ICSPM25 Program

Improvements in Fundamental Performance of Scanning Ion Conductance Microscope for Visualizing Morphological Changes in Biological Samples with Nanoscale Resolution

S. Watanabe

Bio-AFM Frontier Research Center, Institute of Science and Engineering, Kanazawa University, Japan

16:15 S2-3

Quantifying elastic modulus of soft samples with tilting angle by atomic force microscopy

Y. FujiiT. Okajima

Grad. Schl. Inform. Sci and Tech. Hokkaido Univ., Japan

Session 3 : Exhibitor's presentation (Takeuchi)

16:30 S3-1 Tomoe Engineering Co.,Ltd

16:35 S3-2 UNISOKU Co., Ltd.

16:40 S3-3 Nihon Thermal Consulting Co., Ltd.

16:45 S3-4 Tec Corporaion

16:50 S3-5 Oxford Instruments K.K.

16:55 S3-6 Bruker Nano Surfaces Division

17:00 S3-7 Scienta Omicron, Inc.

17:05 S3-8 Research Institute of Biomolecule Metrology Co., Ltd.

17:10 S3-9 OLYMPUS　CORPORATION

17:15 S3-10 Hitachi High-Technologies Corporation

Dinner break (17:20-19:30)

Session 4 : Poster Session (19:30-21:00)

Dec 08 Fri

Session 5 : (Lim, Miyake)

08:30 S5-1 (INVITED)

Using ESR–STM as a tool to build quantum dimers

Y. Bae1,2,3K. Yang2P. Willke1,2,3C. Lutz2A. Heinrich1,3

1Center for Quantum Nanoscience, Institute for Basic Science (IBS), Republic of Korea, 2IBM Almaden Research Center, USA, 3Department of Physics, Ewha Womans University, Republic of Korea

09:10 S5-2 (INVITED)

Atomic-Layer Superconductors with Molecule-based van der Waals Heterostructures and the Rashba Effect

T. Uchihashi

National Institute for Materials Science, Japan

09:40 S5-3

Competing Annulene and Radialene Structures in a Single Anti-Aromatic Molecule Studied by High-Resolution Atomic Force Microscopy

S. Kawai1K. Takahashi2S. Ito2R. Pawlak3T. Meier3P. Spijker4F. Canova4K. Nozaki2A. Foster4E. Meyer3

1National Institute for Materials Science, Japan, 2The University of Tokyo, Japan, 3University of Basel, Switzerland, 4Aalto University, Finland

09:55 S5-4

Visualization of Carrier Dynamics in Organic Thin-Film Transistors by Time-resolved Electrostatic Force Microscopy

K. InnamiK. KobayashiH. Yamada

Department of Electronic Science & Engineering, Kyoto University, Japan

Coffee Break (10:10-10:40)

Session 6 : (Ichii)

10:40 S6-1 (INVITED)

AFM Techniques for Atomic- and Subatomic-scale Imaging and Manipulation

I. Štich1Y.J. Li2Y. Sugawara2

1Slovak Academy of Sciences, Slovakia, 2Osaka University, Japan

11:20 S6-2 (INVITED)

Theory of charge and heat transport at the atomistic level

N. Kobayashi

University of Tsukuba, Japan

11:50 S6-3

Relaxation Observed in Colour AFM Imaging

H. Nishizawa1P.E. Allain1D. Damiron1H. Osawa1D. Kobayashi1N. Sasaki2H. Kawakatsu1

1IIS, University of Tokyo, Japan, 2University of Electro-Communications, Japan

Conference Photo (12:05-12:15)

Get together at poolside with your best smile!

Lunch break (12:15-13:30)

Session 7 : (Schäffer, Liang)

13:30 S7-1 (INVITED)

Single-Molecule Study of Molecular Interactions in Supramolecular Assemblies

W. ZhangY. SongX. LvP. Yang

Jilin University, China

14:10 S7-2

Probing the magnetic states of centrocymmetric magnetic materials by magnetic force microscopy

J. Kim

Pohang University of Science and Technology, Korea

14:25 S7-3

Crossover of Tip-sample Magnetic Couplings in an In-field Spin-polarized Scanning Tunneling Microscopy

S. Phark1D. Sander2

1Center for Quantum Nanoscience, Institute for Basic Science, Korea, 2Max-Planck-Institute of Microstructure Physics, Germany

14:40 S7-4

Local Characterization of Organic Solar Cells by STM

O. Takeuchi1T. Ochiai2K. Shinohara1A. Gomi1F. Ohashi1A. Taninaka1S. Yoshida1H. Shigekawa1

1Univ. of Tsukuba, Japan, 2TAKANO Co., Ltd., Japan

14:55 S7-5

Controlling the Nano-mechanical Properties of Polyethylene Oxide Single Crystal

Y. SongP. YangK. JiangW. Zhang

State Key Laboratory of Supramolecular Structure and Materials, Jilin University, China

Coffee Break (15:10-15:40)

Session 8 : (Zhang, Onishi)

15:40 S8-1

Characterization of External Potential for Field Emission Resonances and Its Applications on Nanometer-scale Measurements

S.-M. Lu1W.-Y. Chan1W.-B. Su1W.W. Pai2H.-L. Liu3C.-S. Chang1

1Institute of Physics, Academia Sinica, Taiwan, 2Center for Condensed Matter Sciences, National Taiwan University, Taiwan, 3Department of Physics, National Taiwan Normal University, Taiwan

15:55 S8-2

Local evaluation of Al₂O₃ passivation layers crystalline silicon solar cells by super-higher-order scanning nonlinear dielectric microscopy

K. Kakikawa1Y. Yamagishi1H. Takato2K. Tanahashi2Y. Cho1

1RIEC, Tohoku Univ., Japan, 2FREA, Japan

16:10 S8-3

Numerical Simulation for Optimization of Electrical Transport Property of Carbon Nanotube Transparent Films

M. TsukudaT. Yamamoto

Tokyo University of Science, Japan

16:25 S8-4

Local Carrier Distribution Imaging of Two-Dimensional Semiconductors by Scanning Nonlinear Dielectric Microscopy

