19th International Colloquium
on Scanning Probe Microscopy (ICSPM19)


ICSPM19 Conference Program

Contents

Time Table

19-Dec (Mon) 20-Dec (Tue) 21-Dec (Wed)
Registration (12:00-14:00)
Wellcome address (14:00-14:10)
Session 1
Liquid-solid interfaces
14:10 S1-1i T. Ichii
14:40 S1-2 M. Kageshima
14:55 S1-3 S. Nishida
15:10 S1-4 K. Kaisei
Coffee break (15:25-15:50)
Session 2
Artificial soft materials
15:50 S2-1i J. Ye
16:20 S2-2 K. Ojima
16:35 S2-3 K. Nakajima
Session 3
Exhibitor's presentation
Break (17:35-18:00)
Dinner (18:00-19:30)
Session 4
Poster session (19:30-21:30)
Breakfast (07:00-08:30)
Session 5
Electric properties
08:30 S5-1s Q.-K. Xue
09:10 S5-2i T. Hanaguri
09:40 S5-3 S. Yoshida
09:55 S5-4 T. Kimura
Coffee break (10:10-10:40)
Session 6
Electric properties
10:40 S6-1 T. Nakayama
10:55 S6-2 Y. Nakajima
11:10 S6-3 Y. Ohashi
11:25 S6-4 S. Katsui
11:40 S6-5 N. Chinone
11:55 S6-6 H. Yasumatsu
12:10 S6-7 T. Matsumoto
12:25 S6-8 K. Hara
Conference Photo (12:40-12:55)
Lunch (12:55-13:55)
Session 7
Spins
13:55 S7-1 T.H. Hui
14:10 S7-2 Y. Yoshida
14:25 S7-3i M. Shiraishi
14:55 S7-4 T. Komeda
15:10 S7-5 T.K. Yamada
15:25 S7-6 K.-i. Morita
Coffee break (15:40-16:05)
Session 8
AFM, sensors, biological
16:05 S8-1 Y. Sugimoto
16:20 S8-2s S. Jeon
17:00 S8-3s K.J. Van Vliet
17:40 S8-4 R. Afrin
Break (17:55-18:30)
Banquet (18:30-21:30)
Breakfast (07:00-08:30)
Session 9
Biological
08:30 S9-1i K. Yasuda
09:00 S9-2 S. Ido
09:15 S9-3 K. Miyamoto
Coffee break (09:30-09:45)
Session 10
New methods
09:45 S10-1 T. TAKAMI
10:00 S10-2 H.-S. Liao
10:15 S10-3i T. Ando
Closing remark (10:45-10:50)
Leave for Chitose Airport (11:00)

Dec 19 Mon

Registration (12:00-14:00)

Wellcome address (H. Shigekawa and M. Yoshimura) (14:00-14:10)

Session 1 : Liquid-solid interfaces (K. Miyake)

14:10 S1-1 (INVITE)  
High-resolution Imaging on Ionic-Liquid/Solid Interfaces using Frequency Modulation Atomic Force Microscopy
T. Ichii, M. Fujimura, M. Negami, K. Murase and H. Sugimura (Dept. of Materials Sci. and Eng., Kyoto Univ.)
14:40 S1-2  
Frequency-Resolved Analysis of Hydrated Water through Pulse-Response Measurement of Atomic Force Microscopy Cantilever
M. Kageshima (Tokyo Gakugei Univ.)
14:55 S1-3  
Time-Dependent Structural Changes of Solid/Liquid Interfaces Observed using Dynamic Lateral Force Microscopy
S. Nishida, H. Murakami, M. Wang, D. Kobayashi and H. Kawakatsu (IIS, Univ. of Tokyo)
15:10 S1-4  
Molecular scale investigation of macromolecules using FM-AFM in liquids
K. Kaisei1, K. Kobayashi2,3, N. Oyabu1,3, M. Ohta3,4, R. Kokawa3,4, Y. Hirata3,5 and H. Yamada1,3 (1Dept. of Electron. Sci. & Eng., Kyoto Univ., 2SACI, Kyoto Univ., 3Japan Sci. Tech. Agen./Adv. Meas. & Anal., 4Shimadzu Corp., 5Nat'l Inst. of Adv. Ind. Sci. & Tech.)

Coffee break (15:25-15:50)

Session 2 : Artificial soft materials (T. Ichii)

15:50 S2-1 (INVITE)  
An Indentation Technique for Nanoscale Dynamic Viscoelastic Measurements at Elevated Temperature
J. Ye (Nissan ARC, Ltd.)
16:20 S2-2  
New method to measure lattice spacing of polymer crystals
K. Ojima, T. Sone and K. Yano (Canon Inc.)
16:35 S2-3  
Relaxation Time Measurement by Dynamic Nanofishing on a Single Polymer Chain
K. Nakajima and T. Nishi (WPI-AIMR, Tohoku Univ.)

Session 3 : Exhibitor's presentation (O. Takeuchi)

16:50 S3-1  Omicron NanoTechnology Japan Inc.
Omicron New Products
16:55 S3-2  Park Systems Japan, Inc.
The Most Recent Applications for MEMS, Material and Biological Science by New Generation AFM
17:00 S3-3  Tomoe Engineering Co., Ltd.
Tomoe's nanotechnology products
17:05 S3-4  UNISOKU Co.,Ltd.
Introduction of latest UHV Low Temperature SPM systems
17:10 S3-5  Research Institute of Biomolecule Metrology Co.,Ltd.
Introduction of high speed AFM systems
17:15 S3-6  OLYMPUS　CORPORATION
Recommended Cantilever
17:20 S3-7  Tec Corporation
Joule-Thomson SPM Head and SPM Control System
17:25 S3-8  Bruker AXS K.K.
The introduction of Bruker SPM with the innovative technology
17:30 S3-9  Daiken Chemical Co., Ltd.
Carbon Nanotube Cantilever

Break (17:35-18:00)

Dinner (18:00-19:30)

Session 4 : Poster session (19:30-21:30) (K. Kobayashi)

Dec 20 Tue

Breakfast (07:00-08:30)

Session 5 : Electric properties (T. Matsumoto)

08:30 S5-1 (S-INVITE)  
Molecular Beam Epitaxy-Scanning Tunneling Microscopy of Iron-Based Superconductors
Q.-K. Xue (Dept. of Physics, Tsinghua Univ.)
09:10 S5-2 (INVITE)  
Magnetic Field Effects on a Topological Insulator Studied by STM/STS
T. Hanaguri1, Y. Fu1, K. Igarashi2, M. Kawamura1, H. Takagi1,3 and T. Sasagawa2 (1RIKEN Advanced Science Inst., 2MSL, Tokyo Inst. of Technology, 3Dept. of Physics, Univ. of Tokyo)
09:40 S5-3  
Time-resolved STM on carrier dynamics at metal-nanoparticle/GaAs(110)
S. Yoshida, W. Omuro, M. Yokota, Y. Terada, O. Takeuchi and H. Shigekawa (Univ. of Tsukuba)
09:55 S5-4  
Local Electrical Characteristics of Pentacene Thin Films Measured by Point-Contact Current-Imaging Atomic Force Microscopy
T. Kimura1, Y. Miyato1, K. Kobayashi2, H. Yamada1 and K. Matsushige1 (1Kyoto Univ., 2SACI, Kyoto Univ.)

