18th International Colloquium
on Scanning Probe Microscopy (ICSPM18)


ICSPM18 Conference Program

Contents

Time Table

9-Dec (Thu) 10-Dec (Fri) 11-Dec (Sat)
Registration (12:00-14:00)
Wellcome address (14:00-14:05)
Session 1
14:05 S1-1s D.J. Müller
14:45 S1-2i A. Ikai
15:15 S1-3 H. Tanaka
Coffee break (15:30-15:50)
Session 2
15:50 S2-1i Y. Kim
16:20 S2-2 C. Chen
16:35 S2-3 T. Komeda
16:50 S2-4i T.K. Yamada
Session 3
Exhibitor's presentation
Break (18:15-18:30)
Dinner (18:30-19:30)
Session 4
Poster session (19:30-21:30)
Breakfast (07:00-08:30)
Session 5
08:30 S5-1s R. Berger
09:10 S5-2 K.-i. Morita
09:25 S5-3 Y. Sugimoto
09:40 S5-4 Y. Hosokawa
09:55 S5-5 H. Nishizawa
Coffee break (10:10-10:30)
Session 6
10:30 S6-1s A. Kühnle
11:10 S6-2 K. Suzuki
11:25 S6-3 T. Ichii
Conference Photo (11:40-11:55)
Lunch (11:55-13:00)
Session 7
13:00 S7-1s J. Seo
13:40 S7-2i T. Enoki
14:10 S7-3 Y. Murata
14:25 S7-4 Y. Nakamura
14:40 S7-5 S. Tanabe
Coffee break (14:55-15:15)
Session 8
15:15 S8-1i X.C. Ma
15:45 S8-2i Y. Hasegawa
16:15 S8-3 M. Iavarone
16:30 S8-4 T.-H. Kim
16:45 S8-5 H. Oka
Break (17:00-18:00)
Banquet (18:00-21:00)
Breakfast (07:00-08:30)
Session 9
08:30 S9-1s F. Rosei
09:10 S9-2 B. Uder
09:25 S9-3 T. Igarashi
09:40 S9-4 C.K. YEOH
09:55 S9-5 F. Iwata
Coffee break (10:10-10:30)
Session 10
10:30 S10-1i T. Takahashi
11:00 S10-2i M. Tabe
11:30 S10-3 N. Kobayashi
11:45 S10-4 A. Masago
Closing remark (12:00-12:05)

Dec 09 Thu

Registration (12:00-14:00)

Wellcome address (H. Shigekawa and M. Yoshimura) (14:00-14:05)

Session 1 : (T. Okajima)

14:05 S1-1 (S-INVITE)  
Opposing activities of hydrostatic pressure and the actomyosin cortex drive mitotic cell rounding
M.P. Stewart1,2, J. Helenius1, Y. Toyoda3, S.P. Ramanathan1, D.J. Müller1 and A.A. Hyman3 (1ETH Zürich, Dept. of Biosystems Science and Engineering, Switzerland, 2Biotechnology Center, Univ. of Technology, Germany, 3Max-Planck-Inst. of Molecular Cell Biology and Genetics, Germany)
14:45 S1-2 (INVITE)  
Cellular Manipulation using Specially Fabricated AFM Probes
A. Ikai, S.-i. Machida, T. Nakayama and R. Afrin (Tokyo Inst. of Technology)
15:15 S1-3  
Real Time Observation of Kcsa Channel Gating with Mechanical Stimulus by AFM
M. Kitta1, M. Hirano2, T. Yanagida2, H. Tanaka1,3, T. Ide2 and T. Kawai1 (1ISIR Osaka Univ., 2NCMSLS GSFB Osaka Univ., 3PRESTO JST)

Coffee break (15:30-15:50)

Session 2 : (F. Rosei)

15:50 S2-1 (INVITE)  
Single-molecule Chemistry through the Inelastic Electron Tunneling Process
Y. Kim (RIKEN ASI)
16:20 S2-2  
Viewing the Interior of a Single Molecule: Photon Imaging at Sub-Molecular Resolution
C. Chen1,2, C.A. Bobisch1,3 and W. Ho1 (1Univ. of California-Irvine, 2RIKEN, 3Univ. of Duisburg-Essen)
16:35 S2-3  
Manipulation of Spin 1/2 Kondo State in Double Decker Phthalocyanine Molecule
T. Komeda1, H. Isshiki1,2, J. Liu1,2, K. Katoh2, Y. Yoshida2, M. Yamashita2, H. Miyasaka2 and B.K. Breedlove2 (1IMRAM,Tohoku Univ., 2Dep. Chemistry, Tohoku Univ.)
16:50 S2-4 (INVITE)  
Magneto-Electric Coupling of Metallic Surfaces: Electrical Control of Spin States in Iron Nano-Clusters
T.K. Yamada (Chiba Univ.)

Session 3 : Exhibitor's presentation (O. Takeuchi)

17:20 S3-1  OLYMPUS CORPORATION
Recommended Cantilevers
17:25 S3-2  Park Systems Japan Inc.
The Most Recent New Application for MEMS, Material and Biological Science by New Generation AFM
17:30 S3-3  UNISOKU Co.,Ltd.
UHV LT Multi-Probe SPM system
17:35 S3-4  JEOL Ltd.
JEOL Scanning Probe Microscope and New Related Techniques
17:40 S3-5  Tec Corporation
SPECS Surface Nano Analysis GmbH & SPECS Zurich GmbH
17:45 S3-6  Omicron NanoTechnology Japan Inc.
New SPM Controller MATRIX
17:50 S3-7  Quantum Design Japan Inc.
Products Introduction of NT-MDT, Russia
17:55 S3-8  TOMOE Engineering Co., Ltd.
Tomoe's products for SPM
18:00 S3-9  SHIMADZU CORPORATION
A New SPM Equipment and its related technique.
18:05 S3-10  CREATEC FISCHER & Co, GmbH, Japan Business Contact Group Inc.
Atomic/Molecular Manipulation (Low Temperature Scanning Tunneling Microscope)
18:10 S3-11  TOYO Corporation
Latest information of image analysis software SPIP and NanoWorld SPM probes

Break (18:15-18:30)

Dinner (18:30-19:30)

Session 4 : Poster session (19:30-21:30) (K. Kobayashi)

Dec 10 Fri

Breakfast (07:00-08:30)

Session 5 : (H. Tokumoto)

