S1-1s

Atomic-scale magnetism through the eyes of STM

A.J. Heinrich, C.F. Hirjibehedin and C.P. Lutz (IBM Almaden Res. Center)

S1-2i

Nanoscale Electrical Conduction

M. Aono (NIMS)

S1-3

Single molecule manipulation by vibrational excitation

M. Ohara^1,2, Y. Kim¹ and M. Kawai^1,2 (¹RIKEN, ²Univ. of Tokyo)

S1-4

Single-atom chemical identification using AFM

Y. Sugimoto¹, P. Pou², M. Abe^1,3, P. Jelinek⁴, R. Perez², S. Morita¹ and O. Custance¹ (¹Osaka Univ., ²Autonoma de Madrid Univ., ³JST PRESTO, ⁴Academy of Sciences)

S2-1s

Quasi-1D physics of atomic wires on Si surfaces

H.W. Yeom (Yonsei Univ.)

S2-2

Hetero-epitaxy of Ge on Si(110) studied by STM

S. Gangopadhyay, M. Yoshimura and K. Ueda (Toyota Technological Inst.)

S2-3

Imaging Sidewall Surfaces of an ErSi₂ Nanocluster on Si(100) by Scanning Tunneling Microscope with a Metal-coated Carbon Nanotube Tip

Y. Murata, M. Kishida, K. Motoyoshi, S. Honda and M. Katayama (Osaka Univ.)

S2-4

Gate Control of Electronic Transport in Defective Carbon Nanotubes

Y. Nakazawa^1,2, T. Yamamoto^1,2 and K. Watanabe^1,2 (¹Tokyo Univ. of Science, ²CREST-JST)

S3-1

Nanotechnologies by Agilent Technologies

Agilent Technologies Japan Ltd.

S3-2

Pencil-type scanning probe microscope for combined instruments

FUJI IMVAC, INC.

S3-3

Intoroduction of JEOL's Scanning Probe Microscope

JEOL Ltd.

S3-4

New SPM Products by Veeco 2006

Nihon Veeco K.K.

S3-5

OLYMPUS Micro Cantilevers since 1991

OLYMPUS CORPORATION

S3-6

New Lineup of RIBM SPM products: SXM-Advance, SXM-Basic, NanoLiveVision

Research Institute of Biomolecule Metrology Co., Ltd.

S3-7

A New SPM Equipment SPM-9600 Model

SHIMADZU CORPORATION

S3-8

Introduction of handling products of Tec Corporation

Tec Corporation

S3-9

AFM cantilever by Tomoe Engineering

Tomoe Engineering Company

S3-10

Introduction of SPM & SPM-based advanced systems

Toyo Corporation

S3-11

Ultimate Nanoprobing in UHV: Four independent Scanning Tunneling Microscopes navigated by High Resolution UHV SEM

ULVAC-PHI

S3-12

New SPM products of Unisoku and RHK technology

UNISOKU Co.,Ltd.

S5-1s

Mechanics of Protein Folding and Unfolding

M. Rief (Techn. Univ. Germany)

S5-2

Viscoelastic responses of single biopolymer investigated with magnetically-modulated atomic force microscopy

Y. Nishihara¹, T. Chikamoto¹, M. Kageshima^1,2, Y. Hirata³, T. Inoue³, S. Kimura⁴, Y. Naitoh¹ and Y. Sugawara¹ (¹Osaka Univ., ²JST-PRESTO, ³National Inst. of Adv. Industrial Sci. and Technol., ⁴Chiba Univ.)

S5-3

Non-equilibrium stretching of a single polymer chain

K. Watanabe, N. Ohno, K. Nakajima and T. Nishi (Tokyo Tech)

S5-4

Optomization of membrane protein attachment to substrate for imaging the conformational changes by atomic force microscopy

Y. Shinozaki¹, K. Sumitomo¹, K. Inoue² and K. Torimitsu¹ (¹NTT BRL, ²Kyushu Univ.)

S5-5

Atomic force microscopy of the purple membrane suspended over nanoholes

K. Sumitomo¹, H. Miyashita¹, K. Furukawa¹, C. Ramanujan², H. Nakashima¹, M. Kobayashi¹, J. F. Ryan² and K. Torimitsu¹ (¹NTT BRL, ²Univ. of Oxford)

