ICSPM29 Program
Contents
* Click speaker's name to see detail.
Dec 09 Thu
Opening (11:45-12:00)
Session 1 : (Onishi)
Dynamic Nature of Metal–Organic Framework Surfaces Imaged by Atomic Force Microscopy
N. Hosono
1The University of Tokyo, Japan, 2Kyoto University, Japan
Superconducting Transition in Ultrathin PbAu Surface Alloy
W. H. Chen1C. H. Chen2G. H. Chen1P. Amrit1F. X. Chen1P. J. Chen1C. K. Ku1C. T. Lee1J. Y. Li2W. C. Chen1I. Matsuda3C. Y. Mou2C. T. Wu1H. T. Jeng2S. J. Tang2C. L. Lin1
1National Yang Ming Chiao Tung University, Taiwan, 2National Tsing Hua University, Taiwan, 3The University of Tokyo, Japan
Development of Optical-pump Biasvoltage-probe Time-resolved STM
O. TakeuchiY. FujimakiT. KogureH. MogiY. ArashidaS. YoshidaA. TaninakaH. Shigekawa
University of Tsukuba, Japan
EFM/KPFM measurement of plasmon-induced charge separation on Au nano-particle/ TiO2 interface
T. MisakaK. KajimotoH. OhyamaT. Matsumoto
Osaka University, Japan
High resolution imaging of photoinduced dipoles on pentacene film by photoinduced force microscopy
T. YamamotoK. FukuzawaY. Sugawara
Osaka University, Japan
Near-Field Spectroscopy of the Thermally Excited Evanescent Waves
R. Sakuma1K.-T. Lin2F. Kimura1,2Y. Kajihara1,2,3
1Department of Precision Engineering, The University of Tokyo, Japan, 2Institute of Industrial Science, The University of Tokyo, Japan, 3JST PRESTO, Japan
Observation of Frequency Shift from N719/6-AHT/Au by Frequency-mode AFM
M. NakayamaK. KajimotoMing-chi. ChengT. YamadaH. OhoyamaT. Matsumoto
Department of Chemistry, Graduate School of Science, Osaka University, Japan
Break (14:00-14:15)
Session 2 : (Iwata)
Development of Time-resolved Multiprobe STM and Applications for Atomic Layered Materials
H. Mogi
University of Tsukuba, Japan
Scanning electrochemical microscopy for operand detection of O2 released on a SrTiO3 photocatalyst excited under water
T. Kosaka1T. Ando2Y. Takahashi2,3T. Hisatomi3,4H. Nishiyama5K. Domen5H. Onishi1
1Kobe University, Japan, 2Kanazawa University, Japan, 3JST, Japan, 4Shinshu University, Japan, 5The University of Tokyo, Japan
Nanoscale in situ study of adhesion property of ZDDP tribofilm using atomic force microscopy
K. Sato1S. Watanabe2S. Sasaki2
1Graduate School of Tokyo University of Science, Japan, 2Tokyo University of Science, Japan
Corrosion Mechanism of Aluminum Alloy at Grain Boundaries Investigated by in-Liquid Nanoscale Potential Measurement Technique
S. Yamamoto1D. Taniguchi1K. Hirata1T. Ozawa2T. Fukuma1
1Kanazawa University, Japan, 2KOBE STEEL, LTD, Japan
Investigation of Subnanometer-Scale Structures of Ionic Liquid/Au Electrode Interfaces by 3D-SFM
T. Ikarashi1R. Sakakibara1T. Yoshino1K. Miyazawa1T. Sumikama1K. Miyata1S. Shimizu2Y. Iwasa3,4T. Fukuma1
1Kanazawa University, Japan, 2CRIEPI, Japan, 3The University of Tokyo, Japan, 4RIKEN CEMS, Japan
Linear mobile structures at sulfonate-terminated alkanethiols/water interfaces investigated by 3D-AFM
M. MorimotoH. Asakawa
Kanazawa University, Japan
Neural Image Restoration for Time-lapse SPM Images
N. UkitaF. YasueK. ShinjoY. KondoH. MitsuboshiM. Yoshimura
Toyoa Technological Institute, Japan
Session 3 : Short presentation by exhibitors (Takeuchi)
16:30 S3-1 Tomoe Engineering Co., Ltd
New products of SPM probes
16:35 S3-2 Bruker Japan K.K. Nano Surfaces and Metrology Division
Introducing Bruker's Atomic Force Microscope and A New High-Speed Bio AFM
HORIBA's new analytical solution for Surface Science
16:45 S3-4 UNISOKU Co., Ltd.
Introduction improved Low Temperature SPM
16:50 S3-5 Scienta Omicron,Inc.
Introduction of vacuum cluster system named “Materials Innovation Platform: MIP” and related surface analysis tools “Scanning Probe Microscopy: SPM
16:55 S3-6 Park Systems Japan Inc.
The most accurate and easiest to use Atomic Force Microscope
17:00 S3-7 NanoAndMore Japan K.K.
With a short delivery time & a wide variety of selections! Introducing our AFM / SPM probes, acoustic insulation, and vibration isolation equipment.
Conference Photo (17:05-17:15)
Screen shot of the Zoom conference room will be taken as "Conference Photo."
If it is possible, enable your camera with your best smile!
Break (17:15-17:30)
Please prepare for the poster session.