08:30 S5-1 (S-INVITE)  
Electrical Characterization of Soft Matter using Scanning Probe Microscopy
A. Domanski1, M. Retschke1, E. Sengupta1, S.A. Weber1, N. Haberkorn2, M. Zorn2, M.N. Tahir2, W. Tremel2, P. Theato2, R. Zentel2, H.-J. Butt1 and R. Berger1 (1Max Planck Inst. for Polymer Research, Germany, 2Univ. of Mainz, Germany)
09:10 S5-2  
High spring constant cantilever for small amplitude dynamic force microscopy using an optical interferometer
K.-i. Morita, Y. Sugimoto, Y. Sasagawa, M. Abe and S. Morita (Osaka Univ.)
09:25 S5-3  
Simultaneous AFM and STM Measurements at Room Temperature
Y. Sugimoto, Y. Nakajima, D. Sawada, K. Morita, M. Abe and S. Morita (Osaka Univ.)
09:40 S5-4  
Measurement of tip-sample interaction forces in FM-AFM under infrared irradiation using free electron laser
Y. Hosokawa1, H.-G. von  Ribbeck2, R. Jacob2, M.T. Wenzel2, L. Eng2, K. Kobayashi1, H. Yamada1 and K. Matsushige1 (1Dept. of Electronic Science and Engineering, Kyoto Univ., 2Inst. for Applied Photophysics, Technical Univ. of Dresden, Germany)
09:55 S5-5  
Measurement of Vibration of a Molecule and Nanometric Oscillator by Emission
H. Nishizawa, Y. Honda, D. Hirayama, D. Kobayashi and H. Kawakatsu (Inst. of Industrial Science, Univ. Tokyo)

Coffee break (10:10-10:30)

Session 6 : (R. Berger)

10:30 S6-1 (S-INVITE)  
Molecular Self-Assembly on Insulating Surfaces Studied by Frequency Modulation Atomic Force Microscopy
A. Kühnle (Gutenberg-Universität Mainz, Inst. of Physical Chemistry, Jakob-Welder-Weg 11, 55099 Mainz, Germany)
11:10 S6-2  
Molecular-Scale Investigations of Local Solvation Structures of Self-Assembled Molecules on Graphite Using FM-AFM
K. Suzuki1, N. Oyabu1,2, K. Kobayashi3, K. Matsushige1 and H. Yamada1 (1Dept. of Electronic Sci. & Eng., Kyoto Univ., 2JST/Adv. Meas. & Analysis, 3SACI, Kyoto Univ.)
11:25 S6-3  
Ionic Liquid/Solid Interfaces Investigated by Frequency Modulation Atomic Force Microscopy utilizing Quartz Tuning Folk Sensors
T. Ichii, M. Fujimura, K. Murase and H. Sugimura (Dept. of Materials Sci. and Eng., Kyoto Univ.)

Conference Photo (11:40-11:55)

Get together at the pool-side with your best smile!

Lunch (11:55-13:00)

Session 7 : (X.C. Ma)

13:00 S7-1 (S-INVITE)  
Visualizing the novel surface states of topological insulators
J. Seo1, P. Roushan1, H. Beidenkopf1, Y.S. Hor2, R. Cava2 and A. Yazdani1 (1Dept. of Physics, Princeton Univ., 2Dept. of Chemistry, Princeton Univ.)
13:40 S7-2 (INVITE)  
Microprobe Investigations of Nanographene and its Derivatives
T. Enoki (Tokyo Inst. of Technology)
14:10 S7-3  
Moiré Superstructures of Graphene on Facetted Nickel Islands
Y. Murata1, V. Petrova2, B.B. Kappes3, A. Ebnonnasir3, I. Petrov2, Y.-H. Xie1, C.V. Ciobanu3 and S. Kodambaka1 (1Univ. of California Los Angeles, 2Univ. of Illinois, 3Colorado School of Mines)
14:25 S7-4  
Structural Analysis of Si-based Nanodot Arrays Self-organized by Selective Etching of SiGe/Si Films
M. Takahashi1, Y. Nakamura1, J. Kikkawa1, O. Nakatsuka2, S. Zaima2 and A. Sakai1 (1Osaka Univ., 2Nagoya Univ.)
14:40 S7-5  
Recognition of Current Route in Multi-channel CNT-FET by MFM
S. Tanabe1, M. Ato1, Y. Okigawa3, T. Mizutani3 and T. Takahashi1,2 (1IIS, The Univ. of Tokyo, 2INQIE, The Univ. of Tokyo, 3Dept. of Quantum Eng., Nagoya Univ.)

Coffee break (14:55-15:15)

Session 8 : (J. Seo)

15:15 S8-1 (INVITE)  
Low-Temperature STM/STS Study on Superconducting FeSe Films
X.C. Ma (Inst. of Physics of CAS)
15:45 S8-2 (INVITE)  
Excitation of vortices in nano-size superconductors studied by low-temperature STM/S
Y. Hasegawa1, T. Nishio2, T. An3 and T. Eguchi4 (1ISSP, Univ. Tokyo, 2RIKEN, 3IMR, Tohoku Univ., 4JST/Keio Univ.)
16:15 S8-3  
Visualizing static and dynamics of vortices in S/F hybrid structures
M. Iavarone1,2,3, G. Karapetrov3,4, A. Scarfato1, F. Bobba1, M. Longobardi1, F. Giubileo1, V. Novosad3, V.G. Yefremenko3 and A.M. Cucolo1 (1Physics Dept., Univ. of Salerno, Italy, 2Physics Dept., Temple Univ., USA, 3Materials Science Division, Argonne Natl. Laboratory, USA, 4Inst. for Electrical Engineering, Slovakia)
16:30 S8-4  
Structural dependence of grain boundary resistivity in copper nanowires
T.-H. Kim1, X.-G. Zhang1, D.M. Nicholson1, B.M. Evans1, N.S. Kulkarni2, B. Radhakrishnan1, E.A. Kenik1 and A.P. Li1 (1ORNL, 2Univ. of Tennessee)
16:45 S8-5  
Spin-Dependent Quantum Interference within a Single Co Island
H. Oka, P.A. Ignatiev, S. Wedekind, G. Rodary, L. Niebergall, V.S. Stepanyuk, D. Sander and J. Kirschner (Max Planck Inst. Halle)

Break (17:00-18:00)

Banquet (18:00-21:00)

Dec 11 Sat

Breakfast (07:00-08:30)

Session 9 : (A. Kühnle)

