ICSPM22 Program
Contents
* Click speaker's name to see detail.
Dec 11 Thu
Registration (12:00-14:00)
Wellcome address (14:00-14:05)
Session 1 : (K. Kobayashi & Z. C. Dong)
Epitaxial Silicene on ZrB2(0001): a Graphene-like Form of Silicon
A. Fleurence
1JAIST, Japan
Direct visualization of N impurity state in GaAs using STM
N. Ishida1M. Jo2T. Mano1T. Noda1Y. Sakuma1D. Fujita1
1National Institute for Materials Science, Japan, 2RIKEN, The Institute of Physical and Chemical Research, Japan
Atomic Force Microscopy Study of Initial and Secondary Oxidation Stages of the Si(111)-(7×7) Surface
J. Onoda1M. Ondracek2A. Yurtsever3P. Jelinek1,2Y. Sugimoto1
1Graduate School of Engineering, Osaka University, Japan, 2Institute of Physics, Academy of Sciences of the Czech Republic, Czech Republic, 3Institute of Scientific and Industrial Research, Osaka University, Japan
Control of Graphene Oxide Film Formation by Surface Modification of Substrates and the Morphological Changes during Methane-assisted Thermal Reduction
B.D. Muhammad ZikriH. ImaiR. SeinoT. TakamiT. Ogino
1Department of Physics, Electrical and Computer Engineering, Graduate School of Engineering, Yokohama National University, Japan
Coffee Break (15:20-15:40)
Session 2 : (A. Fleurence & S. Kurokawa)
Single-Molecule Raman Spectromicroscopy Goes Sub-Nanometer
Z.C. Dong
1University of Science and Technology of China, China
Site-Specific Scanning Spreading Resistance Microscopy (SS-SSRM) and Imaging of pn junctions on cross section within ultra-thin SRAM devices
L. Zhang1M. Koike1K. Hara2Y. Hayase2
1Advenced LSI Technology Lab., Corporate R & D Center, Toshiba Corporation, JAPAN, 2Semiconductor & Storage Products Company, Toshiba Corporation, JAPAN
Scanning Nonlinear Dielectric Microscopy for Visualization of Dopant Distribution in Amorphous Silicon Solar Cells
K. HiroseN. ChinoneY. Cho
1Research Institute of Electrical Communication, Tohoku University, Japan
Photovoltage Measurements by Photo-assisted KFM on Cu(In,Ga)Se2 Solar Cells under Light Illumination with Various Wavelengths
H. Yong1T. Minemoto3T. Takahashi1,2
1Institute of Industrial Science, The University of Tokyo, Japan, 2Institute for Nano Quantum Information Electronics, The University of Tokyo, Japan, 3College of Science and Engineering, Ritsumeikan University, Japan
Surface Potential and Capacitance on CdS/Cu(In,Ga)Se2 Multi-layers Characterized by Kelvin Probe Force Microscopy
T. Ishii1T. Minemoto3T. Takahashi1,2
1Institute of Industrial Science, The University of Tokyo, Japan, 2Institute for Nano Quantum Information Electronics, The University of Tokyo, Japan, 3College of Science and Engineering, Ritsumeikan University, Japan
Session 3 : Exhibitor's presentation (O. Takeuchi)
17:20 S3-1 UNISOKU Co., Ltd.
17:25 S3-2 Tec Corporation
17:30 S3-3 Bruker AXS K.K.
17:35 S3-4 Hitachi High-Tech Scence Corporation
17:40 S3-5 Omicron NanoTechnology Japan, Inc.
17:50 S3-7 Techscience Ltd.
17:55 S3-8 TOME Engineering Co., Ltd.
18:00 S3-9 SHIMADZU CORPORATION
18:10 S3-11 OLYMPUS CORPORATION
Dinner (18:20-19:40)
Dec 12 Fri
Breakfast (07:00-08:00)
Session 5 : (V. Jacques & T. Komeda)
Highly Sensitive Nuclear Magnetic Resonance and its Combination with Scanning Gate Technique
Y. Hirayama
1Graduate School of Science, Tohoku University, Japan, 2ERATO Nuclear Spin Electronics Project, JST, Japan, 3WPI-AIMR, Tohoku University, Japan
Direct observation of 1D and 2D topological edge states
H. W. Yeom
1Institute for Basic Science, Korea
Scanning Tunneling Spectroscopy Study of Graphene Nanoribbons Formed by Crystallographic Etching of HOPG Surface
O. KuboY. SugiyamaR. OmuraM. ShigeharaH. TabataN. MoriM. Katayama
1Osaka university, Japan
Visualization of Ce atoms and site dependent in-gap residual density of state in CeCoIn5
Y. Yoshida1H. Kim1Y. Haga2N. Tataiwa2S. Michito3Z. Fisk4Y. Hasegawa1
1ISSP, The University of Tokyo, Japan, 2Advanced Science Research Center, Japan Atomic Energy Agency, Japan, 3Center for Emergent Matter Science, RIKEN, Japan, 4Department of Physics and Astronomy, University of California, Irvine, USA
Site-specific Josephson Coupling between Two Superconductors at the Atomic Contacts
H. KimY. Hasegawa
1The Institute for Solid State Physics, The University of Tokyo, Japan
Coffee Break (10:05-10:25)
Session 6 : (H.W. Yeom & Y. Sugawara)
Imaging Magnetism at the Nanoscale with a Single Spin Microscope
V. Jacques
1Laboratoire Aime Cotton, CNRS, Uni. Paris-Sud and ENS Cachan, Orsay, France
Modulation of the Molecular Spintronic Properties of Adsorbed Copper Corroles by Detecting Kondo Resonance Mapping
T. Komeda1J. Liu1Z. Shen2F. Wu2
1IMRAM, Tohoku University, Japan, 2Nanjing University, China
Control of Single Molecular Electronic States Using STM Manipulation of Single Magnetic Atoms
S. NakashimaT.K. Yamada
1Graduate School of Advanced Material Science, Chiba University, Japan
Interplay between Current and Force on Si4 Atom Switch
S. Yamazaki1K. Maeda2Y. Sugimoto2M. Abe3P. Pou4,5L. Rodrigo4R. Perez4,5P. Mutombo6P. Jelinek2,6S. Morita1
1The Institute of Scientific and Industrial Research, Osaka Univ., Japan, 2Graduate School of Engineering, Osaka Univ., Japan, 3Graduate School of Engineering Science, Osaka Univ., Japan, 4Dpto de Fis. Teor. de la Mat. Cond., Univ. Autonoma de Madrid,, Spain, 55Cond. Matter Phys. Center (IFIMAC), Univ. Autonoma de Madrid, Spain, 6Inst. of Phys., Academy of Sciences of the Czech Republic, Czech Republic
Conference Photo (11:50-12:05)
Get together at the pool side with your best smile!