S5-6

Nanorheology of living cells investigated by AFM

T. Okajima, M. Tanaka, S. Tsukiyama, T. Kadowaki, S. Yamamoto, M. Shimomura and H. Tokumoto (Hokkaido Univ.)

S6-1s

Single Molecule Recognition Force Microscopy

P. Hinterdorfer (Johannes Kepler University Linz)

S6-2

Single molecule recognition imaging by frequency shift detection in liquids

T. Kawahara, T. Matsumoto, H. Hokonohara and T. Kawai (ISIR, Osaka Univ.)

S6-3

Hydration Force Measurements by Frequency Modulation Dynamic Force Microscopy

K.Kimura¹, T.Horiuchi¹, K.Kobayash², K.Matsushige^1,2 and H.Yamada^1,3 (¹Kyoto Univ., ²IIC, Kyoto Univ., ³CREST )

S6-4

High sensitive phase modulation atomic force microscopy with Q-control technique

N. Kobayashi¹, Y. J . Li^1,2, Y. Naitoh^1,2, M. Kageshima^1,2 and Y. Sugawara^1,2 (¹Osaka Univ., ²CREST-JST)

S6-5

AFM study of α-helix-forming peptides

G. Aoki, T.K. Yamada, S. Kojima and T. Mizoguchi (Gakushuin Univ.)

S7-1s

Nanofabrication, Nanomechanics and Compositional Mapping in Force Microscopy

R. Garcia (Instituto de Microelectronica de Madrid, CSIC)

S7-2i

Linear and nonlinear contact resonance in atomic force acoustic microscopy

M. Muraoka (Akita Univ.)

S7-3

The Origin of Anomalous Dissipation Contrast on Si(001) Surface Observed with NC-AFM at 5K

Y. Sugawara, H. Nomura, Y. Naitoh and M. Kageshima (Osaka Univ.)

S7-4

Atomic resolution AFM on NaCl at 5 K using the QPlus sensor

M. Maier, A. Bettac, J. Schuler, M. Wittmann and A. Feltz (Omicron NanoTechnology GmbH)

S7-5

Atomic resolution frequency-modulation atomic force microscopy in liquid

S. Nishida¹, D. Kobayashi¹, T. Sakurada² and H. Kawakatsu² (¹JST, ²IIS, Univ. of Tokyo)

S7-6

Dynamic Response of Force-modulation Method on Polymer Surfaces

S. Fujinami, K. Nakajima and T. Nishi (Tokyo Tech)

S8-1s

Electromechanics on the nanoscale: A new dimension in Scanning Probe Microscopy

S.V. Kalinin (Oak Ridge National Laboratory)

S8-2i

Tip-pressurized Near-Field Raman Microscopy

S. Kawata^1,2 (¹Osaka Univ., ²RIKEN)

S8-3

Fourier transform photo-absorption spectroscopy by detecting scanning tunneling microscope current

N. Naruse^1,2, Y. Mera^1,2, Y. Nakamura^1,2, M. Ichikawa^1,2 and K. Maeda^1,2 (¹Univ of Tokyo, ²CREST-JST)

S8-4

Plasmon-enhanced forbidden fluorescence from phthalocyanine molecules induced by a scanning tunneling microscope

T. Uemura^1,2, T. Nakano¹, M. Akai-Kasaya^1,3, A. Saito^1,4,5, M. Aono^2,4 and Y. Kuwahara^1,4,5 (¹Osaka Univ., ²Nano System Functionality Center, NIMS, ³PRESTO, JST, ⁴ICORP, JST, ⁵Harima Inst., RIKEN)

S8-5

Optical characterization of single polymer nanotubes using

D. C. Kim¹, R. Kim¹, D. H. Park², J. Joo² and J. Kim¹ (¹Univ. of Incheon, ²Korea Univ.)

S8-6

Time-resolved electrostatic force detection

T. Matsumoto^1,2 and T. Kawai^1,2 (¹ISIR, Osaka University, ²CREST-JST)

S8-7

Ultrafast carrier dynamics in optically excited semiconductors probed by time-resolved scanning tunneling microscopy

Y. Terada, M. Aoyama, H. Kondo, N. Ebisawa, O. Takeuchi and H. Shigekawa (Univ. of Tsukuba, CREST-JST)

S8-8

Modification of an AFM Si tip by Pt sputtering and its characterization

Z.A. Ansari¹, T. Arai² and M. Tomitori¹ (¹JAIST, ²Univ. of Tsukuba, PRESTO-JST)

