20th International Colloquium
on Scanning Probe Microscopy (ICSPM20)


ICSPM20 Conference Program

Contents

Time Table

17-Dec (Mon) 18-Dec (Tue) 19-Dec (Wed)
Registration (12:00-14:00)
Wellcome address (14:00-14:10)
Session 1
14:10 S1-1s Y. Kuk
14:50 S1-2s R. Proksch
15:30 S1-3 A. Berquand
15:45 S1-4 Y. Kim
16:00 S1-5 J. Onoda
Session 2
Exhibitor's presentation
Break (17:05-17:15)
Session 3
Poster session (17:15-19:15)
Free time for dinner (19:15-)
Breakfast (06:30-08:00)
Session 4
08:00 S4-1s A. Raman
08:40 S4-2 T. Okajima
08:55 S4-3 T. Uchihashi
09:10 S4-4 R.-F. Ding
09:25 S4-5 B.-J. Juang
Coffee break (09:40-10:00)
Session 5
10:00 S5-1 H. Liu
10:15 S5-2 F. Ito
10:30 S5-3 T. Ichii
10:45 S5-4 H. Hara
11:00 S5-5 T. Hiasa
11:15 S5-6 H. Asakawa
Conference Photo (11:30-11:45)
Free time for lunch (11:45-13:15)
Session 6
13:15 S6-1i K. Watanabe
13:45 S6-2i M. Ashino
14:15 S6-3 Y. Sugimoto
14:30 S6-4 D. Mizuno
Coffee break (14:45-15:05)
Session 7
15:05 S7-1 S. Yamazaki
15:20 S7-2 E. Inami
15:35 S7-3 T. Kondo
15:50 S7-4 S. Yasuda
16:05 S7-5i N. Takagi
Coffee break (16:35-16:55)
Session 8
16:55 S8-1 H. Tanaka
17:10 S8-2 Y. Fujikawa
17:25 S8-3 S. Yoshida
17:40 S8-4 K. Iwaya
17:55 S8-5 Y.P. Chiu
Break (18:10-18:30)
20th Anniversary Celebration (18:30-21:00)
Breakfast (06:30-08:00)
Session 9
08:00 S9-1i Y. Miyahara
08:30 S9-2 H. Guo
08:45 S9-3 T. Komeda
09:00 S9-4 E. Arima
Session 10
09:15 S10-1 H. Yong
09:30 S10-2 M.C. Shih
09:45 S10-3 K. Nakano
10:00 S10-4 A. Ando
Closing remark (10:15-10:20)
Excursion (10:30-)

Dec 17 Mon

Registration (12:00-14:00)

Wellcome address (H. Shigekawa and M. Yoshimura) (14:00-14:10)

Session 1 : (H. Onishi)

14:10 S1-1 (S-INVITE)  
STM, from a surface science tool to a general condensed matter physics tool
Y. Kuk (Seoul National University, Korea)
14:50 S1-2 (S-INVITE)  
Extracting Quantitative Nanomechanical Properties from Tapping Mode: AM-FM and Loss Tangent Imaging
R. Proksch (Asylum Research)
15:30 S1-3  
Peak Force Tapping investigation of invasive and non-invasive forms of the U251 isogenic cell line: towards detection of cancer at an early stage
A. Berquand1, H.-M. Kuhn2, A. Holloschi2 and P. Kioschis2 (1Bruker Nano, Östliche Rheinbrückenstrasse 49, Karlsruhe, Germany, 2Univ. of Applied Science, Paul-Wittack Strasse 10, Mannheim, Germany)
15:45 S1-4  
Single-Molecule Chemistry on an Ultrathin Insulating Film
J. Jung1, H.-J. Shin2, M. Kawai3 and Y. Kim1 (1RIKEN, 2UNIST, 3Univ. of Tokyo)
16:00 S1-5  
Non-contact Atomic Force Microscopy Study of Oxygen-adsorbed Si(111)-(7×7) Surface at Room Temperature
J. Onoda1, A. Yurtsever1, Y. Sugimoto1, M. Abe2 and S. Morita1 (1Osaka Univ., 2Nagoya Univ.)

Session 2 : Exhibitor's presentation (O. Takeuchi)

16:15 S2-1  UNISOKU Co.,Ltd.
latest UHV LT SPM systems
16:20 S2-2  Park Systems Japan, Inc.
The Most Recent Applications for MEMS, Material and Biological Science by New Generation AFM
16:25 S2-3  Omicron NanoTechnology Japan
A new compact low temperature Fermi SPM with LHe cryostat
16:30 S2-4  Bruker AXS K.K.
The introduction of Bruker SPM with the innovative technology
16:35 S2-5  TOMOE Engineering Co., Ltd.
Introduction of TOMOE's products for Nano-Technology
16:40 S2-6  OLYMPUS CORPORATION
Recommended Cantilever
16:45 S2-7  Asylum Technology
Cypher AFM and Nanoscale Quantitative Mechanical Properties Measurements Tools
16:50 S2-8  SHIMADZU CORPORATION
A New SPM Equipment and its related technique.
16:55 S2-9  KIBO Utilization Promotion Office
Creating new proposals on "KIBO" (the Japanese Experiment Module) utilization
17:00 S2-10  Techscience Ltd.
Compact NaioAFM and Micro manipulater

Break (17:05-17:15)

Session 3 : Poster session (17:15-19:15)

Free time for dinner (19:15-)

Dec 18 Tue

Breakfast (06:30-08:00)

Session 4 : (H. Tanaka)

08:00 S4-1 (S-INVITE)  
Multi-harmonic AFM methods for in-vitro quantitative material property mapping of living cells and viruses
A. Raman and A. Cartagena (School of Mechanical Engineering and Birck Nanotechnology Center, Purdue Univ.)
08:40 S4-2  
Quantitative Measurement of Cell Membrane Fluctuations by Scanning Ion Conductance Microscopy
Y. Mizutani1, M.-H. Choi2, S.-J. Cho2,3 and T. Okajima1 (1Hokkaido Univ., 2Park Systems Corp., 3Seoul Natl. Univ.)
08:55 S4-3  
Combined High-Speed AFM and Optical Microscopy
T. Uchihashi1,2, S. Fukuda1,2 and T. Ando1,2 (1Dept. of Mathematics and Physics, Grad School of Natural Science and Technology Kanazawa Univ., 2Bio-AFM Frontier Research Center, Kanazawa Univ.)
09:10 S4-4  
Development of Adaptable Cantilever Holder for Atomic Force Microscopy in Liquid
R.-F. Ding1,2, H.-S. Liao1,2, C.-W. Yang2, K.-Y. Huang1, I.-S. Hwang2 and C.-S. Chang2 (1Dept. of Mechanical Engineering, Natl. Taiwan Univ., Taipei 10617, Taiwan R.O.C., 2Inst. of Physics, Academia Sinica, Taipei 11529, Taiwan R.O.C.)
09:25 S4-5  
Linear and Angular Detection Functions of Holographic Optical Element (HOE)-AFM
B.-J. Juang1,2, T.-J. Chang1, H.-S. Liao1,2, K.-Y. Huang1, E.-T. Hwu2 and I.-S. Hwang2 (1Dept. of Mechanical Engineering, Natl. Taiwan Univ., 2Inst. of Physics, Academia Sinica)

