ICSPM27 Program
Contents
* Click speaker's name to see detail.
Dec 05 Thu
Registration (11:30-13:00)
Opening (13:00-13:10)
Session 1 : (Yukio Hasegawa)
Novel Xenes beyond Silicene
G. Le Lay1,2J. Yuhara1
1Nagoya University, Japan, 2Aix-Marseille University, France
Atomic-Layer Superconductors
S. Hasegawa
University of Tokyo, Japan
Growth of germanium thin film at graphene/metal interface
S. Suzuki1K. K. H. De Silva2M. Yoshimura2T. Nakayama3,4
1International Center for Young Scientists (ICYS), National Institute for Materials Science (NIMS), Japan, 2Toyota Technological Institute, Japan, 3International Center for Materials Nanoarchitectonics (WPI-MANA), National Institute for Material Sciences (NIMS), Japan, 4Graduate School of Pure and Applied Sciences, University of Tsukuba, Japan
Lattice Defect Restoration in Graphene Oxide via Alcohol-Assisted Thermal Annealing
K. K. H. De SilvaM. Yoshimura
Toyota Technological Institute, Japan
Role of steps on Pb atomic-layer superconductivity
Y. Sato1F. Oguro1K. Asakawa1T. Uchihashi2Y. Hasegawa1
1Institute for Solid State Physics, The University of Tokyo, Japan, 2International Center for Materials Nanoarchitectonics, National Institute for Material Science, Japan
Photoresponse Measurements of Monolayer WSe2MoSe2 In-plane Heterostructure by an Optically-excited Multiprobe method
H. Mogi1Z. Wang1T. Bamba1Y. Takaguchi2T. Endo2S. Yoshida1A. Taninaka1H. Oigawa1Y. Miyata2O. Takeuchi1H. Shigekawa1
1University of Tsukuba, Japan, 2Tokyo Metropolitan University, Japan
Coffee Break (15:20-15:50)
Session 2 : (Takashi Ichii)
Group effect as a route to control the self-assembly of small molecules at solid-liquid interfaces
W. Foster1K. Miyazawa2T. Fukuma2H. Kusumaatmaja1K. Voitchovsky1
1Physics Department, Durham University, United Kingdom, 2Nano Life Science Institute (WPI-NanoLSI), Kanazawa University, Japan
Atomic resolution imaging in polymeric liquid by qPlus AFM
Y. YamadaT. IchiiT. UtsunomiyaH. Sugimura
Kyoto University, Japan
Neutron and AFM studies for Understanding of Tribology
T. Hirayama
Kyoto University, Japan
Session 3 : Exhibitor's presentation (Osamu Takeuchi)
16:50 S3-1 Tomoe Engineering Co.,Ltd
16:55 S3-2 UNISOKU Co., Ltd.
17:00 S3-3 Quantum Design Japan, Inc.
17:05 S3-4 Oxford Instruments KK
17:10 S3-5 Scienta Omicron, Inc.
17:15 S3-6 Anton Paar Japan K. K.
17:25 S3-8 TOYAMA CO., LTD.
Dinner break (17:30-19:30)
Dec 06 Fri
Session 5 : (Futoshi Iwata)
Micro- and Nanoscale Electrochemical 3D Printing
D. Momotenko
Laboratory of Biosensors and Bioelectronics, Institute for Biomedical Engineering, ETH Zurich, Switzerland
Local Viscoelastic Measurements of Polymer Thin Films by Peak-Tracking Scanning Thermal Noise Microscopy
K. KobayashiK. KimuraH. Yamada
Kyoto University, Japan
Defect creation in microtubules and kinesin motility studied by HS-AFM
C. Ganser1K. Takeda2R. Iino2K. Kato1T. Uchihashi1,3
1ExCELLS, National Institutes of Natural Sciences, Japan, 2Institute of Molecular Science, National Institutes of Natural Sciences, Japan, 3Department of Physics, Nagoya University, Japan
Synthesis, Properties, and Electronic Device Applications of Large MoS2 Thin Films by Two-step Chemical Vapor Deposition
A. Ando1M. Okada1T. Shimizu1T. Kubo1S.-I. Yamamoto2T. Irisawa1
1National Institute of Advanced Industrial Science and Technology (AIST), Japan, 2Ryukoku University, Japan
Coffee Break (10:05-10:30)
Session 6 : (Joost Wintterlin)
Direct imaging method of frequency response in dual bias modulation electrostatic force microscopy
R. Fukuzawa1T. Takahashi1,2
1Institute of Industrial Science, The University of Tokyo, Japan, 2Institute for Nano Quantum Information Electronics, Japan
Surface state conductivity on the Si(111)-7x7 surface measured by scanning tunneling potentiometry
M. HamadaH. H. YangY. Hasegawa
The Institute for Solid State Physics, The University of Tokyo, Japan
Non-centrosymmetric Electronic Structures of Defects on Type-II Weyl Semimetals
W. H. Chen1H. I. Huang1N. Kawakami1R. Arafune2N. Takagi3C. L. Lin1
1Department of Electrophysics, National Chiao Tung University, Taiwan, 2International Center for Materials Nanoarchitectonics, National Institute for Materials Science, Japan, 3Graduate School of Human and Environmental Studies, Kyoto University, Japan
STS Studies of Layered Topological Materials
C. L. Lin1N. Kawakami1R. Arafune2E. Minamitani3N. Takagi4
1Department of Electrophysics, National Chiao Tung University, Taiwan, 2International Center for Materials Nanoarchitectonics, National Institute for Materials Science, Japan, 3Institute for Molecular Science, Japan, 4Graduate School of Human and Environmental Studies, Kyoto University, Japan
Conference Photo (11:30-11:40)
Get together with your best smile!