S8-9

Mechanical Vibration Properties of Cantilevered Carbon Nanotubes

S. Sawaya¹, Y. Nakayama^1,2,3 and S. Akita^1,3 (¹Osaka Pref. Univ., ²Osaka Univ. , ³CREST-JST )

S9-1i

Molecular Tips for "Intermolecular Tunneling Microscopy"

T. Nishino, T. Ohshiro and Y. Umezawa (Univ. of Tokyo)

S9-2

Electrical Transport through Polydiacetylene Wires Using Nanogap Flat Electrodes

M. Akai-Kasaya^1,2, N. Ogami², A. Saito², M. Aono³ and Y. Kuwahara² (¹PREST-JST, ²Osaka Univ., ³NIMS)

S9-3

Conductance and force in single molecular junctions of p-phenylene derivatives

S. Fujii and M. Fujihira (Tokyo Inst. of Tech.)

S9-4

Acquisition of a Peak Signal with a High S/N ratio during XANAM measurement

S. Suzuki^1,4, M. Nakamura², K. Kinoshita², Y. Koike³, K. Fujikawa², W.-J. Chun^1,4, M. Nomura³ and K. Asakura¹ (¹CRC Hokkaido-Univ., ²Hokkaido Univ., ³PF-KEK, ⁴CREST-JST)

S9-5

Control of Self-Assembly of Fullerene Programmed by Direct Thiolation and Substrate Interaction

H. Fukidome, M. Yoshimura, K. Ueda, M. Sekido and M. Ohon (Nano High-Tech Res. Center, Toyota Technol. Inst.)

S9-6

Manipulation of BDA molecules deposited on Au(111) surface by tunneling electron injection

Y.F. Zhang¹, T. Osada¹, N. Zhu¹, Y. Sainoo^1,2 and T. Komeda^1,2 (¹IMRAM, Tohoku Univ., ²JST-CREST)

S9-7

SPM analysis of individual dye molecules on TiO₂(110)

A. Sasahara^1,2, M. Ikeda², N. Koide³, L. Han³ and H. Onishi² (¹JST, ²Kobe Univ., ³Sharp Corp.)

S9-8

Single wall carbon nanotubes at metal surfaces

S. Clair, Y. Kim and M. Kawai (RIKEN)

S10-1i

Multi-probe SPM, Present and Future

S. Hasegawa (Univ. of Tokyo)

S10-2

Multi-probe atomic force microscopy using piezoelectric cantilevers

N. Satoh¹, E. Tsunemi¹, K. Kobayashi², S. Watanabe³, T. Fujii³, K. Matsushige¹ and H. Yamada^1,4 (¹Kyoto Univ., ²Kyoto Univ(IIC)., ³Nikon Corporations, ⁴CREST/JST)

S10-3

Photovoltage Mapping on Polycrystalline Silicon Solar Cells by KFM with Piezo-resistive Cantilever

M. Takihara¹, T. Igarashi¹, T. Ujihara² and T. Takahashi¹ (¹Univ. of Tokyo, ²Nagoya Univ.)

S10-4

Electronic Structure of Fe nanodots on MgO thin film

H.-J. Shin, S.H. Kim, H.J. Yang and Y. Kuk (Seoul Nat'l Univ.)

S10-5

Probing the electronic characteristics of single bionanodot

R. Tanaka¹, A. Miura¹, Y. Uraoka¹, T. Fuyuki¹ and I. Yamashita^1,2 (¹NAIST, ²ATRL Matsushita Electric)

S10-6s

Structural bases of catch bonds

C. Zhu (Georgia Inst. of Technology)

S4-1p

Ab initio Green's function study on NMR-STM simulation of hydrogen molecular junction

