重川　秀実（SHIGEKAWA Hidemi)

・

　　

所属：

筑波大学数理物質系　電子・物理工学専攻（物理工学域）

居室：

3F412　TEL/FAX　029-853-5276　E-mail:　hidemi@ims.tsukuba.ac.jp

講義担当：

第三学群 応用理工学類　固体物理学、計測・制御工学、基礎実験学
大学院数理物質系　ナノ物性

専門分野：

ナノサイエンス、ナノテクノロジー、走査プローブ顕微鏡

研究テーマ：

ナノスケール量子マニピュレーションと極限計測

研究略歴：

1980年〜1989年

東京大学工学部物理工学科助手

1987年〜1988年

ベル研究所客員（ブルックへブン国立研究所）

1989年〜1994年

筑波大学物質工学系

1990年4月〜2002年3月

東京大学非常勤講師　工学系研究科物理工学専攻

1990年7月〜8月

ベル研究所客員（ブルックへブン国立研究所）

1990年〜1991年

東北大学金属材料研究所客員非常勤講師

1994年〜

中央大学理工学部非常勤講師（併任）

1995年〜1998年

TARAセンター・プロジェクトリーダー

1997年〜2000年

東京大学大学院工学研究科（化学生命）併任

1999年〜

筑波大学物理工学系

2004年〜

筑波大学数理物質科学研究科　電子・物理工学専攻

2007年〜

筑波大学数理物質科学研究科　物質創成先端科学専攻

2009年〜

独立行政法人物質･材料研究機構国際ナノアーキテクトニクス研究拠点（MANA）
リサーチアドバイザー

2007年10月1日〜2010年3月31日

東北大学原子分子材料科学高等研究機構（WPI−AIMR）連携教授

2010年〜

応用物理学会フェロー

日本表面科学会フェロー

2010年度

日本表面科学会学会賞

2014年

島津賞

2015年

文部科学大臣表彰・科学技術分野
応物学会論文賞

2015年〜2018年

学術システム研究センター専門研究員

学会活動：

1988年4月〜2000年5月

日本表面科学会編集委員

1993年4月〜

応用物理学会薄膜・表面分科会（常任）幹事

1998年5月12日〜1999年5月

日本表面科学会副庶務理事

1999年5月〜2001年5月15日

日本表面科学会庶務理事

2003年5月〜2005年5月

日本表面科学会企画担当理事（企画委員長）

1995年4月〜1997年3月

日本応用物理学会欧文誌（JJAP）編集委員

1998年4月〜2000年3月

応用物理学会機関誌編集委員

2000年1月〜2002年7月

応用物理学会英文機関誌・JSAPI編集委員

2006年〜2008年

応用物理学会薄膜表面物理分科会幹事長

2007年〜2009年

応用物理学会理事、編集委員長

2007年〜2008年

応用物理学会和文機関誌副編集委員長

2008年〜2009年

応用物理学会和文機関誌編集委員長

2008年〜2010年

日本表面科学会理事、副編集委員長

2010年〜2012年

日本表面科学会理事、編集委員長

2010年〜2012年

日本表面科学会理事

2017年〜2018年

日本表面科学会副会長

2017年〜2018年

日本表面科学会理事

2018年〜2019年

日本表面科学会副会長

2018年〜

日本表面真空学会理事

2019年〜2020年

日本表面真空学会副会長

2020年〜

日本表面真空学会会長

所属学会：

日本表面科学会(1985.6〜)、応用物理学会(1978〜)、薄膜・表面分科会、
アメリカ物理学会、アメリカ化学会、日本物理学会、放射光学会
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From recent papers

  • Microscopic basis for the band engineering of Mo1-xWxS2-based heterojunction
    Shoji Yoshida, Yu Kobayashi, Ryuji Sakurada, Shohei Mori, Yasumitsu Miyata, Hiroyuki Mogi, Tomoki Koyama, Osamu Takeuchi, and Hidemi Shigekawa
    Scientific Reports, 5. 14808 (2015), DOI: 10.1038/srep14808

  • Mechanically activated switching of Si-based single-molecule junction as imaged with three-dimensional dynamic probe
    Miki Nakamura, Shoji Yoshida, Tomoki Katayama, Atsushi Taninaka, Yutaka Mera, Susumu Okada, Osamu Takeuchi, and Hidemi Shigekawa
    Nature Communications, 6, 8465 (2015), doi:10.1038/ncomms9465

  • Variation in anisotropic dispersion relations of self-assembled monolayer on Cu(100) induced by modulation of molecular structures
    Ken Kanazawa, Miki Nakamura, Hui Huang, Atsushi Taninaka, and Hidemi Shigekawa
    Surface Science 632, L1-L4 (2014)

  • Real space probe of short-range interaction between Cr in a ferromagnetic semiconductor ZnCrTe
    Ken Kanazawa, Taku Nishimura, Shoji Yoshida, Hidemi Shigekawa and Shinji Kuroda
    Nanoscale, 2014, 6, 14667 (2014)