Lunch break (11:40-13:00)
Session 7 : (George Fantner)
Observation of cells and biomolecules by tip scan atomic force microscopy
A. Narita
Nogoya University, Japan
Investigation of Carrier Dynamics in Organic Polymer Thin-Film Transistors by Time-Resolved Kelvin-Probe Force Microscopy
M. TakeshitaK. KobayashiH. Yamada
Kyoto University, Japan
Nanoscale observation of power semiconductor devices in operation state by scanning probe microscope
A. DoiN. SatohH. Yamamoto
Chiba Institute of Technology, Japan
Synthesis and characterization of molecular oxygen on rutile TiO2 (110) surface using atomic force microscopy
Y. AdachiQ. ZhangM. MiyazakiY. SugawaraY. J. Li
Osaka University, Japan
Colour Atomic Force Microscopy -Relaxation and tip considerations-
H. Kawakatsu1D. Damiron1P. Allain2D. Kobayashi1
1IIS, University of Tokyo, Japan, 2Université Paris Diderot-Paris7 Laboratoire Matériaux et Phénomènes Quantiques, France
Probing two-dimensional ices with scanning probe microscopy
Ye. Tian1Runze. Ma1Duanyun. Cao1Chongqin. Zhu2,3Jinbo. Peng1Jing. Guo1Ji. Chen4Xinzheng. Li4,5Joseph S. Francisco2Xiao C. Zeng3Limei. Xu1,5Enge. Wang1,5,6Ying. Jiang1,5,6
1International Center for Quantum Materials, School of Physics, Peking University, China, 2Department of Earth and Environmental Sciences, University of Pennsylvania, Philadelphia, Pennsylvania 19104, USA, 3Department of Chemistry and Department of Chemical & Biomolecular Engineering and Department of Mechanical & Materials Engineering, University of Nebraska–Lincoln, Lincoln, NE 68588, USA, 4School of Physics, Peking University, China, 5Collaborative Innovation Center of Quantum Matter, China, 6Center for Excellence in Topological Quantum Computation, University of Chinese Academy of Sciences, China
sub-ps Snapshot of Electron Dynamics in an Organic Thin Film Captured by THz-STM
S. Yoshida1Y. Arashida1H. Hirori2T. Tachizaki3H. Ueno1Y. Shinomiya1O. Takeuchi1H. Shigekawa1
1Division of Applied Physics, Faculty of Pure and Applied Sciences, University of Tsukuba, Japan, 2Institute for Chemical Research, Kyoto University, Japan, 3Department of Optical and Imaging Science and Technology, Tokai University, Japan
Coffee Break (15:00-15:30)
Session 8 : (Dmitry Momotenko)
Time Resolved and Correlative Scanning Probe Microscopy
G.E. Fantner
Institute for Bioengineering, École Polytechnique Fédéral de Lausanne, Switzerland
Chemical Control of Resonant Tunneling Conduction through Ruthenium Complexes
T. Matsumoto
Osaka University, Japan
Non-radiative recombination properties in Cu(In,Ga)(S,Se)2 investigated by photothermal AFM
A. Yamada1T. Takahashi1,2
1Institute of Industrial Science, The University of Tokyo, Japan, 2Institute for Nano Quantum Information Electronics, The University of Tokyo, Japan
Scanning probe microscopy of charge-carrier dynamics via terahertz fluctuation
Q. Weng1S. Komiyama2,3
1RIKEN, Japan, 2The University of Tokyo, Japan, 3NICT, Japan
Single ion hydrates under the SPM tip
Jinbo. Peng1Duanyun. Cao1Zhili. He2Jing. Guo1Prokop. Hapala3Runze. Ma1Bowei. Cheng1Ji. Chen1WenJun. Xie2Xin-zheng. Li1Pavel. Jelínek3Li-Mei. Xu1Yi Qin. Gao2En-Ge. Wang1Ying. Jiang1
1School of Physics, Peking University, China, 2College of Chemistry and Molecular Engineering, Peking University, China, 3Institute of Physics, Czech Academy of Sciences, Czech Republic
Tip-enhanced resonance Raman spectroscopy: A novel tool for nanoscale chemical analysis of surfaces
T. Kumagai
Fritz-Haber Institute of the Max-Planck Society, Germany
Break (17:40-19:00)
Banquet (19:00-21:30)
Dec 07 Sat
Session 9 : (Guy Le Lay)
How atoms can move when a surface is fully covered by adsorbates; a video STM study
J. Wintterlin
Dept. of Chemistry, University of Munich, Germany
In-situ Observation of Electrochemical Phenomena by High Speed Scanning Probe Microscope
H. Matsushima
Hokkaido University, Japan
Coffee Break (09:50-10:20)
Session 10 : (Hiroshi Onishi)
Ferroelectric Polarization Writing on Organic Ferroelectric/Reduced Graphene Oxide Heterostructures
P. ViswanathK. K. H. De SilvaM. Yoshimura
Toyota Technological Institute, Japan