K. YamasueY. Cho

Tohoku University, Japan

16:40 S8-5

Atomic-scale Characterization of the Interfacial Phonon in Graphene/SiC using Inelastic Tunneling Spectroscopy

Y. Sainoo5E. Minamitani1R. Arafune2T. Frederiksen3,4T. Suzuki5S. Shahed5T. KObayashi5N. Endo6H. Fukidome6S. Watanabe1T. Komeda5

1Tokyo University, Japan, 2NIMS, Japan, 3Donostia International Physics Center, Spain, 4IKERBASQUE, Spain, 5IMRAM, Tohoku University, Japan, 6RIEC, Tohoku University, Japan

16:55 S8-6

Scanning Kelvin Probe Microscopy Study of Electrical Properties in Chemical Vapor Deposition Synthesized MoS₂ Films and MoS₂ Field-Effect Transistors

A. AndoT. IrisawaT. ShimizuT. Kubo

National Institute of Advanced Industrial Science and Technology (AIST), Japan

17:10 S8-7

Visualization of Traps at SiO₂/SiC Interfaces near the Conduction Band by Local Deep Level Transient Spectroscopy at Low Temperatures

T. AbeY. YamagishiY. Cho

Research Institute of Electrical Communication, Japan

17:25 S8-8

Scanning tunneling microscopy study of √3×√3 germanene on Al(111) grown at nearly room temperature

S. EndoO. KuboN. NakashimaH. TabataM. Katayama

Graduate School of Engineering, Osaka University, Japan

17:40 S8-9

Pure-mechanical polishing of atomically flat surface of 4H-SiC (1-100) for nano-meter scale electric evaluation by ESPM

T. Fujita1H. Itoh2D. Fujita1

1National Institute for Materials Science, Japan, 2National Institute of Advanced Industrial Science and Technology, Japan

Break (17:55-19:00)

Banquet (19:00-21:30)

Dec 09 Sat

Session 9 : (Stich, Sugawara)

08:30 S9-1 (INVITED)

Visualization of Subsurface Nanostructures by Scanning Thermal Noise Microscopy

K. Kobayashi

Kyoto University, Japan

09:00 S9-2

Observation and analysis of thermal evanescent waves on ultra-thin Au films

A. KikuchiK.-T. LinH. NemaF. KimuraY. Kajihara

Institute of Industrial Science, The University of Tokyo, Japan

09:15 S9-3

Magnetic resonance force microscopy using tip ferromagnetic resonance excited by direct microwave transmission via a coaxial resonator

Y. Kinoshita1Y.J. Li2S. Yoshimura1H. Saito1Y. Sugawara2

1Research Center for Engineering Science, Akita University, Japan, 2Department of Applied Physics, Osaka University, Japan

09:30 S9-4

Electrical and Optical Response of Single Molecular Junction

M. KiguchiS. FujiiS. Kaneko

Tokyo Institute of Technology, Japan

09:45 S9-5

Time-resolved Electrostatic Force Microscopy by Tip-Synchronized Photo Excitation

K. Araki1Y. Ie2Y. Aso2H. Ohyama1T. Matsumoto1

1Graduate School of Science, Osaka University, Japan, 2The Institute of Scientific and Industrial Research, Osaka University, Japan

Coffee Break (10:00-10:20)

Session 10 : (Bae, Mera)

10:20 S10-1 (INVITED)

Elementary Process of Nanoscale Friction and Adhesion

N. Sasaki

The University of Electro-Communications, Japan

10:50 S10-2

Bonding and dissociation of oxygen atoms using charge manipulation on rutile TiO₂(110) surface

Y. AdachiH. WenQ. ZhangY. NaitohY. LiY. Sugawara

Osaka University, Japan

11:05 S10-3

Atom-scale structure of TiO₂(110) surface in water imaged by FM-AFM

S. XUEA. SasahraH. Onishi

Graduate School of Science, Kobe University, japan

11:20 S10-4

Alcohol-Assisted Thermal Reduction of Graphene Oxide

K.K.H. De-SilvaH.H. HuangS. SuzukiM. Yoshimura

Graduate School of Engineering, Toyota Technological Institute, Japan

11:35 S10-5

Stable film formation of π-conjugated organic molecules on 3d-magnetic substrate at room temperature

E. Inami1M. Shimasaki1H. Yorimitsu2T. K. Yamada1

1Chiba University, Japan, 2Kyoto University, Japan

Closing (11:50-12:00)

Session 4 : Poster Session

Dec 7 Thu 19:30-21:00

S4-1

Nanostructures of N- and Br- Containing Planar Organic Molecules on Au(111) from Solutions

K. Mino1S. Hasui2M. Shiota2A. Okada2M. Yoshimura3K. Kadano2

1Graduate School of Science and Technology, Kyoto Institute of Technology, Japan, 2Faculty of Materials Science and Engineering, Kyoto Institute of Technology, Japan, 3Toyota Technological Institute, Japan

S4-2

Two-dimensional mapping of graphene oxides by using tip-enhanced Raman scattering spectroscopy

T. InabaK. De silvaT. KawabataM. Yoshimura

Graduate School of Engineering, Toyota Technological Institute, Japan

S4-3

Effect of Tip Functionalisation on the Effective Morse Parameters in Colour AFM

H. Nishizawa1P.E. Allain1D. Damiron1D. Kobayashi1N. Sasaki2H. Kawakatsu1

1IIS, University of Tokyo, Japan, 2University of Electro-Communications, Japan

S4-4

Photothermal vibration excitation by an intensity modulated optical lever

H. NishizawaD. KobayashiH. Kawakatsu

Institute of Industrial Science, The University of Tokyo, Japan

S4-5

Formation Mechanism of Reduced Graphene Oxide Membrane

H.H. Huang1R. Joshi2K. De Silva1M. Yoshimura1

1Graduate School of Engineering, Toyota Technological Institute, Japan, 2School of Mat. Sci. and Eng., University of New South Wales, Australia

S4-6

Local Magnetic Responses of domain wall pinning sensors used for Scanning Magneto-Resistance Microscope