Break (19:30-19:40)
Session 5 : (Miyata)
High Speed Atomic Force Microscopy to study self-assembly of viruses
W. H. Roos
Moleculaire Biofysica, Zernike Instituut, Rijksuniversiteit Groningen, Netherlands
The Study on High Speed Imaging Improvement Method of Scanning Ion Conductance microscopy
J. Zhuang
School of Mechanical Engineering, Xi’an Jiaotong University, China
High-resolution FM-AFM imaging of collage and its higher order structure in aqueous solution
S. KumagaiH. KominamiK. KobayashiH. Yamada
Dept. of Electronic Sci. & Eng., Kyoto Univ., Japan
Dynamic lateral force detection by bimodal AFM utilizing a qPlus sensor with a long probe
Y. Yamada1T. Ichii1T. Utsunomiya1K. Kimura2K. Kobayashi2H. Yamada2H. Sugimura1
1Dept. of Mater. Sci. & Eng., Kyoto Univ, Japan, 2Dept. of Electronic Sci. & Eng., Kyoto Univ., Japan
Comparative study on the surface characteristics between the cytoplasmic and extracellular sides of bacteriorhodopsin by FM-AFM
I. Kimura1H. Kominami1K. Kobayashi1Y. Hirata2H. Yamada1
1Department of Electronic Science and Engineering, Kyoto University, Japan, 2AIST, Japan
Developments in High-Speed AFM: Breaking Speed and Resolution Limits
G. R. Heath1S. Scheuring2,3
1School of Physics & Astronomy, University of Leeds, Leeds, LS2 9JT, United Kingdom, 2Weill Cornell Medicine, Department of Anesthesiology, 1300 York Avenue, New York, NY-10065, USA, 33Weill Cornell Medicine, Department of Physiology and Biophysics, 1300 York Avenue, New York, NY-10065, USA
Massively Parallel Cantilever-free Atomic Force Microscopy
W. Cao1N. Alsharif1Z. Huang2A.E. White1Y. Wan2K.A. Brown1
1Boston University, USA, 2University of Maryland, College Park, USA
Dec 10 Fri
Session 6 : (Sugawara)
Challenges in the application of spin-polarized STM to materials science
T. Miyamachi
1Institute of Materials and Systems for Sustainability (IMaSS), Nagoya University, Japan, 2Graduate School of Engineering and School of Engineering, Nagoya University, Japan
Spin- and Pseudospin-Dependent Tunneling Spectroscopy in Kagome Metal FeSn
J. Seo
Department of Emerging Materials Science, DGIST, Korea
Observation of Yu-Shiba-Rusinov State Enhancement for TbPc22/NbSe22 with Tb Nucleus Spin Resonance
F. AraMI. IkramSMF. ShahedT. Komeda
Institute of Multidisciplinary Research for Advanced Materials (IMRAM), Tohoku University, Japan
On-surface construction of host-guest molecule and rotational motion
T.K. Yamada1F. Nishino1C.H. Wang2M. Horie2R. Nemoto1T. Hosokai3Y. Hasegawa4K. Fukutani4S. Kera4
1Chiba University, Ja@an, 2National Tsing Hua University, Taiwan, 3National Institute of Advanced Industrial Science and Technology, Japan, 4Institute for Molecular Science, Japan
Silylene-Tethered Sonogashira Cross-Coupling on Ag(111)
K. Sun1K. Sagisaka1L. Peng2,3H. Watanabe2F. Xu2R. Pawlak4E. Meyer4Y. Okuda2A. Orita2S. Kawai1,5
1National Institute for Materials Science, Japan, 2Okayama University of Science, Japan, 3Hunan University of Science and Technology, China, 4University of Basel, Switzerland, 5University of Tsukuba, Japan
Quantitative Capacitance Measurements in Frequency Modulation Electrostatic Force Microscopy
R. Fukuzawa1T. Takahashi1,2
1Institute of Industrial Science, The University of Tokyo, Japan, 2Institute for Nano Quantum Information Electronics, The University of Tokyo, Japan
Break (15:00-15:15)
Session 7 : (Yamada)
Development of Scanning NV-Center Magnetometry Diamond Probe
T. An
Japan Advanced Institute of Science and Technology, Japan
Ultrathin Organic Ferroelectrics Self-Assembled on Monolayer Graphene
R. MatsumotoP. ViswanathM. HaraM. Yoshimura
Toyota Technological Institute, Japan
Time-resolved Photo-assisted Kelvin Probe Force Microscopy on Cu(In,Ga)Se2 Solar Cells
T. Kuroiwa1T. Takahashi1,2
1Institute of Industrial Science, The University of Tokyo, Japan, 2Institute for Nano Quantum Information Electronics, The University of Tokyo, Japan
Nanoscale Polarization Writing on Ultrathin Epitaxial Organic Ferroelectrics
P. Viswanath1L.S.R. Kumara2T. Koganezawa2K.K.H. De Silva1Y. Morikuni1V. Kesava Rao1M. Yoshimura1