Evaluation of Thickness of Exfoliated Artificially Synthesized Mica Nanosheets Affixed on Silicon Substrates and its Correlations with Current Voltage Characteristics
I. M. RazzakulM. Tomitori
School of Materials Science, Japan Advanced Institute of Science and Technology, Japan
Plasmon-exciton coupling at an STM junction: fundamental and applications for spatially-resolved single-molecule spectroscopy
H. Imada
RIKEN, CPR, Japan
Closing (11:20-11:30)
Session 4 : Poster Session
Dec 5 Thu 19:30-21:00
High Slew Rate Circuit for High Rigidity Friction Drive
H. KawakatsuD. Kobayashi
Institute of Industrial Science, The University of Tokyo, Japan
Investigation of Surfaces Properties of PVA Brush for Cleaning Semiconductor Wafer by AFM in Liquids
T. Ikarashi1T. Yoshino1K. Miyata1,2K. Miyazawa1,2M. Uno3C. Takatoh3T. Fukuma1,2
1Division of Electrical Engineering and Computer Science, Kanazawa University, Japan, 2WPI-NanoLSI, Kanazawa University, Japan, 3EBARA Corporation, Japan
Visualizing Intermediate State in Calcite Dissolution by High-speed 3D-SFM
K. Miyata1,2K. Adachi1N. Miyashita1K. Miyazawa1,2A.S. Foster1,3T. Fukuma1,2
1Nano Life Science Institute (WPI-NanoLSI), Kanazawa University, Japan, 2Division of Electrical Engineering and Computer Science, Kanazawa University, Japan, 3Department of Applied Physics, Aalto University, Finland
Development of Kelvin probe force microscope capable of measuring high voltage potential of charge distribution of a MEMS comb electrode
K. Fukazawa1T. Uruma2K. Nakazawa1G. Hashiguchi1F. Iwata1
1Graduate School of Integrated Science and Technology, Shizuoka University, Japan, 2Department of Optoelectronics and Nanostructure Science Graduate School of Science and Technology, Shizuoka University, Japan
Generation of high-repetition sub-cycle mid-infrared pulses for ultrafast time-resolved STM
I. Igarashi1Y. Yoshioka2S. Yoshida1Y. Arashida1,2M. Ishikawa1I. Katayama2J. Takeda2H. Shigekawa1
1Tsukuba Univ., Japan, 2Yokohama Natl. Univ., Japan
Boron-doped Reduced Graphene Oxide as a Catalyst Support for Oxygen Evolution Reaction
P. JoshiH.-H. HuangM. HaraM. Yoshimura
Toyota Technological Institute, Japan
Spatially-modulated superconductivity due to the interplay between electronic nematicity and surface structure in FeSexTe1-x at the nematic quantum critical point
Y. Yoshida1,2H. -H. Yang2,3K. Terao4T. Kashiwagi4K. Kadowaki4Y. Hasegawa2
1Kanazawa University, Japan, 2ISSP, University of Tokyo, Japan, 3Karlsruhe Institute of Technology, Germany, 4University of Tsukuba, Japan
Local current mapping of electrochemically-exfoliated graphene oxide by conductive AFM
W. KubotaT. UtsunomiyaT. IchiiH. Sugimura
Kyoto University, Materials Science and Engineering, Japan
Observation of morphology of α-NPD crystal from amorphous thin film for understanding crystal growth mechanism
H. Kanehara1Y. Araki1H. Katsuno2T. Nakada1
1Department of Physical Sciences, Ritsumeikan University, Japan, 2The Institute of Scientific and Industrial Research, Osaka University, Japan
Measurement of Change in Resistance of a Silver Sulfide Nanodot by Removal of Dopant Silver Atoms
N. MishimaT. Hasegawa
Faculty of Advanced Science and engineering, Waseda Univ., Japan
Structural Variations of Two-Dimensional TBPT Networks on Au(111)
S. Hasui1A. Okada2M. Yoshimura3K. Kadono2
1Graduate School of Science and Technology, Kyoto Institute of Technology, Japan, 2Faculty of materials of Science and Engineering, Kyoto Institute of Technology, Japan, 3Toyota Technological Institute, Japan
Fabrication and Evaluation of Single-Atom Tips for Scanning Probe Microscopy by Heat Treatment under High Electric Field
H. KinoshitaM. Tomitori
School of Materials Science JAIST, Japan
Effects of Surface Wettability on Calibration Method for Lateral Force Microscopy
A. Omura
National Institute of Advanced Industrial Science and Technology (AIST), Japan
Elasticity of Brewery Yeast under Ethanol Stress Investigated by Atomic Force Microscopy
K. Toyota1R. Tanaka2T. Okajima1
1Hokkaido University, Japan, 2Research Institute of Biomolecule Metrology Co.,Ltd., Japan