A. YokotaS. TabuchiM. FujiwaraA. SubagyoK. Sueoka

Graduate School of Information Science and Technology, Hokkaido University, Japan

S4-7

Li-ion Transport Phenomena at Grain Boundaries Measured by Atomic Force Microscopy Methods

S. Sasano1R. Ishikawa1I. Sugiyama2T. Higashi1T. Kimura3Y. H. Ikuhara3N. Shibata1,3Y. Ikuhara1,3

1University of Tokyo, Japan, 2Tokyo Institute of Technology, Japan, 3Japan Fine Ceramics Center, Japan

S4-8

Control of Electronic Property of Single DNA Molecule by Intercalation

T. HarashimaT. Nishino

Tokyo Institute of technology, Japan

S4-9

Computational Simulation and Optimization of Edge-Disordered Graphene Nanoribbon FETs

K. Takashima1T. Yamamoto1,2

1Department of Engineering, Tokyo University of Science, Japan, 2Department of Liberal Arts, Tokyo University of Science, Japan

S4-10

Visualization of depletion regions in organic thin-film transistors using scanning capacitance force microscopy(SCFM)

T. YokochoK. InnamiK. KobayashiH. Yamada

Department of Electronic Science & Engineering, Kyoto-University, Japan

S4-11

The effect of Self-Assembled Monolayer on surface potential of N719 over layer

K. KajimotoK. ArakiS. NishijimaM. YamadaY. OtsukaT. Matsumoto

Department of Chemistry, Graduate School of Science, Osaka University, Japan

S4-12

Submolecular-scale Investigations of Endohedral Metallofullerenes Using Bimodal FM-AFM and FM-KPFM at Room Temperature

T. TanakaK. KobayashiH. Yamada

Dept. of Electronic Sci. & Eng., Japan

S4-13

Electronic Structure of the Thermally Fluctuating Molecule Junctions

Y. IsshikiS. FujiiM. Kiguchi

Tokyo Institute of Technology, Kiguchi-Nishino lab, Japan

S4-14

Charge mapping method of biological samples using scanning ion conductance microscopy with a theta nanopipette

T. Shirasawa1Y. Mizutani2T. Ushiki2F. Iwata1,3

1Graduate School of Integrated Science and Technology, Shizuoka University, Japan, 2Graduate School of Medical and Dental Sciences, Niigata University, Japan, 3Research Institute of Electronics, Shizuoka University, Japan

S4-15

Mechanical properties of human corneocyte on gel sheet by atomic force microscopy

H. MatsuokaS. YnagiyaA. Furube

Tokushima University, Japan

S4-16

2D magnetic stray field mapping with force modulation magnetic force microscopy using null method

Y. Kinoshita

Research Center for Engineering Science, Akita University, Japan

S4-17

Local Characterization of a Heavy-Fermion Superconductor via sub-Kelvin Magnetic Force Microscopy

G. Kim1,2D. Wulferding1,2I. Yang1,2H. Kim1,2E.D. Bauer3F. Ronning3R. Movshovich3J. Kim1,2

1Center for Artificial Low Dimensional Electronic Systems, Institute for Basic Science, Pohang, Republic of Korea, 2Department of physics, Pohang University of Science and Technology, Pohang, Republic of Korea, 3Los Alamos National Laboratory, MPA-CMMS, Los Alamos, NM, USA

S4-18

Nanoscale architecture of monatomic layer iron nitride

T. Hattori1T. Miyamachi1S. Nakashima1K. Iwata1Y. Takahashi1Y. Takagi2T. Yokoyama2F. Komori1

1The Institute for Solid State Physics, University of Tokyo, Japan, 2Department of Materials Molecular Science, Institute for Molecular Science, Japan

S4-19

Nanofishing of a single polymer chain: temperature-induced coil–globule transition of poly(N-isopropylacrylamide) chain in water

X. LiangK. Nakajima

Tokyo Institute of Technology, Japan

S4-20

The effects of molecular conformation on 1,4-Benzenediamine single molecular conductance

Y. SugitaS. YoshidaA. TaninakaO. TakeuchiH. Shigekawa

Faculty of Pure and Applied Science, University of Tsukuba, Japan

S4-21

Investigation of Conformational Effects in Single-Molecule Junction using Molecular Dynamics Simulation and Dynamic Probe Method

A. TaninakaS. YoshidaS. SugitaO. TakeuchiH. Shigekawa

Faculty of Pure and Applied Sciences, University of Tsukuba, Tsukuba, Japan

S4-22

Fine processing of polymer by localized atmospheric pressure plasma jet using helium source gas mixed with reactive gas

S. Yamamoto1D. Morimatsu1A. Nakamura1A. Oginno1M. Nagatsu2F. Iwata1,3

1Graduate school of integrated science and technology, Shizuoka University, Japan, 2Graduate school of science and technology, Shizuoka University, Japan, 3Research Institute of Electronics, Shizuoka University, Japan

S4-23

Three-dimensional nanofabrication based on electrophoretic deposition using a scanning ion conductance microscope

M. Yoshioka1F. Iwata1,2

1Graduate school of integrated science and technology, Shizuoka University, Japan, 2Research institute of electronics, Shizuoka University, Japan

S4-24

Tribology study of graphene oxide and reduced graphene oxide on hydrogen terminated silicon via AFM

K. YuY. TuT. UtsunomiyaT. IchiiH. Sugimura

Kyoto University, Japan

S4-25

Effects of Adhesion on the Frictional Properties of Nanostripe Structures

K. Miyake1T. Ueki2K. Ikeda2Y. Ando2

1AIST, Japan, 2Tokyo University of Agriculture and Technology, Japan

S4-26

Two-step process for disassembly mechanism of proteasome α7 homo-tetradecamer by α6 revealed by HS-AFM

T. Kozai1T. Sekiguchi2T. Satoh2H. Yagi2K. Kato2,3T. Uchihashi4

1Grad. Sch. Math. & Phys., Kanazawa Univ., Japan, 2Grad. Sch. Pharm. Sci., Nagoya City Univ., Japan, 3Okazaki Inst. Integra. Biosci. & Inst. Mole. Sci., Japna, 4Dept. Phys., Nagoya Univ., Japan