1Toyota Technological Institute, Japan, 2Centre for Synchrotron Radiation Research, Japan
Effect of Substrate Surface Roughness on Two-Step CVD Growth of Large Area MoS2
A. Ando1T. Kubo1M. Ogura2S.-I. Yamamoto2T. Irisawa1
1National Institute of Advanced Industrial Science and Technology (AIST), Japan, 2Ryukoku University, Japan
Break (16:45-17:00)
Session 8 : (Kawai)
Substrate-induced Broken C4 Symmetry in Superconducting Monolayer FeSe/SrTiO3 - √13x√13
Wen. SiTomoaki. TanakaSatoru. IchinokuraToru. Hirahara
Department of Physics, Tokyo Institute of Technology., Japan
Peculiarities of the electronic transport in metal-induced reconstructions on silicon
A.V. MatetskiyN.V. DenisovL.V. BondarenkoA.Y. TupchayaA.N. MihalyukD.V. GruznevA.V. ZotovA.A. Saranin
Institute of Automation and control processes FEB RAS, Russia
Formation of Anti-phase Domain Boundaries as an Alternative to Phase Separation in 2D Ba-Ti-O/Pd(111) and Sr-Ti-O/Pd(111) Systems
M. HallerR. GlinskiF. WührlO. KrahnS. SchenkS. FörsterW. Widdra
Institute of Physics, University of Halle-Wittenberg, Germany
Giant energy dissipation on twisted bilayer graphene at the magic angle twist
A. Ollier1,2M. Kisiel2U. Gysin2E. Meyer2
1Swiss Nanoscience Institut, Switzerland, 2Departement of Physics, Switzerland
A millikelvin scanning tunneling microscope in ultra-high vacuum with adiabatic demagnetization refrigeration
T. Esat1,2P. Borgens1,3,7X. Yang1,3P. Coenen1,4V. Cherepanov1,4A. Raccanelli5,7F.S. Tautz1,2,3R. Temirov1,6
1Peter Grünberg Institute (PGI-3), Forschungszentrum Jülich, Germany, 2Jülich Aachen Research Alliance (JARA), Fundamentals of Future Information Technology, Germany, 3Experimentalphysik IV A, RWTH Aachen University, Germany, 4mProbes GmbH, Germany, 5Cryovac GmbH & Co KG, Germany, 6Faculty of Mathematics and Natural Sciences, Institute of Physics II, University of Cologne, Germany, 7Current address: Peter Grünberg Institute (Cryo-Lab), Forschungszentrum Jülich, Germany
Measuring sliding friction at the atomic scale
J. Weymouth
Institute of Experimental and Applied Physics, University of Regensburg, Germany
Awarding and Closing (18:45-19:00)
Session 4 : Poster Session
Dec 9 Thu 17:30-19:30
Under-sampled imaging method of scanning tunneling microscopy with compressed sensing algorithm
K. Ueda1,2Z. Diao2H. Yamashita2M. Abe2
1Tokyo Metropolitan Industrial Technology Research Institute, Japan, 2Graduate School of Engineering Science, Osaka University, Japan
Visualization of nanometer-scale three-dimensional structures of chromosomes by three-dimensional atomic force microscopy
R. Kojima1K. Miyazawa1K. Teramae1T. Sumikama1,2M. Meguro3K. Imadate4N. Okano1S. Horike3K. Hirahara4T. Fukuma1
1Kanazawa University, Japan, 2PRESTO, JST, Japan, 3Research Center for Experimental Modeling of Human Disease, Kanazawa University, Japan, 4Department of Mechanical Engineering, Osaka University, Japan
Structural transition of Au-Ga alloy crystals in molten Ga investigated by variable-temperature AFM
Y. AbeY. AibaT. IchiiT. UtsunomiyaH. Sugimura
Department of Materials Science and Engineering, Kyoto University, Japan
Structural analysis on an interface between molten Ga and Cu-Ga alloy by atomic force microscopy
N. SuzukiT. IchiiT. UtsunomiyaH. Sugimura
Department of Materials Science and Engineering, Kyoto University, Japan
Analysis of the elemental effects on the surface potential of aluminum alloy using machine learning
Y. Takara1T. Ozawa1M. Yamaguchi2
1Materials Research Laboratory, KOBE STEEL, LTD., Japan, 2Digital Innovation Technology Center, KOBE STEEL, LTD., Japan
A numerical simulation of stress relaxation atomic force microscopy
M. NakadaT. Okajima
Graduate School of Information Science & Technology, Hokkaido University, Sapporo 060-0814, Japan
High Quality Conductive and Transparent Monolayer Reduced Graphene Oxide Films by Chemical Reduction and Defect Restoration
K.K.H. De SilvaK. ShibataM. Yoshimura
Graduate School of Engineering, Toyota Technological Institute, Japan