  • Spectroscopy: Nanoscale terahertz spectroscopy
    Hidemi Shigekawa, Shoji Yoshida and Osamu Takeuchi
    Nature Photonics, News & Views 8, 815-817 (2014)

  • Probing ultrafast spin dynamics with optical pump-probe scanning tunnelling microscopy
    Shoji Yoshida, Yuta Aizawa, Zi-han Wang, Ryuji Oshima, Yutaka Mera, Eiji Matsuyama, Haruhiro Oigawa, Osamu Takeuchi, and Hidemi Shigekawa
    Nature Nanotechnology 9, 588-593 (2014)

  • Microscopic description of the current-voltage characteristics of a bulk-heterojunction organic solar cell under illumination
    Osamu Takeuchi, Noriaki Takeuchi, Takahiro Ochiai, Hirokazu Kato, Shoji Yoshida, Hidemi Shigekawa
    Applied Physics Express 7, 021602 (2014)

  • Bases for Time-Resolved Probing of Transient Carrier Dynamics by Optical Pump-Probe Scanning Tunneling Microscopy
    Munenori Yokota, Shoji Yoshida, Yutaka Mera, Osamu Takeuchi, Haruhiro Oigawa, and Hidemi Shigekawa
    Nanoscale, 2013, 5, 9170-9175 (2013)

  • Optical pump-probe scanning tunneling microscopy for probing ultrafast dynamics on the nanoscale
    S. Yoshida, Y. Terada, M. Yokota, O. Takeuchi, H. Oigawa and H. Shigekawa
    The European Physical Journal Special Topics 222, 1161-1175 (2013)

  • Single-Atomic-Level Probe of Transient Carrier Dynamics by Laser-Combined Scanning Tunneling Microscopy
    Shoji Yoshida, Munenori Yokota, Osamu Takeuchi, Haruhiro Oigawa, Yutaka Mera, and Hidemi Shigekawa
    Applied Physics Express, 6, 032401 (2013)

  • Direct Probing of Transient Photocurrent Dynamics in p-WSe2 by Time-Resolved Scanning Tunneling Microscopy
    Shoji Yoshida, Yasuhiko Terada, Munenori Yokota, Osamu Takeuchi, Yutaka Mera, and Hidemi Shigekawa
    Applied Physics Express, 6, 016601 (2013)

  • Spontaneous formation of graphene-like stripes on high-index diamond C(331) surface
    Yafei Zhang, Maojie Xu, Yaozhong Zhang, Jing zhang, Jiyun Lu, Bingjian Qian, Dejiong Lu, Liang Wang, Xiaoshuang Chen and Hidemi Shigekawa
    Nanoscale Research Letters, 7 (1):460 (2012)

  • Nanoscale probing of transient carrier dynamics modulated in GaAs-PIN junction by laser-combined scanning tunneling microscopy
    Shoji Yoshida, Yasuhiko Terada, Ryuji Oshima, Osamu Takeuchi and Hidemi Shigekawa
    Nanoscale 4 (3), 757-761 (2012), DOI: 10.1039/C2NR11551D

  • Laser-Combined Scanning Tunneling Microscopy on the Carrier Dynamics in Low-Temperature-Grown GaAs/AlGaAs/GaAs
    Yasuhiko Terada, Shoji Yoshida, Osamu Takeuchi and Hidemi Shigekawa
    Advances in Optical Technologies, 2011, 510186 (2011)

  • Scanning tunneling microscopy/spectroscopy on self-assembly of glycine/Cu(111) nanocavity array
    Ken Kanazawa, Atsushi Taninaka, Hui Huang, Nunenori Nishimura, Shoji Yoshida, Osamu Takeuchi, and Hidemi Shigekawa
    Chem. Commun., 47 (40), 11312 - 11314 (2011), DOI:10.1039/c1cc11829c

  • Hidden variety of biotin-streptavidin/avidin local interactions revealed by site-selective dynamic force spectroscopy
    Atsushi Taninaka, Osamu Takeuchi and Hidemi Shigekawa
    Phys. Chem. Chem. Phys. 12, 12578-12583 (2010)

  • Real space imaging of carrier dynamics by nanoscale pump-probe microscopy
    Y. Terada, S. Yoshida, O. Takeuchia and H. Shigekawa
    Nature Photonics, 4, 12, 869 (2010), DOI :10.1038/NPHOTON.2010.235.

