ICSPM23 Program
Contents
* Click speaker's name to see detail.
Dec 10 Thu
Registration (12:00-14:30)
Welcome address (14:30-14:35)
Session 1 : (J. Kim, Y. Mera)
Confinement of Superconducting Vortices in Magnetic Force Microscopy
J. H. KimH. W. Yeom
1CALDES, IBS, Korea, 2Physics, POSTECH, Korea
Single-layer FeSe on SrTiO3 with a superconducting Tc above 100 K and topological superconductor by proximity effect
J. Jia
Shanghai Jiao Tong University, China
Two dimensional electron gas and polarization measurement in AlGaN/GaN heterostructure using scanning nonlinear dielectric microscopy
K. Hirose1Y. Goto2N. Chinone1Y. Cho1
1Research Institute of Electrical Communication, Tohoku University, Japan, 2Power Electronics Development Div. Toyota Motor Corporation, Japan
Coffee Break (16:10-16:35)
Session 2 : (H. Onishi)
Graphene on C-terminated Face of 4H-SiC Observed by Noncontact Scanning Nonlinear Dielectric Potentiometry
K. YamasueH. FukidomeK. TashimaM. SuemitsuY. Cho
Research Institute of Electrical Communication, Japan
Atomic-site dependence of point contact conductance
H. KimY. Hasegawa
The Institute for Solid State Physics, The University of Tokyo, Japan
Roadmap of emerging logic devices and SPM
K. Usuda
Corporate R & D Center, Toshiba, Japan
Session 3 : Exhibitor's presentation (O. Takeuchi)
18:00 S3-1 UNISOKU Co., Ltd.
18:05 S3-2 ScientaOmicron, Inc.
18:15 S3-4 TOMOE Engneering Co., Ltd.
18:20 S3-5 Bruker AXS K.K.
18:25 S3-6 OLYMPUS CORPORATION
Dinner (18:30-20:00)
Dec 11 Fri
Breakfast (07:00-08:30)
Session 5 : (J.-F. Jia, K. Nakajima)
Lipid microarray platform for force mapping of phophoinositide binding by viral proteins
N.-J. Cho
1School of Materials Science and Engineering, Nanyang Technological University, Singapore, 2Centre for Biomimetic Sensor Science, Nanyang Technological University, Singapore, 3School of Chemical and Biomedical Engineering, Nanyang Technological University, Singapore
Remote spectroscopy below the diffraction limit
Y. Fujita1G. Lu1B. Kenens1T. Inose2H. Uji-i1,2
1KU Leuven, Belgium, 2Hokkaido University, Japan
Au nanoparticle incorporation into supported lipid bilayer membranes and its characterization by atomic force microscopy
N. Sakaguchi1T. Nakayama1R. Kimura1Y. Kimura2,4A. Hirano-Iwata3,4T. Ogino1,4
1Yokohama National Univ., Japan, 2Tokyo Univ. Technology, Japan, 3Tohoku Univ., Japan, 4CREST/JST, Japan
Nanoscale characterization of schottky emitting tip by scanning probe microscope
T. ShimizuM. TanakaN. Watanabe
AIST, Japan
Coffee Break (10:10-10:30)
Session 6 : (N.-J. Cho, S. Kurokawa)
Spectroscopic Studies of Superconductivity in Cuprates and FeSe
C. L. SongL.L. WangX. C. MaQ. K. Xue
Department of Physics, Tsinghua University, China
Charge/spin transport and superconductivity at Rashba spin-split surface states
S. Hasegawa
Department of Physics, University of Tokyo, Japan
Spin-Polarized Scanning Tunneling Microscopy of Co Islands on Au(111)
P. MishraZ. K. QiH. OkaT. Komeda
Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Japan
Atomically-Flat MgO Interface on Fe(001)-p(1x1)O
Y. SakaguchiN.K.M. NazriqT.K. Yamada
Chiba University, Japan
Conference Photo (12:10-12:25)
Lunch (12:25-13:25)
Session 7 : (R. Temirov, K. Miyake)
Enhancing the Chemical Contrast Between Species in Atomic Force Microscopy Using Morse Parameters Mapping
K. Kaminishi1D. Damiron2P. E. Allain2D. Kobayashi1N. Sasaki3H. Kawakatsu1,2
1IIS, UTokyo, Tokyo, Japan, 2LIMMS, IIS, UTokyo, Tokyo, Japan, 3GSIE, UEC, Tokyo, Japan
Energy Dissipation of AFM Studied by Computer Simulation
Y. Senda1S. Shimamura1J. Blomqvist2R. Nieminen2
1Yamaguchi University, Japan, 2Aalto University, Finland
Depletion capacitance on Cd-diffused Cu(In,Ga)Se2 measured by EFM
T. Ishii1T. Minemoto3T. Takahashi1,2
1Institute of Industrial Science, The University of Tokyo, Japan, 2Institute for Nano Quantum Information Electronics, The University of Tokyo, Japan, 3College of Science and Engineering, Ritsumeikan University, Japan
Visualization of subsurface structures by scanning thermal noise microscopy
A. Yao1K. Kobayashi1,2K. Kimura1H. Yamada1
1Dept. of Electronic Sci. & Eng., Kyoto University, Japan, 2The Hakubi Center for Adv. Res., Kyoto University, Japan
In-situ Atomic Scale Analyses of Catalytic Materials by Environmental TEM
S. TakedaK. SomaH. YoshidaN. Kamiuchi
Institute of Scientific and Industrial Research, Osaka University, Japan
Coffee Break (15:05-15:30)