Atom switch by STM current on SrTiO3(100)-√13×√13 surfaces
K. Kim1S. Yamazaki2D. Katsube3H. Yamashita1M. Abe1
1Graduate School of Engineering Science, Osaka University, Japan, 2Department of Physics, School of Science, Tokyo Institute of Technology, Japan, 3Department of Electrical, Electronics and Information Engineering, Nagaoka University of Technology, Japan
Development of Spin Detection System with Superconductor Photon Assisted Tunneling (SC-PAT)
MI. Hossain 1F. Ara1SMF. Shahed1T. Komeda1,2
1Institute of Multidisciplinary Research for Advanced Materials (IMRAM) Katahira 2-1-1, Aoba-ku, Sendai 980-8577, Japan, Japan, 2Department of Chemistry, Graduate School of Science, Tohoku University, Japan, Japan
Development of externally triggerable optical pump-probe scanning tunneling microscope with time resolution of approximately 70 ps
K. Iwaya1M. Yokota1H. Hanada1O. Takeuchi2H. Shigekawa2Y. Miyatake1
1UNISOKU Co., Ltd., Japan, 2University of Tsukuba, Japan
Scanning ion conductance microscopy with capacitance compensation using a double barrel nanopipette for improving imaging time
N. Fukuzawa1K. Nakazawa1F. Iwata1,2
1Graduate school of integrated science and technology, Shizuoka University, Japan, 2Research institute of electronics, Shizuoka University, Japan
Simulation in imaging method of surface topography and charge distribution in scanning Ion Conductance Microscopy with a double-barrel nanopipette
M. Ruiz1K. Nakazawa1F. Iwata1,2
1Graduate School of Integrated Science and Technology, Shizuoka University, Japan, 2Research Institute of Electronics, Shizuoka University, Japan
Combining high repetition subcycle MIR and THz pulses to study field-driven phenomena in condensed matters
N. UmedaY. ArashidaM. IshikawaA. HatanakaH. MogiS. YoshidaO. TakeuchiH. Shigekawa
Department of pure and applied physics, University of Tsukuba, Japan
Humidity-Controlled Atomic Force Microscopy Introducing High Speed Scanner
K. Kyomoto1Y. Miyato2H. Yamashita1M. Abe1
1Graduate School of Engineering Science, Osaka University, Japan, 2Faculty of Advanced Science and Technology, Ryukoku University, Japan
Fine Control of Tip Geometries by Asymmetric Wet Etching for Scanning Ion Conductance Microscopy
R. Yajima1S. Watanabe2
1Graduate School of Frontier Science Initiative, Kanazawa University, Japan, 2WPI Nano Life Science Institute (WPI-NanoLSI), Kanazawa University, Japan
Improvement in Dynamic Motion in a Hopping-Mode Scanning Ion Conductance Microscopy by a Feedforward-Multiple-Pulse Sequence
S. Kaneda1S. Watanabe2
1Graduate School of Natural Science and Technology, Kanazawa University, Japan, 2WPI Nano Life Science Institute (WPI-NanoLSI), Kanazawa University, Japan
Improving Q factor of mass unbalanced quartz tuning fork force sensor with dual piezo excitation
Y. KamoY. Kinoshita
Akita University, Japan
Real-time noise filtering utilized feature space in scanning ion conductance microscopy measurements
Y. Tatsuda1S. Watanabe2
1Graduate School of Natural Science and Technology, Kanazawa University, Japan, 2WPI Nano Life Science Institute (WPI-NanoLSI), Kanazawa University, Japan
Investigation of surface processing using a nanopipette SPM capable of irradiation of inductively coupled plasma based on optical emission spectroscopy
Y. Sano1K. Nakazawa1F. Iwata1,2
1Graduate School of Integrated Science and Technology, Shizuoka University, Japan, 2Research Institute of Electronics, Shizuoka University, Japan
Time-resolved measurement of tunneling current on MoTe2 using multi-terahertz STM
A. HatanakaY. ArashidaM. IshikawaH. MogiS. YoshidaO. TakeuchiH. Shigekawa
University of Tsukuba, Japan
Probing single molecule triplet lifetime by atomic force microscopy
J. Peng1S. Sokolov1D. Hernangómez-Pérez2F. Evers1L. Gross3J.M. Lupton1J. Repp1
1University of Regensburg, Germany, 2Weizmann Institute of Science, Israel, 3IBM Research–Zurich, Switzerland
Facile and Reproducible Fabrication of Ag probes for AFM based Tip-Enhanced Raman Spectroscopy
V. Kesava RaoM. Yoshimura