T. Tada^1,2 and S. Watanabe^1,2 (¹Univ. of Tokyo, ²CREST-JST )

S4-2p

Loop Thermal Current in Graphitic Ribbons with Structural Defects

M. Morooka^1,2, T. Yamamoto^1,2 and K. Watanabe^1,2 (¹Tokyo Univ. of Science, ²CREST-JST )

S4-3p

Subsurface imaging using complementary media

K. Kobayashi (Ochanomizu Univ.)

S4-4p

Nc-AFM and STM simulations of H-terminated Si(001) surfaces

A. Masago¹, S. Watanabe¹, K. Tagami² and M. Tsukada² (¹Univ. Tokyo, ²Waseda Univ.)

S4-5p

STM simulation for B- and P-doped Si(111) surfaces

M. Hirayama, J. Nakamura and A. Natori (UEC)

S4-6p

Steady-state adsorption of hydrogen on Si(111)-7x7 surface

Y. Iwadate¹, S. Heike², M. Fujimori² and T. Hashizume^1,2 (¹Tokyo Inst. of Technology, ²ARL, Hitachi, Ltd. )

S4-7p

Metastable Phase of Si(110) Surface: 5�~8 reconstruction

Y. Ohira, M. Yoshimura and K. Ueda (Toyota Technological Inst.)

S4-8p

Initial Oxidation Process of Si(110)-�g16�~2�h Surface

Y. Ohira, M. Yoshimura and K. Ueda (Toyota Technological Inst.)

S4-9p

Growth of Germanium on hydrogen-terminated Si(113) surface

M. Yoshimura, K. Mamiya and K. Ueda (Toyota Technological Inst.)

S4-10p

Tip-induced diffusion at the Ge(111)-c(2x8) surface

A Ohiso¹, K Mizuta¹, M Hiragaki¹, Y Sugimoto¹, M Abe^1,2 and S Morita¹ (¹Osaka�@Univ., ²JST PRESTO)

S4-11p

Scanning Tunneling Microscopy Study of Pd Adsorption on Pt(111)

E. Narihiro¹, K. Umezawa¹, Y. Ohira² and M. Yoshimura² (¹Osaka Prefecture Univ., ²Toyota Technological Inst.)

S4-12p

Hydrogen adsorption on a Fe monolayer grown on Ni(111) investigated by scanning tunneling microscopy

B. An, S. Fukuyama and K. Yokogawa (AIST)

S4-13p

Surface electronic structures of c(3√2×√2)R45˚-C/Cr(001) thin film surfaces studied by STM/STS

H. Oka, A. Nakai and K. Sueoka (Hokkaido Univ.)

S4-14p

Ultrahigh Vacuum Non-Contact Atomic Force Microscope Observation of Surface Structure and Grain Size Changes of Ge₂Sb₂Te₅ Films by Annealing Effect

M. Asai, A. Miyachi, Y. Yin, H. Sone and S. Hosaka (Gunma-Univ.)

S4-15p

Formation of In nanowires realized on Si(113) Surface

M. Xu, A. Okada, S. Yoshida, K. Kanazawa, K. Hayashi, O. Takeuchi and H. Shigekawa (21st Century COE, CREST-JST, Univ. of Tsukuba)

S4-16p

Au induced nanowire on Si(110) studied by STM

M. Tanaka, M. Yoshimura and K. Ueda (Toyota Technological Institute.)

S4-17p

Observation of carbon nanowire-like structures formed on HOPG substrate

X.L. Guo and D. Fujita (ANCC, NIMS )

S4-18p

Direct Growth of Single Carbon Nanofiber onto W tip induced by Ion Irradiation

J. Tanaka¹, M. Kitazawa^1,2, M. Tanemura¹ and R. Ohta² (¹Nagoya Inst. Technol., ²Olympus Co. Ltd.)

S4-19p

Interaction between single wall carbon nanotubes and organic molecules on metal surfaces

S. Clair, C. Rabot, Y. Kim and M. Kawai (RIKEN)

S4-20p

STM Observation of Titanium-Carbide Metallofullerenes

N. Fukui¹, H. Moribe¹, H. Umemoto¹, T. Sugai¹, Y. Suwa² , S. Heike² , M. Fujimori², T. Hashizume^2,3 and H. Shinohara^1,4,5 (¹Nagoya Univ., ²ARL, Hitachi.Ltd, ³Tokyo Inst. of Technology, ⁴IAR Nagoya Univ., ⁵CREST/JST)

S4-21p

STM/STS Observation of T_d-symmetric Metallofullerene: Lu₂@C₇₆

K. Ohashi¹, N. Fukui¹, H. Umemoto¹, T. Sugai^1,2 and H. Shinohara^1,2,3 (¹Nagoya Univ., ²IAR Nagoya Univ., ³JST/CREST )

S4-22p

STM observation of nanographene on Pt(111)

M. Yamamoto, S. Entani, S. Ikeda and K. Saiki (Univ. of Tokyo )

S4-23p

Surface structures of activated carbon fibers characterized by scanning tunneling microscopy