Session 8 : (C.-L. Song, T. Okajima)
Quantitative Mapping of Nanoscale Electrostatic Potentials Using a Scanning Probe Microscope Tip Equipped with a Single-Molecule Quantum Dot Sensor
R. Temirov
1Peter Grünberg Institut (PGI-3), Forschungszentrum Jülich, Germany, 2Jülich Aachen Research Alliance (JARA) Fundamentals of Future Information Technology, Germany
Accurate Extraction of Electrostatic Force by a Voltage-Pulse Force Spectroscopy
E. Inami
1Research Center for Micro-Nano Technology, Hosei University, Japan, 2Graduate School of Engineering, Osaka University, Japan
Elastic Modulus and Viscoelastic Response of Inhomogeneous Polymers Characterized by Bimodal AFM
H. K. Nguyen1M. Ito1K. Nakajima1,2
1Tohoku University, Japan, 2Tokyo Institute of Technology, Japan
Combined AFM - Confocal Fluorescence Lifetime Imaging Microscopy (FLIM) to Interrogate Nanoenvironments in Bacteria-sensing Polymeric Vesicles and Surface Nanobubbles
N. HainS. Handschuh-WangD. WesnerS. DruzhininH. Schönherr
University of Siegen, Department of Chemistry & Biology, Physical Chemistry I, Siegen
Break (17:35-19:00)
Banquet (19:00-21:30)
Dec 12 Sat
Breakfast (07:00-08:30)
Session 9 : (H. Schönherr, K. Kobayashi)
Silicene, Germanene and Stanene: novel 2D elemental electronic materials beyond graphene:
G. Le Lay
1Aix-Marseille University, CNRS, PIIM UMR 7345, Campus de Saint Jérôme, France, 2School of engineering, Nagoya University, Japan
Reactivity and local electronic structure of graphitic materials
R. Shibuya1D. Guo2T. Kondo2,3,4J. Nakamura2,3,4
1Graduate School of Pure and Applied Sciences, University of Tsukuba, Japan, 2Faculty of Pure and Applied Sciences, University of Tsukuba, Japan, 3Tsukuba Research Center for Interdisciplinary Materials Science (TIMS), University of Tsukuba, Japan, 4Center for Integrated Research in Fundamental Science and Engineering (CiRfSE), University of Tsukuba, Japan
Atomic-resolution Imaging of a Spinel Li4Ti5O12(111) Surface in Ionic Liquid by FM-AFM
T. Ichii1T. Uchida1M. Kitta2T. Utsunomiya1H. Sugimura1
1Kyoto University, Japan, 2AIST, Japan
Layer dependence of structure, composition, and chemical states of ultra-thin cerium oxide film on Rh(111)
L.H. ChanJ. Yuhara
Graduate school of engineering, Nagoya University, Japan
Imagin the Chemical Structure of Single Molecule by Atomic Force Microscopy at Room Temperature
K. Iwata1S. Yamazaki2P. Mutombo3P. Hapala3M. Ondracek3P. Jelinek3Y. Sugimoto4
1Graduate School of Engineering, Osaka University, Japan, 2The Institute of Scientific and Industrial Research, Osaka University, Japan, 3Institute of Physics, Academy of Sciences of the Czech Republic, Czech Republic, 4Department of Advanced Materials Science, University of Tokyo, Japan
Van der Waals interactions and the limits of isolated atom models at interfaces studied by atomic force microscopy
S. Kawai1,2A. Foster3,4T. Björkman3,5S. Nowakowska1J. Björk6F. Federici Canova3,7L. Gade8T. Jung1,9E. Meyer1
1Department of Physics, University of Basel, Switzerland, 2PRESTO, Japan Science and Technology Agency, Japan, 3COMP, Department of Applied Physics, Aalto University, Finland, 4Division of Electrical Engineering and Computer Science, Kanazawa University, Japan, 5Physics/Department of Natural Sciences, Åbo Akademi University, Finland, 6Department of Physics, Chemistry and Biology, IFM, Linköping University, Sweden, 7Aalto Science Institute, Aalto University, Finland, 8Anorganisch-Chemisches Institut, Universität Heidelberg, Germany, 9Laboratory for Micro- and Nanotechnology, Paul Scherrer Institute, Switzerland
Closing Remark (10:40-10:45)
Session 4 : Poster Session
Dec 10 Thu 20:00-22:00
Study of the phase structures and toughening mechanism in PP/EPDM using AFM nanomechanical mapping
X. Liang1H. Iwabuki2K. Fujiwara2S. Fujinami3M. Ito3K. Nakajima1,3
1Graduate School of Science and Engineering, Tokyo Institute of Technology, Japan, 2Industrial Technology Center of Okayama Prefecture, Japan, 3WPI Advanced Institute for Materials Research, Tohoku University, Japan
Observation of selective adsorption of bio-molecules on ferroelectric crystal surfaces with polarization domain patterns
T. Nakayama1A. Isobe1Y. Kimura2,4A. Hirano-Iwata3,4T. Ogino1,4
1Yokohama National University, Japan, 2Tikyo Univ. Tecnology, Japan, 3Tohoku Univ., Japan, 4CREST/JST, Japan
How does the Molecular Linker in Dynamic Force Spectroscopy Affect Probing Molecular Interactions at the Single-Molecule Level?