  • Laser-combined STM for probing ultrafast transient dynamics
    Yasuhiko Terada, Shoji Yoshida, Osamu Takeuchi and Hidemi Shigekawa
    Journal of Physics: Condensed Matter 22, 264008. (2010)

  • Anomalous light emission from metal phthalocyanine films on Au(111) activated by tunneling-current-induced surface plasmon
    A. Okada, K. Kanazawa, K. Hayashi, N. Okawa, T. Kurita, O. Takeuchi and H. Shigekawa
    Applied Physics Express 3, 015201 (2010)

  • Site-Selective Anatomy of Step-by-Step Reactions in Ligand-Receptor Bonding Processes Using Dynamic Force Spectroscopy
    A. Taninaka, O. Takeuchi and H. Shigekawa
    Applied Physics Express 2, 085002　(2009)

  • Self-organization of In nanostructures on Si surfaces
    Maojie Xu, Arifumi Okada, Shoji Yoshida and Hidemi Shigekawa
    Appl. Phys. Lett. 94, 073109 (2009)

  • Optical doping: active control of metal-insulator transition in nanowire
    Yasuhiko Terada, Shoji Yoshida, Atsushi Okubo, Ken Kanazawa, Maojie Xu, Osamu Takeuchi and Hidemi Shigekawa
    Nano Lett. Vol. 8, No. 11, 3577-3581 (2008)

  • Probing nanoscale potential modulation by defect-induced gap states on GaAs(110) using Light-Modulated Scanning Tunneling Spectroscopy
    S.  Yoshida, Y.  Kanitani, O.  Takeuchi and H.  Shigekawa
    Appl. Phys. Lett. 92, 102105 (2008)

  • Nanoscale Dynamics Probed by Laser-Combined Scanning Tunneling Microscopy
    H. Shigekawa, S. Yoshida, O.  Takeuchi, M.  Aoyama, Y. Terada, H.  Kondo and H.  Oigawa
    Thin Solid Films, 516, 9, 2366-2375 (2008)

  • The world supported by the thin film and surface physics
    H. Shigekawa
    JSAP International, 17, 3 (2007)

  • Reversible defect engineering of a single-walled carbon nanotubes with scanning tunneling microscopy
    M.Berthe, S.Yoshida, Y.Ebine, K.Kanazawa, A.Okada, A.Taninaka, O.Takeuchi, N. Fukui, H. Shinohara, S.Suzuki, K.Sumitomo, Y. Kobayashi, B.Grandidier, D.Stievenard and H. Shigekawa
    Nano Lett. Vol. 7, No. 12, 3623-3627 (2007)

  • What Orchestrates the Self-Assembly of Glycine Molecules on Cu(100)?
    K. Kanazawa, A. Taninaka, O. Takeuchi and H. Shigekawa
    Phys. Rev. Lett. 99, 216102 (2007)

  • Anisotropic free-electron-like dispersions and standing waves realized in self-assembled monolayers of glycine on Cu(100)
    K. Kanazawa, Y. Sainoo, Y. Konishi, S. Yoshida, A. Taninaka, A. Okada, M. Berthe, N. Kobayashi, O. Takeuchi and H. Shigekawa
    J. Am. Chem. Soc. 129(4), 740 - 741(2007); (Communication)

  • Microscopic Basis for the Mechanism of Carrier Dynamics in an Operating p-n Junction Examined by using Light-Modulated Scanning Tunneling Spectroscopy
    S. Yoshida, Y. Kanitani, R. Oshima, Y. Okada, O. Takeuchi and H. Shigekawa
    Phys. Rev. Lett. 98, 026802 (2007)

  • Ultrafast photoinduced carrier dynamics in GaNAs probed using femtosecond time-resolved scanning tunnelling microscopy
    Y. Terada, M. Aoyama, H. Kondo, A. Taninaka, O. Takeuchi and H. Shigekawa
    Nanotechnology 18,044028 (2007)

  • Dynamic-Force Spectroscopy Measurement with Precise Force Control Using Atomic-Force Microscopy Probe
    O. Takeuchi, T. Miyakoshi, A. Taninaka, K. Tanaka, D. Cho, M. Fujita, S. Yasuda, S. P. Jarvis and H. Shigekawa
    J. Appl. Phys. 100, 074315 (2006)

  • Bond Fluctuation of S/Se Anchoring Observed in Single-Molecule Conductance Measurements using the Point Contact Method with Scanning Tunneling Microscopy
    S. Yasuda, S. Yoshida, J. Sasaki, Y. Okutsu, T. Nakamura, A. Taninaka, O. Takeuchi and H. Shigekawa
    J. Am. Chem. Soc. 128(24), pp7746-7747 (2006)

  • Single Molecular Anatomy of Solvophobic Effects in Host-Guest Interactions Based on Surface Tension Using Atomic Force Microscopy
    S. Yasuda, I. Suzuki, K. Shinohara and H. Shigekawa
    Phys. Rev. Lett. 96, 228303 (2006)

  • Excitation of molecular vibration modes with inelastic scanning tunneling microscopy processes: Examination through action spectra of cis-2-butene on Pd(110)
    Y. Sainoo, Y. Kim, T. Okawa, T. Komeda, H. Shigekawa, M. Kawai
    Phys. Rev. Lett. (95), 246102 (2005)

  • Development of femtosecond time-resolved scanning tunneling microscopy for nanoscale science and technology.
    H. Shigekawa, O. Takeuchi and M. Aoyama
    Science and Technology of Advanced Materials, 6, 582-588 (2005) (on line now)

  • Probing subpicosecond dynamics using pulsed laser combined scanning tunneling microscopy
    O. Takeuchi, M. Aoyama, R. Oshima, Y. Okada, H. Oigawa, N. Sano, H. Shigekawa, R. Morita and M. Yamashita
    Appl. Phys. Lett. 85(15), 3268-3270 (2004).