S4-27

Scanning Probe Microscope Imaging of DNA Molecules on Graphene Surface

H. TanakaM. Taniguchi

The Institute of Scientific and Industrial Research, Osaka University, Japan

S4-28

Viscoelastic maps obtained by nanorheological AFM with two different driving systems

M. AraiE. UedaX. LiangM. ItoS. KangK. Nakajima

Tokyo Institute of Technology, Japan

S4-29

Development of new mirror-tilter unit for tip-scanning high-speed atomic force microscopy

H. Watanabe1T. Uchihashi2S. Yamanaka1T. Ando1,3

1College of Science and Engineering, Kanazawa University, Japan, 2Department of Physics, Nagoya University, Japan, 3Bio-AFM Frontier Research Center, Japan

S4-30

Toward Elucidating Structure of the Connection Between Alzheimer's Disease-Related Proteins and Its Imaging Molecules

N. NaruseY. Mera

Faculty of Medicine, Shiga University of Medical Science, Japan

S4-31

Investigation of Local Electronic Structure of Graphene Oxide by Scanning Tunneling Microscopy and Spectroscopy

S. KatanoT. WeiT. SasajimaY. Uehara

RIEC, Tohoku University, Japan

S4-32

Nanoscale Luminescence of Two-dimensional Array of Silver Nanoparticles Investigated by STM Light Emission Spectroscopy

S. KatanoM. HotsukiH. AichiY. Uehara

RIEC, Tohoku University, Japan

S4-33

Development of time resolved THz-STM

S. Nagai1S. Yoshida1H. Hirori2T. Tachizaki3O. Takeuchi1H. Shigekawa1

1University of Tsukuba, Japan, 2Kyoto University, Japan, 3Tokai University, Japan

S4-34

Nanoscale Evaluation of Organic Solar Cells by Light-Modulated Scanning Tunneling Microscopy

K. ShinoharaA. GomiF. OhashiS. KoshijiA. TaninakaS. YoshidaO. TakeuchiH. Shigekawa

Faculity of Pure and Applied Sciences, Univ. of Tsukuba, Japan

S4-35

Light emission from organic thin film solar cell measured by STM-LES

A. Gomi1F. Ohashi1K. Shinohara1T. Yasuda2S. Yoshida1O. Takeuchi1H. Shigekawa1

1Faculty of Pure and Applied Sciences, University of Tsukuba, Japan, 2Exploratory Materials Research Laboratory for Energy and Environment, National Institute for Materials Science (NIMS), Japan

S4-36

Spin Dynamics of GaAs Surface with Magnetic Adatoms Probed by Optical Pump-probe Scanning Tunneling Microscopy

Z.H. Wang1,2C.H. Yoon1S. Yoshida1O. Takeuchi1H. Shigekawa1

1Institute of Applied Physics, University of Tsukuba, Japan, 2Doctoral Research Fellow of Japanese Society of Promotion of Science, Japan

S4-37

Nano-imaging of Excess Noise in Graphene with THz Near-field Microscopy

K.-T. Lin1Q. Weng1S. Kim1K. Sugawara2T. Otsuji2S. Komiyama3Y. Kajihara1

1Institute of Industrial Science, The University of Tokyo, Japan, 2Research Institute of Electrical Communication, Tohoku University, Japan, 3Department of Basic Science, The University of Tokyo, Japan

S4-38

Scanning Probe Microscopy Observations of Intercalation Effect on Graphene-assisted Chemical Etching of Ge Surfaces in Water

S. LiK. NakadeT. HiranoK. KawaiK. Arima

Osaka University, Japan

S4-39

Electrochemical FM-AFM analysis of LTO during Li⁺ insertion in ionic-liquid-electrolyte

Y. Takara1M. Kitta2T. Ichii1T. Utsunomiya1H. Sugimura1

1Department of Materials Science and Engineering, Kyoto University, Japan, 2Research Institute for Ubiquitous Energy Devices, National Institute of Advanced Industrial Science and Technology, Japan

S4-40

Observation of Sucrose (001) Surface by FM-AFM

Y. TedzukaT. OguraA. SasaharaH. Onishi

Kobe University, Japan

S4-41

Improvement of Force Sensitivity in FM-AFM for Liquid Metal

M. MurataT. IchiiT. UtsunomiyaH. Sugimura

Department of Materials Science and Engineering, Kyoto University., Japan

S4-42

Improvement of OPP-STM for coherent phonon measurement in Bi₂Te₂Se

T. KishiH. UenoZ.H. WangS. YoshidaO. TakeuchiH. Shigekawa

University of Tsukuba, Japan.

S4-43

Time evolution of morphology and electronic state of oxidized Si(110) during reduction process

M. Yano1Y. Uozumi2S. Yasuda1H. Asaoka1

1Advanced Science Research Center, Japan Atomic Energy Agency, Japan, 2Hitachi Power Solutions Co., Ltd., Japan

S4-44

Simultaneous Measurement of Tunneling Current and Local Contact Potential Difference on Rutile TiO₂(110) by AFM/KPFM

Y. J. LiQ. Z. ZhangY. AdachiH.F. WenY. NaitohY. Sugawara

Osaka　University, Japan

S4-45

Energy Dissipation Detected by Non-contact Atomic Force Microcopy on Si(111)-(7×7) under Bias Voltages

T. Arai1D. Kura1R. Inamura1M. Tomitori2

1Kanazawa University, Japan, 2Japan Advanced Institute of Science and Technology, Japan