08:30 S9-1 (S-INVITE)  
Exploring Molecular Assembly at Surfaces: from supramolecular systems to robust surface confined polymers
F. Rosei (Univ. du Quebec)
09:10 S9-2  
High Precision local electrical Probing: Potential and Limitations for the Analysis of Nanocontacts and Nanointerconnects
B. Uder1, M. Maier1, D. Jie2, N. Chandarsekhar2, C. Joachim3, B. Guenther1 and A. Feltz1 (1Omicron NanoTechnology GmbH, Germany, 2Inst. of Materials Research and Engineering (IMRE),Singapore, 3Nanosciences group, CEMES-CNRS, France)
09:25 S9-3  
Development of novel Nanorheology mapping by atomic force microscope
T. Igarashi1,2,3, K. Nakajima2, S. Fujinami2, Y. Yamamoto2,3 and T. Nishi2 (1Bridgestone Co., 2WPI Advanced Inst. for Materials Research, Tohoku Univ., 3Dept. of Chemistry, Grad. Sch. of Science, Tohoku Univ.)
09:40 S9-4  
Preliminary Results Obtained with a UHV TEM AFM on Si and KBr Filiform Neck Formation
C.K. YEOH, Y. OBATA and H. KAWAKATSU (IIS - Univ. of Tokyo)
09:55 S9-5  
Interactive Nanomanipulation under Real Time Observation by High Speed Imaging
Y. Ohashi1, T. Ushiki2 and F. Iwata1 (1Shizuoka Univ., 2Niigata Univ.)

Coffee break (10:10-10:30)

Session 10 : (H. Onishi)

10:30 S10-1 (INVITE)  
SPM Characterization of Solar Cell Materials
T. Takahashi (The Univ. of Tokyo)
11:00 S10-2 (INVITE)  
Observation of individual dopants in Si channel by Low-Temeperature KFM
M. Tabe1, M. Anwar1, Y. Kawai1, R. Nowak1,2, D. Moraru1, R. Jablonski2 and T. Mizuno1 (1Research Inst. of Electronics, Shizuoka Univ., 2Faculty of Mechatronics, Warsaw Univ. of Technology, Poland)
11:30 S10-3  
Nanoscale Potential Measurements in Liquid by Open-Loop Electric Potential Microscopy
N. Kobayashi1, H. Asakawa2 and T. Fukuma1,2 (1Frontier Science Organization, Kanazawa Univ., 2Bio-AFM Frontier Reseach Center, Kanazawa Univ.)
11:45 S10-4  
Method for Simulating Kelvin Probe Force Microscopy on a Nano-meter Scale and Its Application
A. Masago1, M. Shimizu2 and M. Tsukada1 (1WPI-AIMR, Tohoku Univ., 2AAS)

Closing remark (K. Kobayashi) (12:00-12:05)