Relationship between Rheological Properties and Actin Density in Single Cells Investigated by AFM
R. Tanaka1M. Sawano2K. Kuribayashi-Shigetomi2T. Okajima2
1Research Institute of Biomolecule Metrology Co.,Ltd., Japan, 2Graduate School of Information Science and Technology, Hokkaido University, Japan
Visualizing charge distribution of biological tissue using scanning ion conductance microscopy with double barrel nanopipettes
Y. Katsura1Y. Mizutani2T. Ushiki2K. Nakazawa1F. Iwata1,3
1Graduate School of Integrated Science and Technology, Shizuoka University, Japan, 2Division of Microscopic Anatomy, Niigata University Graduate School Medical and Dental Sciences, Japan, 3Reseach Institute of Electronics, Shizuoka University, Japan
Visualization of nanomechanical responses of living cell surface captured by high-speed ion conductance microscope
S. Kitazawa1L. Sun2A. Housaka2T. Watanabe-Nakayama2H. Konno2S. Watanabe2
1Graduate School of Natural Science and Technology, Kanazawa University, Japan, 2WPI Nano Life Science Institute (WPI-NanoLSI), Kanazawa University, Japan
𝐴𝑔₂𝑆-island network for reservoir computing studied by C-AFM
K. Ojima1T. Hasegawa1Y. Naitoh2
1Department of Pure and Applied Physics, Waseda University, Japan, 2Advanced Industrial Science and Technology, Japan
AFM Nanomechanical Studies on Dynamic Stress Networks of Stretched Thermoplastic Elastomer
H. LiuX. LiangK. Nakajima
School of Materials and Chemical Technology, Tokyo Institute of Technology, Japan
Control of Precipitation and Dissolution of Ag Atoms on a Ta2O5/Ag Nanodot
W. HirayaT. Hasegawa
Department of Pure and Applied Physics, Faculty of Science and Engineering, Waseda University, Japan
Structural analysis on hydrate-melt/mica interfaces by qPlus AFM
T. IchiiS. IchikawaY. YamadaT. UtsunomiyaH. Sugimura
Kyoto University, Japan
Visualization of exciton creation and annihilation in a single molecule
M. Imai-Imada1,2H. Imada1K. Kimura1,2K. Miwa1J. Takeya2Y. Kim1
1Surface and Interface Science Laboratory, RIKEN, Japan, 2Department of Advanced Materials Science, Graduate School of Frontier Science, The University of Tokyo, Japan
Nonplanar Stereochiral Intermolecular Interactions between Upright Molecular Precursors
S. Chaunchaiyakul1C. Zhang1H. Imada1E. Kazuma1F. Ishiwari2Y. Shoji2T. Fukushima2Y. Kim1
1Riken, Japan, 2Tokyo Institute of Technology, Japan
Experimental Verification of Deactivation Process in Atmospheric Tip-Enhanced Raman Spectroscopy (TERS)
Y. YokotaM. HongN. HayazawaB. YangE. KazumaF. C. CatalanY. Kim
RIKEN, Japan
Local Photoelectric Efficiency Distribution of C60/Pentacene Planner- Junction
O. Takeuchi1S. Koshiji1Y. Koshino1S. Nagai2T. Nishi2S. Tomiya2A. Taninaka1S. Yoshida1H. Shigekawa1
1Univ. of Tsukuba, Japan, 2Sony Corp., Japan
Atomic scale ultrafast dynamics at surfaces imaged by time-resolved THz-STM
H. Ueno1S. Yoshida1Y. Arashida1Y. Shinomiya1H. Hirori2T. Takehiro3O. Takeuchi1H. Shigekawa1
1Institute of Applied Physics, University of Tsukuba, Tsukuba, Ibaraki 305-8573, Japan, 2Institute for Chemical Research, Kyoto University, Uji, Kyoto, Japan, 3Department of Optical and Imaging Science and Technology, Tokai University, Kitakaname, Hiratsuka-shi, Kanagawa 259-1292, Japan
Development of tip-enhanced single beam coherent anti-stokes Raman scattering microscopy
Y. Arashida1A. Taninaka1T. Ochiai2K. Saito1S. Ugajin1H. Kurokawa3H. Matsui3S. Yoshida1O. Takeuchi1M. Yoshimura4H. Shigekawa1
1Faculty of Pure and Applied Sciences, University of Tsukuba, Japan, 2Takano CO., LTD., Japan, 3Faculty of Medicine, University of Tsukuba, Japan, 4Toyota Technological Institute, Japan
Microwave Magnetic Field Waveguide Antenna for Ferromagnetic Resonance Force Microscopy
Y. Kinoshita
Akita University, Japan
Corrosion Mechanism of Aluminum Alloy at Grain Boundaries Investigated by in-Liquid Nanoscale Potential Measurement Technique
S. Yamamoto1D. Taniguchi1K. Hirata1J. Omi1D. Mizushima1T. Ozawa3T. Fukuma1,2
1Kanazawa University, Japan, 2WPI-NanoLSI, Japan, 3KOBE STEEL, LTD, Japan
Tip-Enhanced Raman Spectroscopy of Aromatic Thiol Self-Assembled Monolayers on Au(111)
M. HongY. YokotaN. HayazawaE. KazumaY. Kim