S4-46

STM observation to double hetero junction of TMDC monolayer made by MOCVD

K. Murase1Y. Kobayashi2S. Yoshida1O. Takeuchi1Y. Miyata2H. Shigekawa1

1University of Tsukuba, Japan, 2Tokyo Metropolitan Univ, Japan

S4-47

MoS₂ surface affected by UV-O₃ exposure

T. T. Nguyen1A. Ando2T. Komeda3

1Dep. of chem., Tohoku univ., Japan, 2IMRAM, Tohoku univ., Japan, 3AIST, Japan

S4-48

Local work function measurements on H/Fe₃O₄(001) surface

R. Yamazaki1S. Takahashi1S. Takada1K. Omi1S. Hiura1A. Subagyo1,2K. Sueoka1

1Graduate School of IST, Hokkaido Univ, Japan, 2CRIS, Hokkaido Univ, Japan

S4-49

Enhanced Catalytic Activity of Defective Highly Oriented Pyrolytic Graphite Modified by Hydrogen Plasma

R. KaiM. HaraM. Yoshimura

Graduate School of Engineering, Toyota Technological Institute, Japan

S4-50

Switching of Thermoelectric Voltage and Conductance in Au Atomic Junction

A. Aiba1S. Kaneko1M. Kiguchi1F. Demir2A. Saffarzadeh2G. Kirczenow2

1Tokyo Tech, Japan, 2Simon Fraser Univ., Canada

S4-51

Million-atom simulation on quantum transport in carbon nanotubes with thermal atomic vibrations

K. Ishizeki1K. Sasaoka2S. Konabe1,3S. Souma4T. Yamamoto1,3

1Department of Electrical Engineering, Tokyo University of Science, Japan, 2Water Frontier Science and Technology Research Center (W-FST), Research Institute for Science and Technology, Tokyo University of Science, Japan, 3Research Institute for Science and Technology, Tokyo University of Science, Japan, 4Department of Electrical and Electronic Engineering, Kobe University, Japan

S4-52

Formation control of ZnO nanowires using various seed structures

T. IshibeT. TeradaK. WatanabeY. Nakamura

Osaka University, Japan

S4-53

Epitaxial growth of FeGe_γ nanocrystals on Si substrate

T. TeradaT. IshibeK. WatanabeY. Nakamura

Osaka University, Japan

S4-54

Thermal Conductivity Measurements of Vertical Nanowall Structures Using Organic Embedding Medium

K. WatanabeT. MatsumotoY. MiyazakiK. MitaraiR. OkuhataY. Nakamura

Osaka Univ., Japan

S4-55

Monolithic Thermoelectric Modules Fabricated on Si Substrates

K. WatanabeK. KanekoY. Nakamura

Osaka Univ., Japan

S4-56

Direct Observation of Zn-Y Clusters in Mg-Zn-Y LPSO Alloy by STM

S. KurokawaK. TakeuchiT. KobayashiK. Yuge

Department of Materials Science and Engineering, Kyoto University, Japan

S4-57

Localized electronic state of Re dopant in monolayer MoS2 studied by STM/STS

T. Takeuchi1S. Yoshimura2A. Ueda1S. Honda3S. Yoshida1O. Takeuchi1Y. Maniwa2Y. Miyata2H. Shigekawa1

1Univ. of Tsukuba, Japan, 2Tokyo Metropolitan Univ., Japan, 3JST-CREST., Japan

S4-58

Development of a Scanner for High Speed Scanning Tunneling Microscope

N. Handa1H. Yamashita1,2S. Abo1Y. Miyato1M. Abe1

1Graduate school of Engineering Science, Osaka University, Japan, 2PRESTO, JST, Japan

S4-59

STM Emission Spectroscopy on Organic Solar Cell

F. OhashiA. GomiK. ShinoharaS. YoshidaA. TaninakaO. TakeuchiH. Shigekawa

Faculty of Pure and Applied Sciences, University of Tsukuba., Japan

S4-60

Specific interactions between streptavidin and biotin investigated by contact-mode/FM-AFM

K. SugimotoH. KominamiK. KobayashiH. Yamada

Department of Electronic Science & Engineering, Kyoto University, Japan

S4-61

Development of non-destructive local electrical conductivity measurement by using a multi-probe STM

T. BambaH. MogiI. KurodaA. TaninakaS. YoshidaO. TakeuchiH. Shigekawa

Faculty of Pure and Applied Sciences, University of Tsukuba, Japan

S4-62

Influence of dangling bonds at the Si/Mg₂Si interface on thermoelectric properties in Mg₂Si sintered body

Y. SozawaS. KonabeT. Yamamoto

Tokyo University of Science, Japan

S4-63

Detecting Ultrafast Carrier Dynamics of WSe₂ Monolayer by a Multi-probe Optical Pump-probe STM

H. Mogi1Z.H. Wang1Y. Takaguchi2T. Bamba1S. Yoshida1Y. Miyata2O. Takeuchi1H. Shigekawa1

1Faculty of Pure and Applied Sciences, University of Tsukuba, Japan, 2Department of Physics, Tokyo Metropolitan University, Japan

S4-64

Surface potential measurement of silicon fast recovery diode under applied bias voltage using FM-AFM/KFM

T. Uruma1N. Satoh2H. Yamamoto2F. Iwata3

1Department of Optoelectronics and Nanostructure Science Graduate School of Science and Technology, Shizuoka University, Japan, 2Department of Electrical, Electronics and Computer Engineering, Faculty of Engineering, Chiba Institute of Technology, Japan, 3Graduate School of Mechanical Engineering, Shizuoka University, Japan

S4-65

FM-AFM investigations of Li⁺ ion insertion behavior on Si electrode in ionic liquid electrolyte

K. ItakuraT. IchiiT. UtsunomiyaH. Sugimura

Department of Materials Science, Kyoto University, Japan

S4-66

Photo-carrier Recombination Properties in Cu(In,Ga)Se₂ Solar Cells Investigated by Photo-assisted KFM under Various Illumination Conditions

H. Yong1T. Minemoto3T. Takahashi1,2

1Institute of Industrial Science, The University of Tokyo, Japan, 2Institute for Nano Quantum Information Electronics, The University of Tokyo, Japan, 3College of Science and Engineering, Ritsumeikan University, Japan