Coffee break (09:40-10:00)

Session 5 : (F. Iwata)

10:00 S5-1  
Influence of Height Fluctuations on Nanomechanical Mapping Results
H. Liu1, T. Nawa2, S. Fujinami1, K. Nakajima1 and T. Nishi1 (1WPI AIMR, Tohoku Univ., 2Hoyu Co.,Ltd)
10:15 S5-2  
Investigation of Surfactant Self-Assembly at the Interface between Aqueous Solution and Au(111) Substrate by Force Mapping Using FM-AFM
F. Ito1, K. Suzuki1, K. Umeda1, K. Kobayashi2 and H. Yamada1 (1Dept. of Electronics Sci. and Eng., Kyoto Univ., 2SACI, Kyoto Univ.)
10:30 S5-3  
Ionic-Liquid/Electrode Interfaces Investigated by Electrochemical FM-AFM with a Quartz Tuning Fork Sensor
T. Ichii, M. Negami, K. Murase and H. Sugimura (Kyoto Univ.)
10:45 S5-4  
Local Structure Analyses of Ionic Liquid/Rubrene(001) Interface Using FM-AFM
H. Hara1, T. Harada1, A. Imanishi1, Y. Yokota1, T. Uemura2, J. Takeya2 and K. Fukui1 (1Grad. School Engineer. Sci. Osaka Univ., 2ISIR, Osaka Univ.)
11:00 S5-5  
FM-AFM Observation on Mercaptohexanol Monolayer in Aqueous Solution
T. Hiasa, K. Kimura and H. Onishi (Kobe Univ.)
11:15 S5-6  
3D Distribution of Fluctuating Surface Structures at Solid/Liquid Interfaces Visualized by 3D Scanning Force Microscopy
H. Asakawa1, N. Inada2 and T. Fukuma1,2 (1Bio-AFM FRC, Kanazawa Univ., 2Div. of Electrical Eng. and Computer Sci., Kanazawa Univ.)

Conference Photo (11:30-11:45)

Get together with your best smile!

Free time for lunch (11:45-13:15)

Session 6 : (M. Yoshimura)

13:15 S6-1 (INVITE)  
Laser-induced Photochemical Processes on Plasmonic Metal Nanoparticles
K. Watanabe (Tokyo Univ. of Science)
13:45 S6-2 (INVITE)  
Unusual Elastic and Inelastic Behaviors of Carbon Nanotubes due to Molecular Encapsulations: Dynamic Force Microscopy and Spectroscopy Studies
M. Ashino (Univ. of Hamburg)
14:15 S6-3  
Relation between Force and Conductance on the Si(111)-(7x7) surface
Y. Sugimoto1, M. Abe2 and S. Morita1 (1Osaka Univ., 2Nagoya Univ.)
14:30 S6-4  
Atomic dipole moments on hydrogen-adsorbed Si(111)-7×7 surface observed by using noncontact scanning nonlinear dielectric microscopy
D. Mizuno, K. Yamasue and Y. Cho (RIEC Tohoku Univ.)

Coffee break (14:45-15:05)

Session 7 : (K. Kobayashi)

15:05 S7-1  
Nano-Scale Transport on Structured Graphene Using Four-Probe Scanning Tunneling Microscopy and Potentiometry
S. Yamazaki1, O. Pietzsch1, R. Wiesendanger1, J.-K. Lee2, S.-W. Lee3 and U. Dettlaff2 (1Univ. of Hamburg, 2Korea Univ., 3Konkuk Univ.)
15:20 S7-2  
Scanning Tunneling Microscopy Study of Photoinduced Structural Phase Transition of Graphite
E. Inami1, J. Kanasaki2 and K. Tanimura2 (1GSE, Osaka Univ., 2ISIR, Osaka Univ.)
15:35 S7-3  
STS observation of Landau levels in potassium-doped graphite in the absence of external magnetic field
T. Kondo, D. Guo, T. Machida, K. Iwatake, S. Okada and J. Nakamura (Univ. Tsukuba)
15:50 S7-4  
Characterization of the Absolute Potential of the Valence and Conduction Bands of Individual Single-walled Carbon Nanotube using Electrochemical STM
S. Yasuda1,2, K. Ikeda1 and K. Murakoshi1 (1Hokkaido Univ., 2PRESTO)
16:05 S7-5 (INVITE)  
Silicene on Ag(111), New Two-Dimensional Honeycomb Material
N. Takagi (Dept. of Advanced Materials Science, The Univ. of Tokyo)

Coffee break (16:35-16:55)

Session 8 : (K. Nakajima)

16:55 S8-1  
dI/dV Spectroscopy of Ferrocene-Bridged Trisporphyrin on Au(111)
H. Tanaka1, A. Satake2 and T. Kawai1 (1ISIR, Osaka Univ., 2Tokyo Univ. of Science)
17:10 S8-2  
In-Situ Conductivity Measurement on Layer-by-Layer Growth of Bi Thin Film Phase
Y. Fujikawa1 and E. Saitoh1,2,3 (1IMR, Tohoku Univ., 2WPI-AIMR, Tohoku Univ., 3Japan Atomic Energy Agency)
17:25 S8-3  
Probing Electron Spin Dyamics by Time Resolved STM
S. Yoshida1, Y. Aizawa1, O. Takeuchi1, Y. Mera2 and H. Shigekawa1 (1Univ. of Tsukuba, 2The Univ. of Tokyo)
17:40 S8-4  
STM Studies of Perovskite Oxide Thin Films
K. Iwaya1, R. Shimizu1, T. Ohsawa1 and T. Hitosugi1,2 (1WPI-AIMR, Tohoku Univ., 2PRESTO, JST)
17:55 S8-5  
Mapping band alignment across LaAlO3/SrTiO3 hetero-interface using scanning tunneling microscopy
Y.P. Chiu1, B.C. Huang1, P.C. Huang1, V.T. Tra2, J.Y. Lin2, J.C. Yang3 and Y.H. Chu3 (1Dept. of Physics, Natl. Sun Yat-sen Univ., Kaohsiung, 804, Taiwan, 2Inst. of Physics, Natl. Chiao Tung Univ., Hsinchu, 300, Taiwan, 3Dept. of Materials Science and Engineering, Natl. Chiao Tung Univ., HsinChu, 300, Taiwan)