  • Light-Modulated Scanning Tunneling Spectroscopy for Nanoscale Imaging of Surface Photovoltage
    O. Takeuchi, S. Yoshida and H. Shigekawa
    Appl. Phys. Lett. 84(18), 3645-3647 (2004)

  • Phase switching of a single isomeric molecule and associated characteristic rectification
    S. Yasuda, T. Nakamura, M. Matsumoto and H. Shigekawa
    J. Am. Chem. Soc. 125, 16430-16433 (issue 52) (2003)

  • Site-selective silicon adatom desorption using femtosecond laser pulse pairs and scanning tunneling microscopy
    D.N. Futaba, R. Morita, M. Yamashita, S. Tomiyama and H. Shigekawa
    Appl. Phys. Lett. 83, 2333(2003)

  • Formation Process of Cyclodextrin Necklace -Analysis of Hydrogen Bonding on a Molecular Level-
    K. Miyake, S. Yasuda, A. Harada, J. Sumaoka, M. Komiyama and H. Shigekawa
    J. Am. Chem. Soc. 125, 5080-5085 (2003)

  • P(2x2) Phase of Buckled Dimers of Si(100) Observed on n-Type Substrates below 40K by Scanning Tunneling Microscope
    K. Hata, S. Yoshida, and H. Shigekawa
    Phys. Rev. Lett. 89, 286104 (2002)

  • Development of time-resolved scanning tunneling microscopy in femtosecond range
    O. Takeuchi R. Morita, M. Yamashita and H. Shigekawa
    Jpn. J. Appl. Phys. 41, 7B, 4994-4997 (2002)

  • Characteristic adsorption of Xe on a Si(111)-(7x7) surface at low temperature
    Y. J. Li, O. Takeuchi, D. N. Futaba, H. Oigawa, K. Miyake, Y. Kuk and H. Shigekawa
    Physical Review B 65, 113306 (2002)

  • Direct measurement of the chiral quaternary structure in a p-conjugated polymer at room temperature.
    K. Shinohara, S. Yasuda, G. Kato, M. Fujita and H. Sghiekawa
    J. Am. Chem. Soc., 123, 3619-3620 (2001)

  • Atomically resolved local variation of the flip-flop motinof single buckled dimers of Si(100).
    K. Hata, Y. Sainoo and H. Shigekawa
    Phys. Rev. Lett., 86, 3084-3087 (2001)

  • Intramolecular relaxation observed in the surface of the quasi-one-dimensional organic conductor β-(BEDT-TTF)2PF6.
    M. Ishida, O.Takeuchi, T. Mori and H. Shigekawa
    Physical Review B 18, 153405 (2001)

  • Scanning tunneling microscopy on the formation of lipoamide-cyclodextrin monolayer on Au(111)
    S. Yasuda, I. Suzuki, T. Nakamura, M. Matsumoto, M.Komiyama, and H. Shigekawa
    Appl. Phys. Lett. 76, 643-645 (2000)

  • The Molecular Abacus -STM Manipulation of Cyclodextrin Necklace-
    H. Shigekawa, K. Miyake, J. Sumaoka, A. Harada, and M. Komiyama
    J. Am. Chem. Soc. 122, 5411-5412 (2000)

  • Modification of Surface-State Dispersion Upon Xe Adsorption: A Scanning Tunneling Microscope Study
    J.Y. Park, U. D. Ham, S.-J. Kahng, Y. Kuk, K. Miyake, K. Hata, and H. Shigekawa
    Physical Review B 62, R16341-R16344 (2000)

  • Nonresonant femtosecond second hyperpolarizabilities of intramolecular charge-transfer molecules with great excited- and ground-state dipole-moment differences
    M. Yamashita, S. Kimura, Y. Yamaoka, H. Murakami, and R. Morita, H. Shigekawa
    Appl. Phys. Lett. 75, 28-30 (1999)

  • Surface-Charge Density Wave on the Quisi-One Dimensional Conductor β-(BEDT-TTF)2PF6
    M. Ishida, T. Mori, and H. Shigekawa
    Physical Review Letters 83, 596 (1999)

  • Hydrolysis of DNA and RNA by lanthanide ions: mechanistic studies leading to new applications.
    M. Komiyama, N. Takeda, and H. Shigekawa
    Chem. Commun., Feature article 1443-1451 (1999)