Lunch (12:05-13:10)
Session 7 : (T. Okajima & K. Nakajima)
Scanning Electrochemical Microscope (SECM) and Related Systems for Probing Localized Electrochemistry
T. Matsue
1Tohoku University, Japan
SPM Probing of Compliant Synthetic and Biological Microstructures
V. Tsukruk
1Georgia Institute of Technology, USA
Observation of selective adsorption of bio-molecules on polarization domain patterns on ferroelectric crystal surfaces
T. NakayamaA. IsobeT. Ogino
1Yokohama National University, Japan
Layer-Resolved Non-Newtonian Shear Response of Water Confined between Hydrophilic Surfaces
M. Kageshima
1Dept. Phys., Kansai Medical Univ., Japan
Hexadecane Liquid Structured on Salicylic Acid (110) Surface
Y. TanakaH. Onishi
1Kobe University, Japan
Coffee Break (15:15-15:35)
Session 8 : (V. Tsukruk & K. Miyake)
Molecular-scale Investigation of Mixed SO3-/OH SAMs by FM-AFM in Liquid
N. Inada1H. Asakawa2N. Oku1T. Fukuma1,2,3
1Divison of Electronical Eng. and Computer Sci., Kanazawa Univ., Japan, 2Bio-AFM Frontier Research Center, Kanazawa Univ., Japan, 3ACT-C, Japan Science and Technology Agency, Japan
Molecular-scale visualization of DNA strands with non-B DNA conformations using FM-AFM in liquids
H. Kominami1K. Kobayashi1,2H. Yamada2
1Dept. of Electronic Sci. & Eng., Kyoto University, Japan, 2The Hakubi Center for Adv. Res., Kyoto University, Japan
Chemical structures and mechanical properties of molecules studied by high-resolution force microscopy
S. Kawai
1Department of Physics, University of Basel, Switzerland., 2PRESTO, Japan Science and Technology Agency, Japan
Growth Control of Two-Dimensional Covalent Organic Frameworks
S. ClairO. OurdjiniT. FauryM. AbelL. Porte
1CNRS, Aix-Marseille University, IM2NP, France
Neuron-like signal generation and its chaotic analysis of single-walled carbon nanotube and nanoparticle complex
H. Tanaka1,2H. Tamukoh1T. Asai3T. Ogawa2
1Kyushu Institute of Technology, Japan, 2Osaka University, Japan, 3Hokkaido University, Japan
Break (17:05-18:30)
Banquet (18:30-21:00)
Dec 13 Sat
Breakfast (07:00-08:15)
Session 9 : (B. Rodriguez & H. Onishi)
Probe characterization and virtual reference probe for nanoscale morphology measurement
H. ItohC. M. WangJ. Niitsuma
1National Institute of Advanced Industrial Science and Technolog, Japan
Ultrafast Electron Spin Dynamics Investigated by Optical Pump-probe Scanning Tunneling Microscopy
Z.H. Wang1H. Okuyama1S. Yoshida1Y. Mera2O. Takeuchi1H. Shigekawa1
1University of Tsukuba, Japan, 2Shiga University of Medical Science, Japan
Efforts to Enhance Chemical Contrast between Atomic Species while Scanning with an all Optical Non-Contact Atomic Force Microscope.
D. Damiron1,2P. E. Allain1,2Y. Miyazaki1D. Kobayashi1K. Nagao1K. Edagawa1N. Sasaki3H. Kawakatsu1,2
1Institute of Industrial Science the University of Tokyo, Japan, 2LIMMS/CNRS-IIS, France, 3Graduate School of Informatics and Engineering, University of Electro-Communications, Tokyo, Japan
First Achievement of Optical Atomic Resolution Imaging of the α-Al2O3 (0001) Surface by Measuring Photon Induced Force
J. YamanishiT. TokuyamaY. NaitohY. J. LiY. Sugawara
1Department of Applied Physics, Graduate School of Engineering, Osaka University, Japan
Optical nano-thermometry with a sensitive near-field microscope
Y. Kajihara1S. Komiyama2
1Institute of Industrial Science, The University of Tokyo, Japan, 2Department of Basice Science, The University of Tokyo, Institute of Industrial Science, The University of Tokyo
Coffee Break (09:45-10:05)
Session 10 : (T. Takahashi & H. Kawakatsu)
Electrostatic Imaging in Liquid Environments: from Kelvin Probe Force Microscopy to Electrochemical Force Microscopy
B. Rodriguez
1School of Physics & Conway Institute of Biomolecular and Biomedical Research, University College Dublin, Belfield, Dublin 4, Ireland
Scanning Impedance Microscopic Study of Electrode-Channel Interface in Organic Field-Effect Transistors with Modified Electrodes
T. Kimura1K. Kobayashi1,2H. Yamada1
1Department of Electronic Science and Engineering, Kyoto University, Japan, 2The Hakubi Center for Advanced Research, Kyoto University, Japan
High-speed Atomic-resolution Imaging of Calcite Crystal Dissolution Process by FM-AFM
K. Miyata1H. Asakawa2T. Fukuma1,2,3