Session 4 : Poster Session

Dec 9 Thu 19:30-21:30

S4-1  
Influence of Sample Slope on AFM Mechanical Property Measurement
T. Nawa1,2, M. Niwa1, S. Fujinami3, K. Nakajima3, T. Nishi3 and Y. Yamamoto2,3 (1Hoyu Co.,Ltd., 2Grad. Sch. of Chemistry, Tohoku Univ., 3WPI-AIMR, Tohoku Univ.)
S4-2  
Simultaneous Force and Current Mapping of the Si(111)-(7×7) Surface by Dynamic Force Microscopy
K. Ueda, D. Sawada, Y. Sugimoto, M. Abe and S. Morita (Grad. Sch. of Engineering, Osaka Univ.)
S4-3  
Force Spectroscopy on Hydrogen Adsorbed Si(111)-(7×7) Surface Using Dynamic Force Microscopy
M. Fukumoto, H. Tanaka, Y. Sugimoto, M. Abe and S. Morita (Grad. Sch. of Engineering, Osaka Univ.)
S4-4  
Development of Frequency Modulation AFM in Ionic Liquids using Quartz Tuning Fork Sensors
M. Fujimura, T. Ichii, K. Murase and H. Sugimura (Dept. of Materials Science and Engineering, Kyoto Univ.)
S4-5  
Monitoring System of Micro Current Measurements during Conducting Atomic Force Microscopy and Electric Potential with Cyclic-contact Atomic Force Microscopy
T. Oohira and A. Ando (AIST)
S4-6  
Fabricating nanoscale reference materials for AFM
H. Itoh, C.M. Wang and H. Takagi (AIST)
S4-7  
The effective probe shape in amplitude modulation AFM and frequency modulation AFM
C.M. Wang and H. Itoh (AIST (AIST))
S4-8  
High resolution imaging of plasmid DNA under liquid in dynamic mode AFM using a carbon nanofiber cantilever
M. Kitazawa1, S. Ito1, A. Yagi1, N. Sakai1, Y. Uekusa1, R. Ota1, K. Inaba2, A. Hayashi2, Y. Hayashi2 and M. Tanemura2 (1Olympus Co. Ltd., 2NIT Univ.)
S4-9  
Peptide Nanotubes Observed by Frequency-Modulation Atomic Force Microscopy
T. Sugihara1, I. Hayashi1, T. Hiasa1, K. Kimura1, A. Tamura1, H. Onishi1, M. Ohata2, K. Watanabe2, R. Kokawa1,2,3, N. Oyabu3,4, K. Kobayashi5 and H. Yamada4 (1Dept. of Chem., Kobe Univ., 2Shimadzu Corp., 3Adv. Meas. and Analysis, JST, 4Dept. of Electro. Sci. and Eng., Kyoto Univ., 5Innovative Collaboration Center, Kyoto Univ.)
S4-10  
Force Field Spectroscopy on Oxidized Cu(110) Surface with Atomic Force Microscopy
Y. Kinoshita, Y. Naitoh, Y.J. Li and Y. Sugawara (Dept.Appl.Phys.,Osaka Univ.)
S4-11  
Development of Separate-type High-Speed Scanner for SPM
K. Miyata1, S. Yamada1, H. Asakawa1 and T. Fukuma1,2 (1Kanazawa Univ., 2PRESTO JST)
S4-12  
Simultaneous Measurement of Tunneling Current and Force Using Low Temperature Noncontact AFM/STM
Z.M. Ma, Y. Naitoh, Y.J. Li and Y. Sugawara (Dept. of Applied Physics,Grad. Sch. of Engineering,Osaka Univ.)
S4-13  
Time and Space Dependent Studies in Cell Rheology by Atomic Force Microscopy
P.G. Cai, Y. Mizutani, A. Miyaoka, M. Tsuchiya, K. Kawahara and T. Okajima (Hokkaido Univ.)
S4-14  
High Efficiency Laser Photothermal Excitation of Microcantilever Vibrations in Air and Liquids
D. Kiracofe1, K. Kobayashi2, A. Labuda3, A. Raman1 and H. Yamada2 (1Dept. of Mechanical Engineering, Purdue Univ., West Lafayette, Indiana, USA, 2Dept. of Electronic Science and Engineering, Kyoto Univ., Kyoto, Japan, 3Dept. of Physics, McGill Univ., Montreal, Quebec, Canada)
S4-15  
Performance of Optimal Cantilever Dimensions for Dynamic mode AFM in Liquid
K. Onishi1, H. Asakawa1 and T. Fukuma1,2 (1Kanazawa Univ., 2PRESTO, JST)
S4-16  
Development of Nanometer-scale Deposition Technique Using a Nanopipette Probe in Liquid Condition
S. Ito1, K. Yamazaki2 and F. Iwata1,2 (1Grad. Sch. of Science and Technology, Shizuoka Univ., 2Faculty of Engineering, Shizuoka Univ.)
S4-17  
Measurements of Surface Properties of Block Copolymers with Atomic Force Microscopy
D. Wang, S. Fujinami, H. Liu, K. Nakajima and T. Nishi (WPI-AIMR, Tohoku Univ.)
S4-18  
High Resolution Imaging in Liquid Using an Improved Frequency Modulation Atomic Force Microscope
K. Suzuki1, S. Kitamura1, S. Tanaka2, K. Kobayashi3 and H. Yamada4 (1JEOL Ltd., 2NICT, 3IIC, Kyoto Univ., 4Dept. of Electronic Sci. & Eng, Kyoto Univ.)
S4-19  
Development of TEM-AFM and Observation
Y. Obata, C. Yeoh and H. Kawakatsu (Inst. of Industrial Science, The Univ. of Tokyo)
S4-20  
Temperature Dependence of a Gap-type Copper Sulfide Atomic Switch
A. Nayak, K. Terabe, T. Hasegawa and M. Aono (WPI center for Materials Nanoarchitechtonics (MANA), Natl. Inst. for Materials Science)
S4-21  
Visualization of two different forms of DNA by STM
T. Yokoya, H. Usui, H. Sakamoto and K. Mizoguchi (TMU)
S4-22  
Rupture Forces of AMP-Aptamer binding by Atomic Force Spectroscopy
T.H. Nguyen1,2, L. Steinbock1, H.-J. Butt1, M. Helm2 and R. Berger1 (1Max Planck Inst. for Polymer Research Mainz, 2Johannes Gutenberg Univ. Mainz)
S4-23  
Visualization of Domain Dynamics in Lipid Raft Model Membranes
A. Tanaka, Y. Shinozaki, K. Sumitomo and K. Torimitsu (NTT Basic Research Laboratories)
S4-24  
High-Resolution Imaging and Hydration Structure Measurement of DNA Tile in Liquids by FM-AFM