Coffee break (10:10-10:40)

Session 6 : Electric properties (K. Kobayashi)

10:40 S6-1  
Supercurrent flowing through a discontinuous In-induced layer on Si(111)
T. Uchihashi, P. Mishra, M. Aono and T. Nakayama (WPI center for Materials Nanoarchitectonics (MANA), NIMS)
10:55 S6-2  
Photovoltage Decay Investigated by Photoassisted Kelvin Probe Force Microscopy on Cu(In,Ga)Se2 Solar Cells
Y. Nakajima1, T. Menemoto3 and T. Takahashi1,2 (1IIS, Univ. of Tokyo, 2INQIE, Univ. of Tokyo, 3Dep. of Photonics, Ritsumeikan Univ.)
11:10 S6-3  
Properties of single-grain organic thin film transistors investigated by Kelvin-probe force microscopy
Y. Ohashi1, K. Noda1, K. Kobayashi2, K. Matsushige1 and H. Yamada1 (1Dept. of electoronic Sci. & Eng., Kyoto Univ., 2SACI, Kyoto Univ)
11:25 S6-4  
Photoinduced Current Spectra on InAs Wires Observed by Dual Light Illumination Method in STM
S. Katsui1 and T. Takahashi1,2 (1IIS, Univ. of Tokyo, 2INQIE, Univ. of Tokyo)
11:40 S6-5  
Super Higher-Order Nonlinaer Dielectric Microscopy
N. Chinone, K. Yamasue, Y. Hiranaga and Y. Cho (R.I.E.C.,Tohoku Univ.)
11:55 S6-6  
Nano-Space Two-Dimensional Charge Polarization Induced at Interface between Monatomic-Layered Cluster Disk and Solid Surface
H. Yasumatsu1 and N. Fukui2 (1Toyota Tech. Inst., 2Genesis Res. Inst., Inc.)
12:10 S6-7  
Imaging of Transverse Electron Transfer through DNA Molecule by Simultaneous Scanning Tunneling and Frequency-Modulation Microscopy
Y. Maeda1, T. Matsumoto2 and T. Kawai2 (1AIST, 2ISIR, Osaka Univ.)
12:25 S6-8  
Local Photothermal Measurement by AFM under Near-Infrared Light around Grain Boundaries in Multicrystalline Si Solar Cell
K. Hara1 and T. Takahashi1,2 (1IIS, the Univ. of Tokyo, 2INQIE, the Univ. of Tokyo)

Conference Photo (12:40-12:55)

Get together with your best smile!

Lunch (12:55-13:55)

Session 7 : Spins (N. Sugimoto)

13:55 S7-1  
Modeling of graphite superlattices with radius-optimized area-averaging method
T.H. Hui1, R. Rock2 and P.W. Pong1 (1Dept. of Electrical and Electronic Engineering, The Univ. of Hong Kong, Hong Kong, 2Chemical Engineering, Carnegie Mellon Univ., Pittsburgh, USA)
14:10 S7-2  
Detection and manipulation of atomic spins on a two-dimensional non-collinear magnetic template
Y. Yoshida1,2, D. Serrate1,3, P. Ferriani4, A. Kubetzka1, S.-W. Hla5, M. Menzel1, K. von  Bergmann1, S. Heinze4 and R. Wiesendanger1 (1Univ. Hambrug, 2ISSP, Univ. Tokyo, 3Univ. Zaragoza, 4Univ. Kiel, 5Ohio Univ.)
14:25 S7-3 (INVITE)  
Spin Transport and Pure Spin Current in Graphene
M. Shiraishi (Grad. Sch. of Engineering Science, Osaka Univ., Japan)
14:55 S7-4  
STM study of Kondo state in the molecules of bis(phthalocyaninato)terbium (TbPc2) and (naphthalocianine)(phthalocyanine) heteroleptic double-decker complex (TbNPcPc)
T. Komeda1, H. Isshiki1, J. Liu1, K. Katoh2 and M. Yamashita2 (1IMRAM, Tohoku Univ., 2Dept. of Chemistry Grad. Sch. of Science,Tohoku Univ.)
15:10 S7-5  
Giant magnetoresistance through a single molecule
T.K. Yamada1,2, S. Schmaus2,3, A. Bagrets3,4, Y. Nahas2, A. Bork2, F. Evers3,4 and W. Wulfhekel2,3 (1Chiba Univ., 2PI, KIT, 3DFG-CFN, KIT, 4IN, KIT)
15:25 S7-6  
Simultaneous scanning force/tunneling microscopy using a quartz cantilever with a tungsten tip
K.-i. Morita, Y. Sugimoto, M. Abe and S. Morita (Osaka Univ.)

Coffee break (15:40-16:05)

Session 8 : AFM, sensors, biological (T. Komeda)

16:05 S8-1  
Measurement of Atom Hopping Probability and Interaction Force for Atom Manipulation on the Si(111)-(7x7) Surface
Y. Sugimoto, M. Abe and S. Morita (Osaka Univ.)
16:20 S8-2 (S-INVITE)  
Microcantilever sensors as a versatile analytical tool
N. Jung, M. Yun and S. Jeon (Pohang Univ. of Science and Technology (POSTECH))
17:00 S8-3 (S-INVITE)  
Chemomechanics of cell deformation and cell-material interactions: Pulling it all together
K.J. Van Vliet (Dept. of Materials Science and Engineering, and Dept. of Biological Engineering, Massachusetts Inst. of Technology)
17:40 S8-4  
Interaction of Serum Proteins with the Surface of Hemodialysis Tubing
R. Afrin, T.W. -Nakayama, S. Machida, M. Saito and A. Ikai (Tokyo Inst. Tech.)