RIKEN, Japan
Operand observation of the rechargeable Li-O2 battery reaction by environmental controlled electrochemical atomic force microscopy
M. KittaH. Sano
AIST-RIECEN, JAPAN
Plasmon-induced Photoreaction using Ag Nanocube Array
T. Iwahori1R. Yamazaki2T. Sasajima1A. Mizuno2A. Ono2,3Y. Uehara1S. Katano1
1Research Institute of Electrical Communication, Tohoku University, Japan, 2Graduated school of Integrated Science and Technology, Shizuoka University, Japan, 3Research Institute of Electronics, Shizuoka University, Japan
Time-resolved detection of water splitting reaction products by scanning electrochemical microscopy
T. Kosaka1Y. Teduka1T. Ogura1Y. Zhou2Y. Takahashi2T. Hisatomi3H. Nishiyama4K. Domen3,4H. Onishi1
1Department of Chemistry, Kobe University, Japan, 2Nano Life Science Institute, Kanazawa University, Japan, 3Interdisciplinary Cluster for Cutting Edge Research, Shinshu University, Japan, 4Office of University Professor, The University of Tokyo, Japan
Structural Defects on Ethynylene-bridged Anthracene Wires
B. Mallada1,2B. de la Torre1,2A. Sanchez-Grande3T. Chutora1,2D. Ecija3P. Jelinek1,2
1Regional Centre of Advanced Technologies and Materials, Czech Republic, 2The Czech Academy of Sciences, Czech Republic, 3IMDEA Nanociencia, Spain
Real-Time Monitoring of Morphological Change of Metal Surface During Corrosion Process with High-Speed Atomic Force Microscopy
T. Uchihashi1M. Okada2M. Tanaka2T. Kubo2T. Shimizu2
1Department of Physics, Nagoya University, Japan, 2National Institute of Advanced Industrial Science and Technology, Japan
Local Hydration Structure Measurements by Frequency-Modulation Atomic Force Microscopy with Instantaneous Frequency Method
N. FukazawaH. KominamiK. KobayashiH. Yamada
Department of Electronic science and Engineering, Kyoto University, Japan
In-Situ Electrochemical Lithiation/Delithiation Observations of Si Thin Film Anode
I. SharmaM. HaroA. PorkovichZ. ZiadiP. GrammatikopoulosM. Sowwan
Okinawa Institute of Science and Technology Graduate University 1919 1 Tancha, Onna s on, Okinawa 904 0495 Japan, Japan
Analysis of Oxidative Stress on Cancer Cell using Atomic Force Microscopy
S. Ugajin1A. Taninaka1H. Kurokawa2K. Saito1Y. Nagoshi1O. Takeuchi1H. Matsui2H. Shigekawa1
1Faculty of Pure and Applied Sciences, University of Tsukuba, Japan, 2Faculty of Medicine, University of Tsukuba, Japan
Nanoscale amorphization of Ge2Sb2Te5 by laser-driven STM
Y. Shinomiya1K. Asakawa2S. Yaguchi2D. Kim2K. Yoshioka2I. Katayama2Y. Arashida1,2S. Yoshida1H. Shigekawa1M. Kuwahara3J. Takeda2
1Faculty of Pure and Applied Sciences, University of Tsukuba, Tsukuba, Japan, 2Graduate School of Engineering Science, Yokohama National University, Japan, 3Sensing System Research Center, National Institute of Advanced Industrial Science and Technology, Japan
Control surface of PbI2 for high-performance UV photodetector
M. S. XuH. Xiao
College of Information Science and Electronic Engineering, State Key Lab of Silicon Materials, Zhejiang University, China
Ni silicide composition identified by combining scanning probe and spectroscopy
C.H.T. Chang1P.C. Jiang2Y.T. Chow3W.B. Su2J.S. Tsay3
1Department of Electronic Engineering, Minghsin University of Science and Technology, Hsinchu, 2Institute of Physics, Academia Sinica, Taipei, 3Department of Physics, National Taiwan Normal University, Taipei
Development of an atomic force microscope combined with a scanning electron microscope for investigation of electronic properties of an actual semiconductor device
T. Uruma1C. Tunemitu2K. Terao2N. Satoh3H. Yamamoto3K. Nakazawa2F. Iwata1,2
1Department of Optoelectronics and Nanostructure Science Graduate School of Science and Technology, Educational Division, Shizuoka University, Japan, 2Shizuoka University, Japan, 3Faculty of Engineering, Chiba Institute of Technology, Japan
Photo-response image measurement on Si(111) surfaces by using STM
N. HoriguchiK. Kurata
Muroran Institute of Technology, Japan
Surface roughness Dependence of Small Particle Adhesion Force Evaluated by Atomic Force Microscopy
T. Miwa1G. Miya2S. Kanno2