B. An¹, Z. Lin¹, S. Fukuyama¹, K. Yokogawa¹, S. Lim², S-H. Yoon² and I. Mochida² (¹AIST, ²Kyushu Univ.)

S4-24p

STM-BH Imaging of S atoms on Au(111) in Their Different Charge States

Y. Miyawaki¹, S. Kurokawa² and A. Sakai² (¹Kyoto University, ²IIC, Kyoto University)

S4-25p

Local Barrier Height measurements on p-type GaAs(110) surfaces

K. Kobayasi¹, S. Kurokawa² and A. Sakai² (¹Kyoto Univ., ²IIC, Kyoto Univ.)

S4-26p

Local tunneling barrier height (LBH) observations on Ni₃Al(111)

M. Saida, S. Ogata and M. Sasaki (Univ. of Tsukuba)

S4-27p

Surface Potential difference of Biomineralized Inorganic nanodot by KFM

S-I. Yamamoto¹, Y. Uraoka², T. Fuyuki², M. Okuda³ and I. Yamashita³ (¹KCCT, ²NAIST, ³PANASONIC)

S4-28p

Local polarized domains of ferroelectric materials investigated by Kelvin probe force microscopy

A. Nakai¹, N. Satoh¹, K. Kobayashi², K. Matsushige¹ and H. Yamada^1,3 (¹Kyoto Univ., ²IIC, Kyoto Univ., ³CREST JST)

S4-29p

Surface potential measurement of α-sexithiophene by Kelvin probe force microscopy utilizing frequency modulation detection method

N. Satoh¹, K. Kaisei¹, K. Kobayashi², S. Watanabe³, T. Fujii³, K. Matsushige¹ and H. Yamada^1,4 (¹Kyoto Univ., ²Kyoto Univ(IIC)., ³Nikon Corporations, ⁴CREST/JST )

S4-30p

Dynamic KFM/EFM Detecting a Potential by Frequency Shift with Amplitude Feedback

A. Takagi¹, F. Yamada², T. Matsumoto^1,2 and T. Kawai² (¹JST-CREST, ²ISIR, Osaka University)

S4-31p

KFM measurement without bias-voltage feedback

O. Takeuchi, Y. Ohrai, S. Yoshida and H. Shigekawa (CREST, 21st COE, Univ. of Tsukuba, )

S4-32p

Investigation of organic field-effect transistors using Kelvin probe force microscopy

S. Heike and T. Hashizume (ARL, Hitachi Ltd.)

S4-33p

Near field photoluminescence investigations of InGaN/GaN quantum wells grown on freestanding GaN substrate

M.S. Jeong¹, O.H. Cha¹, J.S. Kim¹, C.C. Byeon¹, D.-K. Ko¹, J. Lee¹, C.-H. Hong² and E.-K. Suh² (¹Advanced Photonics Research Inst., GIST, ²Chonbuk National Univ.)

S4-34p

Nanoscale carrier flow in an operating GaAs p-n junction imaged by Light-Modulated Scanning Tunneling Spectroscopy

S. Yoshida, Y. Kanitani, R. Oshima, Y. Okada, O. Takeuchi and H. Shigekawa (CREST, 21st COE, Univ. of Tsukuba, )

S4-35p

Local Measurements of Minority Carrier Diffusion Length in Polycrystalline Silicon Solar Cells by Kelvin Probe Force Microscopy

M. Takihara¹, T. Ujihara² and T. Takahashi¹ (¹Univ. of Tokyo, ²Nagoya Univ. )

S4-36p

Ultrafast photo-induced carrier dynamics observed by pulse-pair excited scanning tunneling microscopy

M. Aoyama, H. Kondo, N. Ebisawa, Y. Terada, O. Takeuchi and H. Shigekawa (Tsukuba-Univ.)

S4-37p

Development of fiber-coupled polarized SNOM

T. Igarashi¹, T. Tadokoro², K. Nakajima¹ and T. Nishi¹ (¹Tokyo Institute of Technology, ²Techno synergy)

S4-38p

SQUID Probe Microscope Combined with Scanning Tunneling Microscope

M. Tachiki¹, T. Hayashi^1,2 and H. Itozaki^1,3 (¹National Inst. for Materials Science, ²Sendai National College of Technology, ³Osaka Univ.)