Break (18:10-18:30)

20th Anniversary Celebration (18:30-21:00)

Dec 19 Wed

Breakfast (06:30-08:00)

Session 9 : (T. Okajima)

08:00 S9-1 (INVITE)  
Energy Level Spectroscopy of Quantum Dots by Force Detection
Y. Miyahara (McGill Univ.)
08:30 S9-2  
In-situ surface observation by using stress/strain fields scanning probe microscopy
H. Guo and D. Fujita (Global Research center for Environments and Energy based on Nanomaterials Science, Natl. Inst. for Materials Science.)
08:45 S9-3  
Observation of Cross-over of Vibration and Kondo Resonance Excitation
T. Komeda1, H. Isshiki1,2, J. Liu1,2, K. Katoh2 and M. Yamashita2 (1IMRAM, Tohoku Univ., 2Dep Chemistry, Tohoku Univ.)
09:00 S9-4  
Development of Magnetic Force Microscopy Using Ferromagnetic Resonance
E. Arima, S. Takada, M. Haze, Y. Naitoh, Y.J. Li and Y. Sugawara (Osaka Univ.)

Session 10 : (M. Kageshima)

09:15 S10-1  
Photovoltage Decay Measurements by P-KFM on Cu(In,Ga)Se2 Solar Cells
H. Yong1, Y. Nakajima1, T. Minemoto3 and T. Takahashi1,2 (1IIS, The Univ. of Tokyo, 2INQIE, The Univ. of Tokyo, 3Fac. of Sci. and Eng., Ritsumeikan Univ.)
09:30 S10-2  
Cross-sectional nanoscale morphology and interfacial band alignment of P3HT:PCBM hybrid solar cell by scanning tunneling microscopy
M.C. Shih1,2, B.C. Huang2, C.C. Lin3, S.S. Li3, C.S. Chang1, Y.P. Chiu2 and C.W. Chen3 (1Inst. of Physics, Academia Sinica, Taipei 11529, Taiwan, 2Dept. of Physics, Natl. Sun Yat-sen Univ., Kaohsiung, 80424, Taiwan, 3Dept. of Materials Science and Engineering, Natl. Taiwan Univ., Taipei, 10617 Taiwan)
09:45 S10-3  
Using TEM-AFM three dimensional nano-range measurement
K. Nakano, S. Takeda, Y. Obata, C. Yeoh, D. Kobayashi and H. Kawakatsu (Inst. of Industrial Science, The Univ. of Tokyo, Japan)
10:00 S10-4  
Mechanical Exfoliation of Transition Metal Dichalcogenides Using Mechanical Probes
A. Ando1, T. Shimizu1, H. Suga2,1 and Y. Morita1 (1AIST, 2CIT)

Closing remark (H. Onishi) (10:15-10:20)

Excursion (11:00-)

The shuttle bus brings you to Okinawa World, Shurijo Castle and some other popular sightseeing places, and then to the airport about 4 pm.