1Division of Electrical Eng. and Computer Sci., Kanazawa Univ., Japan, 2Bio-AFM Frontier Research Center, Kanazawa Univ., Japan, 3ACT-C, Japan Science and Technology Agency, Japan
Development of Compact Multiple-Probe AFM/KFM for Investigation of Neuromorphic Nanostructures
Y. Shingaya1D. Miao2J. Xu1R. Creasey1M. Aono1T. Nakayama1,2
1NIMS, Jaman, 2U. Tsukuba, Japan
Single-Walled Carbon Nanotube as the Probe of Scanning Tunneling Microscopy
M. Irita1Y. Homma1T. Miura2
1Department of Physics, Tokyo University of Science, Japan, 2UNISOKU Co., Ltd., Japan
Closing Remark (11:45-11:50)
Session 4 : Poster Session
Dec 11 Thu 19:30-21:30
Surface dissolution of LiMn2O4(111) model wafer electrodes in aqueous environments
M. Kitta1M. Kohyama1H. Onishi2
1AIST, JAPAN, 2Kobe Univ., JAPAN
Nanoscale Ferromagnetism around dislocations in Mn-doped SrTiO3
Y. Shimbo1I. Sugiyama1N. Shibata1,2Y. Ikuhara1,3,4
1Institute of Engineering Innovation, The University of Tokyo, Japan, 2PRESTO JST, Japan, 3Nanostructures Research Laboratory, Japan, 4WPI Advanced Institute for Materials Research, Japan
Strain Dependence of Electric Field Induced Ion Dynamics in SrTiO3 Measured by Electrochemical Strain Microscopy
I. Sugiyama1N. Shibata1,2Y. Ikuhara1,3,4
1Institute of Engineering Innovation, The University of Tokyo, Japan, 2PRESTO, JST, Japan, 3Nanostructures Research Laboratory, Japan Fine Ceramics Center, Japan, 4WPI Advanced Institute for Materials Research, Tohoku University, Japan
Imaging Mechanism of 3D Hydration Structure of CaF2-Water Interfaces Investigated by Simulation and Experiments
K. Miyazawa1N. Kobayashi1M. Watkins2A. L. Shluger2T. Fukuma1,3
1Division of Electrical Eng. and Computer Sci., Kanazawa University, Japan, 2London Center for Nanotechnol. and Department of Phys. and Astronomy, University College London, UK, 3ACT-C Japan Sci. and Technol. Agency, Japan
Subnanometer-scale Visualization of Outer Surface of Microtubules by FM-AFM in Liquid
K. Takao1H. Asakawa1K. Ikegami2M. Setou2T. Uchihashi3T. Fukuma1,4
1Division of Electrical Eng. and Computer Sci., Kanazawa Univ., Kanazawa 920-1192, Japan, 2Department of Cell Biol. and Anat., Hamamatsu Univ. School of Medicine, Hamamatsu 431-3192, Japan, 3Department of Physics, Kanazawa Univ., Kanazawa 920-1192, Japan, 4ACT-C, Japan Science and Technology Agency, Honcho 4-1-9, Kawaguchi 332-0012, Japan
Single polymer chain viscoelasticity investigated by atomic force microscopy
X. LiangK. Nakajima
1WPI Advanced Institute for Materials Research, Tohoku University, Japan
Effect of adsorbed-H atoms on Fe atoms in Fe3O4(001) film surfaces
S. HiuraA. IkeuchiA. SubagyoK. Sueoka
1Graduate School of Information Science and Technology, Hokkaido University, Japan
Development of a Single Cell Electroporation Method Using a Scanning Ion Conductance Microscope with a Theta Type Nanopipette
S. Sakurai1K. Yamazaki1T. Ushiki2F. Iwata1,3
1Faculty of Engineering, Shizuoka University, Japan, 2Graduate School of Medical and Dental Sciences, Japan, 3Research Institute of Electronics, Shizuoka University, Japan
Surface Potential Mapping of Sputtered All-Solid-State Lithium-Ion Batteries using Kelvin Probe Force Microscopy
H. MasudaN. IshidaD. Fujita
1National Institute for Materials Science, Japan
Cell Adhesion Measurement of a Single Cell Using a Self-sensitive Cantilever
S. Hashimoto1M. Adachi1F. Iwata1,2
1Faculty of Engineering, Shizuoka University, Japan, 2Research Institute of Electronics, Shizuoka University, Japan
STM/STS Study of Ultrathin Mg Films on Fe(001)-whisker
Y. Sakaguchi1L. Gerhard2T.K. Yamada1
1Graduate School of Advanced Integration Science, Chiba University, Japan, 2Institute o Physics, Karlsruhe Institute of Technology, Karlsruhe, Germany
Realizing stable spins in a single atom
T. Miyamachi1,2T. Schuh1T. Märkl1C. Bresch1A. Stöhr1T. Balashov1W. Wulfhekel1
1Karlsruhe Institute of Technology (KIT), Germany, 2ISSP, The University of Tokyo, Japan
Viscoelastic Contact by Atomic Force Microscope
K. NakajimaH. K. NguyenM. ItoD. WangS. Fujinami
1Tohoku University, Japan
Reconsideration of lateral force microscopy: friction on soft and adhesive materials
S. FujinamiK. Nakajima
1Tohoku University, Japan
Preparation of Atomically Flat Pt(111) Surfaces
H. TanakaM. Taniguchi