S. Ido1, N. Oyabu1,2, K. Kobayashi2,3, K. Matsushige1 and H. Yamada1,2 (1Dept. of Electronic Sci. & Eng., Kyoto Univ., 2JST/Adv. Meas. & Analysis, 3SACI, Kyoto Univ.)
S4-25  
Nanoparticle Gold Distribution on the TiO2 Surface
L.L. Kou, Y. Naitoh, Y.J. Li and Y. Sugawara (Osaka Univ.)
S4-26  
The Measurement of local Properties of the Cell Using Fabricated AFM Cantilever
S. Machida1,2, T.W. Nakayama1, I. Harada1, R. Afrin1, T. Nakayama2,3 and A. Ikai1 (1Tokyo Tech, 2MANA NIMS, 3Univ. of Tsukuba)
S4-27  
Rheology of Single Cells under Serum Starvation Measured by Atomic Force Microscopy
A. Miyaoka, Y. Mizutani, M. Tsuchiya, K. Kawahara and T. Okajima (Hokkaido Univ.)
S4-28  
Thickness and boundary identification of epitaxial graphene by scanning tunneling microscopy and resonant spectroscopy
Y.J. Chan, S.Y. Wu, T.H. Wu and C.C. Kuo (Dept. of Physics, Natl. Sun Yat-sen Univ.)
S4-29  
Performance of Co-incorporated Carbon Nanofiber Probes in Magnetic Force Microscopy
K. Inaba1, K. Saida1, A. Hayashi1, Y. Hayashi1, M. Tanemura1, M. Kitazawa2 and R. Ota2 (1Nagoya Inst. of Technology, 2Olympus Co. Ltd.)
S4-30  
Remote Formation of Defects in Single-Walled Carbon Nanotubes Induced by STM Probing
Y. Mera, H. Sato and K. Maeda (The Univ. of Tokyo)
S4-31  
Fabrication of Carbon Nanotubes for High Performance Scanning Probe Microscopy
M. Yoshimura, I.T. Clark and G. Rius (Toyota Tech. Inst.)
S4-32  
Disappearance of Lowest-Order Transmission Resonance in the Ag Film of Critical Thickness
S.M. Lu1,2, H.S. Huang2,3, W.B. Su1,2, Y.R. Peng2, C.L. Lin2, C.S. Chang2 and T.T. Tsong2 (1Tunghai Univ. Taiwan, 2Academia Sinica Taiwan, 3Taiwan Univ.)
S4-33  
Molecular Charge Analysis in α-(ET)2I3 with STM
E. Mori1, H. Sakamoto1, K. Mizoguchi1 and T. Naito2 (1TMU, 2Hokkaido Univ.)
S4-34  
Electron Transmission through Steps of Bi2Se3 and Bi2Te3 Surfaces
K. Kobayashi (Ochanomizu Univ.)
S4-35  
Kelvin Probe Force Microscopy of Interfaces in Pentacene TFTs
S. Kubota1, Y. Inoue1, Y. Iwadate1, T. Ushiyama1, S. Heike2 and T. Hasizume1,2 (1Dept. of Physics, Tokyo Inst. of Technology., 2Advanced Research Laboratory, Hitachi, Ltd.)
S4-36  
Influence of surface states on tunneling spectra of n-type GaAs(110)
N. Ishida1, K. Sueoka2, D. Fujita1 and R.M. Feenstra3 (1NIMS, 2Hokkaido Univ., 3Carnegie Mellon Univ.)
S4-37  
Probing the intrinsic defects on nonpolar (1-100) surface of free-standing GaN by cross-sectional STM
S.Y. Wu1, C.C. Kuo1, K.M. Chen2 and W.I. Lee2 (1Dept. of Physics, Natl. Sun Yat-sen Univ., 2Dept. of Electrophysics, Natl. Chiao Tung Univ.)
S4-38  
High teperature scanning tunneling spectroscopy study on the metallic surface state of the Ge(001) surface
Y.C. Ong and K. Fukutani (Inst. of Industrial Science)
S4-39  
Atomic switch operation using RbAg4I5
I. Sapezanskaia1, A. Nayak2, I. Valov1, T. Hasegawa2, R. Waser1 and M. Aono2 (1RWTH-Aachen Univ., 2Natl. Inst. for Materials Science)
S4-40  
Time Resolved Scanning Tunneling Microscopy; Principles of Measurement
K. Narita, Y. Terada, S. Yoshida, M. Yokota, W. Omuro, O. Takeuchi and H. Shigekawa (Inst. of Applied Physics, Univ. of Tsukuba)
S4-41  
Time Resolved Scanning Tunneling Microscopy : Instruments
W. Omuro, Y. Terada, S. Yoshida, M. Yokota, K. Narita, O. Takeuchi and H. Shigekawa (Inst. of Applied Physics, Tsukuba Univ.)
S4-42  
Time Resolved Scanning Tunneling Microscopy : Results
M. Yokota, Y. Terada, S. Yoshida, K. Narita, W. Omuro, O. Takeuchi and H. Shigekawa (Inst. of Applied Physics, Univ. of Tsukuba)
S4-43  
Electronic Modification of C60 Monolayers via Metal Substrates
Y. Yamada1, S. Yamada1, M. Sasaki1 and T. Tsuru2 (1Tsukuba Univ., 2JAEA)
S4-44  
Interaction Between p- and n-type Organic Semiconductors
T. Nakayama, Y. Yamada and M. Sasaki (Tsukuba Univ.)
S4-45  
Organic Monolayers on the Si(110)-16×2 Single Domain Surface
Y. Yokoyama1,2, Y. Yamada1, H. Asaoka2 and M. Sasaki1 (1Tsukuba Univ., 2JAEA)
S4-46  
First-principles Study of Hydrogenated Si(110) Surface: Atomic Hydrogen Induced 2 x 3 Structure
M. Yoshimura1, S. Hara2 and A. Visikovskiy1 (1Toyota Tech. Inst., 2Tokyo Univ. Sci.)
S4-47  
Photothermal and Potential Properties around Grain Boundary in Multicrystalline Si Solar Cell Studied by AFM
K. Hara1 and T. Takahashi1,2 (1IIS, Univ. of Tokyo, 2INQIE, Univ. of Tokyo)
S4-48  
The Effect of Thin CuI Films on the Morphology of Cu Whiskers
S. Jo1 and K. Kishi2 (1Aichi Gakuin Univ., 2Tokyo Univ. of Sci.)
S4-49  
STM Study of the Redox Behavior on CeO2 (111) Surface with Hydrogen
Y. Sainoo, S.M.F. Shahed and T. Komeda (IMRAM, Tohoku Univ.)
S4-50  
Anisotropic Photoabsorption in InAs Wire Structures Studied by STM under Light Illumination
S. Katsui1 and T. Takahashi1,2 (1IIS, Univ. of Tokyo, 2INQIE, Univ. of Tokyo)
S4-51  
Cantilever Assisted Interference Microscopy using Laser Confocal Microscope Combined with Scanning Probe Microscope
S. Yanagiya, S. Chihara and N. Goto (Univ. Tokushima)