Session 3 : Poster Session

Dec 17 Mon 17:15-19:15

S3-1  
Comparison between Three Quantitative Atomic Force Microscopy Techniques
A. Berquand (Bruker Nano, Östliche Rheinbrückenstrasse 49, Karlsruhe, Germany)
S3-2  
Rectification of force-distance curve using capacitance measurement
Y. Naitou (Nanoelectronics Research Inst., AIST)
S3-3  
Local Electrical Bias Application and Potential Measurements on Diacetylene Thin Film Grains by Dual-Probe Atomic Force Microscopy
M. Hirose1, K. Kobayashi2 and H. Yamada1 (1Kyoto Univ., 2SACI, Kyoto Univ.)
S3-4♥ (Nominated for ICSPM20 Poster Award)  
Toward a Quantitative Understanding of the Effect of Tip Shape on Measurements of Surface Roughness by AFM Based on Simulation Results
C.M. Wang and H. Itoh (AIST, Japan)
S3-5  
Study of the Li Insertion Process in the Spinel Li4Ti5O12 (111) Surface by Atomic Force Microscopy
M. Kitta, Y. Maeda, T. Akita and M. Kohyama (AIST)
S3-6♥ (Nominated for ICSPM20 Poster Award)  
Development of High-speed Atomic-resolution AFM for in-situ Imaging of Solid-liquid Interfaces
K. Miyata, H. Asakawa and T. Fukuma (Kanazawa Univ.)
S3-7♥ (Nominated for ICSPM20 Poster Award)  
Development of Vacuum Electrochemical FM-AFM for Investigation of Ionic-Liquid/Electrode interfaces
M. Negami, T. Ichii, K. Murase and H. Sugimura (Dept. of Materials Sci. and Eng., Kyoto Univ.)
S3-8  
Study of stretching a single poly (N-isopropylacrylamide) chain in mixed Solvent of water/methanol
X. Liang1, K. Nakajima1 and F.M. Winnik2 (1Tohoku Univ, 2Montreal Univ)
S3-9♥ (Nominated for ICSPM20 Poster Award)  
Quantitative charge density measurement of biomolecule in aqueous solutions by FM-AFM with force mapping technique
K. Umeda1, Y. Hirata2, N. Oyabu1, K. Kobayashi3 and H. Yamada1 (1Dept. of Electronic Sci. and Eng., Kyoto Univ., 2AIST, 3SACI, Kyoto Univ.)
S3-10  
Real-time monitoring of cantilever dynamics in non-contact Atomic Force Microscopy
K. Yamamoto, N. Monta, T. Mizuno, H. Hosoi, A. Subagyo and K. Sueoka (Grad. Sch. of Information Science and Technology ,Hokkaido Univ.)
S3-11  
Toward real time chemical contrast atomic force microscopy
M. Othman1, D. Damiron1,2, Y. Toriyama1, D. Kobayashi1 and H. Kawakatsu1 (1IIS, the Univ. of Tokyo, 2LIMMS, IIS the Univ. of Tokyo)
S3-12★ (Invited Poster)  
Differential Charge Amplifier for Detection of Optomechanical Interaction with Quartz Force Sensor
M. Kageshima1, Y. Mera2 and K. Maeda3 (1Kansai Medical Univ., 2Univ. of Tokyo, 3Hokkaido Polytechnic Coll.)
S3-13♥ (Nominated for ICSPM20 Poster Award)  
Development of a large-area scanner for high-speed atomic force microscopy
H. Watanabe1, T. Uchihashi1,2, M. Shibata3, R. Yasuda4 and T. Ando1,2 (1Col.of Sc. and Engr. Kanazawa Univ., 2Bio-AFM Frontier Research Center,Col.of Sc. and Engr. Kanazawa Univ., 3Dept. of Neurobiology, Duke Univ. Medical Center, 4Max Planck Florida Inst.)
S3-14♥ (Nominated for ICSPM20 Poster Award)  
AFM with chemical contrast and its application in lateral force microscopy
D. Damiron1,2, Y. Toriyama1, M. Othman1, D. Kobayashi1 and H. Kawakatsu1 (1LIMMS IIS Tokyo Univ., 2IIS Tokyo Univ.)
S3-15★ (Invited Poster)  
Comparing methods and test artifacts for probe characterizations
H. Itoh and C.M. Wang (AIST)
S3-16♥ (Nominated for ICSPM20 Poster Award)  
Comparison of lateral and vertical modes with bimodal Liquid AFM
H. Murakami, Y. Toriyama, D. Kobayashi, S. Nishida, M. Wang and H. Kawakatsu (IIS, the Univ.of Tokyo)
S3-17  
Development of Atom Probe Atomic Force Microscope for Chemical Identification
H. Nishizawa, Y. Honda, D. Hirayama, D. Kobayashi and H. Kawakatsu (Inst. of Industrial Science, The Univ. of Tokyo)
S3-18★ (Invited Poster)  
Structured Interfacial Liquids Probed by AFM: a Literature Review
H. Onishi (Kobe Univ.)
S3-19♥ (Nominated for ICSPM20 Poster Award)  
Nanomanipulation of nanoparticles using high-speed imaging in tapping mode
I. Ishisaki1, Y. Ohashi1, T. Ushiki2 and F. Iwata1 (1Shizuoka Univ., 2Niigata Univ.)
S3-20★ (Invited Poster)  
Nanoelectroporation for low-invasive delivery of biomolecules into a single living cell using a scanning ion conductance microscope
K. Yamazaki1, K. Ishizaki1, T. Sakurai1, T. Ushiki2 and F. Iwata1 (1Shizuoka Univ., 2Niigata Univ.)
S3-21  
Size estimation of squid and cuttlefish ink particles dispersed in water from their morphologies on solid substrates
T. Matsuura1, T. Saeki1, T. Kato1, S. Todo1, M. Horii1, K. Minato2 and T. Ueno2 (1Hokkaido Univ. of Education, 2Hakodate Natl. College of Technology)
S3-22  
Concentration dependence of glycerin solution on the swelling process of stratum corneum by cantilever-assisted interference microscopy
H. Katayama1, S.-i. Yanagiya2 and N. Goto2 (1Adv. Tech. & Sci., Univ. Tokushima, 2Inst. Tech. & Sci., Univ. Tokushima)
S3-23★ (Invited Poster)  
AFM Study of Collision of Self-spreading Lipid Bilayers within Micro Pattern