S4-67

Self-assembled multi-layer 2D Ag islands on MoS₂

C.H.T. ChangH.H. ChangP.C. JiangW.B. Su

Institute of Physics, Academia Sinica, Taipei 11529, Taiwan, ROC

S4-68

Photothermal-mode AFM on Cu(In,Ga)Se₂ Materials

R. Komatsu1T. Minemoto2T. Takahashi1

1The University of Tokyo, Japan, 2Ritsumeikan University, Japan

S4-69

Nanoscale investigation on active layer of organic solar cells by the FM-AFM/KFM/SCFM

S. Mochizuki1N. Satoh1S. Katori2

1Grad. Sch. of Eng., Chiba Institute of Technology, Chiba 275-0016., Japan, 2Depart. of Electrical and Electronic Eng., National Institute of Technology, Tsuyama College, Okayama 708-0824., Japan

S4-70

Nanoscale investigation of the power MOSFET by the AFM/KFM/SCFM

M. NakajimaY. UchidaN. SatohH. Yamamoto

Chiba Institute of Technology, Japan

Author Index

Abe, M.	S4-58	Konabe, S.	S4-51	Sugawara, Y.	S6-1
Abe, T.	S8-7	Konabe, S.	S4-62	Sugawara, Y.	S9-3
Abo, S.	S4-58	Koshiji, S.	S4-34	Sugawara, Y.	S10-2
Adachi, Y.	S4-44	Kozai, T.	S4-26	Sugimoto, K.	S4-60
Adachi, Y.	S10-2	Kubo, O.	S8-8	Sugimura, H.	S4-24
Aiba, A.	S4-50	Kubo, T.	S8-6	Sugimura, H.	S4-39
Aichi, H.	S4-32	Kura, D.	S4-45	Sugimura, H.	S4-41
Allain, P.E.	S4-3	Kuroda, I.	S4-61	Sugimura, H.	S4-65
Allain, P.E.	S6-3	Kurokawa, S.	S4-56	Sugita, S.	S4-21
Ando, A.	S4-47	Kurubayashi-Shigetomi, K.	S1-3	Sugita, Y.	S4-20
Ando, A.	S8-6	Li, S.	S4-38	Sugiyama, I.	S4-7
Ando, T.	S4-29	Li, Y.	S10-2	Suzuki, S.	S10-4
Ando, Y.	S4-25	Li, Y. J.	S4-44	Suzuki, T.	S8-5
Arafune, R.	S8-5	Li, Y.J.	S6-1	Tabata, H.	S8-8
Arai, M.	S4-28	Li, Y.J.	S9-3	Tabuchi, S.	S4-6
Arai, T.	S4-45	Liang, X.	S4-19	Tachizaki, T.	S4-33
Araki, K.	S4-11	Liang, X.	S4-28	Takada, S.	S4-48
Araki, K.	S9-5	Lim, R.Y.H.	S1-1	Takagi, Y.	S4-18
Arima, K.	S4-38	Lin, K.-T.	S4-37	Takaguchi, Y.	S4-63
Asaoka, H.	S4-43	Lin, K.-T.	S9-2	Takahashi, K.	S5-3
Aso, Y.	S9-5	Liu, H.-L.	S8-1	Takahashi, S.	S4-48
Bae, Y.	S5-1	Lu, S.-M.	S8-1	Takahashi, T.	S4-66
Bamba, T.	S4-61	Lutz, C.	S5-1	Takahashi, T.	S4-68
Bamba, T.	S4-63	Lv, X.	S7-1	Takahashi, Y.	S4-18
Bauer, E.D.	S4-17	Maniwa, Y.	S4-57	Takara, Y.	S4-39
Canova, F.	S5-3	Matsumoto, T.	S4-11	Takashima, K.	S4-9
Chan, W.-Y.	S8-1	Matsumoto, T.	S4-54	Takato, H.	S8-2
Chang, C.-S.	S8-1	Matsumoto, T.	S9-5	Takeuchi, K.	S4-56
Chang, C.H.T.	S4-67	Matsuoka, H.	S4-15	Takeuchi, O.	S4-20
Chang, H.H.	S4-67	Mazur, A.	S1-1	Takeuchi, O.	S4-21
Cho, Y.	S8-2	Meier, T.	S5-3	Takeuchi, O.	S4-33
Cho, Y.	S8-4	Mera, Y.	S4-30	Takeuchi, O.	S4-34
Cho, Y.	S8-7	Meyer, E.	S5-3	Takeuchi, O.	S4-35
Damiron, D.	S4-3	Minamitani, E.	S8-5	Takeuchi, O.	S4-36
Damiron, D.	S6-3	Minemoto, T.	S4-66	Takeuchi, O.	S4-42
De Silva, K.	S4-5	Minemoto, T.	S4-68	Takeuchi, O.	S4-46
De silva, K.	S4-2	Mino, K.	S4-1	Takeuchi, O.	S4-57
De-Silva, K.K.H.	S10-4	Mitarai, K.	S4-54	Takeuchi, O.	S4-59
Demir, F.	S4-50	Miyake, K.	S4-25	Takeuchi, O.	S4-61
Endo, N.	S8-5	Miyamachi, T.	S4-18	Takeuchi, O.	S4-63
Endo, S.	S8-8	Miyata, Y.	S4-46	Takeuchi, O.	S7-4
Foster, A.	S5-3	Miyata, Y.	S4-57	Takeuchi, T.	S4-57
Frederiksen, T.	S8-5	Miyata, Y.	S4-63	Tanahashi, K.	S8-2
Fujii, S.	S4-13	Miyato, Y.	S4-58	Tanaka, H.	S4-27
Fujii, S.	S9-4	Miyazaki, Y.	S4-54	Tanaka, R.	S1-3
Fujii, Y.	S2-3	Mizutani, Y.	S4-14	Tanaka, T.	S4-12
Fujita, D.	S8-9	Mochizuki, S.	S4-69	Taniguchi, M.	S4-27