1Hitachi, Ltd., Research & Development Group, Japan, 2Hitachi High-Technologies Corp., Japan
Effect of Anneling Conditions on β-Ga2O3(-201) Surface Structures and Properties
M. Nakatani1A. Okada1R. A. Ferreyra2D. Ueda1K. Kadono1
1Graduate School of Science and Technology, Institute of Technology, Japan, 2LInE, ECyT, ICIFI, UNSAM-CONICET, Argentina
Evaluation of the Schottky barrier diode made of silicon carbide by multifunctional scanning probe microscope
K. NakayamaS. MasudaN. SatohH. Yamamoto
Grad. Sch. of Eng., Chiba Institute of Technology, Japan
Energy dissipation due to displacement of a Si adatom on Si(111)-(7×7) with noncontact atomic force microscopy
T. Shikichi1J.-I. Iwata2M. Tomitori3A. Oshiyama4T. Arai1
1Natural Science and Technology, Kanazawa University, Kanazawa, Ishikawa 920-1192, Japan, 2AdvanceSoft Corporation, Tokyo 101-0062, Japan, 3Japan Advanced Institute of Science and Technology, Nomi, Ishikawa 923-1292, Japan, 4IMaSS, Nagoya University, Nagoya, Aichi 464-8601, Japan
Ultimate High Conductivity probed by Multiprobe Scanning Tunneling Potentiometry on a High-Quality Graphite Thin Film
H. Mogi1T. Bamba1M. Murakami2Y. Kawashima2M. Yoshimura3A. Taninaka1S. Yoshida1O. Takeuchi1H. Shigekawa1
1University of Tsukuba, Japan, 2Kaneka corporation, Japan, 3Toyota Technological Institute, Japan
Anisotropic electrical conductance on a (001) surface of topological crystalline insulator (Pb,Sn)Se
Y. Guo1R. Hobara1R. Akiyama1H. Toyama1G. Mazur2T. Dietl2S. Hasegawa1
1Department of Physics, University of Tokyo, Japan, 2Polish Academy of Sciences, Poland
Directional mapping of the nanoscale flow patterns adopted by liquids near surfaces
L. PiantanidaA. F. PayamK. Voitchovsky
Physics Department, Durham University, United Kingdom
Photoacoustic Infrared Spectroscopy with AFM-IR
K. OjimaK. Yano
Canon Inc., Japan
Effect of Curcuminoid on Structure of Amyloid-β1-42 Oligomers
T. KanaiH. TaguchiN. NaruseY. Mera
Shiga University of Medical Science, Japan
Investigation of Mechanical Properties of Cellulose Nanofiber Composites by Nano-palpation Atomic Force Microscope
Q. ShenM. ItoX. LiangK. Nakajima
Tokyo Institute of Technology, Japan
Visualization of surface charge difference of lipid bilayers on mica substrate by scanning ion conductance microscopy
S. Kaihatsu1K. Shigyou2T. Ando2S. Watanabe2
1Kanazawa University, Japan, 2WPI-NanoLSI, Japan
Tip-enhanced Raman spectroscopy studies of free-base phenol-substituted porphyrin molecules on Ag(100)
H.F. Wang1Z.B. Zhang1Y.F. Zhang1H. Li1G. Chen1,2Y. Zhang1Y. Zhang1Z.C. Dong1
1Hefei National Laboratory for Physical Sciences at the Microscale and Synergetic Innovation Center of Quantum Information and Quantum Physics, University of Science and Technology of China, China, 2School of Physics and Engineering, Zhengzhou University, China
Molecular orientation change at solid/liquid interface under shear filed from in-situ measurement using sum-frequency generation spectroscopy
K. Miyake1S. Watanabe2S. Sasaki2
1AIST, Japan, 2Tokyo Univ. Sci., Japan
Author Index
| Adachi, K. | S4-4 | Kim, Y. | S4-23 | Shinomiya, Y. | S4-40 |
| Adachi, Y. | S7-4 | Kim, Y. | S4-24 | Shinomiya, Y. | S7-7 |
| Akiyama, R. | S4-50 | Kim, Y. | S4-25 | Shoji, Y. | S4-24 |
| Allain, P. | S7-5 | Kim, Y. | S4-31 | Sowwan, M. | S4-38 |
| Ando, A. | S5-4 | Kimura, K. | S4-23 | Su, W.B. | S4-42 |
| Ando, T. | S4-55 | Kimura, K. | S5-2 | Sugawara, Y. | S7-4 |
| Arafune, R. | S6-3 | Kinoshita, H. | S4-13 | Sugimura, H. | S2-2 |
| Arafune, R. | S6-4 | Kinoshita, Y. | S4-29 | Sugimura, H. | S4-9 |
| Arai, T. | S4-48 | Kitazawa, S. | S4-18 | Sugimura, H. | S4-22 |
| Araki, Y. | S4-10 | Kitta, M. | S4-32 | Sun, L. | S4-18 |
| Arashida, Y. | S4-6 | Kobayashi, D. | S4-2 | Suzuki, S. | S1-3 |
| Arashida, Y. | S4-27 | Kobayashi, D. | S7-5 | Tachizaki, T. | S7-7 |
| Arashida, Y. | S4-28 | Kobayashi, K. | S4-37 | Taguchi, H. | S4-53 |
| Arashida, Y. | S4-40 | Kobayashi, K. | S5-2 | Takagi, N. | S6-3 |
| Arashida, Y. | S7-7 | Kobayashi, K. | S7-2 | Takagi, N. | S6-4 |
| Asakawa, K. | S1-5 | Kominami, H. | S4-37 | Takaguchi, Y. | S1-6 |