K. Furukawa and H. Hibino (NTT Basic Research Laboratories, NTT Co.)
S3-24  
Tempo-spatial Change of Cellular Stiffness in the Process of Developing Epithelial Cell-cell Adhesion Measured by Atomic Force Microscopy
R. Tanaka, T. Mizutani, H. Haga and K. Kawabata (Fac. Adv. Life. Sci. Hokkaido Univ.)
S3-25  
Measurement of Environmental Effects to Single Molecular Interaction in Dynamic Force Spectroscopy
Y. Hirano, T. Hanyu, A. Taninaka, S. Yoshida, O. Takeuchi and H. Shigekawa (Inst. of Appl. Phys, Univ. of Tsukuba)
S3-26♥ (Nominated for ICSPM20 Poster Award)  
Molecular-Scale Study on Hydrated Structures of Oligo (Ethylene Glycol)-Terminated SAMs by Frequency Modulation Atomic Force Microscopy
N. Inada1,2, H. Asakawa3, Y. Matsumoto1 and T. Fukuma1,2,3 (1Dep. of Chem., Kyoto Univ., 2Div. of Electrical Eng. and Computer Sci., Kanazawa Univ., 3Bio-AFM Center, Kanazawa Univ.)
S3-27★ (Invited Poster)  
AFM-based Modulus Determination –Towards ISO Standardization–
K. Nakajima, M. Ito, H. Liu and S. Fujinami (WPI-AIMR, Tohoku Univ.)
S3-28  
Surface Viscoelasticity Analysis of Pressure Sensitive Adhesives Using Force Measurement of Atomic Force Microscope
N. Maruoka1, S. Fujinami2 and K. Nakajima2 (1Nitto Denko Co., 2Tohoku Univ.)
S3-29♥ (Nominated for ICSPM20 Poster Award)  
Viscoelasticity Mapping Technique Achieved by AFM Load Relaxation Measurements
S. Fujinami, M. Ito and K. Nakajima (WPI-AIMR, Tohoku Univ.)
S3-30★ (Invited Poster)  
The Evaluation of the Hydrous Lens Using SPM
C. Kawai1, S. Moriguchi1, Y. Q.Zhang2, T. Fujii2 and R. Kokawa2 (1Shimadzu Analytical & Measuring Center, inc., 2Analytical & Measuring Instruments Div. Shimadzu Corp., Kyoto 604-8511, Japan)
S3-31  
Ultrasmall Droplet Deposition by Nano-inkjet Printing Method
K. Kaisei1, K. Kobayashi2, K. Matsushige3 and H. Yamada4 (1Faculty of Education, Shizuoka Univ., 2Office of SACI, Kyoto Univ., 3Dept. of Materials Chemistry, Ryukoku Univ., 4Dept. of Electronic Science and Engineering, Kyoto Univ.)
S3-32  
Molecular-Scale Investigations of Self-Assembled Surfactant Aggregates on Graphite by Force Mapping Using FM-AFM
K. Suzuki1, K. Kobayashi2, K. Matsushige1 and H. Yamada1 (1Dept. of Electronic Sci. and Eng., Kyoto Univ., 2SACI, Kyoto Univ.)
S3-33  
Effect of Types of Ga/Si(111) Reconstructed Structure on Growth Morphology of GaSb Island
R. Machida1, K. Yoshiki1, S. Hara1, K. Irokawa1, H. Miki1, A. Kawazu2 and H.I. Fujishiro1 (1Tokyo Univ. of Science, 2Tokyo Denki Univ.)
S3-34  
Surface Morphology Transformation of Si(111) Surface during Native Oxidation
R. Hasunuma, S. Doi and K. Yamabe (Inst. of Applied Physics, Univ. of Tsukuba)
S3-35  
Adsorption of Hydrogen Atom on Ni(110) Surface Studied by Low Temperature Scanning Tunneling Microscopy
S. Katano1, Y. Kim2 and M. Kawai2,3 (1RIEC, Tohoku Univ., 2RIKEN, 3Univ. of Tokyo)
S3-36  
Tunneling Electron-induced Photon Emission from Single-walled Carbon Nanotube Adsorbed on Au(111)
S. Katano, S. Seki and Y. Uehara (RIEC, Tohoku Univ.)
S3-37★ (Invited Poster)  
STM-based Electric Field Modulation Spectroscopy Using a Supercontinuum Light Source in Fourier Transform Scheme
Y. Mera, S. Nakada, K. Ishibe and K. Maeda (The Univ. of Tokyo)
S3-38♥ (Nominated for ICSPM20 Poster Award)  
Transfer Free Graphene Films from Polymer at Relatively Low Temperatures
R.N. Tiwari1, G. Rius2 and M. Yoshimura1 (1Toyota Technological Inst., 2Nagoya Inst. of Technology)
S3-39  
Transformation of carbon black to graphene
R.N. Tiwari, M. Ishihara and M. Yoshimura (Toyota Technological Inst., 2-12-1 Hisakata, 468-8511 Tempaku, Nagoya, Japan)
S3-40  
Thermal transformation of carbon hybrid materials to graphene films
R.N. Tiwari, M. Ishihara and M. Yoshimura (Toyota Technological Inst., 2-12-1 Hisakata, 468-8511 Tempaku, Nagoya, Japan)
S3-41★ (Invited Poster)  
Preparation of Graphene Substrate for DNA Sequencing
H. Tanaka (ISIR Osaka Univ.)
S3-42  
Measurement of Electrical Property of Metal Coated Carbon Nanofibers Probes
K. Saida1, M. Kubota1, S. Tanaka1, S. Matsui1, M. Tanemura1, M. Kitazawa2 and R. Ohta2 (1Nagoya Inst. of Tech., 2Olympus Co. Ltd.)
S3-43  
Fabrication and Characterization of Alloy Incorporated Carbon Nanofiber Probes for Magnetic Force Microscopy by Ion Irradiation Method
M. Kubota1, K. Saida1, S. Matsui1, S. Tanaka1, M. Tanemura1, M. Kitazawa2 and R. Ohta2 (1Nagoya Inst. of Tech., 2Olympus Co. Ltd.)
S3-44  
Fabrication and AFM Observation of Graphene Fromed by Carbon Deposition
T. Ohkane1, M. Kato1, K. Uki1, S. Harako1, S. Komuro2 and X. Zhao1 (1Tokyo Univ. of Sci., 2Toyo Univ.)
S3-45  
Quantitative Characterization of a Single-Walled Carbon Nanotube Diameter by Atomic Force Microscopy
T. Inaba1, R. Sugiyama1, H. Itoh2 and Y. Homma1 (1Tokyo Univ. of Sci., 2AIST)
S3-46  
Moiré Structure of Transferred Graphene on HOPG
M. Ishihara and M. Yoshimura (Toyota Tech. Inst.)
S3-47★ (Invited Poster)  