Break (17:55-18:30)

Banquet (18:30-21:30)

Dec 21 Wed

Breakfast (07:00-08:30)

Session 9 : Biological (T. Okajima)

08:30 S9-1 (INVITE)  
Constructive Understanding of Multicellular Network using On-chip Cellomics Technology
K. Yasuda (Tokyo Medical and Dental Univ.)
09:00 S9-2  
High-resolution Imaging of Monoclonal Antibodies in Liquids by FM-AFM
S. Ido1, H. Kimiya2, K. Kobayashi3, K. Matsushige1 and H. Yamada1 (1Dept. of Electronic Sci. and Eng., Kyoto Univ., 2Panasonic Corp., 3SACI, Kyoto Univ.)
09:15 S9-3  
Local Deposition of metallic colloidal nanoparticles from an AFM tip using dielectrophoresis
K. Miyamoto1, K. Kaisei1, K. Kobayashi2, H. Yamada1 and K. Matsushige1 (1Dept. of Electronic Science and Engineering, Kyoto Univ., 2SACI, Kyoto Univ.)

Coffee break (09:30-09:45)

Session 10 : New methods (H. Onishi)

09:45 S10-1  
Development of Beetle-type Robot with Sub-micropipette Probe
T. TAKAMI, X.L. DENG, J.W. SON, B.H. PARK and T. KAWAI (Konkuk Univ.)
10:00 S10-2  
Fast Spring Constant Calibration of Micro-cantilever using Astigmatic Detection System
H.-S. Liao1,2, B.-J. Juang1,2, K.-Y. Huang1, E.-T. Hwu2 and C.-S. Chang2 (1Dept. of Mechanical Engineering, Natl. Taiwan Univ., 10617, Taipei, Taiwan, 2Inst. of Physics, Academia Sinica, 11529, Taipei, Taiwan)
10:15 S10-3 (INVITE)  
High-speed atomic force microscopy coming of age
T. Ando1,2, N. Kodera2 and T. Uchihashi1,2 (1Dept. of Physics, Kanazawa Univ., 2Bio-AFM Frontier Research Center, Kanazawa Univ.)

Closing remark (H. Onishi) (10:45-10:50)

Leave for Chitose Airport (11:00)

The shuttle bus goes to the airport via "Ainu Musium Poroto Kotan."
Arrival time at Chitose will be before 14:30.

