Exhibitors

For any inquiries or requests regarding exhibitions at the conference, please contact the Organizing Committee.

Exhibitor List

Exhibition
SThM module and SPM probes 
Presentation
SThM module and SPM probes 
Address
Osaki Bright Bright Core, 5-15, Kitashinagawa 5-chome, Shinagawa-ku, Tokyo 141-0001, Japan 
Tel / Fax
+81-3-3442-5142 / +81-3-3442-5175
Contact
Mr Akifumi Kobayashi <akobayashi@tomo-e.co.jp> 
URL
http://www.tomo-e.co.jp/
Exhibition
 
Presentation
 
Address
2-4-3 Kasugano, Hirakata, Osaka 573-0131, Japan 
Tel / Fax
+81-72-858-6456 / +81-72-859-5655
Contact
Mr Toshiaki Nagamura <toshiaki@unisoku.co.jp> 
URL
http://www.unisoku.com/
Exhibition
Introduction for model free nanoscale IR absorption spectroscopy for organic component and IR absorption image for inorganic component by s-SNOM. 
Presentation
Introduction for model free nanoscale IR absorption spectroscopy for organic component and IR absorption image for inorganic component by s-SNOM. 
Address
Shinjuku Mitsuba bldg.,5F, Nishi-Shinjuku 1-5-11, Shinjuku, Tokyo 160-0023, Japan 
Tel / Fax
+81-3-5339-1470 / +81-3-5339-1471
Contact
Mr Norio Urayama <n-urayama@thermconsult.co.jp> 
URL
http://www.therm-info.com/
Exhibition
SPM Control System / Tramea System / AFM-related products / UHV-Suitecase / Wobblestick manipulators / In-situ Exchagable Crucible Evaporator / Miniature K-Cell / Ion Sources / Electron Source / Thin Film Deposition and Sample Preparation 
Presentation
 
Address
5-43-1-1601 Higashioizumi, Nerima-ku, Tokyo 178-0063, Japan 
Tel / Fax
+81-3-5935-1060 / +81-3-5935-1070
Contact
Mr Keigo Matsuda <matsuda@t-e-c.co.jp> 
URL
http://www.t-e-c.co.jp/
Exhibition
Asylum Research Atomic Force Microscopy 
Presentation
Asylum Research Atomic Force Microscopy 
Address
IS building, 3-32-42 Higashi-Shinagawa, Shinagawa-ku, Tokyo 140-0002, Japan 
Tel / Fax
+81-3-6732-8969 / +81-3-6732-8939
Contact
Yasushi Deguchi <yasushi.deguchi@oxinst.com> 
URL
https://www.oxford-instruments.com/AFM
Exhibition
The world’s first complete commercial solution for AFM-based scanning electrochemical microscopy “PeakForce SECM™” 
Presentation
Introduction of atomic force microscopy with new nanoelectrode tips for high resolution electrochemical, nanomechanical and nanoelectrical imaging 
Address
1-4-1 Shinkawa, Chuo-ku, Tokyo 104-0033, Japan 
Tel / Fax
+81-3-3523-6361 /
Contact
Nao Morihashi <nao.morihashi@bruker.com> 
URL
http://www.bruker.com/nano
Exhibition
The latest UHV-SPM products of Scienta Omicron 
Presentation
The latest UHV-SPM products of Scienta Omicron 
Address
6-16-4 Minami-Oi Shinagawa, Tokyo 140-0013, Japan 
Tel / Fax
+81-3-6404-9133 / +81-3-6404-9134
Contact
Hitoshi Tomizuka <Naoko.Oiwa@ScientaOmicron.com> 
URL
http://scientaomicron.co.jp/
Exhibition
High-speed Atomic Force Microscope SS-NEX / PS-NEX 
Presentation
High-speed Atomic Force Microscope SS-NEX / PS-NEX 
Address
1-17-1 Sengen, Tsukuba, Ibaraki 305-0047, Japan 
Tel / Fax
+81-29-896-6500 / +81-29-896-6501
Contact
Mr Takashi MORII <morii@ribm.co.jp> 
URL
http://www.ribm.co.jp/
Exhibition
OLYMPUS Micro Cantilever 
Presentation
OLYMPUS Micro Cantilever 
Address
2-3 Kuboyama-cho, Hachioji-shi, Tokyo 192-8512, Japan 
Tel / Fax
+81-42-691-7403 / +81-42-691-7509
Contact
Mr Takaaki TAKENOBU <probe@olympus.co.jp> 
URL
http://probe.olympus-global.com/
Exhibition
Atomic Force Microscopes (AFM) 
Presentation
Atomic Force Microscopes (AFM) 
Address
1-24-14 Nishi-Shimbashi, Minato-ku, Tokyo 105-8717, Japan 
Tel / Fax
+81-50-3139-4299 / +81-3-3504-7756
Contact
Mr Takamasa Nomura <takamasa.nomura.ej@hitachi-hightech.com> 
URL
https://www.hitachi-hightech.com/global/products/science/