Synthesis of Carbon Nanostructures from Size-selected Platinum Clusters
Y. Matsuoka and M. Yoshimura (Toyota Tech. Inst.)
S3-48★ (Invited Poster)  
Atomistic calculation of electron injection into the surface states of Bi2Te3 from Bi
K. Kobayashi (Dep. of Phys., Ochanomizu Univ.)
S3-49  
Fabrication and Operation of Atomic Switch of Pb Cluster on Si(111)-(7x7) Surface with a Combined AFM/STM at Room Temperature
E. Inami1, K. Ueda1, Y. Sugimoto1, M. Abe2 and S. Morita3 (1GSE, Osaka Univ., 2GSE, Nagoya Univ., 3ISIR, Osaka Univ.)
S3-50  
Surface of Nano-cage Compound C12A7:e-
Y. Toda1, H. Hirayama2 and H. Hosono1,3 (1FRC TITech, 2DMSE TITech, 3MCES TITech)
S3-51  
Molecular symmetry driven SU(4) Kondo effect in FePc/Au(111)
E. Minamitani1, N. Tsukahara2, D. Matsunaka3, N. Takagi2, M. Kawai2 and Y. Kim1 (1RIKEN, Surface and Interface Science Laboratory, 2Dept. of Advanced Materials Science, The Univ. of Tokyo, 3Dept. of Mechanical Engineering, Osaka Univ.)
S3-52  
Atomic Force Microscopy Observation on In/Si(111)-4×1 Surface at Room Temperature
K. Iwata1, S. Yamazaki1, Y. Sugimoto1, M. Abe2 and S. Morita1 (1Osaka Univ., 2Nagoya Univ.)
S3-53  
Difference in Electronic States between Clean and Modified Fe3O4(001) Thin Film Surfaces
S. Hiura, A. Ikeuchi, A. Subagyo and K. Sueoka (Hokkaido Univ.)
S3-54  
Surface Electronic Properties in Anti-phase Domain on Epitaxially grown Fe3O4/MgO(100)
A. Ikeuchi, A. Subagyo, S. Hiura and K. Sueoka (Grad. Sch. Info. Sci. & Tech., Hokkaido Univ.)
S3-55♥ (Nominated for ICSPM20 Poster Award)  
Simultaneous Current and Force-Induced Atom Switching
S. Yamazaki1, R. Takatani1, D. Sawada1, Y. Sugimoto1, M. Abe2, S. Morita3, P. Pou4, R. Perez4, P. Mutombo5 and P. Jelinek5 (1Osaka Univ., 2Nagoya Univ., 3Osaka Univ., 4Univ. Autonoma of Madrid, 5Academy of Sci. of Czech)
S3-56  
STM Investigation of CO on Pt(111) : Superstructure Formation and Dynamic Behavior Involved with Bridge CO
H.J. Yang1,2, Y. Kim2 and M. Kawai1 (1Dept. Adv. Mater. Sci., GSFS, The Univ. Tokyo, 2RIKEN ASI)
S3-57  
Kondo resonance observation of a stable radical molecule
L. Jie1, I. Hironari1, K. Keiichi1, Y. Masahiro1, B.B. K1, T. Shinya1 and K. Tadahiro2 (1Dept. of Chemistry Tohoku Univ., 2IMRAM Tohoku Univ.)
S3-58  
Electronic characterization of interface between Si substrate and Cu-based metal paste on an atomic scale using KFM
F. Yamada1, M. Yoshida2, U. Itoh2, I. Sumita1, I. Kamiya1 and Y. Oshita1 (1Toyota Tech. Inst., 2AIST)
S3-59  
Origin of SPPX-STM signals from semiconductor
M. Yokota1, S. Yoshida1, Y. Mera2, O. Takeuchi1 and H. Shigekawa1 (1Inst. of Applied Physics, Univ. of Tsukuba, 2The Univ. of Tsukuba)
S3-60  
Nanoscale Evaluation of Organic Solar Cells by Light-Modulated Scanning Tunneling Microscopy
T. Ochiai, H. Kato, S. Yoshida, O. Takeuchi and H. Shigekawa (Inst. of Applied Physics, Univ. of Tsukuba)
S3-61♥ (Nominated for ICSPM20 Poster Award)  
Mechanical control of Si-based single molecular conductance
M. Nakamura1, S. Yoshida1, T. Nakamura2, Y. Mera3, O. Takeuchi1 and H. Shigekawa1 (1Inst. of Applied Physics, Univ. of Tsukuba, 2NRI, AIST, 3The Univ. of Tokyo)
S3-62  
Circularly-polarized light modulation for the detection of spin dynamics by Time Resolved STM
Y. Aizawa1, S. Yoshida1, Y. Mera2, O. Takeuchi1 and H. Shigekawa1 (1Univ. of Tsukuba, 2The Univ. of Tokyo)
S3-63  
(removed)
S3-64★ (Invited Poster)  
Highly Insulative and Transparent MgO Thin Films Doped Co Nanoparticles Prepared by Arc Plasma Gun
S.-I. Yamamoto1, H. Kosuga1 and H. Yoshioka2 (1Ryukoku Univ., 2Hyogo Pref. Inst. of Tech.)
S3-65  
Surface Potential of MgO Thin Film after annealing in vacuum with KPFM
S.-I. Yamamoto1, H. Yoshioka2, Y. Nakajima3 and S. Hasegawa4 (1Ryukoku Univ., 2Hyogo pref. inst. tech., 3Riken Keiki, 4Tokyo Univ.)
S3-66♥ (Nominated for ICSPM20 Poster Award)  
Selective adsorption and subsequent dissociation of thiol derivatives at sulfur vacancies on MoS2(0001)
M. Makarova, Y. Okawa and M. Aono (WPI-MANA, NIMS)
S3-67♥ (Nominated for ICSPM20 Poster Award)  
Local Photothermal Measurements by AFM on Cu(In,Ga)Se2 Solar Cells
Y. Hamamoto1, K. Hara1, T. Minemoto3 and T. Takahashi1,2 (1IIS, The Univ. of Tokyo, 2INQIE, The Univ. of Tokyo, 3Fac. of Sci. and Eng., Ritsumeikan Univ.)
S3-68  
Comblike Structure of MoO2/Mo(110) Surface: STM and DFT Study
A. Okada1, S. Hara2, M. Yoshimura3 and Y. Ishikawa1 (1Kyoto Inst. Tech., 2Tokyo Univ. of Science, 3Toyota Tech. Inst.)
S3-69♥ (Nominated for ICSPM20 Poster Award)  
STM study of the epitaxial growth of CeO2(111) on Ru(0001)
T. Hasegawa, F. Shahed and T. Komeda (Inst. of Multidisciplinary Research for Advanced Materials Tohoku Univ..)
S3-70  
Study on (NH4)2S-treated GaAs(001) Surface Probed by Time-resolved Scanning Tunneling Microscopy
H. Oigawa, M. Yokota, S. Yoshida, O. Takeuchi and H. Shigekawa (Inst. of Applied Physics, Univ. of Tsukuba)