S4-39p

The effect of polarization direction on the electrical field distribution at near-field of a tip-on-aperture NSOM probe

J.-B. Kim¹, S.-J. Na¹ and W.-S. Chang² (¹Korea Advanced Inst. of Science and Technology, ²Korea Inst. of Machinery and Materials)

S4-40p

Fabrication of cantilevered tip-on-aperture probe for enhancing of the resolution of scanning near-field optical microscopy

W.-S. Chang¹ and M.-S. Jeong² (¹Korea Inst. of Machinery and Mateirlas, ²Advanced Photonic Res. Inst.)

S4-41p

Development of an Ultrasonic Atomic Force Microscope with digital PLL and AGC

K. Nakamoto¹, Y. Imashige¹, H. Uchiumi¹, K. Yonei¹, S. Kitamura¹, T. Tsuji² and K. Yamanaka² (¹JEOL Ltd., ²Tohoku-Univ.)

S4-42p

Functional AFM using self-detective Cantilever

Y. Miyatake, Y. Yamamoto, T. Sasaki, K. Ishikawa, H. Mizuno and T. Nagamura (UNISOKU Co.,Ltd.)

S4-43p

Electromechanical Imaging and Polarization Switching of Ferroelectric Materials in a Liquid Environment: Ultrahigh Resolution and Novel Physics

B.J. Rodriguez, S. Jesse, A. Baddorf and S.V. Kalinin (Oak Ridge National Laboratory)

S4-44p

The Hunt for a Snark: Spatially Resolved Imaging of Nucleation Centers in Ferroelectrics

S. Jesse, B.J. Rodriguez and S.V. Kalinin (Oak Ridge National Laboratory)

S4-45p

Does it Always Have to be a Sine? Band Excitation Method and Energy Dissipation Measurements by SPM

Stephen Jesse and Sergei V. Kalinin (Oak Ridge National Laboratory)

S4-46p

The AFM Tweezers System : Creation of a New Class of Atomic Force Microscope

K. Ayano¹, K. Nakagawa², T. Takekawa¹, T. Konno³, T. Kobayashi³, M. Yasutake⁴, T. Umemoto⁴ and G. Hashiguchi¹ (¹Kagawa Univ, ²Tokyo Univ, ³AOI ELEC-CO.,LTD, ⁴SII NT Inc.)

S4-47p

Development of a High-speed Atomic force Microscope (AFM)

Y. J. Li^1,2 , N. Kobayashi¹ , H. Nomura¹, Y. Naitoh^1,2, M. Kageshima^1,2 and Y. Sugawara^1,2 (¹Osaka Univ., ²CREST, JST)

S4-48p

Reduction of frequency noise in frequency modulation AFM in liquid environment

T. Horiuchi¹, K. Kimura¹, K. Kobayashi², Y. Hirata³, K. Matsushige¹ and H. Yamada¹ (¹Kyoto Univ, ²IIC Kyoto Univ, ³AIST )

S4-49p

Towards AFM in TEM using optical fiber-less Laser Doppler velocimetry

T. Sakurada¹, K. Nakagawa¹, Y. Hoshi¹, S. Meguro², O. Takano² and H. Kawakatsu¹ (¹IIS, Univ. of Tokyo, ²Neoark Corporation)

S4-50p

2D comparison between heterodyne laser interferometer and crystal periodicity observed by friction force micsoscopy

Y. Hoshi and H. Kawakatsu (IIS, Univ. of Tokyo)

S4-51p

Phase-Locked Forced-Oscillation AFM Controller

D. Kobayashi¹, S. Nishida¹ and H. Kawakatsu² (¹JST, ²IIS Univ. of Tokyo)

S4-52p

Electric conductance through a point contact between a Si tip and a Si surface

T. Arai^1,2 and M. Tomitori³ (¹Univ. Tsukuba, ²SORST, JST, ³JAIST )

S4-53p

Local conductance imaging of nanomaterials on insulator using an integrated nanogap probe

M. Nagase and H. Yamaguchi (NTT BRL)

S4-54p

Monitoring conditions of cantilever and control during conducting atomic force microscopy spectroscopy measurements

T. Oohira and A. Ando (AIST )

S4-55p

Development of multi-probe AFM with optical beam deflection method

E. Tsunemi¹, N. Satoh¹, K. Kobayashi², K. Matsushige¹ and H. Yamada^1,3 (¹Kyoto Univ., ²IIC Kyoto Univ., ³CREST/JST)

S4-56p

Molecular-resolution imaging using 2nd-resonance frequency modulation atomic force microscopy with optical beam deflection system