A. TaninakaK. AizawaT. HanyuY. HiranoO. TakeuchiH. Shigekawa
Faculty of Pure and Applied Sciences, University of Tsukuba, Japan
Friction Force on Adhesive Elastic Material by AFM/LFM
A. Kumagai1S. Fujinami2M. Ito1K. Nakajima1,3
1WPI Advanced Institute for Materials Research, Tohoku University, Japan, 2Research Center of Synchrotron radiation science, Riken, Japan, 3Department of Organic and Polymeric Materials, Tokyo Institute of Technology, Japan
Nano-scale Viscoelastic Contact by AFM
K. Nakajima
1Department of Organic & Polymeric Materials, Tokyo Institute of Technology, Japan, 2WPI-AIMR, Tohoku University, Japan
A scanning ion conductance microscopy study of ion current behaviors on charged surfaces of polydimethylsiloxane
Y. Eguchi1K. Ishizaki1M. Nakajima2T. Ushiki2F. Iwata3
1Faculty of Engineering, Shizuoka University, Johoku, Naka-ku, Hamamatsu 432-8561, Japan, 2Division of Microscopic Anatomy, Niigata University Graduate School of Medical and Dental Sciences, 757-5 Asahimachi-dori-1, Chuo-ku, Niigata 951-8510, Japan, 3Research Institute of Electronics, Shizuoka University, Johoku, Naka-ku, Hamamatsu 432-8561, Japan
Rubber-filler Interface Investigated by Nanp-rheological AFM
M. Ito1S. Fujinami2K. Nakajima1,3
1WPI Advanced Institute for Materials Research, Tohoku University, Japan, 2Research Center of Synchrotron Radiation Science, Riken, Japan, 3Department of Organic and Polymeric Materials, Graduate School of Engineering, Tokyo Institute of Technology, Japan
Identification of Al Atoms Sites on Al2O3 /NiAl(110) Surface by NC-AFM
Y. J. LiH. YokoyamaH. F. WenY. NaitohY. Sugawara
Osaka University, Japan
Morphology and Electrical Studies on Defect-induced MoS2 Nanosheet by O2 Plasma Treatment
A. AndoM. HorikawaJ. MiyawakiT. ShimizuT. Kubo
National Institute of Advanced Industrial Science and Technology (AIST), Japan
Measurement of work function difference between Pb/Si(111) and Pb/Ge/Si(111) by high-order Gundlach oscillation
H. S. Huang1,2,3W. Y. Chan2W. B. Su2G. Hoffmann4C. S. Chang1,2
1Department of Physics, National Taiwan University, Taiwan, 2Institute of Physics, Academia Sinica, Taiwan, 3Taiwan International Graduate Program, Taiwan, 4Department of Physics, National Tsing Hua University, Taiwan
Mechanical exfoliation of graphene on Si(111)7×7 surface
K. HataJ. Yuhara
School of engineering, Nagoya University, Japan
Observation of the Schottky barrier diode under applied bias voltage with Kelvin probe force microscopy
T. UrumaN. Satoh
Chiba Institute of Technology, Graduate School of Engineering, 2-17-1, Tsudanuma, Narashino, Chiba, 275-0016, Japan
Measurement of subsurface charge ordering in Fe3O4(001) by STM/STS
M. JochiS. HiuraA. IkeuchiA. SubagyoK. Sueoka
Graduate School of Information Science and Technology, Hokkaido University, Japan
Initial Oxidation of Ga/Si(100) Studied by Scanning Tunneling Microscopy
M. Kizu1K. Nishimura1A. Okada1M. Yoshimura2K. Kadono1
1Kyoto Institute of Technology, Japan, 2Toyota Technological Institute, Japan
Metal-organic Molecular Beam Epitaxy of GaAsNSe Films using Ga Droplets on GaP(001)
Y. ShimomuraY. IgarashiS. KimuraY. SuzukiK. Uesugi
Division of Information and Electronic Engineering, Muroran Institute of Technology, Japan
Distribution of Local Density of States on Silicene Nanoribbon Array
O. KuboR. OmuraN. NakashimaM. ShigeharaR. KugaH. TabataN. MoriM. Katayama
Osaka University, Japan
Initial Growth of Barium Disilicide Epitaxial Film on Si(111) Analyzed by Scanning Tunneling Microscopy and Spectroscopy
O. KuboT. OtsukaS. OkasakaH. TabataM. Katayama
Osaka University, Japan
Photovoltaic Measurements on Cu(In,Ga)Se2 Solar Cells by Photo-assisted KFM under Lights with Various Photon Energies
H. Yong1T. Minemoto2T. Takahashi1
1the University of Tokyo, Japan, 2Ritsumeikan University, Japan
Composition and local atomic arrangement of decagonal Al-Co-Ni and Al-Co-Cu quasicrystal surfaces
J. Yuhara1K. Horiba1R. Zenkyu1M. Sato1M. Schimid2P. Varaga2
1Nagoya University, Japan, 2Technische Universität Wien, Austria
Field Enhancement Factors and Self-Focus Functions Manifesting in Field Emission Resonances in Scanning Tunneling Microscopy
Wei-Bin. SuChun-Liang. LinWen-Yuan. Chan Shin-Ming. LuChia-Seng. Chang
Institute of Physics, Academia Sinica, Taiwan
Observation of covering epitaxial β-FeSi2 nanodots with Si for fabricating Si/β-FeSi2 nanodots stacked structures
S. SakaneK. WatanabeM. IsogawaS. TakeuchiA. SakaiY. Nakamura
Graduate School of Engineering Science, Osaka University, Japan
STM Study of Graphene Nanodots Array on SiC
A. Visikovskiy1T. Kajiwara1S. Tanaka1M. Yoshimura2
1Dept. of Applied Quantum Physics and Nuclear Engineering, Kyushu University, Japan, 2Toyota Technological Institute, Japan