Author index

*Boldface represents the presenters.

Abe, M. S3-49 : Kawai, M. S3-51 : Rius, G. S3-38
Abe, M. S3-52 : Kawai, M. S3-56 : Saeki, T. S3-21
Abe, M. S3-55 : Kawai, T. S8-1 : Saida, K. S3-42
Abe, M. S6-3 : Kawakatsu, H. S3-11 : Saida, K. S3-43
Aizawa, Y. S3-62 : Kawakatsu, H. S3-14 : Saitoh, E. S8-2
Aizawa, Y. S8-3 : Kawakatsu, H. S3-16 : Sakurai, T. S3-20
Akita, T. S3-5 : Kawakatsu, H. S3-17 : Satake, A. S8-1
Ando, A. S10-4 : Kawakatsu, H. S10-3 : Sawada, D. S3-55
Ando, T. S3-13 : Kawazu, A. S3-33 : Seki, S. S3-36
Ando, T. S4-3 : Keiichi, K. S3-57 : Shahed, F. S3-69
Aono, M. S3-66 : Kim, Y. S1-4 : Shibata, M. S3-13
Arima, E. S9-4 : Kim, Y. S3-35 : Shigekawa, H. S3-25
Asakawa, H. S3-6 : Kim, Y. S3-51 : Shigekawa, H. S3-59
Asakawa, H. S3-26 : Kim, Y. S3-56 : Shigekawa, H. S3-60
Asakawa, H. S5-6 : Kimura, K. S5-5 : Shigekawa, H. S3-61
Ashino, M. S6-2 : Kioschis, P. S1-3 : Shigekawa, H. S3-62
Berquand, A. S1-3 : Kitazawa, M. S3-42 : Shigekawa, H. S3-70
Berquand, A. S3-1 : Kitazawa, M. S3-43 : Shigekawa, H. S8-3
Burkitbayev, M. S3-63 : Kitta, M. S3-5 : Shih, M.C. S10-2
Cartagena, A. S4-1 : Kobayashi, D. S3-11 : Shimizu, R. S8-4
Chang, C.-S. S4-4 : Kobayashi, D. S3-14 : Shimizu, T. S10-4
Chang, C.S. S10-2 : Kobayashi, D. S3-16 : Shin, H.-J. S1-4
Chang, T.-J. S4-5 : Kobayashi, D. S3-17 : Shinya, T. S3-57
Chen, C.W. S10-2 : Kobayashi, D. S10-3 : Subagyo, A. S3-10
Chiu, Y.P. S8-5 : Kobayashi, K. S3-3 : Subagyo, A. S3-53
Chiu, Y.P. S10-2 : Kobayashi, K. S3-9 : Subagyo, A. S3-54
Cho, S.-J. S4-2 : Kobayashi, K. S3-31 : Sueoka, K. S3-10
Cho, Y. S6-4 : Kobayashi, K. S3-32 : Sueoka, K. S3-53
Choi, M.-H. S4-2 : Kobayashi, K. S3-48 : Sueoka, K. S3-54
Chu, Y.H. S8-5 : Kobayashi, K. S5-2 : Suga, H. S10-4
Damiron, D. S3-11 : Kohyama, M. S3-5 : Sugawara, Y. S9-4
Damiron, D. S3-14 : Kokawa, R. S3-30 : Sugimoto, Y. S1-5
Dettlaff, U. S7-1 : Komeda, T. S3-69 : Sugimoto, Y. S3-49
Ding, R.-F. S4-4 : Komeda, T. S9-3 : Sugimoto, Y. S3-52
Doi, S. S3-34 : Komuro, S. S3-44 : Sugimoto, Y. S3-55
Fujii, T. S3-30 : Kondo, T. S7-3 : Sugimoto, Y. S6-3
Fujikawa, Y. S8-2 : Korzhynbayeva, K. S3-63 : Sugimura, H. S3-7
Fujinami, S. S3-27 : Kosuga, H. S3-64 : Sugimura, H. S5-3
Fujinami, S. S3-28 : Kubota, M. S3-42 : Sugiyama, R. S3-45
Fujinami, S. S3-29 : Kubota, M. S3-43 : Sumita, I. S3-58
Fujinami, S. S5-1 : Kuhn, H.-M. S1-3 : Suzuki, K. S3-32
Fujishiro, H.I. S3-33 : Lee, J.-K. S7-1 : Suzuki, K. S5-2
Fujita, D. S9-2 : Lee, S.-W. S7-1 : Tadahiro, K. S3-57
Fukuda, S. S4-3 : Li, S.S. S10-2 : Takada, S. S9-4
Fukui, K. S5-4 : Li, Y.J. S9-4 : Takagi, N. S3-51
Fukuma, T. S3-6 : Liang, X. S3-8 : Takagi, N. S7-5
Fukuma, T. S3-26 : Liao, H.-S. S4-4 : Takahashi, T. S3-67
Fukuma, T. S5-6 : Liao, H.-S. S4-5 : Takahashi, T. S10-1
Furukawa, K. S3-23 : Lin, C.C. S10-2 : Takatani, R. S3-55
Gabdullin, M. S3-63 : Lin, J.Y. S8-5 : Takeda, S. S10-3
Goto, N. S3-22 : Liu, H. S3-27 : Takeuchi, O. S3-25
Guo, D. S7-3 : Liu, H. S5-1 : Takeuchi, O. S3-59
Guo, H. S9-2 : Liu, J. S9-3 : Takeuchi, O. S3-60
Guseynov, N. S3-63 : Machida, R. S3-33 : Takeuchi, O. S3-61
Haga, H. S3-24 : Machida, T. S7-3 : Takeuchi, O. S3-62
Hamamoto, Y. S3-67 : Maeda, K. S3-12 : Takeuchi, O. S3-70
Hanyu, T. S3-25 : Maeda, K. S3-37 : Takeuchi, O. S8-3
Hara, H. S5-4 : Maeda, Y. S3-5 : Takeya, J. S5-4
Hara, K. S3-67 : Makarova, M. S3-66 : Tanaka, H. S3-41
Hara, S. S3-33 : Maruoka, N. S3-28 : Tanaka, H. S8-1
Hara, S. S3-68 : Masahiro, Y. S3-57 : Tanaka, R. S3-24
Harada, T. S5-4 : Matsui, S. S3-42 : Tanaka, S. S3-42
Harako, S. S3-44 : Matsui, S. S3-43 : Tanaka, S. S3-43
Hasegawa, S. S3-65 : Matsumoto, Y. S3-26 : Tanemura, M. S3-42
Hasegawa, T. S3-69 : Matsunaka, D. S3-51 : Tanemura, M. S3-43
Hasunuma, R. S3-34 : Matsuoka, Y. S3-47 : Tanimura, K. S7-2
Haze, M. S9-4 : Matsushige, K. S3-31 : Taninaka, A. S3-25
Hiasa, T. S5-5 : Matsushige, K. S3-32 : Tazhibayeva, S. S3-63
Hibino, H. S3-23 : Matsuura, T. S3-21 : Tiwari, R.N. S3-38
Hirano, Y. S3-25 : Mera, Y. S3-12 : Tiwari, R.N. S3-39
Hirata, Y. S3-9 : Mera, Y. S3-37 : Tiwari, R.N. S3-40