Session 4 : Poster Session

Dec 19 Mon 19:30-21:30

S4-1  
AFM observation of fine trenches using carbon nanofiber probes
M. Kitazawa1, A. Toda1, R. Ohta1, K. Saida2, Y. Hayashi2 and M. Tanemura2 (1Olympus Co. Ltd., 2Nagoya Inst. of Technology)
S4-2  
Effect of Tip Shapes on the Determination of Contact Area Using Atomic Force Microscope Indentation
K. Miyake1 and S. Sasaki2 (1AIST, 2Tokyo Univ. Sci.)
S4-3  
Quantitative Characterization of Nanoscale Surface Roughness by AFM with Known Probe Shapes
C.M. Wang and H. Itoh (AIST)
S4-4  
Atomic Hydrogen Exposure of a Si Cantilever and a Si Surface in an AFM
T. Miyagi1, A. Sasahara1, M. Tomitori1, R. Kokawa2, M. Ohta2, H. Yamada3, K. Kobayashi3 and N. Oyabu3,4 (1JAIST, 2Shimadzu Corp., 3Kyoto Univ., 4JST)
S4-5  
Thickness Measurement of Oxide Nanostructures Buried in a Semiconductor Surface
F. Yamada and I. Kamiya (Toyota Tech. Inst.)
S4-6  
Three dimensional force mapping and KPFM measurements on the CaF2/Si(111) surface
M. Fukumoto, Y. Sugimoto, M. Abe and S. Morita (Grad. Sch. of Engineering, Osaka Univ.)
S4-7  
Measurement of Tip-sample Interaction Changes in FM-AFM under Infrared Irradiation on Polymer Thin Films
Y. Hosokawa1, K. Kobayashi2, H. Yamada1 and K. Matsushige1 (1Dept. of Electronic Sci. & Eng., Kyoto Univ., 2SACI, Kyoto Univ.)
S4-8  
Alkali-Metal Adsorption and Manipulation on a Hydroxylated TiO2 (110) Surface Using Atomic Force Microscopy
A. Yurtsever1, Y. Sugimoto1, M. Abe1, K. Matsunaga2,3, I. Tanaka2 and S. Morita1 (1Osaka Univ., 2Kyoto Univ., 3Nagoya Univ.)
S4-9  
Charge disordered structure of Fe3O4(001) surface studied by non-contact atomic force microscopy
T. Mizuno, S. Oishi, H. Hosoi, S. Agus and K. Sueoka (Hokkaido Univ.)
S4-10  
Development of Magnetic Exchange Force Microscopy Using Ferromagnetic Resonance
S. Takada, M. Haze, Y. Naitoh, Y. J.Li and Y. Sugawara (Dept. of Applied Physics,Osaka Univ.)
S4-11  
Stable Contrast Mode on TiO2 (110) Surface by AFM with W-coated Tips
Y.J. Li, Y. Tsukuda, Y. Naitoh and Y. Sugawara (Dept. of Applied Physics, Osaka Univ.)
S4-12  
FM-AFM analysis of optical response of dye-adsorbed TiO2(110) surfaces
T. Yoshi, L.T.U. Tu, A. Sasahara and M. Tomitori (JAIST Univ.)
S4-13  
Friction and Wear on Nano-Contact with Vibration
Y. Obata1, Y. Tomizawa2, C. Yeoh1, K. Nakano1 and H. Kawakatsu1 (1Inst. of Industrial Science, The Univ. of Tokyo, 2Corporate R&D Center, Toshiba Co.)
S4-14  
Improvement in the Usability of Sample and Cantilever Holding Mechanisms for Separate-type High-Speed AFM Scanner
K. Miyata, S. Furuya, H. Asakawa and T. Fukuma (Kanazawa Univ.)
S4-15  
Atomic-resolution imaging in liquid by frequency modulation atomic force microscopy using small cantilevers
K. Onishi1, H. Asakawa2 and T. Fukuma1,2,3 (1Grad. School of Natural Science and Technology, 2Bio-AFM Frontier Research Center, 3Frontier Science Organization, Kanazawa Univ.)
S4-16  
Force Measurement Enabling Precise Analysis by Dynamic Force Spectroscopy
A. Taninaka, Y. Hirano, O. Takeuchi and H. Shigekawa (Inst. of Appl. Phys, Univ. of Tsukuba)
S4-17  
Development of a self-sensitive atomic force microscope for high-speed imaging in liquid condition
S. Matsumoto and F. Iwata (Shizuoka Univ.)
S4-18  
Atomic Imaging of Aragonite(001) Surface in Water by FM-AFM
Y. Araki1, K. Tsukamoto1, N. Oyabu2, K. Kobayashi2 and H. Yamada2 (1Tohoku Univ., 2Kyoto Univ.)
S4-19  
2D Force Mapping on Interfaces between Solids and Ionic-Liquids by Tuning Fork FM-AFM
M. Negami, T. Ichii, K. Murase and H. Sugimura (Dept. of Materials Sci. and Eng., Kyoto Univ.)
S4-20  
High-speed Operating of Liquid-environment FM-AFM Using Wideband Digital PLL Circuit
S. Yoshioka1, H. Asakawa2 and T. Fukuma1,2,3 (1Grad. School of Natural Science and Technology, 2Bio-AFM Frontier Research Center, 3Frontier Science Organization)
S4-21  
Ionic Liquid Aqueous Solution / Graphite Electrode Interfaces Observed by Frequency Modulation AFM
Y. Yokota, T. Harada, A. Imanishi and K. Fukui (Dept. of Chemistry, Grad. Sch. of Engineering Science, Osaka Univ.)
S4-22  
Single-cell electroporation using a scanning ion conductance microscope for low-invasive injection of molecules
K. Yamazaki1, K. Fukuda1, T. Ushiki2 and F. Iwata1 (1Shizuoka Univ., 2Niigata Univ.)
S4-23  
Study of Time and Temperature Dependence on Structural Transitions of Solid/Liquid Interfaces using Liquid AFM
H. Murakami, S. Nishida, M. Wang, D. Kobayashi and H. Kawakatsu (Inst. of Industrial Science, the Univ. of Tokyo)
S4-24  
Temporal Variation of Single Cell Rheology Investigated by Atomic Force Microscopy
P.G. Cai, Y. Mizutani, K. Kawahara and T. Okajima (Hokkaido Univ.)
S4-25  
Fabrication of Uniform NTA Films on Flat Substrate for AFM Bioimaging
Y. Hoshi, K. Ise and T. Matsuura (Hokkaido Univ. Edu.)
S4-26  
Heat Treatment Effect in Silanization for Force Curve Measurement
K. Ise, Y. Hoshi and T. Matsuura (Hokkaido Univ. Edu.)
S4-27  
Microwell Array with Polyacrylamide Gel for Nanobiodevice Platform