S4-52  
Metallic Tip Enhancement of DUV Resonance Raman Scattering using Aluminum Probe
A. Taguchi1, N. Hayazawa1 and S. Kawata1,2 (1Riken, 2Osaka Univ.)
S4-53  
Vibrational Excitation of a Single Molecule Studied by Scanning Tunneling Microscope Light Emission Spectroscopy
S. Katano and Y. Uehara (RIEC Tohoku Univ.)
S4-54  
Development of Novel System Combining STM-cathodoluminescence and STM-electroluminescence Nanospectroscopies
K. Watanabe1, Y. Nakamura2, S. Kuboya3, R. Katayama3, K. Onabe3 and M. Ichikawa4 (1NIMS, 2Osaka Univ., 3Univ. of Tokyo, 4Univ. of Tokyo)
S4-55  
Development of Ion-Separated Local Concentration Probe with Nano-Pipettes
T. TAKAMI, J.W. SON, J.-K. LEE, B.H. PARK and T. KAWAI (Konkuk Univ.)
S4-56  
A Model for Chemical Processes on Oxide Island Surfaces formed by Local Anodic Oxidation
M. Nakamura, Y. Kashiwase and T. Ogino (Grad. Sch. of Engineering, Yokohama Natl. Univ.)
S4-57  
Ripple-free Surface of Graphene Sheets on Alkanethiolate Self-Assembled Monolayers : Scanning Tunneling Microscopy Studies
N.-S. Lee1, N. Lim2, Y. Majima1,3 and G. Cho1 (1Printed Electronics of WCU, Sunchon Natl. Univ., 2Printed Electronics Research Inst., PARU Co., 3Materials and Structures Lab. Tokyo Inst. of Tech.)
S4-58  
Growth of Epitaxial Ni-Al Alloys on Ni(111) Investigated by Low-Energy Electron Diffraction and Scanning Tunneling Microscopy
B. An, L. Zhang, T. Iijima and K. Yokogawa (AIST)
S4-59  
Temperature Dependence of Hydrogen Induced Cracking in SUS304 Austenitic Steel Investigated by Scanning Probe Microscopy
L. Zhang, B. An, T. Iijima and K. Yokogawa (AIST)
S4-60  
Evaluation of Photoinduced Microcrystalline Formation on a Photochromic Diarylethene Film using Atomic Force Microscope
S.-i. Yamamoto, A. Uyama and K. Uchida (Ryukoku Univ.)
S4-61  
In Situ Observation of Surface Reconstruction of Si(100) with Stress and Strain
H.X. Guo and D. Fujita (Natl Inst Mat Sci, Adv Nano Characterizat Ctr & Int Ctr Mat Nanoarchitecton)
S4-62  
Dynamic Evaluation of Supermolecular, Ferritin, Using High-Speed AFM
S.-I. Yamamoto1, T. Okada2, Y. Uraoka3 and I. Yamashita4 (1Ryukoku Univ., 2RIBM, 3NAIST, 4Panasonic)
S4-63  
Magnetic Properties of Fe/Fe Oxide Core-Shell Clusters Formed on GaN(0001)
T. Furuya, M. Sotani, H. Ichihara, S. Hasegawa and H. Asahi (ISIR, Osaka Univ)
S4-64  
Towards Measurement of Vibration of Nanocantilevers - Imaging the Vibration of Alkanethiols as Bottom-up Fabricated Oscillators -
Y. Honda, H. Nishizawa, F. Piette, D. Hirayama, D. Kobayashi and H. Kawakatsu (Tokyo Univ.)
S4-65  
Study of GaSb quantum dot on Si(111) surface by scanning tunneling microscopy
K. Fuse, K. Yagishita, R. Machida, S. Hara, K. Irokawa, H. Miki and H.I. Fujishiro (Tokyo Univ. of Science)
S4-66  
Chiral-selective growth of amino acid molecules self assembled on Cu(111) studied by STM
M. Nishimura, K. Kanazawa, A. Taninaka, S. Yoshida, O. Takeuchi and H. Shigekawa (Inst. of Applied Physics, Univ. of Tsukuba)
S4-67  
Ultra-Flat Flims of Pb on the Si(111) Surface
M. Matsumoto, K. Fukutani and T. Okano (Inst. of Industrial Science, the Univ. of Tokyo)
S4-68  
FM-AFM study of Polyethylene-Adsorbed Graphite Immersed in Water
M. Yamazaki1,2, R. Kokawa1,2, M. Ohta1,2, K. Watanabe1,2, T. Hiasa3, K. Kimura1,3, H. Onishi1,3, N. Oyabu1,4, K. Kobayashi1,5 and H. Yamada1,4 (1JST, 2Shimadzu Corp., 3Kobe Univ., 4Kyoto Univ., 5ICC,Kyoto Univ.)
S4-69  
Nanomechanical Mapping On Deformed Semicrystalline Polymers
H. Liu, D. Wang, S. Fujinami, K. Nakajima and T. Nishi (WPI Advanced Inst. for Materials Research, Tohoku Univ.)
S4-70  
Method to Derive Viscoelasticity and Adhesion Separately from Force Measurement 2
S. Fujinami, H. Liu, D. Wang, K. Nakajima and T. Nishi (WPI Advanced Inst. for Materials Research, Tohoku Univ.)
S4-71  
Conductance measurement of single molecular junction with Si electrode using STM
M. Nakamura1, S. Yoshida1, T. Nakamura2, O. Takeuchi1 and H. Shigekawa1 (1Inst. of Applied Physics,Univ. of Tsukuba, Tsukuba, Ibaraki,305-8573,Japan,, 2NRI, AIST, Tsukuba Ibaraki 305-8565, Japan)
S4-72  
Reconsideration of Site-selective Dynamic Force Spectroscopy Analysis of Streptavidin-Biotin Interactions
A. Taninaka, Y. Hirano, O. Takeuchi and H. Shigekawa (Inst. of Appl. Phys, Univ. of Tsukuba)
S4-73  
In situ detection of the spin Hall effect in ultrathin bismuth films
T. Tono, T. Hirahara and S. Hasegawa (Dept. of Physics, Univ. of Tokyo)
S4-74  
AFM Imaging on Double Stranded Structures of Algorithmically Assembled DNA Tiles in Liquid
S. Tanaka1, M. Tagawa2,5, K. Suzuki3, S. Kitamura3 and A. Suyama4 (1Natl. Inst. of Information and Communications Technology, 2Center for Functional Nanomaterials, Brookhaven Natl. Laboratory, 3JEOL Ltd., Japan., 4Dept. of Life Sciences and Inst. of Physics, Grad. Sch. of Arts and Sciences, The Univ. of Tokyo, 5JST PRESTO)