Si and Ge Ultrathin Films by Ag-Induced Layer-Exchange Growth
M. Kurosawa1,2,3A. Ohta2,3M. Araidai1,2,3S. Zaima1,2
1Institute of Materials and Systems for Sustainability, Nagoya University, Japan, 2Graduate School of Engineering, Nagoya University, Japan, 3Institute for Advanced Research, Nagoya University, Japan
Nanoscale polarimetry with STM light emission on P3HT:PCBM solar cell
K. Murao1K. Naito1T. Ochiai1,2T. Yasuda3S. Yoshida1O. Takeuchi1H. Shigekawa1
1Faculty of Pure and Applied Sciences, University of Tsukuba., Japan, 2Takano Co,Ltd, Japan, 3NIMS, Japan
Spatial Distribution of P3HT:PCBM Organic Photo Voltaic Property Using Multistep LM-STS
Y. Kobayashi1T. Ochiai1,2T. Yasuda3S. Yoshida1O. Takeuchi1H. Shigekawa1
1Faculty of Pure and Applied Sciences, University of Tsukuba, Japan, 2Takano Co., Ltd., Japan, 3National Institute for Materials Science, Japan
Preparation of Atomically Flat Ni(111) on Mica Substrate
H. TanakaM. Taniguchi
ISIR, Osaka U., Japan
Photo-response imaging on Si(111) 7x7 surfaces by using STM
N. HoriguchiK. Yadate
Muroran Institute of Technology, Japan
Analysis of compositional variation in Mo1-xWxS2 single layer heterostructure using STM
H. Mogi1S. Yoshida1Y. Kobayashi2Y. Miyata2O. Takeuchi1H. Shigekawa1
1Faculty of Pure and Applied Sciences, University of Tsukuba, Japan, 2Department of Physics, Tokyo Metropolitan University, Japan
Measuring bending stiffness of nanowires using force probe under electron microscope
A. Taninaka1G. Yazaki2T. Iijima2O. Takeuchi1
1Faculty of Pure and Applied Sciences, University of Tsukuba, Japan, 2Graduate School of Pure and Applied Sciences, University of Tsukuba, Japan
Effect of tip thermal expansion in laser combined STM
M. ShigenoZ. WangT. KishiS. YoshidaO. TakeuchiH. Shigekawa
Faculty of Pure and Applied Sciences, University of Tsukuba., Japan
Mapping the fluctuations of Dirac point in BiSbTeSe2 measured by STM/STS
Y. HosomiS. YoshidaO. TakeuchiH. ShigekawaY. SuzukiK. Kadowaki
Faculty of Pure and Applied Sciences, University of Tsukuba, Japan
Real space analysis on phase transition between Peierls and Mott states in [Pd(chxn)2Br]Br2 by STM
Y. Hosomi1S. Yoshida1A. Taninaka1O. Takeuchi1H. Shigekawa1T. Yoshida2S. Takaishi2M. Yamashita2
1Faculty of Pure and Applied Sciences, University of Tsukuba, Japan, 2Tohoku University, Japan
Atomic scale STM/STS analysis on transition metal dichalcogenide heterostructures
R. Sakurada1S. Yoshida1A. Taninaka1Y. Kobayashi2H. Mogi1T. Kouyama1Y. Miyata2O. Takeuchi1H. Shigekawa1
1Faculty of Pure and Applied Sciences, University of Tsukuba, Japan, 2Department of Physics, Tokyo Metropolitan University, Japan
Making and revealing stacking structure of high quality graphene grown on SiC (𝟎𝟎𝟎𝟏 ̅ ) substrate
K. Tashima1R. Suto1H. Fukidome1M. Suemitsu1K. Horiba2H. Kumigashira2M. Kotsugi3T. Ohkochi4
1Research Institute of Electrical Communication, Japan, 2High Energy Accelerator Research Organization, Japan, 3Tokyo University of Scienece, Japan, 4JASRI, SPring-8, Japan
Investigation of Stress Induced Surface Roughness of SiO2 Films Grown on Semiconductor Substrates
R. HasunumaK. Yamabe
Institute of Applied Physics, University of Tsukuba, Japan
Epitaxial growth of iron oxide nanodots on Si substrate using Fe-coated Ge nuclei
T. IshibeK. WatanabeS. TakeuchiA. SakaiY. Nakamura
Graduate School of Engineering Science , University of Osaka, Japan
Formation of One-Dimensional Chain of Very Small Carbon Clusters on Noble Metal surfaces
S. KurokawaK. HirashigeA. Sakai
Kyoto University, Japan
Atom-resolved analysis of solid surfaces covered with thin water layers in air by frequency modulation atomic force microscopy
T. Arai1,2K. Sato1M. Koshioka1A. Iida2
1Graduate School of Natural Sci. & Technol., Kanazawa University, Japan, 2Science and Engineering, Kanazawa University, Japan
Mn-segregated Ferromagnetic Dislocations along SrTiO3 grain boundary
Y. Shimbo1I. Sugiyama2R. Ishikawa1N. Shibata1Y. Ikuhara1,2,3
1Institute of Engineering Innovation, The University of Tokyo, Japan, 2WPI Advanced Institute for Materials Research, Tohoku University, Japan, 3Nanostructures Research Laboratory, Japan Fine Ceramics Center, Japan
STM and STS study of the Mn layers on Fe/Cu(001)
S. NakashimaT. MiyamachiF. Komori
Institute for Solid State Physics of the University of Tokyo, Japan
Reversible Resistive Switching of Ag Nanowire Network
R. Higuchi1Y. Shingaya1T. Nakayama1,2
1International Center for Materials Nanoarchitectonics (MANA), National Institute for Materials Science, Japan, 2Graduate School of Pure and Applied Sciences, University of Tsukuba, Japan