Hirayama, D. S3-17 : Mera, Y. S3-59 : Toda, Y. S3-50
Hirayama, H. S3-50 : Mera, Y. S3-61 : Todo, S. S3-21
Hironari, I. S3-57 : Mera, Y. S3-62 : Toriyama, Y. S3-11
Hirose, M. S3-3 : Mera, Y. S8-3 : Toriyama, Y. S3-14
Hitosugi, T. S8-4 : Miki, H. S3-33 : Toriyama, Y. S3-16
Hiura, S. S3-53 : Minamitani, E. S3-51 : Tra, V.T. S8-5
Hiura, S. S3-54 : Minato, K. S3-21 : Tsukahara, N. S3-51
Holloschi, A. S1-3 : Minemoto, T. S3-67 : Uchihashi, T. S3-13
Homma, Y. S3-45 : Minemoto, T. S10-1 : Uchihashi, T. S4-3
Honda, Y. S3-17 : Miyahara, Y. S9-1 : Ueda, K. S3-49
Horii, M. S3-21 : Miyata, K. S3-6 : Uehara, Y. S3-36
Hosoi, H. S3-10 : Mizuno, D. S6-4 : Uemura, T. S5-4
Hosono, H. S3-50 : Mizuno, T. S3-10 : Ueno, T. S3-21
Huang, B.C. S8-5 : Mizutani, T. S3-24 : Uki, K. S3-44
Huang, B.C. S10-2 : Mizutani, Y. S4-2 : Umeda, K. S3-9
Huang, K.-Y. S4-4 : Monta, N. S3-10 : Umeda, K. S5-2
Huang, K.-Y. S4-5 : Moriguchi, S. S3-30 : Ushiki, T. S3-19
Huang, P.C. S8-5 : Morita, S. S1-5 : Ushiki, T. S3-20
Hwang, I.-S. S4-4 : Morita, S. S3-49 : Wang, C.M. S3-4
Hwang, I.-S. S4-5 : Morita, S. S3-52 : Wang, C.M. S3-15
Hwu, E.-T. S4-5 : Morita, S. S3-55 : Wang, M. S3-16
Ichii, T. S3-7 : Morita, S. S6-3 : Watanabe, H. S3-13
Ichii, T. S5-3 : Morita, Y. S10-4 : Watanabe, K. S6-1
Ikeda, K. S7-4 : Murakami, H. S3-16 : Wiesendanger, R. S7-1
Ikeuchi, A. S3-53 : Murakoshi, K. S7-4 : Winnik, F.çoiseM. S3-8
Ikeuchi, A. S3-54 : Murase, K. S3-7 : Yamabe, K. S3-34
Imanishi, A. S5-4 : Murase, K. S5-3 : Yamada, F. S3-58
Inaba, T. S3-45 : Musabekov, K. S3-63 : Yamada, H. S3-3
Inada, N. S3-26 : Mutombo, P. S3-55 : Yamada, H. S3-9
Inada, N. S5-6 : Naitoh, Y. S9-4 : Yamada, H. S3-31
Inami, E. S3-49 : Naitou, Y. S3-2 : Yamada, H. S3-32
Inami, E. S7-2 : Nakada, S. S3-37 : Yamada, H. S5-2
Irokawa, K. S3-33 : Nakajima, K, S5-1 : Yamamoto, K. S3-10
Ishibe, K. S3-37 : Nakajima, K. S3-8 : Yamamoto, S.-I. S3-64
Ishihara, M. S3-39 : Nakajima, K. S3-27 : Yamamoto, S.-I. S3-65
Ishihara, M. S3-40 : Nakajima, K. S3-28 : Yamashita, M. S9-3
Ishihara, M. S3-46 : Nakajima, K. S3-29 : Yamasue, K. S6-4
Ishikawa, Y. S3-68 : Nakajima, Y. S3-65 : Yamazaki, K. S3-20
Ishisaki, I. S3-19 : Nakajima, Y. S10-1 : Yamazaki, S. S3-52
Ishizaki, K. S3-20 : Nakamura, J. S7-3 : Yamazaki, S. S3-55
Isshiki, H. S9-3 : Nakamura, M. S3-61 : Yamazaki, S. S7-1
Ito, F. S5-2 : Nakamura, T. S3-61 : Yanagiya, S.-i. S3-22
Ito, M. S3-27 : Nakano, K. S10-3 : Yang, C.-W. S4-4
Ito, M. S3-29 : Nawa, T. S5-1 : Yang, H.J. S3-56
Itoh, H. S3-4 : Negami, M. S3-7 : Yang, J.C. S8-5
Itoh, H. S3-15 : Negami, M. S5-3 : Yasuda, R. S3-13
Itoh, H. S3-45 : Nishi, T. S5-1 : Yasuda, S. S7-4
Itoh, U. S3-58 : Nishida, S. S3-16 : Yeoh, C. S10-3
Iwata, F. S3-19 : Nishizawa, H. S3-17 : Yokota, M. S3-59
Iwata, F. S3-20 : Obata, Y. S10-3 : Yokota, M. S3-70
Iwata, K. S3-52 : Ochiai, T. S3-60 : Yokota, Y. S5-4
Iwatake, K. S7-3 : Ohashi, Y. S3-19 : Yong, H. S10-1
Iwaya, K. S8-4 : Ohkane, T. S3-44 : Yoshida, M. S3-58
Jelinek, P. S3-55 : Ohsawa, T. S8-4 : Yoshida, S. S3-25
Jie, L. S3-57 : Ohta, R. S3-42 : Yoshida, S. S3-59
Juang, B.-J. S4-5 : Ohta, R. S3-43 : Yoshida, S. S3-60
Jung, J. S1-4 : Oigawa, H. S3-70 : Yoshida, S. S3-61
K., B.B. S3-57 : Okada, A. S3-68 : Yoshida, S. S3-62
Kageshima, M. S3-12 : Okada, S. S7-3 : Yoshida, S. S3-70
Kaisei, K. S3-31 : Okajima, T. S4-2 : Yoshida, S. S8-3
Kamiya, I. S3-58 : Okawa, Y. S3-66 : Yoshiki, K. S3-33
Kanasaki, J. S7-2 : Onishi, H. S3-18 : Yoshimura, M. S3-38
Katano, S. S3-35 : Onishi, H. S5-5 : Yoshimura, M. S3-39
Katano, S. S3-36 : Onoda, J. S1-5 : Yoshimura, M. S3-40
Katayama, H. S3-22 : Orazymbetova, A. S3-63 : Yoshimura, M. S3-46
Kato, H. S3-60 : Oshita, Y. S3-58 : Yoshimura, M. S3-47
Kato, M. S3-44 : Othman, M. S3-11 : Yoshimura, M. S3-68
Kato, T. S3-21 : Othman, M. S3-14 : Yoshioka, H. S3-64
Katoh, K. S9-3 : Oyabu, N. S3-9 : Yoshioka, H. S3-65
Kawabata, K. S3-24 : Perez, R. S3-55 : Yurtsever, A. S1-5
Kawai, C. S3-30 : Pietzsch, O. S7-1 : Zhang, Y.Q. S3-30
Kawai, M. S1-4 : Pou, P. S3-55 : Zhao, X. S3-44
Kawai, M. S3-35 : Raman, A. S4-1 :
Sp