Fujita, T.	S8-9	Mogi, H.	S4-61	Taninaka, A.	S4-20
Fujiwara, M.	S4-6	Mogi, H.	S4-63	Taninaka, A.	S4-21
Fukidome, H.	S8-5	Morimatsu, D.	S4-22	Taninaka, A.	S4-34
Furube, A.	S4-15	Movshovich, R.	S4-17	Taninaka, A.	S4-59
Ganser, C.	S2-1	Murase, K.	S4-46	Taninaka, A.	S4-61
Gomi, A.	S4-34	Murata, M.	S4-41	Taninaka, A.	S7-4
Gomi, A.	S4-35	Nagai, S.	S4-33	Tedzuka, Y.	S4-40
Gomi, A.	S4-59	Nagase, M.	S1-3	Terada, T.	S4-52
Gomi, A.	S7-4	Nagatsu, M.	S4-22	Terada, T.	S4-53
Handa, N.	S4-58	Naitoh, Y.	S4-44	Tomitori, M.	S4-45
Hara, M.	S4-49	Naitoh, Y.	S10-2	Tsukuda, M.	S8-3
Harashima, T.	S4-8	Nakade, K.	S4-38	Tu, Y.	S4-24
Hasui, S.	S4-1	Nakajima, K.	S4-19	Uchida, Y.	S4-70
Hattori, T.	S4-18	Nakajima, K.	S4-28	Uchihashi, T.	S2-1
Heinrich, A.	S5-1	Nakajima, M.	S4-70	Uchihashi, T.	S4-26
Higashi, T.	S4-7	Nakamura, A.	S4-22	Uchihashi, T.	S4-29
Hirano, T.	S4-38	Nakamura, Y.	S4-52	Uchihashi, T.	S5-2
Hirori, H.	S4-33	Nakamura, Y.	S4-53	Ueda, A.	S4-57
Hiura, S.	S4-48	Nakamura, Y.	S4-54	Ueda, E.	S4-28
Honda, S.	S4-57	Nakamura, Y.	S4-55	Uehara, Y.	S4-31
Hotsuki, M.	S4-32	Nakashima, N.	S8-8	Uehara, Y.	S4-32
Huang, H.H.	S4-5	Nakashima, S.	S4-18	Ueki, T.	S4-25
Huang, H.H.	S10-4	Naruse, N.	S4-30	Ueno, H.	S4-42
Ichii, T.	S4-24	Nema, H.	S9-2	Uozumi, Y.	S4-43
Ichii, T.	S4-39	Nguyen, T. T.	S4-47	Uruma, T.	S4-64
Ichii, T.	S4-41	Nishijima, S.	S4-11	Ushiki, T.	S4-14
Ichii, T.	S4-65	Nishino, T.	S4-8	Utsunomiya, T.	S4-24
Ie, Y.	S9-5	Nishizawa, H.	S4-3	Utsunomiya, T.	S4-39
Ikeda, K.	S4-25	Nishizawa, H.	S4-4	Utsunomiya, T.	S4-41
Ikuhara, Y.	S4-7	Nishizawa, H.	S6-3	Utsunomiya, T.	S4-65
Ikuhara, Y. H.	S4-7	Nozaki, K.	S5-3	Wang, Z.H.	S4-36
Inaba, T.	S4-2	Ochiai, T.	S7-4	Wang, Z.H.	S4-42
Inami, E.	S10-5	Oginno, A.	S4-22	Wang, Z.H.	S4-63
Inamura, R.	S4-45	Ogura, T.	S4-40	Watanabe, H.	S4-29
Innami, K.	S4-10	Ohashi, F.	S4-34	Watanabe, K.	S4-52
Innami, K.	S5-4	Ohashi, F.	S4-35	Watanabe, K.	S4-53
Irisawa, T.	S8-6	Ohashi, F.	S4-59	Watanabe, K.	S4-54
Ishibe, T.	S4-52	Ohashi, F.	S7-4	Watanabe, K.	S4-55
Ishibe, T.	S4-53	Ohyama, H.	S9-5	Watanabe, S.	S2-2
Ishikawa, R.	S4-7	Okada, A.	S4-1	Watanabe, S.	S8-5
Ishizeki, K.	S4-51	Okajima, T.	S1-3	Wei, T.	S4-31
Isshiki, Y.	S4-13	Okajima, T.	S2-3	Wen, H.	S10-2
Itakura, K.	S4-65	Okuhata, R.	S4-54	Wen, H.F.	S4-44
Ito, M.	S4-28	Omi, K.	S4-48	Weng, Q.	S4-37
Ito, S.	S5-3	Onishi, H.	S4-40	Willke, P.	S5-1
Itoh, H.	S8-9	Onishi, H.	S10-3	Wulferding, D.	S4-17
Iwata, F.	S4-14	Osawa, H.	S6-3	XUE, S.	S10-3
Iwata, F.	S4-22	Otsuji, T.	S4-37	Yagi, H.	S4-26
Iwata, F.	S4-23	Otsuka, Y.	S4-11	Yamada, H.	S4-10
Iwata, F.	S4-64	Pai, W.W.	S8-1	Yamada, H.	S4-12
Iwata, K.	S4-18	Pawlak, R.	S5-3	Yamada, H.	S4-60
Jiang, K.	S7-5	Phark, S.	S7-3	Yamada, H.	S5-4
Jiang, P.C.	S4-67	Ronning, F.	S4-17	Yamada, M.	S4-11
Joshi, R.	S4-5	Saffarzadeh, A.	S4-50	Yamada, T. K.	S10-5
KObayashi, T.	S8-5	Sainoo, Y.	S8-5	Yamagishi, Y.	S8-2
Kadano, K.	S4-1	Saito, H.	S9-3	Yamagishi, Y.	S8-7
Kai, R.	S4-49	Sakiyama, Y.	S1-1	Yamamoto, H.	S4-64
Kajihara, Y.	S4-37	Sander, D.	S7-3	Yamamoto, H.	S4-70
Kajihara, Y.	S9-2	Sasahara, A.	S4-40	Yamamoto, S.	S4-22
Kajimoto, K.	S4-11	Sasahra, A.	S10-3	Yamamoto, T.	S4-9
Kakikawa, K.	S8-2	Sasajima, T.	S4-31	Yamamoto, T.	S4-51
Kaneko, K.	S4-55	Sasaki, N.	S4-3	Yamamoto, T.	S4-62
Kaneko, S.	S4-50	Sasaki, N.	S6-3	Yamamoto, T.	S8-3
