19th International Colloquium
on Scanning Probe Microscopy (ICSPM19)


The 19th International Colloquium on Scanning Probe Microscopy (ICSPM19) will be held at Toyako Manseikaku, Hokkaido prefecture in Japan from December 19-21, 2011.

ICSPM has been held under the sponsorship of Japan Society of Applided Physics, and was originally a series of the conference on SPM organized in 1985 first to stimulate the SPM related science and technology which were growing in Japan. In 1993, the conference was reorganized as an international colloquium and has been held annually.

In 2000, ICSPM 8 and Asian SPM 3 were held in conjunction to make a progressive development of this field. The Asian SPM is the conference organized to encourage interactions and exchange of participants from Asian and Pacific rim countries. In 2002, in order to celebrate the 10th anniversary of the colloquium, the ICSPM 10 was successfully held in Hawaii. In 2005, ICSPM13 was held in conjunction with STM05 in Sapporo with more than 750 participants from 39 countries.

For details, follow the links below to browse the previous conference sites:

This year, in consideration of the recent development of nano-science and technology, we are planning to invite several distinguished scientists of this field to reconsider the potential of SPM works for the future. You are cordially invited to participate in the conference. Active participation of young researchers, especially students, is strongly encouraged

Scope and Topics

The conference will cover recent advances in scanning probe techniques like STM, AFM and SNOM. Fields of interest are:

  • Bio- & macromolecules and polymers
  • Semiconductor and metal surface structure
  • Adsorbates and reactions on semiconductor and metal surfaces
  • Magnetic systems
  • Nanotubes and 1-D wires
  • Catalysis & electrochemistry
  • Nano-optical phenomena
  • Interaction within and between single molecules
  • Atom and molecular manipulation
  • Nano-patterning
  • Oxides
  • Cells and biological systems
  • Theory of probe-matter interactions
  • Tip preparation and functionalisation
  • Bottom-up process
  • Molecular electronics

Contributions to the scientific program regarding all aspects and application of these techniques are welcome.


Invited and contributed talks, poster presentations and vendor exhibitions will constitute the program. You are kindly invited to submit an abstract to participate in the conference. On the basis of the submitted abstracts a selection will be made of contributions to be presented as an invited or contributed talk or as a poster. All accepted abstracts become part of an abstract book, to be distributed at the conference. Conference participants are invited to contribute a paper, which must contain new material preferably unpublished at the time of the conference. These papers will be published in the official proceedings of the conference.