Frictional Behavior of C60-Graphene Composite Film Observed by Friction Force Microscopy
M. YoshimuraT. NagamoriS. Suzuki
Toyota Technological Institute, Japan
Optical and Mechanical Detection of Near-field Light by Atomic Force Microscopy using a Piezoelectric Cantilever
N. Satoh1,2K. Kobayashi2S. Watanabe3T. Fujii3K. Matsushige2H. Yamada2
1Chiba Institute of Technology, Japan, 2Kyoto University, Japan, 3Nikon Corporation, Japan
Concepts and Experimental Verification for Suppressing Optical Interference of OPU-AFM
H.-F. Huang1,2A. Liu1,2E.-T. Hwu2K.-Y. Huang1
1Department of Mechanical Engineering, National Taiwan University, Taiwan, 2Institute of Physics, Academia Sinica, Taiwan
Demonstration of TERS (Tip-enhanced Raman Scattering) measurement with low force constant cantilever
T. Kozu1,2M. Misawa1H. Fukushima2R. Uehara3M. Yoshimura3K. Nishida2
1RENISHAW KK, Japan, 2National Defense Academy, Japan, 3Toyota Technological Institute, Japan
Three-dimensional imaging of lubricant molecules on magnetic disk for hard disk drive by 3D-SFM
K. Miyazawa1N. Nakajima1M. Toyoda1R. Sagata2T. Shimizu2T. Soda2T. Fukuma1,3
1Division of Electrical Engineering and Computer Science, Kanazawa University, Japan, 2MORESCO Corporation, Japan, 3ACT-C, Japan Science and Technology Agency, Japan
Data Treatments for Real-time Detection of Morse Potential Parameters with Atomic Force Microscopy
D. Damiron1K. Kaminishi2P. E. Allain1F. Pop1D. Kobayashi2N. Sasaki3H. Kawakatsu1,2
1LIMMS, IIS, UTokyo, Tokyo, Japan, 2IIS, UTokyo, Tokyo, Japan, 3GSIE, UEC, Tokyo, Japan
Chiral Switch Operated at Room Temperature
E. Inami1,3I. Hamada2K. Ueda3M. Abe4S. Morita5Y. Sugimoto3,6
1Research Center for Micro-Nano Technology, Japan, 2International Center for Materials Nano architectonics, National Institute for Materials Science, Japan, 3Graduate School of Engineering, Osaka University, Japan, 4Graduate School of Engineering Science, Osaka University, Japan, 5The Institute of Scientific and Industrial Research, Osaka University, Japan, 6Department of Advanced Materials Science, University of Tokyo, Japan
Dolomites in Liquid Imaged by FM-AFM
Y. TakataY. ArakiH. Onishi
Graduate School of Science, University of Kobe, Japan
2D Network-like Nanostructure of Molybdenum Disulfide (MoS2) Formed by Inward-Plasma Etching
T. Kubo1J. Miywaki1T. Shimizu1S. Shimbori2S. Takahashi2A. Ando3
1Nanomaterials Research Institute, AIST,, Japan, 2Sanyu Co., Ltd., Japan, 3Nanoelectronics Research Institute, AIST, Japan
Development of a scanning nanopipette probe microscope for atmospheric pressure plasma jets fine processing
D. Morimatsu1H. Sugimoto1A. Nakamura1A. Ogino1M. Nagatsu1,2F. Iwata1,3
1Graduate school of integrated science and technology, Shizuoka University 3-5-1, Johoku, Naka-ku, Hamamatsu 432-8561, Japan, 2Graduate school of science and technology, Shizuoka University 3-5-1, Johoku, Hamamatsu 432-8561, Japan, 3Research institute of electronics, Shizuoka University 3-5-1, Johoku, Hamamatsu 432-8561, Japan
The use of Ga+ focused ion beams in graphene patterning
H. -H. HuangT. IkedaM. Yoshimura
Toyota Technological Institute, Japan
Development of a Local Hydration Probe Microscope Using Tip-Enhanced Sum Frequency Generation (SFG)
T. Hashizume1,2H. Yoshino1,2S. Nagata1S. Heike1K. Saito1,2T. Oka1,2H. Koizumi1
1Research & Development Group, Hitachi, Ltd., Japan, 2Dep. of Physics, Tokyo Institute of Technology, Japan
Multi-frequency force modulation atomic force microscopy: Simultaneous measurements of living cells in frequency and time domains
R. TakahashiT. Okajima
Graduate School of Information Science & Technology, Hokkaido University, Japan
Imaging of Molecular Recognition Events by Amplitude-Modulation Atomic Force Microscopy with a Photo-Thermal Excitation Technique
T. NyuT. OgawaT. Hayashi
Tokyo Institute of Technology, Japan
Viscoelastic Responses of Interfacial Water Investigated by Amplitude-Modulation Atomic Force Microscopy with a Technique of Photo-Thermal Excitation
T. NyuT. OgawaT. Hayashi
Tokyo Institute of Technology, Japan
Investigation of shear force of strongly adhering cells on substrates using atomic force microscopy and fluorescence microscopy
S. Hashimoto1Y. Masuda2Y. Kawata2S. Terakawa3F. Iwata1,2
1Graduate School of Engineering, Shizuoka University, Japan, 2Research Institute of Electronics, Shizuoka University, Japan, 3Faculty of Health Science, Tokoha University, Japan
First-principles study on locally-disordered structures of the Mn-induced GaAs(001)-(2 × 2) surface
A. Akaishi1K. Funatsuki1A. Ohtake2J. Nakamura1
1The University of Electro-Communications(UEC-Tokyo), Japan, 2National Institute for Materials Science (NIMS), Japan
Quantifying local elastic modulus of living embryonic tissue by atomic force microscopy