  • Extended X-ray Absorption Fine Structure Study on the Cerium (IV)-induced DNA Hydrolysis: Implication to the Roles of 4f Orbitals in the Catalysis
    H. Shigekawa, M. Ishida, K. Miyake, R. Shioda, Y. Iijima, T. Imai, H. Takahashi, J. Sumaoka, and M. Komiyama
    Appl. Phys. Lett. 74, 460-462 (1999)

  • Surface Dynamics Studied by Perturbing the Surface with the Tip of Scanning Tunneling Microscopy-Si(100) at 80K
    K. Hata, M. Ishida, K. Miyake, and H. Shigekawa
    Appl. Phys. Lett. 73, 40-42 (1998)

  • Origin of the Symmetric Dimers in the Si(100) Surface
    H. Shigekawa, K. Hata, K. Miyake, M. Ishida, and S. Ozawa
    Phys. Rev. B 55, 15448 (1997)

  • Core level photoelectron spectroscopy on the lanthanide-induced hydrolysis of DNA
    H. Shigekawa, H. Ikawa, R. Yoshizaki, Y. Iijima, J. Sumaoka, M. Komiyama
    Appl. Phys. Lett. 68, 1433 (1996)

  • Structural studies of tetrathafulvalene-tetracyanoquinodimethanw thin Films by scanning tunneling microscopy.
    N. Ara, H. Shigekawa, K. Yase, M. Yoshimura, A. Kawazu
    Appl. Phys. Lett. 66(24), 3278-3280 (1995)

  • Electronic Structure of Si(111)-7x7 phase boundary studied by scanning tunneling microscopy
    K. Miyake, H. Shigekawa and R. Yoshizaki
    Appl. Phys. Lett. 66(25), 3468-3470 (1995)

  • Selenium-treated GaAs(001)-2x3 Surface Studied by Scanning Tunneling Microscopy
    H. Shigekawa, H. Oigawa, K. Miyake, Y. Aiso, Y. Nannichi, T. Hashizume and T. Sakurai
    Appl. Phys. Lett. 65(5), 607-609 (1994)

    1993年以前の論文
    トップページに戻る
    成果報告のページに戻る

    • 主な著書


    『SMART NANOPARTICLES TECHNOLOGY』
    （INTECH，2012）
    H. Shigekawa, S. Yoshida,
    M. Yoshimura and Y. Mera


    『ナノ構造の科学と
    ナノテクノロジー
    ー量子デバイスの
    基礎を学ぶためにー』
    （共立出版，2011）
    吉村雅満、目良裕、
    重川美咲子、重川秀実 訳


    『STM Based Techniques
    Combined with Optics』
    Handbook of Nanophysics:
    Principles and Methods
    Ed. by Klaus D. Sattler,
    (Taylor & Francis Books,
    Inc. 2010, in print)
    H. Shigekawa, O. Takeuchi,
    Y. Terada and S. Yoshida


    『走査プローブ顕微鏡
    -正しい実験とデータ
    解析のために必要
    なこと-』
    (共立出版, 2009)
    重川秀実、吉村雅満、
    河津　璋　編　（分担執筆）


    The world supported by
    the thin film and
    surface physics
    JSAP International,
    17, 3 (2007)
    H. Shigekawa


    『表面物性工学
    ハンドブック　第2版』
    (丸善, 2007)
    小間 篤、青野正和、
    石橋幸治、塚田 捷 編
    （分担執筆）


    『いかにして実験を行うか
    -誤差の扱いから論文作成まで-』
    (丸善, 2006)
    重川秀実、山下理恵、
    吉村雅満、風間重雄　訳


    『物理学辞典』
    (培風館, 2005)
    物理学辞典編集委員会　編　
    （分担執筆）


    『実戦ナノテクノロジー
    -走査プローブ顕微鏡と
    局所分光-』
    (裳華房, 2005)
    重川秀実、吉村雅満、坂田亮、
    河津璋　編


    『第2版　科学大辞典』
    (丸善, 2005)
    国際科学振興財団　編
    （分担執筆）


    Mono-Cycle Photonics
    and Optical Scanning
    Tunneling Microscopy
    -Route to Femtosecond
    Angstrom Technology-
    (Springer, 2005)


    日本表面科学会編
    『新訂版・表面科学の
    基礎と応用』
    基礎技術編３節11.3
    「STM」
    (エヌ・ティー・エス, 2004)
    武内修、重川秀実
    （編集代表 岩澤康裕)


    朝倉物性物理シリーズ
    極限実験技術
    走査プローブ顕微鏡
    （朝倉書店, 2003）


    『応用物理ハンドブック
    　第２版』
    (丸善, 2002)
    応用物理学会編
    （編集委員）


    ナノテクノロジーのため
    の走査プローブ顕微鏡
    （丸善，2002）


    走査型プローブ顕微鏡
    ＳＴＭからＳＰＭへ
    （丸善，1998)