| Asakawa, K. | S4-40 | Komiyama, S. | S8-4 | Takahashi, T. | S6-1 |
| Bamba, T. | S1-6 | Konno, H. | S4-18 | Takahashi, T. | S8-3 |
| Bamba, T. | S4-49 | Kosaka, T. | S4-34 | Takahashi, Y. | S4-34 |
| Cao, Duanyun. | S7-6 | Koshiji, S. | S4-26 | Takatoh, C. | S4-3 |
| Cao, Duanyun. | S8-5 | Koshino, Y. | S4-26 | Takeda, J. | S4-6 |
| Catalan, F. C. | S4-25 | Kubo, T. | S4-36 | Takeda, J. | S4-40 |
| Chang, C.H.T. | S4-42 | Kubo, T. | S5-4 | Takeda, K. | S5-3 |
| Chaunchaiyakul, S. | S4-24 | Kubota, W. | S4-9 | Takehiro, T. | S4-27 |
| Chen, G. | S4-56 | Kumagai, T. | S8-6 | Takeshita, M. | S7-2 |
| Chen, Ji. | S7-6 | Kurata, K. | S4-44 | Takeuchi, O. | S1-6 |
| Chen, Ji. | S8-5 | Kuribayashi-Shigetomi, K. | S4-16 | Takeuchi, O. | S4-26 |
| Chen, W. H. | S6-3 | Kurokawa, H. | S4-28 | Takeuchi, O. | S4-27 |
| Cheng, Bowei. | S8-5 | Kurokawa, H. | S4-39 | Takeuchi, O. | S4-28 |
| Chow, Y.T. | S4-42 | Kusumaatmaja, H. | S2-1 | Takeuchi, O. | S4-39 |
| Chutora, T. | S4-35 | Kuwahara, M. | S4-40 | Takeuchi, O. | S4-49 |
| Damiron, D. | S7-5 | Le Lay, G. | S1-1 | Takeuchi, O. | S7-7 |
| De Silva, K. K. H. | S1-3 | Li, H. | S4-56 | Takeya, J. | S4-23 |
| De Silva, K. K. H. | S1-4 | Li, Xin-zheng. | S8-5 | Tanaka, M. | S4-36 |
| De Silva, K. K. H. | S10-1 | Li, Xinzheng. | S7-6 | Tanaka, R. | S4-15 |
| Dietl, T. | S4-50 | Li, Y. J. | S7-4 | Tanaka, R. | S4-16 |
| Doi, A. | S7-3 | Liang, X. | S4-20 | Taniguchi, D. | S4-30 |
| Domen, K. | S4-34 | Liang, X. | S4-54 | Taninaka, A. | S1-6 |
| Dong, Z.C. | S4-56 | Lin, C. L. | S6-3 | Taninaka, A. | S4-26 |
| Ecija, D. | S4-35 | Lin, C. L. | S6-4 | Taninaka, A. | S4-28 |
| Endo, T. | S1-6 | Liu, H. | S4-20 | Taninaka, A. | S4-39 |
| Fantner, G.E. | S8-1 | Ma, Runze. | S7-6 | Taninaka, A. | S4-49 |
| Ferreyra, R. A. | S4-46 | Ma, Runze. | S8-5 | Teduka, Y. | S4-34 |
| Foster, A.S. | S4-4 | Mallada, B. | S4-35 | Terao, K. | S4-8 |
| Foster, W. | S2-1 | Masuda, S. | S4-47 | Terao, K. | S4-43 |
| Francisco, Joseph S. | S7-6 | Matsui, H. | S4-28 | Tian, Ye. | S7-6 |
| Fukazawa, K. | S4-5 | Matsui, H. | S4-39 | Tomitori, M. | S4-13 |
| Fukazawa, N. | S4-37 | Matsumoto, T. | S8-2 | Tomitori, M. | S4-48 |
| Fukuma, T. | S2-1 | Matsushima, H. | S9-2 | Tomitori, M. | S10-2 |
| Fukuma, T. | S4-3 | Mazur, G. | S4-50 | Tomiya, S. | S4-26 |
| Fukuma, T. | S4-4 | Mera, Y. | S4-53 | Toyama, H. | S4-50 |
| Fukuma, T. | S4-30 | Minamitani, E. | S6-4 | Toyota, K. | S4-15 |
| Fukushima, T. | S4-24 | Mishima, N. | S4-11 | Tsay, J.S. | S4-42 |
| Fukuzawa, R. | S6-1 | Miwa, K. | S4-23 | Tunemitu, C. | S4-43 |
| Ganser, C. | S5-3 | Miwa, T. | S4-45 | Uchihashi, T. | S1-5 |
| Gao, Yi Qin. | S8-5 | Miya, G. | S4-45 | Uchihashi, T. | S4-36 |
| Grammatikopoulos, P. | S4-38 | Miyake, K. | S4-57 | Uchihashi, T. | S5-3 |
| Guo, Jing. | S7-6 | Miyashita, N. | S4-4 | Ueda, D. | S4-46 |
| Guo, Jing. | S8-5 | Miyata, K. | S4-3 | Uehara, Y. | S4-33 |
| Guo, Y. | S4-50 | Miyata, K. | S4-4 | Ueno, H. | S4-27 |
| Hamada, M. | S6-2 | Miyata, Y. | S1-6 | Ueno, H. | S7-7 |
| Hapala, Prokop. | S8-5 | Miyazaki, M. | S7-4 | Ugajin, S. | S4-28 |
| Hara, M. | S4-7 | Miyazawa, K. | S2-1 | Ugajin, S. | S4-39 |
| Haro, M. | S4-38 | Miyazawa, K. | S4-3 | Uno, M. | S4-3 |
| Hasegawa, S. | S1-2 | Miyazawa, K. | S4-4 | Uruma, T. | S4-5 |
| Hasegawa, S. | S4-50 | Mizuno, A. | S4-33 | Uruma, T. | S4-43 |
| Hasegawa, T. | S4-11 | Mizushima, D. | S4-30 | Ushiki, T. | S4-17 |
| Hasegawa, T. | S4-19 | Mizutani, Y. | S4-17 | Utsunomiya, T. | S2-2 |
| Hasegawa, T. | S4-21 | Mogi, H. | S1-6 | Utsunomiya, T. | S4-9 |
| Hasegawa, Y. | S1-5 | Mogi, H. | S4-49 | Utsunomiya, T. | S4-22 |
| Hasegawa, Y. | S4-8 | Momotenko, D. | S5-1 | Viswanath, P. | S10-1 |
| Hasegawa, Y. | S6-2 | Murakami, M. | S4-49 | Voitchovsky, K. | S2-1 |
| Hashiguchi, G. | S4-5 | Nagai, S. | S4-26 | Voitchovsky, K. | S4-51 |
| Hasui, S. | S4-12 | Nagoshi, Y. | S4-39 | Wang, En-Ge. | S8-5 |
| Hayazawa, N. | S4-25 | Naitoh, Y. | S4-19 | Wang, Enge. | S7-6 |
| Hayazawa, N. | S4-31 | Nakada, T. | S4-10 | Wang, H.F. | S4-56 |
| He, Zhili. | S8-5 | Nakajima, K. | S4-20 | Wang, Z. | S1-6 |