1The Institute of Scientific and Industrial Research, Osaka University, Japan
Investigation of local contact potential difference of Au nanoclusters on TiO2(110) surface by KPFM/STM
H.F. WenR. KanbayashiM. SuesadaY. NaitohY.J. LiY. Sugawara
1Department of Physics, Osaka University, Japan
Scanning Tunneling Microscopy Study on Ga/Si(111): Effect of Annealing and Initial Oxidation
T. Naeshirozako1A. Okada1K. Nishimura1M. Yoshimura2K. Kadono1
1Kyoto Institute of Technology, Japan, 2Toyota Technological Institute, Japan
Nanoprobe Characterization of Liquid-phase Exfoliated MoS2 Nanosheets
E. MiedaR. AzumiS. ShimadaA. Ando
1National Institute of Advanced Industrial Science and Technology (AIST), Japan
Force spectroscopy of an NH3-reacted Si(111)-(7×7) surface by non-contact AFM with different tip states
T. Arai1Y. Sakano1R. Inamura1M. Tomitori2
1Kanazawa University, Japan, 2Japan Advanced Institute of Science and Technology, Japan
Oxygen atom observation of Fe3O4(001) film surfaces by NC-AFM
K. HanazonoS. OishiT. MizunoH. HosoiA. IkeuchiS. HiuraK. Sueoka
1Graduate School of Information Science and Technology, Hokkaido University, Japan
Water wettability of Si surfaces prepared in an ultrahigh vacuum chamber
T. MiyagiA. SasaharaM. Tomitori
1Japan Advanced Institute of Science and Technology, Japan
Force sensor of a resonance frequency-retuned quartz tuning fork with a high Q-value for non-contact atomic force microscopy
H. OoeT. Arai
1Graduate school of natural science and technology, Kanazawa University, Japan
Electronic States of Two-Dimensional Topological Crystalline Insulators
K. Kobayashi
1Ochanomizu University, Japan
Microscopic Analysis of Electric Contact by Conductive-AFM
A. Omura1M. Fukuta1K. Miyake1T. Kondo2M. Onuma2
1Advanced Manufacturing Research Institute (AMRI), National Institute of Advanced Industrial Science and Technology (AIST), Japan, 2Yazaki Parts CO., LTD., Japan
Scanning tunneling microscope potentiometry on single layer graphene flakes
T. Koyama1H. Mogi1M. Yoshimura2O. Takeuchi1H. Shigekawa1
1Institute of Applied Physics, Univ. of Tsukuba, Japan, 2Toyota Technological Institute, Japan
Anisotropic electrical conductivity in ultrathin films of topological insulators grown on a vicinal Silicon substrate
N. Fukui1T. Hirahara2S. Hasegawa1
1Department of Physics, University of Tokyo, Japan, 2Department of Physics, Tokyo Institute of Technology, Japan
Cr impurity-induced Electronic States in ZnTe(110)
K. KanazawaT. NishimuraS. YoshidaH. ShigekawaS. Kuroda
1Graduate School of Pure and Applied Sciences University of Tsukuba, Japan
Electronic and magnetic properties of Mn/W(110) studied by Spin-Polarized STM
M. HazeY. YoshidaY. Hasegawa
1The University of Tokyo, Japan
Magnetic Exchange Force Microscopy Using Magnetic Tip Modulated by Ferromagnetic Resonance
E. ArimaK. IsoyamaI. YoshitakaY. NaitohY.J. LiY. Sugawara
1Department of Applied Physics, Graduate School of Engineering, Osaka University, Japan
High Resolution Magnetization Measurement of External-field-Switched Magnetic Nanodot Using Scanning Near-field Polarization Microscopy
R. TakahashiT. JinK. OhyamaV. NhatH. SoneY. YinS. Hosaka
1Graduate School of Sci. and Tech., Gunma University, Japan
Difference in Electronic Density of States between Isolated and Densely-Packed Silicene Nanoribbons
R. OmuraO. KuboM. ShigeharaH. TabataN. MoriM. Katayama
1Osaka University, Japan
Reaction of Hydrogen Plasma with HOPG Surface
M. YoshimuraS. Katafuchi
1Toyota Technological Institute, Japan
Effect of Substrate Steps on the Morphology of Transferred Graphene
T. NagamoriS. SuzukiM. Yoshimura
1Toyota Technological Institute, Japan
Looking into the Domain Boundaries in HOPG: Atomic Force Microscopy (AFM) and Electron Backscatter Diffraction (EBSD) Study
M. Yoshimura1T. Ikeda1H. Morita2
1Toyota Technological Institute, Japan, 2Oxford Instruments, Japan
Simultaneous Mesurement of Electirical Property and Contact Force of Conductive Carbon Nanofiver Probes
S. Tanaka1S. Matsui1K. Nakamura1K. Taniyama1M. Tanemura1M. Kitazawa2R. Ohta2
1Nagoya Institute of Technology., Japan, 2Olympus Co. Ltd., Japan
Annealing effect of alloy incorporated carbon nanofiber probes for magnetic force microscopy prepared by ion irradiation method
S. Matsui1S. Tanaka1M. Tanemura1M. Kitazawa2