Surface Science Laboratory, Toyota Technological Institute, Japan
Evaluation of Small Particle Adhesion Force on Low Temperature Surface using Atomic Force Microscopy
T. MiwaT. Hashizume
1Tokyo Institute of Technology, Department of Physics, Japan, 2Hitachi, Ltd., Research & Development Group, Japan
Surface Potential Measurements of Micropatterned Aromatic Monolayers Covalently Attached to n-Si(111) via Si-C and Si-O bonds
M.C.T. GarciaT. UtsunomiyaT. IchiiH. Sugimura
Kyoto University, Japan
Optical properties of Mn doped ZnS thin films under gas-phase conditions and application to inorganic EL
T. KitawakiK. WaniT. ImaiS.-I. Yamamoto
Ryukoku University, Japan
Thermal Stability of β-Ga2O3(-201) Surface Morphology
N. NagaharaA. OkadaK. Kadono
Kyoto Inst. Tech., Japan
Phase Transition-induced Structural Change of Ge2Te2Sb5 Surface
S. Morita1J. Sakai2M. Kuwahara3S. Katano1
1Research Institute of Electrical Communication, Tohoku University, Japan, 2Toshima Manufacturing Company, Japan, 3National Institute of Advanced Industrial Science and Technology, Japan
STM Study of Thin Film Growth of SnO2 by Pulsed Laser Deposition
L. Hou1T. Ishibe1D. Katsube2Y. Nakamura1H. Yamashita1M. Abe1
1Graduate School of Engineering Science, Osaka University, Japan, 2Nagaoka Univ. Tech., Japan
Fabrication of large-area twisted bilayer TMDC moiré superlattice
T. Sato1K. Ito1J. Peng1H. Mogi1O. Takeuchi1S. Yoshida1Y. Miyata2H. Shigekawa1
1Institute of Applied Physics, University of Tsukuba, Japan, 2Department of Physics, Tokyo Metropolitan University, Japan
Local Strain-stress Evolution of Polymeric Materials Revealed by In-situ AFM Nanomechanical Mapping
H. LiuX. LiangK. Nakajima
School of Materials and Chemical Technology, Tokyo Institute of Technology, Japan
Stress relaxation behavior of developing embryo measured by atomic force microscopy
Y. TsuboyamaM. YokoboriT. MatsuboY. FujiiT. Okajima
Laboratory of Cellular and Tissue Engineering, Japan
Interaction of surface defects of titanium dioxide analyzed by image processing of scanning probe microscopy images
S. Tsubokura1H. Hioki2H. Noma1T. Minato3
1Ritsumeikan University, Japan, 2Kyoto University, Japan, 3Institute for Molecular Science, National Institutes of Natural Sciences, Japan
Quantifying mechanical property of epithelial cell dome by atomic force microscopy
K. ShigemuraK.K. ShigetomiA. SubagyoK. SueokaT. Okajima
Graduate School of Information Science & Technology, Hokkaido University, Japan
Nanomechanical properties of VUV-irradiated cyclo-olefin polymer investigated by atomic force microscopy
K. SakamotoT. IchiiT. UtsunomiyaH. Sugimura
Department of Materials Science and Engineering, Kyoto University, Japan
Direct Observation of Effects of Photodynamic Therapy using Atomic Force Microscopy
M. Kamiyanagi1A. Taninaka1,2Y. Nagoshi1S. Ugajin1H. Kurokawa3,4H. Matsui3O. Takeuchi1H. Shigekawa1
1Faculty of Pure and Applied Sciences, University of Tsukuba, Japan, 2TAKANO Co., LTD., Japan, 3Faculty of medicine, University of Tsukuba, Japan, 4MoBiol Technologies Co., Japan
Curcuminoids-induced Amyloid-β disassembly assessed by electrophoresis and AFM
A. MatsuiJ. P. BellierH. TaguchiN. NaruseY. Mera
Shiga University of Medical Science, Japan
Local current mapping of electrochemically-exfoliated graphene oxide after thermal-assisted photoreduction
Y. HirotomiW. KubotaT. UtsunomiyaT. IchiiH. Sugimura
Department of Materials Science and Engineering, Kyoto University, Japan
CVD synthesis of MoS2 by face-to-face supply using drop-casting method
M. Ogura1A. Ando2T. Imai1T. Ban1S.-I. Yamamoto1
1Ryukoku Univ., Japan, 2AIST, Japan
Nanoscale Observation of Light Emission from Reduced and Unreduced Graphene Oxide
S. KatanoT. SasajimaR. Kasama
RIEC, Tohoku University, Japan
Characterization of two-dimensional oxide nanosheets exfoliated from Ga-based liquid metal
N. MaedaM. NagaiT. ImaiS.-I. Yamamoto
Ryukoku, Univ., Japan
Coexistance of the multiple superstructures for a Dy-Cu surface alloy
A. Kadkhodazadeh1S. Mousavion1L. Lyu1B. Stadtmueller1,2M. Aeschlimann1