| Hirata, K. | S4-30 | Nakajima, K. | S4-54 | Watanabe, S. | S4-18 |
| Hiraya, W. | S4-21 | Nakatani, M. | S4-46 | Watanabe, S. | S4-55 |
| Hirayama, T. | S2-3 | Nakayama, K. | S4-47 | Watanabe, S. | S4-57 |
| Hirori, H. | S4-27 | Nakayama, T. | S1-3 | Watanabe-Nakayama, T. | S4-18 |
| Hirori, H. | S7-7 | Nakazawa, K. | S4-5 | Weng, Q. | S8-4 |
| Hisatomi, T. | S4-34 | Nakazawa, K. | S4-17 | Wintterlin, J. | S9-1 |
| Hobara, R. | S4-50 | Nakazawa, K. | S4-43 | Xiao, H. | S4-41 |
| Hong, M. | S4-25 | Narita, A. | S7-1 | Xie, WenJun. | S8-5 |
| Hong, M. | S4-31 | Naruse, N. | S4-53 | Xu, Li-Mei. | S8-5 |
| Horiguchi, N. | S4-44 | Nishi, T. | S4-26 | Xu, Limei. | S7-6 |
| Housaka, A. | S4-18 | Nishiyama, H. | S4-34 | Xu, M. S. | S4-41 |
| Huang, H. I. | S6-3 | Ochiai, T. | S4-28 | Yaguchi, S. | S4-40 |
| Huang, H.-H. | S4-7 | Ogura, T. | S4-34 | Yamada, A. | S8-3 |
| Ichii, T. | S2-2 | Oguro, F. | S1-5 | Yamada, H. | S4-37 |
| Ichii, T. | S4-9 | Oigawa, H. | S1-6 | Yamada, H. | S5-2 |
| Ichii, T. | S4-22 | Ojima, K. | S4-19 | Yamada, H. | S7-2 |
| Ichikawa, S. | S4-22 | Ojima, K. | S4-52 | Yamada, Y. | S2-2 |
| Igarashi, I. | S4-6 | Okada, A. | S4-12 | Yamada, Y. | S4-22 |
| Iino, R. | S5-3 | Okada, A. | S4-46 | Yamamoto, H. | S4-43 |
| Ikarashi, T. | S4-3 | Okada, M. | S4-36 | Yamamoto, H. | S4-47 |
| Imada, H. | S4-23 | Okada, M. | S5-4 | Yamamoto, H. | S7-3 |
| Imada, H. | S4-24 | Okajima, T. | S4-15 | Yamamoto, S. | S4-30 |
| Imada, H. | S10-3 | Okajima, T. | S4-16 | Yamamoto, S.-I. | S5-4 |
| Imai-Imada, M. | S4-23 | Omi, J. | S4-30 | Yamazaki, R. | S4-33 |
| Irisawa, T. | S5-4 | Omura, A. | S4-14 | Yang, B. | S4-25 |
| Ishikawa, M. | S4-6 | Onishi, H. | S4-34 | Yang, H. -H. | S4-8 |
| Ishiwari, F. | S4-24 | Ono, A. | S4-33 | Yang, H. H. | S6-2 |
| Ito, M. | S4-54 | Oshiyama, A. | S4-48 | Yano, K. | S4-52 |
| Iwahori, T. | S4-33 | Ozawa, T. | S4-30 | Yokota, Y. | S4-25 |
| Iwata, F. | S4-5 | Payam, A. F. | S4-51 | Yokota, Y. | S4-31 |
| Iwata, F. | S4-17 | Peng, Jinbo. | S7-6 | Yoshida, S. | S1-6 |
| Iwata, F. | S4-43 | Peng, Jinbo. | S8-5 | Yoshida, S. | S4-6 |
| Iwata, J.-I. | S4-48 | Piantanida, L. | S4-51 | Yoshida, S. | S4-26 |
| Jelinek, P. | S4-35 | Porkovich, A. | S4-38 | Yoshida, S. | S4-27 |
| Jelínek, Pavel. | S8-5 | Razzakul, I. M. | S10-2 | Yoshida, S. | S4-28 |
| Jiang, P.C. | S4-42 | Saito, K. | S4-28 | Yoshida, S. | S4-40 |
| Jiang, Ying. | S7-6 | Saito, K. | S4-39 | Yoshida, S. | S4-49 |
| Jiang, Ying. | S8-5 | Sanchez-Grande, A. | S4-35 | Yoshida, S. | S7-7 |
| Joshi, P. | S4-7 | Sano, H. | S4-32 | Yoshida, Y. | S4-8 |
| Kadono, K. | S4-12 | Sasajima, T. | S4-33 | Yoshimura, M. | S1-3 |
| Kadono, K. | S4-46 | Sasaki, S. | S4-57 | Yoshimura, M. | S1-4 |
| Kadowaki, K. | S4-8 | Sato, Y. | S1-5 | Yoshimura, M. | S4-7 |
| Kaihatsu, S. | S4-55 | Satoh, N. | S4-43 | Yoshimura, M. | S4-12 |
| Kanai, T. | S4-53 | Satoh, N. | S4-47 | Yoshimura, M. | S4-28 |
| Kanehara, H. | S4-10 | Satoh, N. | S7-3 | Yoshimura, M. | S4-49 |
| Kanno, S. | S4-45 | Sawano, M. | S4-16 | Yoshimura, M. | S10-1 |
| Kashiwagi, T. | S4-8 | Sharma, I. | S4-38 | Yoshino, T. | S4-3 |
| Katano, S. | S4-33 | Shen, Q. | S4-54 | Yoshioka, K. | S4-40 |
| Katayama, I. | S4-6 | Shigekawa, H. | S1-6 | Yoshioka, Y. | S4-6 |
| Katayama, I. | S4-40 | Shigekawa, H. | S4-6 | Yuhara, J. | S1-1 |
| Kato, K. | S5-3 | Shigekawa, H. | S4-26 | Zeng, Xiao C. | S7-6 |
| Katsuno, H. | S4-10 | Shigekawa, H. | S4-27 | Zhang, C. | S4-24 |
| Katsura, Y. | S4-17 | Shigekawa, H. | S4-28 | Zhang, Q. | S7-4 |
| Kawakami, N. | S6-3 | Shigekawa, H. | S4-39 | Zhang, Y. | S4-56 |
| Kawakami, N. | S6-4 | Shigekawa, H. | S4-40 | Zhang, Y. | S4-56 |
| Kawakatsu, H. | S4-2 | Shigekawa, H. | S4-49 | Zhang, Y.F. | S4-56 |
| Kawakatsu, H. | S7-5 | Shigekawa, H. | S7-7 | Zhang, Z.B. | S4-56 |
| Kawashima, Y. | S4-49 | Shigyou, K. | S4-55 | Zhou, Y. | S4-34 |
| Kazuma, E. | S4-24 | Shikichi, T. | S4-48 | Zhu, Chongqin. | S7-6 |
| Kazuma, E. | S4-25 | Shimizu, T. | S4-36 | Ziadi, Z. | S4-38 |
| Kazuma, E. | S4-31 | Shimizu, T. | S5-4 | de la Torre, B. | S4-35 |
| Kim, D. | S4-40 | Shinomiya, Y. | S4-27 | | |