology, 3Kawasaki Medical School)

70.  A Study of Effects of Chain Lengths on Adhesive Forces between a Gold Tip and a Gold Substrate Covered with Alkanethiol Self-Assembled Monolayers

K. Akimoto, F. Sato, T. Morikawa and M. Fujihira  (Tokyo Institute of Technology)

71.  The Dependence of Electrical Conduction on Conformational Change in a Single Alkyl Chain Induced by a Scanning Tunneling Microscope Tip

M. Suzuki, S. Fujii, S. Wakamatsu, U. Akiba and M. Fujihira  (Tokyo Institute of Technology )

72.  Nano-Mechanical Properties of Soft Materials

M. Komura, K. Nakajima and T. Nishi (Tokyo Institute of Technology)

73.  Tribological Behavior of Terphenyl Self-Assembled Monolayer Studied by a Pin-on-Plate Method and AFM

M. Nakano, T. Ishida, T. Numata, Y. Ando and S. Sasaki (AIST)

74.  The Effect of Pile-Up and Contact Area on the Hardness Measured by Nanoindentation

K. Miyake, S. Fujisawa, T. Ishida, and S. Sasaki  (AIST)

75.  STM Observation of High-Density Nanocrystalline Gold after Creep Deformation

H. Tanimoto1, S. Sakai2 and H. Mizubayashi1  (1Univ. of Tsukuba, 2JAERI)

76.  Nanomechanical Characteristics of Hard Carbon Thin Films Measured Using Nanoindenter Interfaced with SPM

K. –H. Lee, N. Saito, H. Sugimura and O. Takai  (Nagoya Univ.)

77.  New Fabrication Method of Nano-Dot Structures Using an Atomic Force Microscope with a Nano-Jet Probe

S. Ohkouchi, Y. Nakamura, H. Nakamura and K. Asakawa  (FESTA)

78.  Nano-Scale Pattern Fabrication Using Scanning Tunneling Microscope Tips in a Field Emission Mode

M. Hirade1, T. Arai1, 2 and M. Tomitori1  (1JAIST, 2JST)

79.  High Resolution AFM Imaging of the Si(111)-(7x7) Surface by Detecting a Single Chemical Bonding Force

T. Eguchi1, K. Akiyama2, M. Ono1, T. Sakurai2 and Y. Hasegawa1,3 (1Univ. of Tokyo, 2Tohoku Univ., 3PRESTO)