1Nagoya Institute of Technology, Japan, 2Olympus Co. Ltd., Japan
Phase transition between charge density wave and Mott-Hubbard state in low dimensional organic conductor measured by low temperature STM
Y. Hosomi1T. Yoshida2S. Takaishi2M. Yamashita2S. Yoshida1O. Takeuchi1H. Shigekawa1
1Institute of Applied University of Tsukuba, Japan, 2Department of chemistry Touhoku university, Japan
Structures and Electronic Properties of Tungsten Oxide Nanowire Studied by Transmission Electron Microscopy Combined with Probe Techniques
A. Taninaka1G. Yazaki2T. Kizuka1
1Division of Materials Science, Faculty of Pure and Applied Sciences, University of Tsukuba, Japan, 2Materials Science, Graduate School of Pure and Applied Sciences, University of Tsukuba, Japan
Spatial Variation of Bond Formation Probability and Rupture Force in Dynamic Force Spectroscopy on Biotin-Streptavidin System
A. TaninakaK. AizawaT. HanyuO. TakeuchiH. Shigekawa
1Faculty of Pure and Applied Sciences, University of Tsukuba, Japan
Terahertz near-field microscopy without external illumination
Y. Kajihara1S. Komiyama2K-.T. Lin1S. Kim1
1Institute of Industrial Science, The University of Tokyo, Japan, 2Department of Basice Science, The University of Tokyo, Japan
Evaluation of Probe Temperature during Measurements of Tip-enhanced Raman Spectroscopy
M. MochizukiT. YanoM. HaraT. Hayashi
1Tokyo Institute of Technology, Japan
Electromagnetic properties of scanning tunneling microscope tip–sample gap in the THz frequency range
Y. Uehara1S. Katano1M. Kuwahara2T. Suzuki3
1Tohoku University, Japan, 2National Institute of Advanced Industrial Science and Technology, Japan, 3Sendai National College of Technology, Japan
The Development of Femtosecond Time-resolved Scanning Tunneling Microscopy for Probing Ultrafast Coherent Phonon Dynamics
M. ShigenoZH. WangT. KishizawaS. YoshidaO. TakeuchiH. Shigekawa
1Institute of Applied Physics, University of Tsukuba, Japan
Inter-nanospace atom manipulation for cluster assembly
Y. Sugimoto1A. Yurtsever2N. Hirayama1M. Abe3S. Morita2
1Graduate School of Engineering, Osaka University, Japan, 2The Institute of Scientific and Industrial Research, Osaka University, Japan, 3Graduate School of Engineering Science, Osaka University, Japan
Fabrication of a Single Silver Nanoparticle on Si(111) Using Scanning Tunneling Microscope Tip
S. KatanoM. HotsukiY. Uehara
1RIEC, Tohoku University, Japan
Site-dependent Electronic Structures of a Single Molecule on a Metal Surface Studied by Scanning Tunneling Microscopy
S. Katano1M. Hori2,3Y. Kim2M. Kawai2,3
1RIEC, Tohoku University, Japan, 2RIKEN, Japna, 3Department of Advanced Materials Science, The University of Tokyo, Japan
An Attempt to Contact Two STM Tips at Both Surfaces of Free-Standing Graphene
S. KurokawaK. ShizumeA. Sakai
1Kyoto University, Japan
Nanopatterning of Suspended Graphene Films by Local Catalytic Etching Using an Ag-Coated Atomic Force Microscopy Probe
D. MashiyamaT. Ogino
1Graduate School of Engineering, Yokohama National University, Japan
Surface and subsurface electronic states of Fe3O4(001) thin film
A. IkeuchiS. HiuraA. SubagyoK. Sueoka
1Graduate School of Information Science and Technology, Hokkaido University, Japan
Density Profile of SiO2 Films and Its Relation with TDDB Lifetime
R. HasunumaM. HayashiK. Yamabe
1University of Tsukuba, Japan
Change in water wettability under Cassie-Baxter law for SiO2 patched overlayers epitaxially grown on a rutile TiO2 (110) surface
L. TuS. AkiraT. Masahiko
1Japan Advanced Institute of Science and Technology, Japan
(2n×1) Reconstructions of TiO2(011) Revealed by Atomic Force Microscopy and Scanning Tunneling Microscopy
J. Onoda1C.L. Pang2A. Yurtsever3Y. Sugimoto1G. Thomton2
1Graduate School of Engineering, Osaka University, Japan, 2Department of Chemistry and London Centre for Nanotechnology, University College London, UK, 3Institute of Scientific and Industrial Research, Osaka University, Japan
Vesicle Fusion into Supported Lipid Bilayer on SiO2 Substrates Observed by Atomic Force Microscopy
A. OshimaA. TanakaY. KashimuraK. Sumitomo
1NTT Basic Research Laboratories, Japan
Origin of Cell-to-Cell Mechanical Variation Investigated by Atomic Force Microscopy
P.G. CaiT. Okajima