Author index

*Boldface represents the presenters.

Abe, M. S4-3 : Kitazawa, M. S4-8 : Sakamoto, H. S4-21
Abe, M. S5-2 : Kitazawa, M. S4-29 : Sakamoto, H. S4-33
Abe, M. S5-3 : Kitta, M. S1-3 : Sander, D. S8-5
Afrin, R. S1-2 : Kobayashi, D. S4-64 : Sapezanskaia, I. S4-39
Afrin, R. S4-26 : Kobayashi, D. S5-5 : Sasagawa, Y. S5-2
An, B. S4-58 : Kobayashi, K. S4-9 : Sasaki, M. S4-43
An, B. S4-59 : Kobayashi, K. S4-14 : Sasaki, M. S4-44
An, T. S8-2 : Kobayashi, K. S4-18 : Sasaki, M. S4-45
Ando, A. S4-5 : Kobayashi, K. S4-24 : Sato, H. S4-30
Anwar, M. S10-2 : Kobayashi, K. S4-34 : Sawada, D. S4-2
Aono, M. S4-20 : Kobayashi, K. S4-68 : Sawada, D. S5-3
Aono, M. S4-39 : Kobayashi, K. S5-4 : Scarfato, A. S8-3
Asahi, H. S4-63 : Kobayashi, K. S6-2 : Sengupta, E. S5-1
Asakawa, H. S4-11 : Kobayashi, N. S10-3 : Seo, J. S7-1
Asakawa, H. S4-15 : Kodambaka, S. S7-3 : Shahed, S.M.F. S4-49
Asakawa, H. S10-3 : Kokawa, R. S4-9 : Shigekawa, H. S4-40
Asaoka, H. S4-45 : Kokawa, R. S4-68 : Shigekawa, H. S4-41
Ato, M. S7-5 : Komeda, T. S2-3 : Shigekawa, H. S4-42
Beidenkopf, H. S7-1 : Komeda, T. S4-49 : Shigekawa, H. S4-66
Berger, R. S4-22 : Kou, L.L. S4-25 : Shigekawa, H. S4-71
Berger, R. S5-1 : Kubota, S. S4-35 : Shigekawa, H. S4-72
Bobba, F. S8-3 : Kuboya, S. S4-54 : Shimizu, M. S10-4
Bobisch, C.A. S2-2 : Kulkarni, N.S. S8-4 : Shinozaki, Y. S4-23
Breedlove, B.K. S2-3 : Kuo, C.C. S4-28 : Son, J.W. S4-55
Butt, H.-J. S4-22 : Kuo, C.C. S4-37 : Sotani, M. S4-63
Butt, H.-J. S5-1 : Labuda, A. S4-14 : Steinbock, L. S4-22
Cai, P.G. S4-13 : Lee, J.-K. S4-55 : Stepanyuk, V.S. S8-5
Cava, R. S7-1 : Lee, N.-S. S4-57 : Stewart, M.P. S1-1
Chan, Y.J. S4-28 : Lee, W.I. S4-37 : Su, W.B. S4-32
Chandarsekhar, N. S9-2 : Li, A.P. S8-4 : Sueoka, K. S4-36
Chang, C.S. S4-32 : Li, Y.J. S4-10 : Sugawara, Y. S4-10
Chen, C. S2-2 : Li, Y.J. S4-12 : Sugawara, Y. S4-12
Chen, K.M. S4-37 : Li, Y.J. S4-25 : Sugawara, Y. S4-25
Chihara, S. S4-51 : Lim, N. S4-57 : Sugihara, T. S4-9
Cho, G. S4-57 : Lin, C.L. S4-32 : Sugimoto, Y. S4-2
Ciobanu, C.V. S7-3 : Liu, H. S4-17 : Sugimoto, Y. S4-3
Clark, I.T. S4-31 : Liu, H. S4-69 : Sugimoto, Y. S5-2
Cucolo, A.M. S8-3 : Liu, H. S4-70 : Sugimoto, Y. S5-3
Domanski, A. S5-1 : Liu, J. S2-3 : Sugimura, H. S4-4
Ebnonnasir, A. S7-3 : Longobardi, M. S8-3 : Sugimura, H. S6-3
Eguchi, T. S8-2 : Lu, S.M. S4-32 : Sumitomo, K. S4-23
Eng, L. S5-4 : Müller, D..J. S1-1 : Suyama, A. S4-74
Enoki, T. S7-2 : Ma, X.C. S8-1 : Suzuki, K. S4-18
Evans, B.M. S8-4 : Ma, Z.M. S4-12 : Suzuki, K. S4-74
Feenstra, R.M. S4-36 : Machida, R. S4-65 : Suzuki, K. S6-2
Feltz, A. S9-2 : Machida, S. S4-26 : Tabe, M. S10-2
Fujimura, M. S4-4 : Machida, S.-i. S1-2 : Tagawa, M. S4-74
Fujimura, M. S6-3 : Maeda, K. S4-30 : Taguchi, A. S4-52
Fujinami, S. S4-1 : Maier, M. S9-2 : Tahir, M.N. S5-1
Fujinami, S. S4-17 : Majima, Y. S4-57 : Takagi, H. S4-6
Fujinami, S. S4-69 : Masago, A. S10-4 : Takahashi, M. S7-4
Fujinami, S. S4-70 : Matsumoto, M. S4-67 : Takahashi, T. S4-47
Fujinami, S. S9-3 : Matsushige, K. S4-24 : Takahashi, T. S4-50
Fujishiro, H.I. S4-65 : Matsushige, K. S5-4 : Takahashi, T. S7-5
Fujita, D. S4-36 : Matsushige, K. S6-2 : Takahashi, T. S10-1
Fujita, D. S4-61 : Mera, Y. S4-30 : Takami, T. S4-55
Fukuma, T. S4-11 : Miki, H. S4-65 : Takeuchi, O. S4-40
Fukuma, T. S4-15 : Miyaoka, A. S4-13 : Takeuchi, O. S4-41
Fukuma, T. S10-3 : Miyaoka, A. S4-27 : Takeuchi, O. S4-42
Fukumoto, M. S4-3 : Miyasaka, H. S2-3 : Takeuchi, O. S4-66
Fukutani, K. S4-38 : Miyata, K. S4-11 : Takeuchi, O. S4-71
Fukutani, K. S4-67 : Mizoguchi, K. S4-21 : Takeuchi, O. S4-72
Furuya, T. S4-63 : Mizoguchi, K. S4-33 : Tamura, A. S4-9
Fuse, K. S4-65 : Mizuno, T. S10-2 : Tanabe, S. S7-5
Giubileo, F. S8-3 : Mizutani, T. S7-5 : Tanaka, A. S4-23
Goto, N. S4-51 : Mizutani, Y. S4-13 : Tanaka, H. S1-3
Guenther, B. S9-2 : Mizutani, Y. S4-27 : Tanaka, H. S4-3
Guo, H.X. S4-61 : Moraru, D. S10-2 : Tanaka, S. S4-18
Haberkorn, N. S5-1 : Mori, E. S4-33 : Tanaka, S. S4-74
Hara, K. S4-47 : Morita, K. S5-3 : Tanemura, M. S4-8
Hara, S. S4-46 : Morita, K.-i. S5-2 : Tanemura, M. S4-29
Hara, S. S4-65 : Morita, S. S4-2 : Taninaka, A. S4-66
Harada, I. S4-26 : Morita, S. S4-3 : Taninaka, A. S4-72
Hasegawa, S. S4-63 : Morita, S. S5-2 : Terabe, K. S4-20
Hasegawa, S. S4-73 : Morita, S. S5-3 : Terada, Y. S4-40
Hasegawa, T. S4-20 : Murase, K. S4-4 : Terada, Y. S4-41
Hasegawa, T. S4-39 : Murase, K. S6-3 : Terada, Y. S4-42
Hasegawa, Y. S8-2 : Murata, Y. S7-3 : Theato, P. S5-1
Hasizume, T. S4-35 : Naito, T. S4-33 : Tono, T. S4-73
Hayashi, A. S4-8 : Naitoh, Y. S4-10 : Torimitsu, K. S4-23
Hayashi, A. S4-29 : Naitoh, Y. S4-12 : Toyoda, Y. S1-1