T. Ichii¹, K. Kobayashi², K. Matsushige¹ and H. Yamada¹ (¹Kyoto Univ., ²IIC, Kyoto Univ.)

S4-57p

Atomic resolution frequency-modulation atomic force microscopy in liquid using photothermal excitation and laser Doppler velocimetry

S. Nishida¹, D. Kobayashi¹, T. Sakurada² and H. Kawakatsu² (¹JST, ²IIS, Univ. of Tokyo)

S4-58p

Dissipative force modulation Kelvin probe force microscopy applying doubled frequency ac bias voltage

H. Nomura, K. Kawasaki, T. Chikamoto, Y. Naitoh, M. Kageshima and Y. Sugawara (Osaka-Univ.)

S4-59p

Single-crystal nano-wire cantilevers for scannig force microscopy

K. Nakagawa¹, T. Sakurada¹, D. Kobayashi¹, D. Saya², G. Hashiguchi³ and H. Kawakatsu¹ (¹IIS, ²LAAS-CNRS, ³Kagawa-Univ)

S4-60p

Fabrication of Carbon Nanotube Tips for Scanning Probe Microscopy through the Preparation of Catalyst by Arc Plasma Deposition

Y. Matsuura, C.-C. Chiu, M. Yoshimura and K. Ueda (Toyota Technological Inst.)

S4-61p

Electric properties of single carbon nanofibers grown on tips of scanning probe microscope by ion irradiation

M. Kitazawa^1,2, R. Ohta¹, J. Tanaka² and M. Tanemura² (¹Olympus Co.Ltd., ²NIT)

S4-62p

Nanometer-scale deposition of photo-curing resin using a nanopipette probe microscope and near-field optical illumination

Y. Ushiro, A. Sasaki and F. Iwata (Shizuoka Univ.)

S4-63p

Mechanism of electric field induced deposition of In nano-dots with the Nano-Jet Probe

S. Ohkouchi^1,2, Y. Sugimoto^1,3, N. Ozaki³, H. Ishikawa¹ and K. Asakawa³ (¹AIST, ²NEC Corp., ³Univ. of Tsukuba)

S4-64p

Fabrication of periodic nano-holes on GaAs substrate by using AFM tip assisted oxidation and chemical wet etching

J.S. Kim, M.S. Jeong, C.C. Byeon, D.-K. Ko and J. Lee (Advanced Photonics Research Inst., GIST)

S4-65p

AFM based atomic manipulation at room temperature

Y. Sugimoto¹, M. Abe^1,2, O. Custance¹ and S. Morita¹ (¹Osaka Univ., ²JST PRESTO)

S4-66p

Research on Fine Structures and Mechanical Properties of Human Hair by Atomic Force Microscope

H. Kitano^1,2, A. Yamamoto¹, M. Niwa¹, S. Fujinami², K. Nakajima², T. Nishi² and S. Naito³ (¹Hoyu Co.,Ltd., ²Tokyo Inst. of Technology, ³KEK)

S4-67p

Single Molecular Anatomy of Host-guest Chemistry Based on Atomic Force Microscopy Study of Cyclodextrin-ferrocene Molecular Interaction

S. Yasuda¹, Y. Okutsu², I. Suzuki³, K. Shinohara⁴, O. Takeuchi² and H. Shigekawa² (¹AIST, ²Univ. of Tsukuba, ³Tohoku Univ., ⁴JAIST)

S4-68p

Visualization of stretch-induced intracellular tensional response of single fibroblasts by mechanical-SPM

K. Tamura, T. Mizutani, H. Haga and K. Kawabata (Hokkaido Univ.)

S4-69p

Elastic properties of gels and living cells measured by colloidal probe AFM

T. Kadowaki¹, T. Okajima¹, X.M. Tao² and H. Tokumoto¹ (¹Hokkaido Univ., ²Zhejiang Univ.)

S4-70p

Frequency Sweep Method Using Piezo-Resistive Cantilever for Femto-Gram Biosensor

K. Takeda¹ , H. Sone¹, H. Okano² and S. Hosaka¹ (¹Gunma-Univ., ²Tokyo Sokki Kenkyujo Co. Ltd.)

S4-71p

Supported planar membranes made from cyclic lipids

M. Shibakami, R. Goto and M. Nakamura (AIST)

S4-72p

Application of Scanning Tunneling Microscopy to Identification of Pheromone Molecules of Insects