1Graduate School of Information Science and Technology, Hokkaido University, Japan
Noise consideration for extraction of information from frequency shift curves for chemical contrast -Algorithms for treating quantitative data into physical parameters-
Y. Miyazaki1P.E. Allain1,2D. Damiron1,2D. Kobayashi1K. Nagao1K. Edagawa1N. Sasaki3H. Kawakatsu1,2
1Institute of Industrial Science the University of Tokyo, Japan, 2LIMMS/CNRS-IIS, France, 3Graduate School of Informatics and Engineering, University of Electro-Communications, Tokyo, Japan
Control of STM Tip Radii
T. AbeT.K. Yamada
1Graduate School of Advanced Material Science, Chiba University, Japan
Si Probe Attached QPlus Sensor for Imaging in Liquid Environment
T. IchiiK. OmoriN. TagaiT. UchidaT. UtsunomiyaH. Sugimura
1Department of Materials Science and Engineering, Kyoto University, Japan
A Versatile UHV FIMAFM
H. NishizawaD. KobayashiH. Kawakatsu
1Institute of Industrial Science, UTokyo, Japan
Highly Insulative and Transparent MgO Thin Films Doped Nanoparticles Prepared by Arc Plasma Gun
S.-I. YamamotoH. Kosuga
1Ryukoku University, Japan
Formation of Homochiral Glycine/Cu(111) Quantum Corral Array Realized Using Alanine Nuclei
M. Nakamura1H. Huang2K. Kanazawa1A. Taninaka1S. Yoshida1O. Takeuchi1H. Shigekawa1
1University of Tsukuba, Japan, 2Hefei University, China
Three-dimensional visualization of molecular conformation effect on single molecular conductance
M. Nakamura1S. Yoshida1Y. Mera2O. Takeuchi1H. Shigekawa1
1University of Tsukuba, Japan, 2The University of Tokyo, Japan
New Insights into Morphology of the High–Efficiency Low Band Gap Polymer-Fullerene Bulk Heterojunction Solar Cells
D. Wang1F. Liu2T. P. Russell2K. Nakajima1
1WPI–Advanced Institute for Materials Research (WPI-AIMR), Tohoku University, Japan, 2Department of Polymer Science and Engineering, University of Massachusetts, Amherst, USA
Local Electrical Property Measurements of Crystalline Thin Films of Alkyl-Substituted Semiconducting Molecules by Dual-Probe AFM
T. Shimizu1Y. Yamagishi1K. Kobayashi1,2H. Yamada1
1Dept. of Electronic Sci. & Eng.,Kyoto Univ, Japan, 2The Hakubi Center for Adv. Res, Kyoto Univ, Japan
Control of Porphyrin UHV Sublimation with Molecular Modification
M. Shimasaki1H. Yorimitsu2T.K. Yamada1
1Graduate School of Advanced Material Science, Chiba University, Japan, 2Graduate School of Science, Kyoto University, Japan
Fast FM Demodulator Based on Time Domain Measurement
D. KobayashiH. Kawakatsu
1Institute of Industrial Science, the University of Tokyo, Japan
Measurements of Anisotropic Conductivity in WSe2 Nanosheets
A. Ando1N. Ninomiya2,1T. Mori1T. Shimizu1K. Ueno3
1National Institute of Advanced Industrial Science and Technology, Japan, 2Yokohama National University, Japan, 3Saitama University, Japan
Local Characteristics of P3HT:PCBM Bulk-hetero Junction Organic Solar Cell by Light-Modulated STM/AFM
T. Ochiai1,2T. Yasuda3H. Kato1Y. Kobayashi1Y. Yoshida1O. Takeuchi1H. Shigekawa1
1Institute of Applied Physics, University of Tsukuba, Japan, 2Takano Co., Ltd.,, Japan, 3NIMS, Japan
Analysis of energy dissipation in FM-AFM caused by the association and dissociation processes of surface micelles
K. Suzuki1K. Kobayashi2N. Oyabu1K. Matsushige1H. Yamada1
1Department of Electronic Science and Engineering, Kyoto University, Japan, 2The Hakubi Center for Advanced Research, Kyoto University, Japan
STM Light Emission Spectroscopy on P3HT:PCBM Solar Cell
K. Naito1K. Murao1T. Yasuda2T. Ochiai1,3S. Yoshida1O. Takeuchi1H. Shigekawa1
1University of Tsukuba, Japan, 2NIMS, Japan, 3Takano Co., Ltd., Japan
Author Index
| Abe, M. | S4-44 | Kobayashi, K. | S10-2 | Shigekawa, H. | S4-39 |
| Abe, M. | S6-4 | Kobayashi, N. | S4-4 | Shigekawa, H. | S4-43 |
| Abe, T. | S4-56 | Kobayashi, Y. | S4-67 | Shigekawa, H. | S4-60 |
| Abel, M. | S8-4 | Kohyama, M. | S4-1 | Shigekawa, H. | S4-61 |
| Adachi, M. | S4-10 | Koike, M. | S2-2 | Shigekawa, H. | S4-67 |
| Aizawa, K. | S4-39 | Komeda, T. | S6-2 | Shigekawa, H. | S4-69 |
| Akira, S. | S4-51 | Kominami, H. | S8-2 | Shigekawa, H. | S9-2 |
| Allain, P. E. | S9-3 | Komiyama, S. | S4-40 | Shigeno, M. | S4-43 |
| Allain, P.E. | S4-55 | Komiyama, S. | S9-5 | Shimada, S. | S4-18 |
| Ando, A. | S4-18 | Kondo, T. | S4-24 | Shimasaki, M. | S4-64 |