    応用物理用語大事典
    （オーム社，1998)


    "Cyclodextrins as Enzyme
    Models."(p401-422)
    Comprehensive supramolecular
    chemistry, Cyclodextrins
    vol. 3,
    edited by J. Szejtli
    （Elsevier Science Ltd.,
    Oxford.，1996）
    M. Komiyama, and H. Shigekawa


    有機分子のＳＴＭ/ＡＦＭ
    （共立出版，1993）


    『表面物性工学ハンドブック』
    (丸善, 1987)
    小間 篤、八木克道、
    塚田 捷、青野正和 編
    （分担執筆）

    トップページに戻る

    1993年以前

  • 有機材料のSTM
    H. SHIGEKAWA, M. YOSHIMURA and A. KAWAZU
    日本結晶学会誌　35(2), 126-134 (1993)

  • トンネル電子で眺めてみると
    H. SHIGEKAWA
    筑波フォーラム No.34, 130-133 (1992)

  • STM study of organic thin films of BEDT-TTF iodid
    M. YOSHIMURA, H. SHIGEKAWA, K. Kawabata, Y. SAITO and A. KAWAZU
    Appl. Surf. Sci. 60/61, 317-320 (1992)

  • Electronic Structure of the Organic Superconductor K-(BEDTITTF)2Cu(NCS)2 Studied by Angle-Resolved Photoemission Spectroscopy
    Masamichi YOSHIMURA, Hidemi SHIGEKAWA, Takehiko MORI, Masami KAGESHIMA, Hiroo KATO, Yasuo SAKISAKA, Gunzi SAITO and Akira KAWAZU
    Jpn. J. Appl. Phys. 31(5A), 1341-1342 (1992)

  • Potassium-induced charge redistribution on Si(Ill) surfaces studied by core-level photoemission spectroscopy
    Y. Ma, C.T. Chen, G. Meigs, F. Sette, G. Illing and Hidemi Shigekawa
    Phys. Rev. B 45(11), 5961-5964 (1992)

  • Observation of surfaces of organic thin films
    Akira KAWAZU, Masamichi YOSHIMURA and Hidemi SHIGEKAWA
    Ouyou Butsuri 61(10), 1048-1052 (1992)

  • Angle Resolved Photoemission Spectra of Organic Superconductor k-(BEDT-TTF)2Cu(NCS)2.
    M. Yoshimura, H. Shigekawa, T. Mori, M. Kageshima, H. Kato, G. Saito and A. Kawazu
    Photon Factory Activity Report, 8, 210 (1992)

  • The surface structure of an organic conductor (BEDT-TTF)2KHg(SCN)4 observed by scanning tunneling microscopy
    Masamichi Yoshimura, Norihiko Ara, Masami Kageshima, Ryu Shiota, Akira Kawazu, Hidemi Shigekawa, Yoshio Saito, Masashi Oshima, Hatsumi Mori, Hideki Yamochi and Gunji Saito
    Surf. Sci. 242, 18-21 (1991)

  • Surface structure of the organic conductor β-(BEDT-TTF)2I3　0bserved by scanning tunneling microscopy [where BEDT-TTF is bis (ethylenedithio) tetrathiafulvalene]
    Masamichi Yoshimura, Hidemi Shigekawa, Hideki Yamochi, Gunji Saito, Yoshio Saito and Akira Kawazu
    Phys. Rev. B 44(4), 1970-1972 (1991)

  • Electronic structure of the organic superconductor k-(BEDT-TTF)2Cu(NCS)2[where BEDT-TTF is bis(ethylenedithio) tetrathiafulvalene] studied by scanning tunneling microscopy
    Masamichi Yoshimura, Hidemi Shigekawa, Hitoshi Nejoh, Gunji Saito, Yoshio Saito and Akira Kawazu
    Phys. Rev. B 43(16), 13590-13593 (1991)

  • Scanning tunneling microscopy on cyclodextrin inclusion complexes
    Hidemi Shigekawa, Tatsuya Morozumi, Makoto Komiyama, Masamichi Yoshimura, Akira Kawazu and Yoshio Saito
    J. Vac. Sci. Technol. B9(2), 1189-1192 (1991)

  • lmaging of an organic superconductor (BEDT-TTF)2(NH4)Hg(SCN)4 surface structure by scanning tunneling microscopy
    Akira Kawazu, Masamichi Yoshimura, Hidemi Shigekawa, Hatsumi Mori and Gunzi Saito
    J. Vac. Sci. Technol. B9(2), 1006-1008 (1991)

  • Resonance Curves Obtained in the Vibration of Fe-30％Si Reeds
    Masamichi YOSHIMURA, Tomoko AKIYAMA, Hidemi SHIGEKAWA, Takao TSUNO, Yoshio NAKAMURA and Shin-ichi HYODO
    Jpn. J. Appl. Phys. 30(7), 1432-1433 (1991)