Hayashi, I. S4-9 : Naitoh, Y. S4-25 : Tremel, W. S5-1
Hayashi, Y. S4-8 : Nakajima, K. S4-1 : Tsong, T.T. S4-32
Hayashi, Y. S4-29 : Nakajima, K. S4-17 : Tsuchiya, M. S4-13
Hayazawa, N. S4-52 : Nakajima, K. S4-69 : Tsuchiya, M. S4-27
Heike, S. S4-35 : Nakajima, K. S4-70 : Tsukada, M. S10-4
Helenius, J. S1-1 : Nakajima, K. S9-3 : Tsuru, T. S4-43
Helm, M. S4-22 : Nakajima, Y. S5-3 : Uchida, K. S4-60
Hiasa, T. S4-9 : Nakamura, M. S4-56 : Uder, B. S9-2
Hiasa, T. S4-68 : Nakamura, M. S4-71 : Ueda, K. S4-2
Hirahara, T. S4-73 : Nakamura, T. S4-71 : Uehara, Y. S4-53
Hirano, M. S1-3 : Nakamura, Y. S4-54 : Uekusa, Y. S4-8
Hirano, Y. S4-72 : Nakamura, Y. S7-4 : Uraoka, Y. S4-62
Hirayama, D. S4-64 : Nakatsuka, O. S7-4 : Ushiki, T. S9-5
Hirayama, D. S5-5 : Nakayama, T. S1-2 : Ushiyama, T. S4-35
Ho, W. S2-2 : Nakayama, T. S4-26 : Usui, H. S4-21
Honda, Y. S4-64 : Nakayama, T. S4-44 : Uyama, A. S4-60
Honda, Y. S5-5 : Nakayama, T.W. S4-26 : Valov, I. S4-39
Hor, Y.S. S7-1 : Narita, K. S4-40 : Visikovskiy, A. S4-46
Hosokawa, Y. S5-4 : Narita, K. S4-41 : Wang, C.M. S4-6
Huang, H.S. S4-32 : Narita, K. S4-42 : Wang, C.M. S4-7
Hyman, A.A. S1-1 : Nawa, T. S4-1 : Wang, D. S4-17
Iavarone, M. S8-3 : Nayak, A. S4-20 : Wang, D. S4-69
Ichihara, H. S4-63 : Nayak, A. S4-39 : Wang, D. S4-70
Ichii, T. S4-4 : Nguyen, T.H. S4-22 : Waser, R. S4-39
Ichii, T. S6-3 : Nicholson, D.M. S8-4 : Watanabe, K. S4-9
Ichikawa, M. S4-54 : Niebergall, L. S8-5 : Watanabe, K. S4-54
Ide, T. S1-3 : Nishi, T. S4-1 : Watanabe, K. S4-68
Ido, S. S4-24 : Nishi, T. S4-17 : Weber, S.A.L. S5-1
Igarashi, T. S9-3 : Nishi, T. S4-69 : Wedekind, S. S8-5
Ignatiev, P.A. S8-5 : Nishi, T. S4-70 : Wenzel, M.T. S5-4
Iijima, T. S4-58 : Nishi, T. S9-3 : Wu, S.Y. S4-28
Iijima, T. S4-59 : Nishimura, M. S4-66 : Wu, S.Y. S4-37
Ikai, A. S1-2 : Nishio, T. S8-2 : Wu, T.H. S4-28
Ikai, A. S4-26 : Nishizawa, H. S4-64 : Xie, Y.-H. S7-3
Inaba, K. S4-8 : Nishizawa, H. S5-5 : Yagi, A. S4-8
Inaba, K. S4-29 : Niwa, M. S4-1 : Yagishita, K. S4-65
Inoue, Y. S4-35 : Novosad, V. S8-3 : Yamada, H. S4-9
Irokawa, K. S4-65 : Nowak, R. S10-2 : Yamada, H. S4-14
Ishida, N. S4-36 : Obata, Y. S4-19 : Yamada, H. S4-18
Isshiki, H. S2-3 : Obata, Y. S9-4 : Yamada, H. S4-24
Ito, S. S4-8 : Ogino, T. S4-56 : Yamada, H. S4-68
Ito, S. S4-16 : Ohashi, Y. S9-5 : Yamada, H. S5-4
Itoh, H. S4-6 : Ohata, M. S4-9 : Yamada, H. S6-2
Itoh, H. S4-7 : Ohta, M. S4-68 : Yamada, S. S4-11
Iwadate, Y. S4-35 : Oka, H. S8-5 : Yamada, S. S4-43
Iwata, F. S4-16 : Okada, T. S4-62 : Yamada, T.K. S2-4
Iwata, F. S9-5 : Okajima, T. S4-13 : Yamada, Y. S4-43
Jablonski, R. S10-2 : Okajima, T. S4-27 : Yamada, Y. S4-44
Jacob, R. S5-4 : Okano, T. S4-67 : Yamada, Y. S4-45
Jie, D. S9-2 : Okigawa, Y. S7-5 : Yamamoto, S-I. S4-62
Jo, S. S4-48 : Omuro, W. S4-40 : Yamamoto, S.-i. S4-60
Joachim, Ch. S9-2 : Omuro, W. S4-41 : Yamamoto, Y. S4-1
Kühnle, A. S6-1 : Omuro, W. S4-42 : Yamamoto, Y. S9-3
Kanazawa, K. S4-66 : Onabe, K. S4-54 : Yamashita, I. S4-62
Kappes, B.B. S7-3 : Ong, Y.C. S4-38 : Yamashita, M. S2-3
Karapetrov, G. S8-3 : Onishi, H. S4-9 : Yamazaki, K. S4-16
Kashiwase, Y. S4-56 : Onishi, H. S4-68 : Yamazaki, M. S4-68
Katano, S. S4-53 : Onishi, K. S4-15 : Yanagida, T. S1-3
Katayama, R. S4-54 : Oohira, T. S4-5 : Yanagiya, S. S4-51
Katoh, K. S2-3 : Ota, R. S4-8 : Yazdani, A. S7-1
Katsui, S. S4-50 : Ota, R. S4-29 : Yefremenko, V.G. S8-3
Kawahara, K. S4-13 : Oyabu, N. S4-9 : Yeoh, C. S4-19
Kawahara, K. S4-27 : Oyabu, N. S4-24 : Yeoh, C.K. S9-4
Kawai, T. S1-3 : Oyabu, N. S4-68 : Yokogawa, K. S4-58
Kawai, T. S4-55 : Oyabu, N. S6-2 : Yokogawa, K. S4-59
Kawai, Y. S10-2 : Park, B.H. S4-55 : Yokota, M. S4-40
Kawakatsu, H. S4-19 : Peng, Y.R. S4-32 : Yokota, M. S4-41
Kawakatsu, H. S4-64 : Petrov, I. S7-3 : Yokota, M. S4-42
Kawakatsu, H. S5-5 : Petrova, V. S7-3 : Yokoya, T. S4-21
Kawakatsu, H. S9-4 : Piette, F. S4-64 : Yokoyama, Y. S4-45
Kawata, S. S4-52 : Radhakrishnan, B. S8-4 : Yoshida, S. S4-40
Kenik, E.A. S8-4 : Raman, A. S4-14 : Yoshida, S. S4-41
Kikkawa, J. S7-4 : Ramanathan, S.P. S1-1 : Yoshida, S. S4-42
Kim, T.-H. S8-4 : Retschke, M. S5-1 : Yoshida, S. S4-66
Kim, Y. S2-1 : von Ribbeck, H.-G. S5-4 : Yoshida, S. S4-71
Kimura, K. S4-9 : Rius, G. S4-31 : Yoshida, Y. S2-3
Kimura, K. S4-68 : Rodary, G. S8-5 : Yoshimura, M. S4-31
Kinoshita, Y. S4-10 : Rosei, F. S9-1 : Yoshimura, M. S4-46
Kiracofe, D. S4-14 : Roushan, P. S7-1 : Zaima, S. S7-4
Kirschner, J. S8-5 : Saida, K. S4-29 : Zentel, R. S5-1
Kishi, K. S4-48 : Sainoo, Y. S4-49 : Zhang, L. S4-58
Kitamura, S. S4-18 : Sakai, A. S7-4 : Zhang, L. S4-59
Kitamura, S. S4-74 : Sakai, N. S4-8 : Zhang, X.-G. S8-4
Sp