| Ando, A. | S4-66 | Kosuga, H. | S4-59 | Shimbo, Y. | S4-2 |
| Aono, M. | S10-4 | Koyama, T. | S4-25 | Shimizu, T. | S4-63 |
| Arai, T. | S4-19 | Kubo, O. | S4-31 | Shimizu, T. | S4-66 |
| Arai, T. | S4-22 | Kubo, O. | S5-3 | Shingaya, Y. | S10-4 |
| Arima, E. | S4-29 | Kuroda, S. | S4-27 | Shizume, K. | S4-47 |
| Asai, T. | S8-5 | Kurokawa, S. | S4-47 | Shluger, A. L. | S4-4 |
| Asakawa, H. | S4-5 | Kuwahara, M. | S4-42 | Sone, H. | S4-30 |
| Asakawa, H. | S8-1 | Li, Y. J. | S9-4 | Stöhr, A. | S4-12 |
| Asakawa, H. | S10-3 | Li, Y.J. | S4-16 | Subagyo, A. | S4-7 |
| Azumi, R. | S4-18 | Li, Y.J. | S4-29 | Subagyo, A. | S4-49 |
| Balashov, T. | S4-12 | Liang, X. | S4-6 | Sueoka, K. | S4-7 |
| Bresch, C. | S4-12 | Lin, K-.T. | S4-40 | Sueoka, K. | S4-20 |
| Cai, P.G. | S4-54 | Liu, F. | S4-62 | Sueoka, K. | S4-49 |
| Chinone, N. | S2-3 | Liu, J. | S6-2 | Suesada, M. | S4-16 |
| Cho, Y. | S2-3 | Maeda, K. | S6-4 | Sugawara, Y. | S4-16 |
| Clair, S. | S8-4 | Mano, T. | S1-2 | Sugawara, Y. | S4-29 |
| Creasey, R. | S10-4 | Masahiko, T. | S4-51 | Sugawara, Y. | S9-4 |
| Damiron, D. | S4-55 | Mashiyama, D. | S4-48 | Sugimoto, Y. | S1-3 |
| Damiron, D. | S9-3 | Masuda, H. | S4-9 | Sugimoto, Y. | S4-44 |
| Dong, Z.C. | S2-1s | Matsue, T. | S7-1p | Sugimoto, Y. | S4-52 |
| Edagawa, K. | S4-55 | Matsui, S. | S4-35 | Sugimoto, Y. | S6-4 |
| Edagawa, K. | S9-3 | Matsui, S. | S4-36 | Sugimura, H. | S4-57 |
| Faury, T. | S8-4 | Matsushige, K. | S4-68 | Sugiyama, I. | S4-2 |
| Fisk, Z. | S5-4 | Mera, Y. | S4-61 | Sugiyama, I. | S4-3 |
| Fleurence, A. | S1-1i | Mera, Y. | S9-2 | Sugiyama, Y. | S5-3 |
| Fujinami, S. | S4-13 | Miao, D. | S10-4 | Sumitomo, K. | S4-53 |
| Fujinami, S. | S4-14 | Michito, S. | S5-4 | Suzuki, K. | S4-68 |
| Fujita, D. | S1-2 | Mieda, E. | S4-18 | Suzuki, S. | S4-33 |
| Fujita, D. | S4-9 | Minemoto, T. | S2-4 | Suzuki, T. | S4-42 |
| Fukui, N. | S4-26 | Minemoto, T. | S2-5 | Tabata, H. | S4-31 |
| Fukuma, T. | S4-4 | Miura, T. | S10-5 | Tabata, H. | S5-3 |
| Fukuma, T. | S4-5 | Miyagi, T. | S4-21 | Tagai, N. | S4-57 |
| Fukuma, T. | S8-1 | Miyake, K. | S4-24 | Takahashi, R. | S4-30 |
| Fukuma, T. | S10-3 | Miyamachi, T. | S4-12 | Takahashi, T. | S2-4 |
| Fukuta, M. | S4-24 | Miyata, K. | S10-3 | Takahashi, T. | S2-5 |
| Gerhard, L. | S4-11 | Miyazaki, Y. | S4-55 | Takaishi, S. | S4-37 |
| Haga, Y. | S5-4 | Miyazaki, Y. | S9-3 | Takami, T. | S1-4 |
| Hanazono, K. | S4-20 | Miyazawa, K. | S4-4 | Takao, K. | S4-5 |
| Hanyu, T. | S4-39 | Mizuno, T. | S4-20 | Takeuchi, O. | S4-25 |
| Hara, K. | S2-2 | Mochizuki, M. | S4-41 | Takeuchi, O. | S4-37 |
| Hara, M. | S4-41 | Mogi, H. | S4-25 | Takeuchi, O. | S4-39 |
| Hasegawa, S. | S4-26 | Mori, N. | S4-31 | Takeuchi, O. | S4-43 |
| Hasegawa, Y. | S4-28 | Mori, N. | S5-3 | Takeuchi, O. | S4-60 |
| Hasegawa, Y. | S5-4 | Mori, T. | S4-66 | Takeuchi, O. | S4-61 |
| Hasegawa, Y. | S5-5 | Morita, H. | S4-34 | Takeuchi, O. | S4-67 |
| Hashimoto, S. | S4-10 | Morita, S. | S4-44 | Takeuchi, O. | S4-69 |
| Hasunuma, R. | S4-50 | Morita, S. | S6-4 | Takeuchi, O. | S9-2 |
| Hayase, Y. | S2-2 | Muhammad Zikri, B.D. | S1-4 | Tamukoh, H. | S8-5 |
| Hayashi, M. | S4-50 | Murao, K. | S4-69 | Tanaka, A. | S4-53 |
| Hayashi, T. | S4-41 | Mutombo, P. | S6-4 | Tanaka, H. | S4-15 |
| Haze, M. | S4-28 | Märkl, T. | S4-12 | Tanaka, H. | S8-5 |
| Hirahara, T. | S4-26 | Naeshirozako, T. | S4-17 | Tanaka, S. | S4-35 |
| Hirayama, N. | S4-44 | Nagamori, T. | S4-33 | Tanaka, S. | S4-36 |
| Hirayama, Y. | S5-1p | Nagao, K. | S4-55 | Tanaka, Y. | S7-5 |
| Hirose, K. | S2-3 | Nagao, K. | S9-3 | Tanemura, M. | S4-35 |
| Hiura, S. | S4-7 | Naito, K. | S4-69 | Tanemura, M. | S4-36 |
| Hiura, S. | S4-20 | Naitoh, Y. | S4-16 | Taniguchi, M. | S4-15 |
| Hiura, S. | S4-49 | Naitoh, Y. | S4-29 | Taninaka, A. | S4-38 |
| Homma, Y. | S10-5 | Naitoh, Y. | S9-4 | Taninaka, A. | S4-39 |
| Hori, M. | S4-46 | Nakajima, K. | S4-6 | Taninaka, A. | S4-60 |
| Hosaka, S. | S4-30 | Nakajima, K. | S4-13 | Taniyama, K. | S4-35 |
| Hosoi, H. | S4-20 | Nakajima, K. | S4-14 | Tataiwa, N. | S5-4 |
| Hosomi, Y. | S4-37 | Nakajima, K. | S4-62 | Thomton, G. | S4-52 |
| Hotsuki, M. | S4-45 | Nakamura, K. | S4-35 | Tokuyama, T. | S9-4 |
| Huang, H. | S4-60 | Nakamura, M. | S4-60 | Tomitori, M. | S4-19 |