  • Intermittent Automodulation Observed in Fe-3%Si Reeds
    Masamichi YOSHIMURA, Tomoko AKIYAMA, Hidemi SHIGEKAWA, Takao TSUNO, Yoshio NAKAMURA and Shin-ichi HYODO
    Jpn. J. Appl. Phys. 30(10), 2560-2561 (1991)

  • Synchrotron radiation photoemission analysis for (NH4)2Sx-treated GaAs
    Hirohiko Sugahara, Masaharu Oshima, Haruhiro Oigawa, H. Shigekawa and Yasuo Nannichi
    J. Appl. Phys. 69(8), 4349-4353 (1991)

  • Surface structure of selenium-treated GaAs (001) studied by field ion scanning tunneling microscopy
    H. Shigekawa, H. Hashizume, H. Oigawa, K. Motai, Y. Mera, Y. Nannichi and T. Sakurai
    Appl. Phys. Lett. 59(23), 2986-2988 (1991)

  • Structural Stability of BEDT-TTF Based Organic Conductors [BEDT-TTF:bis (ethylenedithio) tetrathiafulvalene]
    Masamichi YOSHIMURA, Hidemi SHIGEKAWA, Yoshio SAITO and Akira KAWAZU
    Hyomen Kagaku 12(8), 516-519 (1991)

  • International Conference　｢STM '90/NANO I」
    Hidemi Shigekawa
    Hyomen Kagaku 11(10), 44 (1990)

  • Scanning Tunneling Microscopy on Compound Semiconductor Surfaces
    H.  Shigekawa
    JSAP Catalog Number:AP902308, 27-52 (1990)

  • Thermal Relaxation of Strained SiGe/Si Heterostructure
    Hidemi SHIGEKAWA, Hiroyuki KANAYA and Yukiko CHO
    Jpn. J. Appl. Phys. 29(5), L736-L738 (1990)

  • Observation of an organic superconductor [bis(ethylenedithio)-tetrathiafulvalene]2[Cu(NCS)2] by scanning tunneling microscopy
    M. Yoshimura, K. Fujita, N. Ara, M. Kageshima, R. Shioda, A. Kawazu, H. Shigekawa and S. Hyodo
    J. Vac. Sci. Technol. A8(1), 488-489 (1990)

  • Surface Study of an Organic Superconductor k-(BEDT-TTF)2Cu(NCS)2 Using a Scanning Tunneling Microscope
    Masamichi YOSHIMURA, Norihiko ARA, Masami KAGESHIMA ,Ryu SHIOTA, Akira KAWAZU, Hidemi SHIGEKAWA, Hatsumi MORI, Hideki YAMOCHI and Gunji SAITO
    Hyomen Kagaku 11(6), 353-356 (1990)

  • STM Observation of (NH4)2Sx-treated GaAs(100) Surface
    Masamichi YOSHIMURA, Ryu SHIOTA, Akihiko KUROKI, Norihiko ARA, Masami KAGESHIMA, Hidemi SHIGEKAWA, Haruhiro OIGAWA, Yasuo NANNICHI, Yoshio SAITO and Akira KAWAZU
    Hyomen Kagaku 11(8), 495-499 (1990)

  • Stabilization of GaAs Surface by Sulfur Treatment
    Haruhiro OIGAWA, Jia-Fa FAN, Yasuo NANNICHI and Hidemi SHIGEKAWA
    Hyomen Kagaku 11(8), 469-476 (1990)

  • STM Study of(BEDT-TTF)2Cu(NCS)2 Surface
    M. Yoshimura, N. Ara, M. Kageshima, R. Shioda, A. Kawazu, H. Shigekawa, H. Mori, M. Oshima, H. Yamochi, and G. Saito
    Springer Proceedings in Physics 51, 280-283 (1990)

  • Dependence of the Carrier Concentration Profile at the Si MBE Layer/p-Si Substrate Interface on the Si Substrate Preparation Method
    Hiroyuki Kanaya, Hidemi Shigekawa, Fumio Hasegawa and Eiso Yamaka
    Jpn. J. Appl. Phys. 29(2), L195-L197 (1990)

  • 第4回走査型トンネル顕微鏡/電子分光国際会議
    吉村雅満･重川秀実･河津　璋
    Shinku 33(1), 28-30 (1990)

  • Study of interface formation on Co/Si(111)-7x7 using angle-resolved photoemission
    David D. Chambliss ,Thor N. Rhodi, J. E. Rowe and H. Shigekawa
    J. Vac. Sci. Technol. A7(3), 2449-2453 (1989)

  • STM/STS Study of Semiconductor Surfaces
    Masamichi YOSHIMURA, Akira KAWAZU and Hidemi SHIGEKAWA
    Hyomen Kagaku 10(9), 579-587 (1989)

  • Initial Stage of Au Schottky Barrier Formulation on (NH4)2Sx-treated n-GaAs.
    H. Sugahara, M. Oshima, H. Oigawa, H. Shigekawa and Y. Nannichi
    Photon Factory Activity Report, 7, 232 (1989)