K. Kawazu¹, K. Nakajima¹, M. Hara¹, T. Ando², Y. Ishikawa³ and S. Tatsuki³ (¹Tokyo Inst Tech, ²Tokyo Univ. of Agriculture and Technology, ³Univ of Tokyo)

S4-73p

Supramolecular π-Conjugated Polyrotaxane

K. Shinohara and T. Kitami (JAIST)

S4-74p

STM-induced photoemission spectroscopy on rubrene thin films - Does surface plasmon play an essential role for photoemission? -

A. Okada^1,2,3, K. Kanazawa^1,2,3, M. Berthe^1,2,3, K. Hayashi^1,2,3, N. Okawa^1,2,3, O. Takeuchi^1,2,3 and H. Shigekawa^1,2,3 (¹21th Century COE, ²CREST-JST, ³Univ. of Tsukuba)

S4-75p

STM/STS on the standing wave of anisotropic dispersion relations observed for self-assembled glycine monolayers on Cu(100)

K. Kanazawa^1,2,3, Y. Konishi^1,2,3, Y. Sainoo⁴, S. Yoshida^1,2,3, O. Takeuchi^1,2,3 and H. Shigekawa^1,2,3 (¹Univ. of Tsukuba, ²21st Century COE, ³CREST, ⁴IMRAM Tohoku Univ.)

S4-76p

Scanning capacitance microscopy for alkylsilane monolayer covered-Si substrates patterned by scanning probe lithography

J. Han¹, K-H Lee², S. Fujii¹, H. Sano¹, Y. J. Kim¹, T. Ichii¹, K. Murase¹ and H. Sugimura¹ (¹Kyoto Univ., ²Research Inst. of Industrial Science & Technology)

S4-77p

DNA-based assembly of Au nanoparticles on TiO₂ powder

Y. Maeda, T. Akita and T. Fujitani (AIST)

S4-78p

Evaluation of Hydrophilicity and Stability of the Silicon Wafer Surface by Force Spectroscopy

J. Jung, I. Kim, B. Hong and B. Lee (Siltron Inc.)

S4-79p

Quantitative measurement of viscoelastic property with Scanning Probe Microscopy

M. Ohta¹, T. Ito¹, T. Marui¹, A. Kogure², M. Matsuda¹ and R. Kokawa¹ (¹Shimadzu Corp., ²Shimadzu AMC )

S4-80p

Interfacial Structure of Carbon Nanotube/Elastomer Composites Observed by Atomic Force Microscopy

A. Niikura, K. Nakajima, S. Fujinami, S. Nagai and T. Nishi (TOKYO Tech)

S4-81p

Temperature-dependence of Polymer Chain Conformation

N. Ohno, K. Watanabe, K. Nakajima and T. Nishi (Tokyo Tech)

S4-82p

Interim Report on Dynamic Nanofishing -from Forced Oscillation to Noise Analysis-

K. Nakajima, K. Watanabe, N. Ohno and T. Nishi (Tokyo Inst. of Technology)

S4-83p

Simultaneous quantification of elastic and adhesive interactions realized by AFM

S. Nagai, S. Fujinami, K. Nakajima and T. Nishi (Tokyo Tech)

S4-84p

Energy Dissipation at an Ultrasonically Oscillating Super-Hydrophobic Surface in Various Liquids

T. Kobayashi¹, M. Fujita² and M. Fujihira¹ (¹Tokyo Tech, ²Fujifilm )

S4-85p

Mechanism of velocity saturation of atomic friction force and the dynamic superlubricity at torsional resonance

M. Igarashi, J. Nakamura and A. Natori (UEC)

S4-86p

Atomic-resolution Imaging in Liquid by Amplitude Detection Dynamic-mode AFM

S. Kitamura¹, Y. Takeda¹, Y. Imashige¹ and H. Yamada² (¹JEOL Ltd., ²Kyoto Univ.)

S4-87p

Spatial fluctuation in the quality of ultrathin SiO₂ films observed by conducting atomic force microscope

A. Ando, T. Oohira and Y. Naitou (NeRI, AIST)

S4-88p

Spatial variation of thickness of ultrathin SiO₂ films observed by scanning capacitance microscopy

Y. Naitou¹, A. Ando¹, H. Ogiso², S. Kamohara³, F. Yano³ and A. Nishida³ (¹NRI, AIST, ²AMRI, AIST, ³MIRAI-Selete, Inc)