| Ichii, T. | S4-57 | Nakamura, M. | S4-61 | Tomitori, M. | S4-21 |
| Ikeda, T. | S4-34 | Nakashima, S. | S6-3 | Tsukruk, V. | S7-2s |
| Ikegami, K. | S4-5 | Nakayama, T. | S7-3 | Tu, L. | S4-51 |
| Ikeuchi, A. | S4-7 | Nakayama, T. | S10-4 | Uchida, T. | S4-57 |
| Ikeuchi, A. | S4-20 | Nguyen, H. K. | S4-13 | Uchihashi, T. | S4-5 |
| Ikeuchi, A. | S4-49 | Nhat, V. | S4-30 | Uehara, Y. | S4-42 |
| Ikuhara, Y. | S4-2 | Niitsuma, J. | S9-1i | Uehara, Y. | S4-45 |
| Ikuhara, Y. | S4-3 | Ninomiya, N. | S4-66 | Ueno, K. | S4-66 |
| Imai, H. | S1-4 | Nishimura, K. | S4-17 | Ushiki, T. | S4-8 |
| Inada, N. | S8-1 | Nishimura, T. | S4-27 | Utsunomiya, T. | S4-57 |
| Inamura, R. | S4-19 | Nishizawa, H. | S4-58 | Wang, C. M. | S9-1i |
| Irita, M. | S10-5 | Noda, T. | S1-2 | Wang, D. | S4-13 |
| Ishida, N. | S1-2 | Ochiai, T. | S4-67 | Wang, D. | S4-62 |
| Ishida, N. | S4-9 | Ochiai, T. | S4-69 | Wang, Z.H. | S9-2 |
| Ishii, T. | S2-5 | Ogawa, T. | S8-5 | Wang, ZH. | S4-43 |
| Isobe, A. | S7-3 | Ogino, T. | S1-4 | Watkins, M. | S4-4 |
| Isoyama, K. | S4-29 | Ogino, T. | S4-48 | Wen, H.F. | S4-16 |
| Ito, M. | S4-13 | Ogino, T. | S7-3 | Wu, F. | S6-2 |
| Itoh, H. | S9-1i | Ohta, R. | S4-35 | Wulfhekel, W. | S4-12 |
| Iwata, F. | S4-8 | Ohyama, K. | S4-30 | Xu, J. | S10-4 |
| Iwata, F. | S4-10 | Oishi, S. | S4-20 | Yamabe, K. | S4-50 |
| Jacques, V. | S6-1s | Okada, A. | S4-17 | Yamada, H. | S4-63 |
| Jelinek, P. | S1-3 | Okajima, T. | S4-54 | Yamada, H. | S4-68 |
| Jelinek, P. | S6-4 | Oku, N. | S8-1 | Yamada, H. | S8-2 |
| Jin, T. | S4-30 | Okuyama, H. | S9-2 | Yamada, H. | S10-2 |
| Jo, M. | S1-2 | Omori, K. | S4-57 | Yamada, T.K. | S4-11 |
| Kadono, K. | S4-17 | Omura, A. | S4-24 | Yamada, T.K. | S4-56 |
| Kageshima, M. | S7-4 | Omura, R. | S4-31 | Yamada, T.K. | S4-64 |
| Kajihara, Y. | S4-40 | Omura, R. | S5-3 | Yamada, T.K. | S6-3 |
| Kajihara, Y. | S9-5 | Ondracek, M. | S1-3 | Yamagishi, Y. | S4-63 |
| Kanazawa, K. | S4-27 | Onishi, H. | S4-1 | Yamamoto, S.-I. | S4-59 |
| Kanazawa, K. | S4-60 | Onishi, H. | S7-5 | Yamanishi, J. | S9-4 |
| Kanbayashi, R. | S4-16 | Onoda, J. | S1-3 | Yamashita, M. | S4-37 |
| Kashimura, Y. | S4-53 | Onoda, J. | S4-52 | Yamazaki, K. | S4-8 |
| Katafuchi, S. | S4-32 | Onuma, M. | S4-24 | Yamazaki, S. | S6-4 |
| Katano, S. | S4-42 | Ooe, H. | S4-22 | Yano, T. | S4-41 |
| Katano, S. | S4-45 | Oshima, A. | S4-53 | Yasuda, T. | S4-67 |
| Katano, S. | S4-46 | Ourdjini, O. | S8-4 | Yasuda, T. | S4-69 |
| Katayama, M. | S4-31 | Oyabu, N. | S4-68 | Yazaki, G. | S4-38 |
| Katayama, M. | S5-3 | Pang, C.L. | S4-52 | Yeom, H. W. | S5-2s |
| Kato, H. | S4-67 | Perez, R. | S6-4 | Yin, Y. | S4-30 |
| Kawai, M. | S4-46 | Porte, L. | S8-4 | Yong, H. | S2-4 |
| Kawai, S. | S8-3i | Pou, P. | S6-4 | Yorimitsu, H. | S4-64 |
| Kawakatsu, H. | S4-55 | Rodrigo, L. | S6-4 | Yoshida, S. | S4-27 |
| Kawakatsu, H. | S4-58 | Rodriguez, B. | S10-1s | Yoshida, S. | S4-37 |
| Kawakatsu, H. | S4-65 | Russell, T. P. | S4-62 | Yoshida, S. | S4-43 |
| Kawakatsu, H. | S9-3 | Sakaguchi, Y. | S4-11 | Yoshida, S. | S4-60 |
| Kim, H. | S5-4 | Sakai, A. | S4-47 | Yoshida, S. | S4-61 |
| Kim, H. | S5-5 | Sakano, Y. | S4-19 | Yoshida, S. | S4-69 |
| Kim, S. | S4-40 | Sakuma, Y. | S1-2 | Yoshida, S. | S9-2 |
| Kim, Y. | S4-46 | Sakurai, S. | S4-8 | Yoshida, T. | S4-37 |
| Kimura, T. | S10-2 | Sasahara, A. | S4-21 | Yoshida, Y. | S4-28 |
| Kishizawa, T. | S4-43 | Sasaki, N. | S4-55 | Yoshida, Y. | S4-67 |
| Kitazawa, M. | S4-35 | Sasaki, N. | S9-3 | Yoshida, Y. | S5-4 |
| Kitazawa, M. | S4-36 | Schuh, T. | S4-12 | Yoshimura, M. | S4-17 |
| Kitta, M. | S4-1 | Seino, R. | S1-4 | Yoshimura, M. | S4-25 |
| Kizuka, T. | S4-38 | Setou, M. | S4-5 | Yoshimura, M. | S4-32 |
| Kobayashi, D. | S4-55 | Shen, Z. | S6-2 | Yoshimura, M. | S4-33 |
| Kobayashi, D. | S4-58 | Shibata, N. | S4-2 | Yoshimura, M. | S4-34 |
| Kobayashi, D. | S4-65 | Shibata, N. | S4-3 | Yoshitaka, I. | S4-29 |
| Kobayashi, D. | S9-3 | Shigehara, M. | S4-31 | Yurtsever, A. | S1-3 |
| Kobayashi, K. | S4-23 | Shigehara, M. | S5-3 | Yurtsever, A. | S4-44 |
| Kobayashi, K. | S4-63 | Shigekawa, H. | S4-25 | Yurtsever, A. | S4-52 |
| Kobayashi, K. | S4-68 | Shigekawa, H. | S4-27 | Zhang, L. | S2-2 |
| Kobayashi, K. | S8-2 | Shigekawa, H. | S4-37 | | |