1Department of Physics and Research Center OPTIMAS, University of Kaiserslautern, Erwin-Schroedinger-Strasse 46, 67663 Kaiserslautern, Germany, 2Institute of Physics, Johannes Gutenberg University Mainz, Staudingerweg 7, 55128 Mainz, Germany
Surface charge dependent structure of ionic liquid/alkali halide interfaces investigated by atomic force microscopy
H.P. Mungse1S. Okudaira1M. Yamauchi2T. Ichii1T. Utsunomiya1S. Maruyama2Y. Matsumoto2H. Sugimura1
1Department of Materials Science & Engineering, Kyoto University, Japan, 2Department of Applied Chemistry, Tohoku University, Japan
STM-IETS Measurement of Exchange Interaction Energy of Radical Ligand and Metal 4f of SMM TbPc<sub>2</sub> on Superconductor NbSe<sub>2</sub>
S.M.F. ShahedM.I. HossainF. AraT. Komeda
Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Japan
First Principles Study of Fe<sub>2</sub>VAl and Fe<sub>2</sub>VAl/Si Thin Films and Their Magnetic Enhancement
K. Kobayashi1H. Takaki2M. Shimono3H. Ishii2N. Kobayashi2K. Hirose4N. Tsujii1T. Mori1
1International Center for Materials Nanoarchitechtonics (MANA), National Institute for Materials Science, Japan, 2Institute of Applied Physics, University of Tsukuba, Japan, 3Research Center for Structural Materials (RCSM), National Institute for Materials Science, Japan, 4NEC Corporation, Smart Energy Research Laboratories, Japan
Effect of Inductor Types and Shapes on the Characteristics of an Inorganic EL driven by Wireless Power Transmission
D. SatouT. KitawakiK. WaniS.-I. Yamamoto
Ryukoku Univ., Japan
Effect of anion on water-in-salt/solid interfacial structures investigated by atomic force microscopy
J. TsuyoshiY. BaoT. IchiiT. UtsunomiyaH. Sugimura
Department of Materials Science and Engineering, Kyoto University, Japan
On-Surface Synthesis of Multi-Block Co-Oligomers by Defluorinative Coupling of CF3-Substituted Aromatic Systems
S. Kawai1A. Ishikawa1S. Ishida2T. Yamakado2Y. Ma1K. Sun1Y. Tateyama1R. Pawlak3E. Meyer3S. Saito2A. Osuka2
1National Institute for Materials Science, Japan, 2Kyoto University, Japan, 3University of Basel, Switzerland
Investigating Intermediate States in Calcite Crystal Dissolution and Growth Processes by High-speed FM-AFM
K. Miyata1,2,3N. Miyashita2T. Nakagawa3Y. Kawagoe2T. Fukuma1,2,3
1Nano Life Science Institute (WPI-NanoLSI), Kanazawa University, Japan, 2Division of Electrical Engineering and Computer Science, Kanazawa University, Japan, 3Division of Frontier Engineering, Kanazawa University, Japan
Effect of additive metal salt on ionic liquid/Li4Ti5O12 electrode interfaces investigated by atomic force microscopy
Y. BaoT. IchiiT. UtsunomiyaH. Sugimura
Kyoto University, Japan
Local electrochemical measurement of all solid-state batteries using c-AFM
Y. MaedaM. KittaK. Kuratani
National Institute of Advanced Industrial Science and Technology (AIST), Japan
Evaluation of phosphonic acid self-assembled monolayers on aluminum oxide surfaces in aqueous solution
K. TakeishiY. YoshikawaT. OhtakeS.-I. Yamamoto
Ryukoku Univ., Japan
Author Index
| Abe, M. | S4-1 | Kinoshita, Y. | S4-17 | Satou, D. | S4-45 |
| Abe, M. | S4-8 | Kisiel, M. | S8-4 | Schenk, S. | S8-3 |
| Abe, M. | S4-14 | Kitawaki, T. | S4-25 | Scheuring, S. | S5-6 |
| Abe, M. | S4-28 | Kitawaki, T. | S4-45 | Seo, J. | S6-2 |
| Abe, Y. | S4-3 | Kitta, M. | S4-50 | Shahed, S.M.F. | S4-43 |
| Aeschlimann, M. | S4-41 | Kobayashi, K. | S4-44 | Shahed, SMF. | S4-9 |
| Aiba, Y. | S4-3 | Kobayashi, K. | S5-3 | Shahed, SMF. | S6-3 |
| Alsharif, N. | S5-7 | Kobayashi, K. | S5-4 | Shibata, K. | S4-7 |
| Amrit, P. | S1-2 | Kobayashi, K. | S5-5 | Shigekawa, H. | S1-3 |
| An, T. | S7-1 | Kobayashi, N. | S4-44 | Shigekawa, H. | S4-10 |
| Ando, A. | S4-38 | Koganezawa, T. | S7-4 | Shigekawa, H. | S4-13 |
| Ando, A. | S7-5 | Kogure, T. | S1-3 | Shigekawa, H. | S4-20 |
| Ando, T. | S2-2 | Kojima, R. | S4-2 | Shigekawa, H. | S4-29 |
| Ara, F. | S4-9 | Komeda, T. | S4-9 | Shigekawa, H. | S4-35 |
| Ara, F. | S4-43 | Komeda, T. | S4-43 | Shigemura, K. | S4-33 |
| Ara, F. | S6-3 | Komeda, T. | S6-3 | Shigetomi, K.K. | S4-33 |