K. Sumitomo, H. Nakashima, A. Tanaka, Y. Kashimura, A. Shimada and K. Torimitsu (NTT Basic Research Laboratories)
S4-28  
Ion current mapping of living cells using ion conductance microscopy
Y. Mizutani and T. Okajima (Hokkaido Univ.)
S4-29  
Molecular Resolution Investigation of Amino Acid Crystal in Liquid by Frequency-Modulation AFM
K. Nagashima1,2, K. Okuyama1, M. Abe1, S. Morita1, N. Kanehisa1, H. Matsumura1, T. Inoue1, N. Oyabu3, K. Kobayashi3, H. Yamada3, M. Ohta4 and R. Kokawa4 (1Osaka Univ., 2Hokkaido Univ., 3Kyoto Univ., 4Shimadzu Co.)
S4-30  
Cell Cycle Dependence of Single Cell Rheology Investigated by AFM
Y. Usuki, Y. Mizutani, M. Tsuchiya and T. Okajima (Grad. Sch. Info. Sci. & Tech., Hokkaido Univ.)
S4-31  
Power-law rheology of normal and cancer cells investigated by atomic force microscopy
R. Takahashi, Y. Mizutani, K. Kawahara and T. Okajima (Grad. Sch. Info. Sci. & Tech., Hokkaido Univ.)
S4-32  
The Number of Cyclic Stretch Regulates Cellular Elasticity in C2C12 Myoblasts
K. Takemoto, T. Mizutani, K. Tamura, K. Takeda, H. Haga and K. Kawabata (Faculty of Advanced Life Sciences, Hokkaido Univ.)
S4-33  
Frequency modulation atomic force microscopy of collagen fibrils in liquids
K. Kaisei1, K. Kobayashi2,3, N. Oyabu1,3, M. Ohta3,4, R. Kokawa3,4, T. Ushiki5, Y. Hirata3,6 and H. Yamada1,3 (1Dept of Electron. Sci. & Eng., Kyoto Univ., 2SACI, Kyoto Univ., 3Japan Sci. Tech. Agen./Adv. Meas. & Anal., 4Shimadzu Corp., 5Grad. Sch. of Med. & Dent. Sci., Niigata Univ., 6Nat'l Inst. of Adv. Ind. Sci. & Tech.)
S4-34  
Sub-attoliter droplet deposition using dynamic mode AFM with an FIB-CVD-fabricated nozzle
K. Kaisei1, K. Miyamoto1, K. Kobayashi2, H. Yamada1 and K. Matsushige1 (1Dept. of Electron. Sci. & Eng., Kyoto Univ., 2SACI, Kyoto Univ.)
S4-35  
Surface Reconstruction Rearrangement Induced by Pentacene and Perfluoropentacene Molecules
Y.Y. Lo1,2, G. Hoffmann1, W.B. Su1, C.I. Wu2 and C.S. Chang1 (1Inst. of Physics, Academia Sinica, Taiwan, ROC, 2Institure of Photonics and Optoelectronics, NTU, Taiwan,ROC)
S4-36  
Au electrode/pentacene interfaces of TFTs investigated by Kelvin probe force microscopy
Y. Inoue1, T. Ishida1, S. Kubota1, Y. Iwadate1, T. Ushiyama1, S. Heike2 and T. Hashizume1,2,3 (1Dept. of Condensed Matter Phys, Tokyo Inst. of tech., 2Central Research Laboratory, Hitachi, Ltd., 3WPI-AIMR, Tohoku Univ.)
S4-37  
Study of the Iron Silicide Film Growth on Si(111) by Low-Energy Electron Microscopy and Scanning Tunneling Microscopy
M. Matsumoto1, K. Fukutani1, T. Okano1 and H. Hibino2 (1IIS, Univ. Tokyo, 2NTT Basic Res. Lab.)
S4-38  
Prism-Coupled Scanning Tunneling Microscope Light Emission Analyzed by Finite-Difference-Time-Domain Method
W. iida, S. Katano and Y. Uehara (RIEC, Tohoku Univ.)
S4-39  
Imaging of Al2O3 Thin Film
R. Doi, S. Ozawa, Y. Naitoh, Y.J. Li and S. Sugawara (Dept. of Applied Physics, Grad. Sch. of Engineering, Univ. of Osaka)
S4-40  
Initial adsorption of lithium and propylene carbonate on a metal oxide surface for lithium ion battery observed by scanning tunneling microscopy
H. Tatsumi, A. Sasahara and M. Tomitori (JAIST)
S4-41  
Study of GaSb Strained Layer Locally Grown on Si(111) by Scanning Tunneling Microscopy
R. Machida1, K. Yagishita1, S. Hara1, K. Irokawa1, H. Miki1, A. Kawazu2 and H.I. Fujishiro1 (1Tokyo Univ. of Science, 2Tokyo Denki Univ.)
S4-42  
Development and Performance Evaluation of Preamplifier Circuit for Multi-probe STM
T. Koyama, N. Kaneda, O. Takeuchi and H. Shigekawa (Inst. of Applied Physics, Univ. of Tsukuba)
S4-43  
Fabrication Method of Plastic Micropores for Artificial Lipid Bilayer Formation
H. TANAKA1,2 (1ISIR, Osaka Univ., 2PRESTO, JST)
S4-44  
Molecular Rotation in Self-Assembled Multidecker Porphyrin Complexes
H. Tanaka1, T. Ikeda2, M. Takeuchi3, K. Sada4, S. Shinkai5,6 and T. Kawai1 (1ISIR Osaka Univ., 2Kyushu Univ., 3NIMS, 4Hokkaido Univ., 5Sojo Univ., 6ISIT)
S4-45  
Quantitative Microscopic Mechanical properties of Polymers Revealed By AFM
H. Liu, S. Fujinami, D. Wang, X. Liang, T. Nishi and K. Nakajima (WPI AIMR, Tohoku Univ.)
S4-46  
Length Scale of Mechanical Heterogeneity in a Glassy Polymer Determined by Atomic Force Microscopy
D. Wang, K. Nakajima and T. Nishi (WPI Advanced Inst. for Materials Research, Tohoku Univ., 2-1-1 Katahira, Aoba, Sendai, 980-8577, Japan)
S4-47  
Precise morphology imaging of the photo-resist in water
H. Itoh, T. Odaka and C.M. Wang (AIST)
S4-48  
Viscoelasticity, Adhesion and Extended JKR theory in Force Measurement
S. Fujinami, H. Liu, D. Wang, K. Nakajima and T. Nishi (WPI-AIMR, Tohoku Univ.)
S4-49  
STM Investigation of Thermal Stability of Uni-size Pt Cluster Disk on Si Substrate
N. Fukui1 and H. Yasumatsu2 (1Genesis research Inst., Inc., East Tokyo Laboratory, 2Cluster Research Laboratory, Toyota Technological Inst.)
S4-50  
High-Resolution Observation of MgAl2O4(111) Spinel Surface Using Noncontact Atomic Force Microscopy
A. Okada1, S. Go1, M. Yoshimura2 and Y. Ishikawa1 (1Kyoto Inst. Tech., 2Toyota Tech. Inst.)