Y. Fujii1W. Koizumi2K. Hotta2K. Oka2T. Okajima1
1Grad. Schl. Inform. Sci and Tech. Hokkaido Univ., Japan, 2Grad. Schl. Biosci. and Bioinfo. Keio Univ., Japan
First-principles study on two-dimensional crystals of group IV element on insulating film
M. Araidai1,2,3M. Kurosawa1,2,3A. Ohta2,3K. Shiraishi1,3
1Institute of Materials and Systems for Sustainability, Nagoya University, Japan, 2Institute for Advanced Research, Nagoya University, Japan, 3Graduate School of Engineering, Nagoya University, Japan
Silver Nanowire-Based Tip for STM-Tip-Enhanced Raman Scattering Microscopy
T. Fujita1T. Inose2S. De Feyter1H. Uji-i1,2
1KU Leuven, Belgium, 2RIES, Hokkaido Univ., Japan
Two-Dimensional Molecular Networks on Au(111) Fabricated by Solvent Evaporation
Y. Nakata1K. Minou1A. Okada1M. Yoshimura2K. Kadono1
1Kyoto Institute of Technology, Japan, 2Toyota Technological Institute, Japan
Temperature-dependent electronic structures across LaMnO3/SrMnO3 heterointerfaces
J.C. Wang1,2B.C. Huang3C.L. Liu4W.C. Kuo4T.M. Uen4J.Y. Juang4Y.H. Chu3,5Y.P. Chiu2,1,3
1Department of Physics, National Sun Yat-Sen University, Taiwan, 2Department of Physics, National Taiwan Normal University, Taiwan, 3Institute of Physics, Academia Sinica, Taiwan, 4Department of Electrophysics, National Chiao Tung University, Taiwan, 5Department of Materials Science and Engineering, National Chiao Tung University, Taiwan
Three-dimensional probe of molecular conformation effect on single molecular conductance
T. KatayamaY. SugitaS. YoshidaO. TakeuchiH. Shigekawa
Faculty of Pure and Applied Sciences, University of Tsukuba, Japan
Graphene Oxide on Au(111) Studied by Scanning Tunneling Microscopy
S. KatanoW. TaoY. Uehara
RIEC, Tohoku University, Japan
Size-controlled Deposition a Single Silver Nanoparticle on Semiconductor Surface Using Scanning Tunneling Microscope
S. KatanoM. HotsukiY. Uehara
RIEC, Tohoku University, Japan
Real space observation of electronic structures of La@C82 superatom upon clustering realized using glycine nanocavities
T. Ochiai1,2A. Taninaka1K. Kanazawa1O. Takeuchi1H. Shigekawa1
1Faculty of Pure and Applied Sciences, University of Tsukuba, Japan, 2TAKANO Co., Ltd., Japan
Interfacial Electronic Properties at LaAlO3/SrTiO3 Heterointerfaces with Au Nanoclusters Modulated by Visible Light
P. C. Huang1,2J. C. Lin3T. V. Thanh4T. T. Lin2B. C. Huang3Y. P. Chiu1,2,3J. Y. Lin4Y. H. Chu5,3
1Department of Physics, National Taiwan Normal University, Taipei 116, Taiwan, 2Department of Physics, National Sun Yat-sen University, Kaohsiung 804, Taiwan, 3Institute of Physics, Academia Sinica, Taipei 11529, Taiwan, 4Institute of Physics, National Chiao Tung University, Hsinchu 30010, Taiwan, 5Department of Materials Science and Engineering, National Chiao Tung University, Hsinchu 30010, Taiwan
Surface Potential Measurements of Multi-layer Graphene by KPFM
K. KiyosumiS. SuzukiM. Yoshimura
Toyota Technological Institute, Japan
AFM in Liquid Metal
N. TagaiT. UchidaT. IchiiT. UtsunomiyaH. Sugimura
Department of Materials Science and Engineering, Kyoto University, Japan
Study of the spinel LiMn2O4(111) surface in a non-aqueous electrolyte solution by environmental controlled atomic force microscopy
M. KittaM. Kohyama
AIST, JAPAN
Surface Analysis of Molten-Flux-Grown Layered Perovskite Particles by Atomic Force Microscopy
A. Orum1K. Takatori2S. Hori2M. Yoshimura1T. Tani2
1Toyota Technological Institute,, Japan, 2Toyota Central Research and Development Labs Inc., Japan
Visualizing Intermediate State in Calcite Dissolution by High-speed FM-AFM
K. Miyata1J. Tracy2P. Spijker2A. S. Foster1,2K. Miyazawa1T. Fukuma1,3
1Division of Electrical Eng. and Computer Sci., Kanazawa University, Japan, 2COMP Centre of Excellence, Department of Applied Physics, Aalto University, Finland, 3ACT-C, Japan Science and Technology Agency, Japan
Study for the measurement of interaction force by means of FM-AFM
N. YoshidaK. HigashinoK. Sueoka
Graduate School of Information Science and Technology, Hokkaido University, Japan
Author Index
| Abe, M. | S4-48 | Kitta, M. | S4-71 | Shigekawa, H. | S4-30 |
| Aizawa, K. | S4-3 | Kitta, M. | S9-3 | Shigekawa, H. | S4-31 |
| Akaishi, A. | S4-58 | Kiyosumi, K. | S4-69 | Shigekawa, H. | S4-32 |
| Allain, P. E. | S4-47 | Kizu, M. | S4-14 | Shigekawa, H. | S4-33 |
| Allain, P. E. | S7-1 | Kobayashi, D. | S4-47 | Shigekawa, H. | S4-64 |
| Ando, A. | S4-9 | Kobayashi, D. | S7-1 | Shigekawa, H. | S4-67 |
| Ando, A. | S4-50 | Kobayashi, K. | S4-43 | Shigeno, M. | S4-30 |
| Arai, T. | S4-38 | Kobayashi, K. | S7-4 | Shimamura, S. | S7-2 |
| Araidai, M. | S4-23 | Kobayashi, Y. | S4-25 | Shimbo, Y. | S4-39 |