| Arashida, Y. | S1-3 | Kominami, H. | S5-3 | Shimizu, S. | S2-5 |
| Arashida, Y. | S4-13 | Kominami, H. | S5-5 | Shimono, M. | S4-44 |
| Arashida, Y. | S4-20 | Kondo, Y. | S2-7 | Shinjo, K. | S2-7 |
| Asakawa, H. | S2-6 | Kosaka, T. | S2-2 | Si, Wen. | S8-1 |
| Ban, T. | S4-38 | Krahn, O. | S8-3 | Sokolov, S. | S4-21 |
| Bao, Y. | S4-46 | Ku, C. K. | S1-2 | Stadtmueller, B. | S4-41 |
| Bao, Y. | S4-49 | Kubo, T. | S7-5 | Subagyo, A. | S4-33 |
| Bellier, J. P. | S4-36 | Kubota, W. | S4-37 | Sueoka, K. | S4-33 |
| Bondarenko, L.V. | S8-2 | Kumagai, S. | S5-3 | Sugawara, Y. | S1-5 |
| Borgens, P. | S8-5 | Kumara, L.S.R. | S7-4 | Sugimura, H. | S4-3 |
| Brown, K.A. | S5-7 | Kuratani, K. | S4-50 | Sugimura, H. | S4-4 |
| Cao, W. | S5-7 | Kuroiwa, T. | S7-3 | Sugimura, H. | S4-24 |
| Chen, C. H. | S1-2 | Kurokawa, H. | S4-35 | Sugimura, H. | S4-34 |
| Chen, F. X. | S1-2 | Kuwahara, M. | S4-27 | Sugimura, H. | S4-37 |
| Chen, G. H. | S1-2 | Kyomoto, K. | S4-14 | Sugimura, H. | S4-42 |
| Chen, P. J. | S1-2 | Lee, C. T. | S1-2 | Sugimura, H. | S4-46 |
| Chen, W. C. | S1-2 | Li, J. Y. | S1-2 | Sugimura, H. | S4-49 |
| Chen, W. H. | S1-2 | Liang, X. | S4-30 | Sugimura, H. | S5-4 |
| Cheng, Ming-chi. | S1-7 | Lin, C. L. | S1-2 | Sumikama, T. | S2-5 |
| Cherepanov, V. | S8-5 | Lin, K.-T. | S1-6 | Sumikama, T. | S4-2 |
| Coenen, P. | S8-5 | Liu, H. | S4-30 | Sun, K. | S4-47 |
| De Silva, K.K.H. | S4-7 | Lupton, J.M. | S4-21 | Sun, K. | S6-5 |
| De Silva, K.K.H. | S7-4 | Lyu, L. | S4-41 | Suzuki, N. | S4-4 |
| Denisov, N.V. | S8-2 | Ma, Y. | S4-47 | Taguchi, H. | S4-36 |
| Diao, Z. | S4-1 | Maeda, N. | S4-40 | Takahashi, T. | S6-6 |
| Domen, K. | S2-2 | Maeda, Y. | S4-50 | Takahashi, T. | S7-3 |
| Esat, T. | S8-5 | Maruyama, S. | S4-42 | Takahashi, Y. | S2-2 |
| Evers, F. | S4-21 | Matetskiy, A.V. | S8-2 | Takaki, H. | S4-44 |
| Fujii, Y. | S4-31 | Matsubo, T. | S4-31 | Takara, Y. | S4-5 |
| Fujimaki, Y. | S1-3 | Matsuda, I. | S1-2 | Takeishi, K. | S4-51 |
| Fukuma, T. | S2-4 | Matsui, A. | S4-36 | Takeuchi, O. | S1-3 |
| Fukuma, T. | S2-5 | Matsui, H. | S4-35 | Takeuchi, O. | S4-10 |
| Fukuma, T. | S4-2 | Matsumoto, R. | S7-2 | Takeuchi, O. | S4-13 |
| Fukuma, T. | S4-48 | Matsumoto, T. | S1-4 | Takeuchi, O. | S4-20 |
| Fukutani, K. | S6-4 | Matsumoto, T. | S1-7 | Takeuchi, O. | S4-29 |
| Fukuzawa, K. | S1-5 | Matsumoto, Y. | S4-42 | Takeuchi, O. | S4-35 |
| Fukuzawa, N. | S4-11 | Meguro, M. | S4-2 | Tanaka, Tomoaki. | S8-1 |
| Fukuzawa, R. | S6-6 | Mera, Y. | S4-36 | Tang, S. J. | S1-2 |
| Förster, S. | S8-3 | Meyer, E. | S4-47 | Taniguchi, D. | S2-4 |
| Garcia, M.C.T. | S4-24 | Meyer, E. | S6-5 | Taninaka, A. | S1-3 |
| Glinski, R. | S8-3 | Meyer, E. | S8-4 | Taninaka, A. | S4-35 |
| Gross, L. | S4-21 | Mihalyuk, A.N. | S8-2 | Tateyama, Y. | S4-47 |
| Gruznev, D.V. | S8-2 | Minato, T. | S4-32 | Tatsuda, Y. | S4-18 |
| Gysin, U. | S8-4 | Misaka, T. | S1-4 | Tautz, F.S. | S8-5 |
| Haller, M. | S8-3 | Mitsuboshi, H. | S2-7 | Temirov, R. | S8-5 |
| Hanada, H. | S4-10 | Miwa, T. | S4-23 | Teramae, K. | S4-2 |
| Hara, M. | S7-2 | Miyamachi, T. | S6-1 | Tsubokura, S. | S4-32 |
| Hasegawa, Y. | S6-4 | Miyashita, N. | S4-48 | Tsuboyama, Y. | S4-31 |
| Hashizume, T. | S4-23 | Miyata, K. | S2-5 | Tsujii, N. | S4-44 |
| Hatanaka, A. | S4-13 | Miyata, K. | S4-48 | Tsuyoshi, J. | S4-46 |
| Hatanaka, A. | S4-20 | Miyata, Y. | S4-29 | Tupchaya, A.Y. | S8-2 |
| Heath, G. R. | S5-6 | Miyatake, Y. | S4-10 | Ueda, K. | S4-1 |
| Hernangómez-Pérez, D. | S4-21 | Miyato, Y. | S4-14 | Ugajin, S. | S4-35 |
| Hioki, H. | S4-32 | Miyazawa, K. | S2-5 | Ukita, N. | S2-7 |
| Hirahara, K. | S4-2 | Miyazawa, K. | S4-2 | Umeda, N. | S4-13 |
| Hirahara, Toru. | S8-1 | Mogi, H. | S1-3 | Utsunomiya, T. | S4-3 |
| Hirata, K. | S2-4 | Mogi, H. | S2-1 | Utsunomiya, T. | S4-4 |
| Hirata, Y. | S5-5 | Mogi, H. | S4-13 | Utsunomiya, T. | S4-24 |
| Hirose, K. | S4-44 | Mogi, H. | S4-20 | Utsunomiya, T. | S4-34 |
| Hirotomi, Y. | S4-37 | Mogi, H. | S4-29 | Utsunomiya, T. | S4-37 |