Kaneko, S.	S9-4	Sasaki, N.	S10-1	Yamanaka, S.	S4-29
Kang, S.	S4-28	Sasano, S.	S4-7	Yamashita, H.	S4-58
Kapinos, L.E.	S1-1	Sasaoka, K.	S4-51	Yamasue, K.	S8-4
Katano, S.	S4-31	Satoh, N.	S4-64	Yamazaki, R.	S4-48
Katano, S.	S4-32	Satoh, N.	S4-69	Yang, I.	S4-17
Katayama, M.	S8-8	Satoh, N.	S4-70	Yang, K.	S5-1
Kato, K.	S4-26	Satoh, T.	S4-26	Yang, P.	S7-1
Katori, S.	S4-69	Schäffer, T.E.	S1-2	Yang, P.	S7-5
Kawabata, T.	S4-2	Sekiguchi, T.	S4-26	Yano, M.	S4-43
Kawai, K.	S4-38	Shahed, S.	S8-5	Yasuda, S.	S4-43
Kawai, S.	S5-3	Shibata, N.	S4-7	Yasuda, T.	S4-35
Kawakatsu, H.	S4-3	Shigekawa, H.	S4-20	Ynagiya, S.	S4-15
Kawakatsu, H.	S4-4	Shigekawa, H.	S4-21	Yokocho, T.	S4-10
Kawakatsu, H.	S6-3	Shigekawa, H.	S4-33	Yokota, A.	S4-6
Kiguchi, M.	S4-13	Shigekawa, H.	S4-34	Yokoyama, T.	S4-18
Kiguchi, M.	S4-50	Shigekawa, H.	S4-35	Yong, H.	S4-66
Kiguchi, M.	S9-4	Shigekawa, H.	S4-36	Yoon, C.H.	S4-36
Kikuchi, A.	S9-2	Shigekawa, H.	S4-42	Yorimitsu, H.	S10-5
Kim, G.	S4-17	Shigekawa, H.	S4-46	Yoshida, S.	S4-20
Kim, H.	S4-17	Shigekawa, H.	S4-57	Yoshida, S.	S4-21
Kim, J.	S4-17	Shigekawa, H.	S4-59	Yoshida, S.	S4-33
Kim, J.	S7-2	Shigekawa, H.	S4-61	Yoshida, S.	S4-34
Kim, S.	S4-37	Shigekawa, H.	S4-63	Yoshida, S.	S4-35
Kimura, F.	S9-2	Shigekawa, H.	S7-4	Yoshida, S.	S4-36
Kimura, T.	S4-7	Shimasaki, M.	S10-5	Yoshida, S.	S4-42
Kinoshita, Y.	S4-16	Shimizu, T.	S8-6	Yoshida, S.	S4-46
Kinoshita, Y.	S9-3	Shinohara, K.	S4-34	Yoshida, S.	S4-57
Kirczenow, G.	S4-50	Shinohara, K.	S4-35	Yoshida, S.	S4-59
Kishi, T.	S4-42	Shinohara, K.	S4-59	Yoshida, S.	S4-61
Kitta, M.	S4-39	Shinohara, K.	S7-4	Yoshida, S.	S4-63
Kobayashi, D.	S4-3	Shiota, M.	S4-1	Yoshida, S.	S7-4
Kobayashi, D.	S4-4	Shirasawa, T.	S4-14	Yoshimura, M.	S4-1
Kobayashi, D.	S6-3	Song, Y.	S7-1	Yoshimura, M.	S4-2
Kobayashi, K.	S4-10	Song, Y.	S7-5	Yoshimura, M.	S4-5
Kobayashi, K.	S4-12	Souma, S.	S4-51	Yoshimura, M.	S4-49
Kobayashi, K.	S4-60	Sozawa, Y.	S4-62	Yoshimura, M.	S10-4
Kobayashi, K.	S5-4	Spijker, P.	S5-3	Yoshimura, S.	S4-57
Kobayashi, K.	S9-1	Su, W.-B.	S8-1	Yoshimura, S.	S9-3
Kobayashi, N.	S6-2	Su, W.B.	S4-67	Yoshioka, M.	S4-23
Kobayashi, T.	S4-56	Subagyo, A.	S1-3	Yu, K.	S4-24
Kobayashi, Y.	S4-46	Subagyo, A.	S4-6	Yuge, K.	S4-56
Komatsu, R.	S4-68	Subagyo, A.	S4-48	Zhang, Q.	S10-2
Komeda, T.	S4-47	Sueoka, K.	S1-3	Zhang, Q. Z.	S4-44
Komeda, T.	S8-5	Sueoka, K.	S4-6	Zhang, W.	S7-1
Kominami, H.	S4-60	Sueoka, K.	S4-48	Zhang, W.	S7-5
Komiyama, S.	S4-37	Sugawara, K.	S4-37	Štich, I.	S6-1
Komori, F.	S4-18	Sugawara, Y.	S4-44

ICSPM25 Program

Contents

Time Table

Dec 07 Thu

Registration (12:00-13:30)

Opening (13:30-13:40)

Session 1 : (Kawakatsu)

Coffee Break (15:15-15:45)

Session 2 : (Takahashi)

Session 3 : Exhibitor's presentation (Takeuchi)

Dinner break (17:20-19:30)

Session 4 : Poster Session (19:30-21:00)

Dec 08 Fri

Session 5 : (Lim, Miyake)

Coffee Break (10:10-10:40)

Session 6 : (Ichii)

Conference Photo (12:05-12:15)

Lunch break (12:15-13:30)

Session 7 : (Schäffer, Liang)

Coffee Break (15:10-15:40)

Session 8 : (Zhang, Onishi)

Break (17:55-19:00)

Banquet (19:00-21:30)

Dec 09 Sat

Session 9 : (Stich, Sugawara)

Coffee Break (10:00-10:20)

Session 10 : (Bae, Mera)

Closing (11:50-12:00)

Session 4 : Poster Session

Dec 7 Thu 19:30-21:00

Author Index