S4-51  
Electrical Properties of Individual MoO2 Nanotube with Rectangular Cross Sections Measured by a Nanoprobe System Mounted in a SEM
T. Sakurai1, H. Handa1, M. Ishikawa2, H. Fukidome1, M. Yoshimura3, T. Abe4 and M. Suemitsu1 (1RIEC, Tohoku Univ., 2Aichi Univ. of Education, 3Toyota Tech. Inst., 4Tohoku Inst. of Tech.)
S4-52  
Local Anodization of MoS2 Using Electrical Atomic Force Microscope
A. Ando1, T. Oohira1 and T. Shimizu2 (1Nanoelectronics Research Inst., AIST, 2Nanosystem Research Inst.,AIST)
S4-53  
Aluminum Adsorption on Si(110): STM and First-principles Study of “4 × 6” Superstructure
M. Yoshimura1, D. Matsuoka1 and S. Hara2 (1Toyota Technological Inst., 2Tokyo Univ. of Science)
S4-54  
Graphene Precipitation on Nickel Foil
M. Yoshimura and H. Obokata (Toyota Technological Inst.)
S4-55  
Local Electronic Characterization of Individual Single-walled Carbon Nanotube using Electrochemical STM
S. Yasuda, K. Ikeda, M. Takase and K. Murakoshi (Hokkaido Univ.)
S4-56  
Fabrication and Characterization of Metal Incorporated Carbon Nanofiber Probes by Ion Irradiation Method
M. Kubota1, K. Saida1, K. Inaba1, T. Noda1, Y. Hayashi1, M. Tanemura1, M. Kitazawa2 and R. Ohta2 (1Nagoya Inst. of Technology, 2Olympus Co. Ltd.)
S4-57  
Adsorption of Biomolecules to Graphene Flakes Supported on Sapphire Surfaces in Aqueous Environment
K. Yamazaki, T. Wada, H. Komurasaki and T. Ogino (Yokohama Natl. Univ.)
S4-58  
Measurement of Young’s Modulus of Co-incorporated Carbon Nanofiber Probes
K. Saida1, M. Kubota1, K. Inaba1, T. Noda1, Y. Hayashi1, M. Tanemura1, M. Kitazawa2 and R. Ohta2 (1Nagoya Inst. of Technology, 2Olympus Co. Ltd.)
S4-59  
Mechanical conductance regulation of Si based single molecular junction
M. Nakamura1, S. Yoshida1, T. Nakamura2, O. Takeuchi1 and H. Shigekawa1 (1Inst. of Applied Physics, Univ. of Tsukuba, 2NRI, AIST)
S4-60  
The Role of Water for Gap Formation on Metallic Single Walled Carbon Nanotubes Induced by STM Current Injection
Y. Mera, H. Sato, S. Hiratani, Y. Inoue and K. Maeda (Univ. of Tokyo)
S4-61  
Optical measurement of gold nano-grating fabricated by scanning probe lithography
M. Egami, T. Ichii, K. Murase and H. Sugimura (Dept. of Materials Science and Engineering, Kyoto Univ.)
S4-62  
Investigation of Optical Properties in Nano Region Using Photon AFM
S. YAMADA, Y. Naitoh, Y. J.Li and Y. Sugawara (Osaka Univ.)
S4-63  
Sub-nm Resolution Imaging on Sapphire Surface with Photon AFM
M. Furukawa, Y. Naitoh, Y.J. Li and Y. Sugawara (Dept. of Applied Physics, Grad. Sch. of Engineering, Osaka Univ.)
S4-64  
Fabrication of Gold Nanoparticle Array for Plasmon Waveguide Using Scanning Probe Lithography
M. Kuwata1, T. Ichii1, T. Narushima2, E. Kazawa3, H. Okamoto2, I. Nakamura3, K. Murase1 and H. Sugimura1 (1Kyoto Univ., 2IMS, 3TIRI)
S4-65  
Carrier dynamics of p-WSe2 measured by time-resolved STM
T. Kishizawa, Y. Iwata, M. Yokota, S. Yoshida, O. Takeuchi and H. Shigekawa (Inst. of Appl. Phys., Univ. of Tsukuba)
S4-66  
Removal of interference artifact in time-resolved STM by means of precise phase control of laser pulses
W. Omuro, T. Kishizawa, O. Takeuchi and H. Shigekawa (Inst. of Applied Physics, Univ. of Tsukuba.)
S4-67  
Scanning Tunneling Microscope Light Emission Study of the Au Substrate Covered with Alkanethiolate Molecule Monolayers
S. Katano, W. Iida and Y. Uehara (RIEC, Tohoku Univ.)
S4-68  
Effect of the Electron Donating/Attracting Substituent on Metal-Molecule Hybridization
S. Katano1,2, M. Hori2,3, Y. Kim2 and M. Kawai2,3 (1RIEC, Tohoku Univ., 2RIKEN, 3Univ. of Tokyo)
S4-69  
Origins of shrinking energy spacing manifesting in empty quantum well states of Pb islands on Cu(111)
W.Y. Chan1,3, H.S. Huang1,2, W.B. Su1,4, G. Hoffmann1, S.M. Lu1, C.S. Chang1, M.K. Wu1,3 and T.T. Tsong1 (1Inst. of Physics, 2Taiwan International Graduate Program, Academia Sinica, Nankang, Taipei 11529, Taiwan, 3Dept. of Physics, Natl. Tsing Hua Univ., Hsinchu 30013, Taiwan, 4Dept. of Physics, Tunghai Univ., Taichung 407, Taiwan)
S4-70  
Polymerization of Monomolecular Layer Containing Pyrrolyl Groups by a Chemical Adsorbed Technique
S.-i. Yamamoto1 and K. Ogawa2 (1Ryukoku Univ., 2Kagawa Univ.)
S4-71  
Tip-induced Redox Manipulation on Ferrocene Derivative Monolayers
Y. Shimokawa, T. Ichii, K. Murase and H. Sugimura (Kyoto Univ.)
S4-72  
Structural and Electronic Properties around Antiphase Domain Boundaries in Epitaxial Fe3O4 Films on MgO(100)
A. Ikeuchi, A. Subagyo, S. Hiura and K. Sueoka (Hokkaido Univ.)
S4-73  
Optical excitation dependence of carrier relaxation processes appearing in SPPX-STM on semiconductor
M. Yokota, K. Narita, Y. Terada, S. Yoshida, O. Takeuchi and H. Shigekawa (Inst. of Applied Physics, Univ. of Tsukuba)
S4-74  
Laser - combined STM study on bulk - hetero junction structure in organic solar cell
T. Ochiai, N. Takeuchi, S. Yoshida,, O. Takeuchi and H. Shigekawa (Inst. of Applied of Physics, Univ. of Tsukuba,)