| Hisatomi, T. | S2-2 | Mori, T. | S4-44 | Utsunomiya, T. | S4-42 |
| Horie, M. | S6-4 | Morikuni, Y. | S7-4 | Utsunomiya, T. | S4-46 |
| Horike, S. | S4-2 | Morimoto, M. | S2-6 | Utsunomiya, T. | S4-49 |
| Hosokai, T. | S6-4 | Morita, S. | S4-27 | Utsunomiya, T. | S5-4 |
| Hosono, N. | S1-1 | Mou, C. Y. | S1-2 | Viswanath, P. | S7-2 |
| Hossain , MI. | S4-9 | Mousavion, S. | S4-41 | Viswanath, P. | S7-4 |
| Hossain, M.I. | S4-43 | Mungse, H.P. | S4-42 | Wan, Y. | S5-7 |
| Hou, L. | S4-28 | Nagahara, N. | S4-26 | Wang, C.H. | S6-4 |
| Huang, Z. | S5-7 | Nagai, M. | S4-40 | Wani, K. | S4-25 |
| Ichii, T. | S4-3 | Nagoshi, Y. | S4-35 | Wani, K. | S4-45 |
| Ichii, T. | S4-4 | Nakada, M. | S4-6 | Watanabe, H. | S6-5 |
| Ichii, T. | S4-24 | Nakagawa, T. | S4-48 | Watanabe, S. | S2-3 |
| Ichii, T. | S4-34 | Nakajima, K. | S4-30 | Watanabe, S. | S4-15 |
| Ichii, T. | S4-37 | Nakamura, Y. | S4-28 | Watanabe, S. | S4-16 |
| Ichii, T. | S4-42 | Nakayama, M. | S1-7 | Watanabe, S. | S4-18 |
| Ichii, T. | S4-46 | Nakazawa, K. | S4-11 | Weymouth, J. | S8-6 |
| Ichii, T. | S4-49 | Nakazawa, K. | S4-12 | White, A.E. | S5-7 |
| Ichii, T. | S5-4 | Nakazawa, K. | S4-19 | Widdra, W. | S8-3 |
| Ichinokura, Satoru. | S8-1 | Naruse, N. | S4-36 | Wu, C. T. | S1-2 |
| Ikarashi, T. | S2-5 | Nemoto, R. | S6-4 | Wührl, F. | S8-3 |
| Ikram, MI. | S6-3 | Nishino, F. | S6-4 | Xu, F. | S6-5 |
| Imadate, K. | S4-2 | Nishiyama, H. | S2-2 | Yajima, R. | S4-15 |
| Imai, T. | S4-25 | Noma, H. | S4-32 | Yamada, H. | S5-3 |
| Imai, T. | S4-38 | Ogura, M. | S4-38 | Yamada, H. | S5-4 |
| Imai, T. | S4-40 | Ogura, M. | S7-5 | Yamada, H. | S5-5 |
| Irisawa, T. | S7-5 | Ohoyama, H. | S1-7 | Yamada, T. | S1-7 |
| Ishibe, T. | S4-28 | Ohtake, T. | S4-51 | Yamada, T.K. | S6-4 |
| Ishida, S. | S4-47 | Ohyama, H. | S1-4 | Yamada, Y. | S5-4 |
| Ishii, H. | S4-44 | Okada, A. | S4-26 | Yamaguchi, M. | S4-5 |
| Ishikawa, A. | S4-47 | Okajima, T. | S4-6 | Yamakado, T. | S4-47 |
| Ishikawa, M. | S4-13 | Okajima, T. | S4-31 | Yamamoto, S. | S2-4 |
| Ishikawa, M. | S4-20 | Okajima, T. | S4-33 | Yamamoto, S.-I. | S4-25 |
| Ito, K. | S4-29 | Okano, N. | S4-2 | Yamamoto, S.-I. | S4-38 |
| Iwasa, Y. | S2-5 | Okuda, Y. | S6-5 | Yamamoto, S.-I. | S4-40 |
| Iwata, F. | S4-11 | Okudaira, S. | S4-42 | Yamamoto, S.-I. | S4-45 |
| Iwata, F. | S4-12 | Ollier, A. | S8-4 | Yamamoto, S.-I. | S4-51 |
| Iwata, F. | S4-19 | Onishi, H. | S2-2 | Yamamoto, S.-I. | S7-5 |
| Iwaya, K. | S4-10 | Orita, A. | S6-5 | Yamamoto, T. | S1-5 |
| Jeng, H. T. | S1-2 | Osuka, A. | S4-47 | Yamashita, H. | S4-1 |
| Kadkhodazadeh, A. | S4-41 | Ozawa, T. | S2-4 | Yamashita, H. | S4-8 |
| Kadono, K. | S4-26 | Ozawa, T. | S4-5 | Yamashita, H. | S4-14 |
| Kajihara, Y. | S1-6 | Pawlak, R. | S4-47 | Yamashita, H. | S4-28 |
| Kajimoto, K. | S1-4 | Pawlak, R. | S6-5 | Yamauchi, M. | S4-42 |
| Kajimoto, K. | S1-7 | Peng, J. | S4-21 | Yamazaki, S. | S4-8 |
| Kamiyanagi, M. | S4-35 | Peng, J. | S4-29 | Yang, X. | S8-5 |
| Kamo, Y. | S4-17 | Peng, L. | S6-5 | Yasue, F. | S2-7 |
| Kaneda, S. | S4-16 | Raccanelli, A. | S8-5 | Yokobori, M. | S4-31 |
| Kasama, R. | S4-39 | Repp, J. | S4-21 | Yokota, M. | S4-10 |
| Katano, S. | S4-27 | Roos, W. H. | S5-1 | Yoshida, S. | S1-3 |
| Katano, S. | S4-39 | Ruiz, M. | S4-12 | Yoshida, S. | S4-13 |
| Katsube, D. | S4-8 | Sagisaka, K. | S6-5 | Yoshida, S. | S4-20 |
| Katsube, D. | S4-28 | Saito, S. | S4-47 | Yoshida, S. | S4-29 |
| Kawagoe, Y. | S4-48 | Sakai, J. | S4-27 | Yoshikawa, Y. | S4-51 |
| Kawai, S. | S4-47 | Sakakibara, R. | S2-5 | Yoshimura, M. | S2-7 |
| Kawai, S. | S6-5 | Sakamoto, K. | S4-34 | Yoshimura, M. | S4-7 |
| Kera, S. | S6-4 | Sakuma, R. | S1-6 | Yoshimura, M. | S4-22 |
| Kesava Rao, V. | S4-22 | Sano, Y. | S4-19 | Yoshimura, M. | S7-2 |
| Kesava Rao, V. | S7-4 | Saranin, A.A. | S8-2 | Yoshimura, M. | S7-4 |
| Kim, K. | S4-8 | Sasajima, T. | S4-39 | Yoshino, T. | S2-5 |
| Kimura, F. | S1-6 | Sasaki, S. | S2-3 | Zhuang, J. | S5-2 |
| Kimura, I. | S5-5 | Sato, K. | S2-3 | Zotov, A.V. | S8-2 |
| Kimura, K. | S5-4 | Sato, T. | S4-29 | | |