| Araidai, M. | S4-60 | Kobayashi, Y. | S4-28 | Shimbori, S. | S4-50 |
| Araki, Y. | S4-49 | Kobayashi, Y. | S4-33 | Shimizu, T. | S4-9 |
| Björk, J. | S9-6 | Kohyama, M. | S4-71 | Shimizu, T. | S4-46 |
| Björkman, T. | S9-6 | Koizumi, H. | S4-53 | Shimizu, T. | S4-50 |
| Blomqvist, J. | S7-2 | Koizumi, W. | S4-59 | Shimizu, T. | S5-4 |
| Chan, L.H. | S9-4 | Komeda, T. | S6-3 | Shimomura, Y. | S4-15 |
| Chan, W. Y. | S4-10 | Komori, F. | S4-40 | Shingaya, Y. | S4-41 |
| Chan, Wen-Yuan. | S4-20 | Kondo, T. | S9-2i | Shiraishi, K. | S4-60 |
| Chang, C. S. | S4-10 | Koshioka, M. | S4-38 | Soda, T. | S4-46 |
| Chang, Chia-Seng. | S4-20 | Kotsugi, M. | S4-34 | Soma, K. | S7-5p |
| Chinone, N. | S1-3 | Kouyama, T. | S4-33 | Song, C. L. | S6-1s |
| Chiu, Y. P. | S4-68 | Kozu, T. | S4-45 | Spijker, P. | S4-73 |
| Chiu, Y.P. | S4-63 | Kubo, O. | S4-16 | Su, W. B. | S4-10 |
| Cho, N.-J. | S5-1s | Kubo, O. | S4-17 | Su, Wei-Bin. | S4-20 |
| Cho, Y. | S1-3 | Kubo, T. | S4-9 | Subagyo, A. | S4-13 |
| Cho, Y. | S2-1 | Kubo, T. | S4-50 | Suemitsu, M. | S2-1 |
| Chu, Y. H. | S4-68 | Kuga, R. | S4-16 | Suemitsu, M. | S4-34 |
| Chu, Y.H. | S4-63 | Kumagai, A. | S4-4 | Sueoka, K. | S4-13 |
| Damiron, D. | S4-47 | Kumigashira, H. | S4-34 | Sueoka, K. | S4-74 |
| Damiron, D. | S7-1 | Kuo, W.C. | S4-63 | Sugawara, Y. | S4-8 |
| De Feyter, S. | S4-61 | Kurokawa, S. | S4-37 | Sugimoto, H. | S4-51 |
| Druzhinin, S. | S8-4s | Kurosawa, M. | S4-23 | Sugimoto, Y. | S4-48 |
| Eguchi, Y. | S4-6 | Kurosawa, M. | S4-60 | Sugimoto, Y. | S9-5 |
| Federici Canova, F. | S9-6 | Le Lay, G. | S9-1s | Sugimura, H. | S4-70 |
| Foster, A. | S9-6 | Li, Y. J. | S4-8 | Sugimura, H. | S9-3 |
| Foster, A. S. | S4-73 | Liang, X. | S4-1 | Sugita, Y. | S4-64 |
| Fujii, T. | S4-43 | Lin, Chun-Liang. | S4-20 | Sugiyama, I. | S4-39 |
| Fujii, Y. | S4-59 | Lin, J. C. | S4-68 | Suto, R. | S4-34 |
| Fujinami, S. | S4-1 | Lin, J. Y. | S4-68 | Suzuki, S. | S4-42 |
| Fujinami, S. | S4-4 | Lin, T. T. | S4-68 | Suzuki, S. | S4-69 |
| Fujinami, S. | S4-7 | Liu, A. | S4-44 | Suzuki, Y. | S4-15 |
| Fujita, T. | S4-61 | Liu, C.L. | S4-63 | Suzuki, Y. | S4-31 |
| Fujita, Y. | S5-2i | Lu, Shin-Ming. | S4-20 | Tabata, H. | S4-16 |
| Fujiwara, K. | S4-1 | Lu, G. | S5-2i | Tabata, H. | S4-17 |
| Fukidome, H. | S2-1 | Ma, X. C. | S6-1s | Tagai, N. | S4-70 |
| Fukidome, H. | S4-34 | Masuda, Y. | S4-57 | Takahashi, R. | S4-54 |
| Fukuma, T. | S4-46 | Matsushige, K. | S4-43 | Takahashi, S. | S4-50 |
| Fukuma, T. | S4-73 | Meyer, E. | S9-6 | Takahashi, T. | S4-18 |
| Fukushima, H. | S4-45 | Minemoto, T. | S4-18 | Takahashi, T. | S7-3 |
| Funatsuki, K. | S4-58 | Minemoto, T. | S7-3 | Takaishi, S. | S4-32 |
| Gade, L. | S9-6 | Minou, K. | S4-62 | Takata, Y. | S4-49 |
| Goto, Y. | S1-3 | Misawa, M. | S4-45 | Takatori, K. | S4-72 |
| Guo, D. | S9-2i | Mishra, P. | S6-3 | Takeda, S. | S7-5p |
| Hain, N. | S8-4s | Miyamachi, T. | S4-40 | Takeuchi, O. | S4-3 |
| Hamada, I. | S4-48 | Miyata, K. | S4-73 | Takeuchi, O. | S4-24 |
| Handschuh-Wang, S. | S8-4s | Miyata, Y. | S4-28 | Takeuchi, O. | S4-25 |
| Hanyu, T. | S4-3 | Miyata, Y. | S4-33 | Takeuchi, O. | S4-28 |
| Hapala, P. | S9-5 | Miyawaki, J. | S4-9 | Takeuchi, O. | S4-29 |
| Hasegawa, S. | S6-2i | Miyazawa, K. | S4-46 | Takeuchi, O. | S4-30 |
| Hasegawa, Y. | S2-2i | Miyazawa, K. | S4-73 | Takeuchi, O. | S4-31 |
| Hashimoto, S. | S4-57 | Miywaki, J. | S4-50 | Takeuchi, O. | S4-32 |
| Hashizume, T. | S4-53 | Mogi, H. | S4-28 | Takeuchi, O. | S4-33 |
| Hasunuma, R. | S4-35 | Mogi, H. | S4-33 | Takeuchi, O. | S4-64 |
| Hata, K. | S4-11 | Mori, N. | S4-16 | Takeuchi, O. | S4-67 |
| Hayashi, T. | S4-55 | Morimatsu, D. | S4-51 | Takeuchi, S. | S4-21 |
| Hayashi, T. | S4-56 | Morita, S. | S4-48 | Takeuchi, S. | S4-36 |
| Heike, S. | S4-53 | Murao, K. | S4-24 | Tanaka, H. | S4-26 |
| Higashino, K. | S4-74 | Mutombo, P. | S9-5 | Tanaka, M. | S5-4 |
| Higuchi, R. | S4-41 | Nagamori, T. | S4-42 | Tanaka, S. | S4-22 |
| Hirano, Y. | S4-3 | Nagata, S. | S4-53 | Tani, T. | S4-72 |
| Hirano-Iwata, A. | S4-2 | Nagatsu, M. | S4-51 | Taniguchi, M. | S4-26 |
| Hirano-Iwata, A. | S5-3 | Naito, K. | S4-24 | Taninaka, A. | S4-3 |
| Hirashige, K. | S4-37 | Naitoh, Y. | S4-8 | Taninaka, A. | S4-29 |
| Hirose, K. | S1-3 | Nakajima, K. | S4-1 | Taninaka, A. | S4-32 |
| Hiura, S. | S4-13 | Nakajima, K. | S4-4 | Taninaka, A. | S4-33 |
| Hoffmann, G. | S4-10 | Nakajima, K. | S4-5 | Taninaka, A. | S4-67 |
| Hori, S. | S4-72 | Nakajima, K. | S4-7 | Tao, W. | S4-65 |
| Horiba, K. | S4-19 | Nakajima, K. | S8-3 | Tashima, K. | S2-1 |
| Horiba, K. | S4-34 | Nakajima, M. | S4-6 | Tashima, K. | S4-34 |
| Horiguchi, N. | S4-27 | Nakajima, N. | S4-46 | Temirov, R. | S8-1s |