Author index

*Boldface represents the presenters.

Abe, M. S4-8 : Kobayashi, K. S4-18 : Sakurai, T. S4-51
Abe, M. S4-29 : Kobayashi, K. S4-29 : Sasagawa, T. S5-2
Abe, M. S7-6 : Kobayashi, K. S4-33 : Sasahara, A. S4-4
Abe, M. S8-1 : Kobayashi, K. S4-34 : Sasahara, A. S4-12
Abe, T. S4-51 : Kobayashi, K. S5-4 : Sasahara, A. S4-40
Afrin, R. S8-4 : Kobayashi, K. S6-3 : Sasaki, S. S4-2
Agus, S. S4-9 : Kobayashi, K. S9-2 : Sato, H. S4-60
Ando, A. S4-52 : Kobayashi, K. S9-3 : Schmaus, S. S7-5
Ando, T. S10-3 : Kodera, N. S10-3 : Serrate, D. S7-2
Aono, M. S6-1 : Kokawa, R. S1-4 : Shigekawa, H. S4-16
Araki, Y. S4-18 : Kokawa, R. S4-4 : Shigekawa, H. S4-42
Asakawa, H. S4-14 : Kokawa, R. S4-29 : Shigekawa, H. S4-59
Asakawa, H. S4-15 : Kokawa, R. S4-33 : Shigekawa, H. S4-65
Asakawa, H. S4-20 : Komeda, T. S7-4 : Shigekawa, H. S4-66
Bagrets, A. S7-5 : Komurasaki, H. S4-57 : Shigekawa, H. S4-73
von Bergmann, K. S7-2 : Koyama, T. S4-42 : Shigekawa, H. S4-74
Bork, A. S7-5 : Kubetzka, A. S7-2 : Shigekawa, H. S5-3
Cai, P.G. S4-24 : Kubota, M. S4-56 : Shimada, A. S4-27
Chan, W.Y. S4-69 : Kubota, M. S4-58 : Shimizu, T. S4-52
Chang, C.-S. S10-2 : Kubota, S. S4-36 : Shimokawa, Y. S4-71
Chang, C.S. S4-35 : Kuwata, M. S4-64 : Shinkai, S. S4-44
Chang, C.S. S4-69 : Li, Y.J. S4-10 : Shiraishi, M. S7-3
Chinone, N. S6-5 : Li, Y.J. S4-11 : Son, J.W. S10-1
Cho, Y. S6-5 : Li, Y.J. S4-39 : Sone, T. S2-2
Deng, X.L. S10-1 : Li, Y.J. S4-62 : Su, W.B. S4-35
Doi, R. S4-39 : Li, Y.J. S4-63 : Su, W.B. S4-69
Egami, M. S4-61 : Liang, X. S4-45 : Subagyo, A. S4-72
Evers, F. S7-5 : Liao, H.-S. S10-2 : Suemitsu, M. S4-51
Ferriani, P. S7-2 : Liu, H. S4-45 : Sueoka, K. S4-9
Fu, Y. S5-2 : Liu, H. S4-48 : Sueoka, K. S4-72
Fujimura, M. S1-1 : Liu, J. S7-4 : Sugawara, S. S4-39
Fujinami, S. S4-45 : Lo, Y.Y. S4-35 : Sugawara, Y. S4-10
Fujinami, S. S4-48 : Lu, S.M. S4-69 : Sugawara, Y. S4-11
Fujishiro, H.I. S4-41 : Machida, R. S4-41 : Sugawara, Y. S4-62
Fukidome, H. S4-51 : Machida, S. S8-4 : Sugawara, Y. S4-63
Fukuda, K. S4-22 : Maeda, K. S4-60 : Sugimoto, Y. S4-6
Fukui, K. S4-21 : Maeda, Y. S6-7 : Sugimoto, Y. S4-8
Fukui, N. S4-49 : Matsumoto, M. S4-37 : Sugimoto, Y. S7-6
Fukui, N. S6-6 : Matsumoto, S. S4-17 : Sugimoto, Y. S8-1
Fukuma, T. S4-14 : Matsumoto, T. S6-7 : Sugimura, H. S1-1
Fukuma, T. S4-15 : Matsumura, H. S4-29 : Sugimura, H. S4-19
Fukuma, T. S4-20 : Matsunaga, K. S4-8 : Sugimura, H. S4-61
Fukumoto, M. S4-6 : Matsuoka, D. S4-53 : Sugimura, H. S4-64
Fukutani, K. S4-37 : Matsushige, K. S4-7 : Sugimura, H. S4-71
Furukawa, M. S4-63 : Matsushige, K. S4-34 : Sumitomo, K. S4-27
Furuya, S. S4-14 : Matsushige, K. S5-4 : Takada, S. S4-10
Go, S. S4-50 : Matsushige, K. S6-3 : Takagi, H. S5-2
Haga, H. S4-32 : Matsushige, K. S9-2 : Takahashi, R. S4-31
Hanaguri, T. S5-2 : Matsushige, K. S9-3 : Takahashi, T. S6-2
Handa, H. S4-51 : Matsuura, T. S4-25 : Takahashi, T. S6-4
Hara, K. S6-8 : Matsuura, T. S4-26 : Takahashi, T. S6-8
Hara, S. S4-41 : Menemoto, T. S6-2 : Takami, T. S10-1
Hara, S. S4-53 : Menzel, M. S7-2 : Takase, M. S4-55
Harada, T. S4-21 : Mera, Y. S4-60 : Takeda, K. S4-32
Hashizume, T. S4-36 : Miki, H. S4-41 : Takemoto, K. S4-32
Hayashi, Y. S4-1 : Mishra, P. S6-1 : Takeuchi, M. S4-44
Hayashi, Y. S4-56 : Miyagi, T. S4-4 : Takeuchi, N. S4-74
Hayashi, Y. S4-58 : Miyake, K. S4-2 : Takeuchi, O. S4-16
Haze, M. S4-10 : Miyamoto, K. S4-34 : Takeuchi, O. S4-42
Heike, S. S4-36 : Miyamoto, K. S9-3 : Takeuchi, O. S4-59
Heinze, S. S7-2 : Miyata, K. S4-14 : Takeuchi, O. S4-65
Hibino, H. S4-37 : Miyato, Y. S5-4 : Takeuchi, O. S4-66
Hiranaga, Y. S6-5 : Mizuno, T. S4-9 : Takeuchi, O. S4-73
Hirano, Y. S4-16 : Mizutani, T. S4-32 : Takeuchi, O. S4-74
Hirata, Y. S1-4 : Mizutani, Y. S4-24 : Takeuchi, O. S5-3
Hirata, Y. S4-33 : Mizutani, Y. S4-28 : Tamura, K. S4-32
Hiratani, S. S4-60 : Mizutani, Y. S4-30 : Tanaka, A. S4-27
Hiura, S. S4-72 : Mizutani, Y. S4-31 : Tanaka, H. S4-43
Hla, S-W. S7-2 : Morita, K.-i. S7-6 : Tanaka, H. S4-44
Hoffmann, G. S4-35 : Morita, S. S4-6 : Tanaka, I. S4-8
Hoffmann, G. S4-69 : Morita, S. S4-8 : Tanemura, M. S4-1
Hori, M. S4-68 : Morita, S. S4-29 : Tanemura, M. S4-56
Hoshi, Y. S4-25 : Morita, S. S7-6 : Tanemura, M. S4-58
Hoshi, Y. S4-26 : Morita, S. S8-1 : Taninaka, A. S4-16
Hosoi, H. S4-9 : Murakami, H. S1-3 : Tatsumi, H. S4-40
Hosokawa, Y. S4-7 : Murakami, H. S4-23 : Terada, Y. S4-73