| Horikawa, M. | S4-9 | Nakamura, A. | S4-51 | Terakawa, S. | S4-57 |
| Hosomi, Y. | S4-31 | Nakamura, J. | S4-58 | Thanh, T. V. | S4-68 |
| Hosomi, Y. | S4-32 | Nakamura, J. | S9-2i | Toyoda, M. | S4-46 |
| Hotsuki, M. | S4-66 | Nakamura, Y. | S4-21 | Tracy, J. | S4-73 |
| Hotta, K. | S4-59 | Nakamura, Y. | S4-36 | Uchida, T. | S4-70 |
| Huang, B. C. | S4-68 | Nakashima, N. | S4-16 | Uchida, T. | S9-3 |
| Huang, B.C. | S4-63 | Nakashima, S. | S4-40 | Ueda, K. | S4-48 |
| Huang, H. -H. | S4-52 | Nakata, Y. | S4-62 | Uehara, R. | S4-45 |
| Huang, H. S. | S4-10 | Nakayama, T. | S4-2 | Uehara, Y. | S4-65 |
| Huang, H.-F. | S4-44 | Nakayama, T. | S4-41 | Uehara, Y. | S4-66 |
| Huang, K.-Y. | S4-44 | Nakayama, T. | S5-3 | Uen, T.M. | S4-63 |
| Huang, P. C. | S4-68 | Nazriq, N.K.M. | S6-4 | Uesugi, K. | S4-15 |
| Hwu, E.-T. | S4-44 | Nguyen, H. K. | S8-3 | Uji-i, H. | S4-61 |
| Ichii, T. | S4-70 | Nieminen, R. | S7-2 | Uji-i, H. | S5-2i |
| Ichii, T. | S9-3 | Nishida, K. | S4-45 | Uruma, T. | S4-12 |
| Igarashi, Y. | S4-15 | Nishimura, K. | S4-14 | Ushiki, T. | S4-6 |
| Iida, A. | S4-38 | Nowakowska, S. | S9-6 | Usuda, K. | S2-3p |
| Iijima, T. | S4-29 | Nyu, T. | S4-55 | Utsunomiya, T. | S4-70 |
| Ikeda, T. | S4-52 | Nyu, T. | S4-56 | Utsunomiya, T. | S9-3 |
| Ikeuchi, A. | S4-13 | Ochiai, T. | S4-24 | Varaga, P. | S4-19 |
| Ikuhara, Y. | S4-39 | Ochiai, T. | S4-25 | Visikovskiy, A. | S4-22 |
| Inami, E. | S4-48 | Ochiai, T. | S4-67 | Wang, J.C. | S4-63 |
| Inami, E. | S8-2i | Ogawa, T. | S4-55 | Wang, L.L. | S6-1s |
| Inose, T. | S4-61 | Ogawa, T. | S4-56 | Wang, Z. | S4-30 |
| Inose, T. | S5-2i | Ogino, A. | S4-51 | Watanabe, K. | S4-21 |
| Ishibe, T. | S4-36 | Ogino, T. | S4-2 | Watanabe, K. | S4-36 |
| Ishii, T. | S7-3 | Ogino, T. | S5-3 | Watanabe, N. | S5-4 |
| Ishikawa, R. | S4-39 | Ohkochi, T. | S4-34 | Watanabe, S. | S4-43 |
| Ishizaki, K. | S4-6 | Ohta, A. | S4-23 | Wen, H. F. | S4-8 |
| Isobe, A. | S4-2 | Ohta, A. | S4-60 | Wesner, D. | S8-4s |
| Isogawa, M. | S4-21 | Ohtake, A. | S4-58 | Xue, Q. K. | S6-1s |
| Ito, M. | S4-1 | Oka, H. | S6-3 | Yadate, K. | S4-27 |
| Ito, M. | S4-4 | Oka, K. | S4-59 | Yamabe, K. | S4-35 |
| Ito, M. | S4-7 | Oka, T. | S4-53 | Yamada, H. | S4-43 |
| Ito, M. | S8-3 | Okada, A. | S4-14 | Yamada, H. | S7-4 |
| Iwabuki, H. | S4-1 | Okada, A. | S4-62 | Yamada, T.K. | S6-4 |
| Iwata, F. | S4-6 | Okajima, T. | S4-54 | Yamashita, M. | S4-32 |
| Iwata, F. | S4-51 | Okajima, T. | S4-59 | Yamasue, K. | S2-1 |
| Iwata, F. | S4-57 | Okasaka, S. | S4-17 | Yamazaki, S. | S9-5 |
| Iwata, K. | S9-5 | Omura, R. | S4-16 | Yao, A. | S7-4 |
| Jelinek, P. | S9-5 | Ondracek, M. | S9-5 | Yasuda, T. | S4-24 |
| Jia, J. | S1-2s | Onishi, H. | S4-49 | Yasuda, T. | S4-25 |
| Jochi, M. | S4-13 | Orum, A. | S4-72 | Yazaki, G. | S4-29 |
| Juang, J.Y. | S4-63 | Otsuka, T. | S4-17 | Yeom, H. W. | S1-1s |
| Jung, T. | S9-6 | Pop, F. | S4-47 | Yokoyama, H. | S4-8 |
| Kadono, K. | S4-14 | Qi, Z. K. | S6-3 | Yong, H. | S4-18 |
| Kadono, K. | S4-62 | Sagata, R. | S4-46 | Yoshida, H. | S7-5p |
| Kadowaki, K. | S4-31 | Saito, K. | S4-53 | Yoshida, N. | S4-74 |
| Kajiwara, T. | S4-22 | Sakaguchi, N. | S5-3 | Yoshida, S. | S4-24 |
| Kaminishi, K. | S4-47 | Sakaguchi, Y. | S6-4 | Yoshida, S. | S4-25 |
| Kaminishi, K. | S7-1 | Sakai, A. | S4-21 | Yoshida, S. | S4-28 |
| Kamiuchi, N. | S7-5p | Sakai, A. | S4-36 | Yoshida, S. | S4-30 |
| Kanazawa, K. | S4-67 | Sakai, A. | S4-37 | Yoshida, S. | S4-31 |
| Katano, S. | S4-65 | Sakane, S. | S4-21 | Yoshida, S. | S4-32 |
| Katano, S. | S4-66 | Sakurada, R. | S4-33 | Yoshida, S. | S4-33 |
| Katayama, M. | S4-16 | Sasaki, N. | S4-47 | Yoshida, S. | S4-64 |
| Katayama, M. | S4-17 | Sasaki, N. | S7-1 | Yoshida, T. | S4-32 |
| Katayama, T. | S4-64 | Sato, K. | S4-38 | Yoshimura, M. | S4-14 |
| Kawai, S. | S9-6 | Sato, M. | S4-19 | Yoshimura, M. | S4-22 |
| Kawakatsu, H. | S4-47 | Satoh, N. | S4-12 | Yoshimura, M. | S4-42 |
| Kawakatsu, H. | S7-1 | Satoh, N. | S4-43 | Yoshimura, M. | S4-45 |
| Kawata, Y. | S4-57 | Schimid, M. | S4-19 | Yoshimura, M. | S4-52 |
| Kenens, B. | S5-2i | Schönherr, H. | S8-4s | Yoshimura, M. | S4-62 |
| Kim, H. | S2-2i | Senda, Y. | S7-2 | Yoshimura, M. | S4-69 |
| Kim, J. H. | S1-1s | Shibata, N. | S4-39 | Yoshimura, M. | S4-72 |
| Kimura, K. | S7-4 | Shibuya, R. | S9-2i | Yoshino, H. | S4-53 |
| Kimura, R. | S5-3 | Shigehara, M. | S4-16 | Yuhara, J. | S4-11 |
| Kimura, S. | S4-15 | Shigekawa, H. | S4-3 | Yuhara, J. | S4-19 |
| Kimura, Y. | S4-2 | Shigekawa, H. | S4-24 | Yuhara, J. | S9-4 |
| Kimura, Y. | S5-3 | Shigekawa, H. | S4-25 | Zaima, S. | S4-23 |
| Kishi, T. | S4-30 | Shigekawa, H. | S4-28 | Zenkyu, R. | S4-19 |