Huang, H.S. S4-69 : Murakoshi, K. S4-55 : Terada, Y. S5-3
Huang, K.-Y. S10-2 : Murase, K. S1-1 : Toda, A. S4-1
Hui, T.H. S7-1 : Murase, K. S4-19 : Tomitori, M. S4-4
Hwu, E.-T. S10-2 : Murase, K. S4-61 : Tomitori, M. S4-12
Ichii, T. S1-1 : Murase, K. S4-64 : Tomitori, M. S4-40
Ichii, T. S4-19 : Murase, K. S4-71 : Tomizawa, Y. S4-13
Ichii, T. S4-61 : Nagashima, K. S4-29 : Torimitsu, K. S4-27
Ichii, T. S4-64 : Nahas, Y. S7-5 : Tsong, T.T. S4-69
Ichii, T. S4-71 : Naitoh, Y. S4-10 : Tsuchiya, M. S4-30
Ido, S. S9-2 : Naitoh, Y. S4-11 : Tsukamoto, K. S4-18
Igarashi, K. S5-2 : Naitoh, Y. S4-39 : Tsukuda, Y. S4-11
iida, W. S4-38 : Naitoh, Y. S4-62 : Tu, L.T.U. S4-12
Iida, W. S4-67 : Naitoh, Y. S4-63 : Uchihashi, T. S6-1
Ikai, A. S8-4 : Nakajima, K. S2-3 : Uchihashi, T. S10-3
Ikeda, K. S4-55 : Nakajima, K. S4-45 : Uehara, Y. S4-38
Ikeda, T. S4-44 : Nakajima, K. S4-46 : Uehara, Y. S4-67
Ikeuchi, A. S4-72 : Nakajima, K. S4-48 : Ushiki, T. S4-22
Imanishi, A. S4-21 : Nakajima, Y. S6-2 : Ushiki, T. S4-33
Inaba, K. S4-56 : Nakamura, I. S4-64 : Ushiyama, T. S4-36
Inaba, K. S4-58 : Nakamura, M. S4-59 : Usuki, Y. S4-30
Inoue, T. S4-29 : Nakamura, T. S4-59 : Van Vliet, K.J. S8-3
Inoue, Y. S4-36 : Nakano, K. S4-13 : Wada, T. S4-57
Inoue, Y. S4-60 : Nakashima, H. S4-27 : Wang, C.M. S4-3
Irokawa, K. S4-41 : Nakayama, T. S6-1 : Wang, C.M. S4-47
Ise, K. S4-25 : Narita, K. S4-73 : Wang, D. S4-45
Ise, K. S4-26 : Narushima, T. S4-64 : Wang, D. S4-46
Ishida, T. S4-36 : Negami, M. S1-1 : Wang, D. S4-48
Ishikawa, M. S4-51 : Negami, M. S4-19 : Wang, M. S1-3
Ishikawa, Y. S4-50 : Nishi, T. S2-3 : Wang, M. S4-23
Isshiki, H. S7-4 : Nishi, T. S4-45 : Watanabe-Nakayama, T. S8-4
Itoh, H. S4-3 : Nishi, T. S4-46 : Wiesendanger, R. S7-2
Itoh, H. S4-47 : Nishi, T. S4-48 : Wu, C.I. S4-35
Iwadate, Y. S4-36 : Nishida, S. S1-3 : Wu, M.K. S4-69
Iwata, F. S4-17 : Nishida, S. S4-23 : Wulfhekel, W. S7-5
Iwata, F. S4-22 : Noda, K. S6-3 : Xue, Q.-K. S5-1
Iwata, Y. S4-65 : Noda, T. S4-56 : Yagishita, K. S4-41
Jeon, S. S8-2 : Noda, T. S4-58 : Yamada, F. S4-5
Juang, B.-J. S10-2 : Obata, Y. S4-13 : Yamada, H. S1-4
Jung, N. S8-2 : Obokata, H. S4-54 : Yamada, H. S4-4
Kageshima, M. S1-2 : Ochiai, T. S4-74 : Yamada, H. S4-7
Kaisei, K. S1-4 : Odaka, T. S4-47 : Yamada, H. S4-18
Kaisei, K. S4-33 : Ogawa, K. S4-70 : Yamada, H. S4-29
Kaisei, K. S4-34 : Ogino, T. S4-57 : Yamada, H. S4-33
Kaisei, K. S9-3 : Ohashi, Y. S6-3 : Yamada, H. S4-34
Kamiya, I. S4-5 : Ohta, M. S1-4 : Yamada, H. S5-4
Kaneda, N. S4-42 : Ohta, M. S4-4 : Yamada, H. S6-3
Kanehisa, N. S4-29 : Ohta, M. S4-29 : Yamada, H. S9-2
Kashimura, Y. S4-27 : Ohta, M. S4-33 : Yamada, H. S9-3
Katano, S. S4-38 : Ohta, R. S4-1 : Yamada, S. S4-62
Katano, S. S4-67 : Ohta, R. S4-56 : Yamada, T.K. S7-5
Katano, S. S4-68 : Ohta, R. S4-58 : Yamamoto, S.-i. S4-70
Katoh, K. S7-4 : Oishi, S. S4-9 : Yamashita, M. S7-4
Katsui, S. S6-4 : Ojima, K. S2-2 : Yamasue, K. S6-5
Kawabata, K. S4-32 : Okada, A. S4-50 : Yamazaki, K. S4-22
Kawahara, K. S4-24 : Okajima, T. S4-24 : Yamazaki, K. S4-57
Kawahara, K. S4-31 : Okajima, T. S4-28 : Yano, K. S2-2
Kawai, M. S4-68 : Okajima, T. S4-30 : Yasuda, K. S9-1
Kawai, T. S4-44 : Okajima, T. S4-31 : Yasuda, S. S4-55
Kawai, T. S6-7 : Okamoto, H. S4-64 : Yasumatsu, H. S4-49
Kawai, T. S10-1 : Okano, T. S4-37 : Yasumatsu, H. S6-6
Kawakatsu, H. S1-3 : Okuyama, K. S4-29 : Ye, J. S2-1
Kawakatsu, H. S4-13 : Omuro, W. S4-66 : Yeoh, C. S4-13
Kawakatsu, H. S4-23 : Omuro, W. S5-3 : Yokota, M. S4-65
Kawamura, M. S5-2 : Onishi, K. S4-15 : Yokota, M. S4-73
Kawazu, A. S4-41 : Oohira, T. S4-52 : Yokota, M. S5-3
Kazawa, E. S4-64 : Oyabu, N. S1-4 : Yokota, Y. S4-21
Kim, Y. S4-68 : Oyabu, N. S4-4 : Yoshi, T. S4-12
Kimiya, H. S9-2 : Oyabu, N. S4-18 : Yoshida, S. S4-59
Kimura, T. S5-4 : Oyabu, N. S4-29 : Yoshida, S. S4-65
Kishizawa, T. S4-65 : Oyabu, N. S4-33 : Yoshida, S. S4-73
Kishizawa, T. S4-66 : Ozawa, S. S4-39 : Yoshida, S. S5-3
Kitazawa, M. S4-1 : Park, B.H. S10-1 : Yoshida, Y. S7-2
Kitazawa, M. S4-56 : Pong, P.W.T. S7-1 : Yoshida,, S. S4-74
Kitazawa, M. S4-58 : Rock, R. S7-1 : Yoshimura, M. S4-50
Kobayashi, D. S1-3 : Sada, K. S4-44 : Yoshimura, M. S4-51
Kobayashi, D. S4-23 : Saida, K. S4-1 : Yoshimura, M. S4-53
Kobayashi, K. S1-4 : Saida, K. S4-56 : Yoshimura, M. S4-54
Kobayashi, K. S4-4 : Saida, K. S4-58 : Yoshioka, S. S4-20
Kobayashi, K. S4-7 : Saito, M. S8-4 : Yun, M. S8-2
Sp