  • Photoemission Analysis for (NH4)2Sx-treated GaAs with a Photon Energy og 80eV.
    H. Sugahara, M. Oshima, H. Oigawa, H. Shigekawa and Y. Nannichi
    Photon Factory Activity Report, 7, 231 (1989)

  • Photoelectron Emission Study on (NH4)2Sx-treated GaAs.
    Y. Nannichi, H. Shigekawa, H. Oigawa, N. H. Yong, T. Fukase, Y. Kurata, M. Oshima, H. Sugahara and T. Kawamura
    Photon Factory Activity Report, 7, 230 (1989)

  • Synchrotron Radiation Photoemission Study on (NH4)2Sx-treated n-GaAs.
    H. Sugahara, M. Oshima, H. Oigawa, H. Shigekawa and Y. Nannichi
    21th Conference on Solid State Devices and Materials, Tokyo, c-3-LN4, 547-548 (1989)

  • テレビカメラとマイクロコンピュータを利用した低速電子の回折強度の迅速測定
    K. Nishikata, M. Matsumoto, Y. Endo, H. Shigekawa and A. Kawazu
    Hyoumenkagaku, 10 (1), 47-51 (1989)

  • 放射光光電子分光による硫化アンモニウム処理GaAs表面状態の解析
    H. Sugahara, M. Oshima, H. Oigawa, H. Shigekawa and Y. Nannichi
    電子情報通信学会, ED89-64, 1-6 (1989)

  • Adsorption of antimony on Au(001)
    G. K. Wertheim, J. E. Rowe, D. N. E. Buchanan, H. L. Polite and H. Shigekawa
    Phys. Rev. B. 38(14), 9606-9611 (1988)

  • Interface Formulation on Co/Si(111) Using Angle Resolved Photoemin for Band Mapping
    D. C. Chambliss, T. Rhodin, J. E. Rowe and H. Shigekawa
    National Synchrotron Light Source (Brookhaven National Laboratory, USA) Annual Report 83 (1988)

  • Component Assignments of the Raman Spectrum from Highly Elongated Silica Glass Fibers
    Kazuhiro Ema, Yoshinori Hibino, Hidemi Shigekawa and Shin-ichi Hyodo
    Jpn. J. Appl. Phys. 26(5), 649-654 (1987)

  • エキソ放出
    Hidemi Shigekawa and Shin-ichi Hyodo
    表面物性工学ハンドブック(丸善), 446-448 (1987)

  • 機械的処理とエキソ電子
    Hidemi Shigekawa and Shin-ichi Hyodo
    Ouyou Butsuri 55(5), 431-435 (1986)

  • TWO-PROCESS MODEL OF PSEE FROM SCRATCHED METALS
    Hidemi SHIGEKAWA and Shin-ichi HYODO
    Applications of Surface Science 22/23, 361-368 (1985)

  • Two-Process Model for a Comprehensive Interpretation of Photostimulated Exoelectron Emission
    Hidemi SHIGEKAWA and Shin-ichi HYODO
    Jpn. J. Appl. Phys. Suppl. 24-4, 21-26 (1985)

  • PSEE-Related Phenomena Indicative of the Meaning of Two-Process ModeI Parameters for Mechanically Deformed Aluminum
    Hidemi SHIGEKAWA, Yuichiro FUJIWARA, Yuji ANDO, Akiko KUMAGAI and Shin-ichi HYODO
    Jpn. J. Appl. Phys. Suppl. 24-4, 122-124 (1985)

  • A Method for Determining the Activation Rates of PSEE Centers in Scratched Aluminum by Varying the Stimulation Intensity
    Hidemi SHIGEKAWA, Yuji ANDO, Akiko KUMAGAI and Shin-ichi HYODO
    Jpn. J. Appl. Phys. 24(9), 1240 (1985)

  • Strength Mesurements of Optical Glass Fibers Correlated with Fracture Origin Detection
    Kazuhiro EMA, Hidemi SHIGEKAWA and Shin-ichi HYODO
    東京大学工学部総合試験所年報, 44, 75-78 (1985)

  • A Note on Electron Transfer to Exoelectron Emission Sources from Scratched Aluminum
    Hidemi SHIGEKAWA, Yuichiro FUJIWARA and Shin-ichi HYODO
    Jpn. J. Appl. Phys. 23(8), 1146 (1984)

  • Acoustic Location of Fracture Origin in Optical Glass Fibers
    KAZUHIRO EMA, HIDEMI SHIGEKAWA AND SHIN-lCHI HYODO
    Communicaltions of the American Ceramic Society 67(6), c104-105 (1984)

  • Effect of Glass/Coating Interface on the Strength of Optical Fibers
    HajimeTANAKA, Hidemi SHIGEKAWA,　Shinobu　FUJITA,　Hideyuki YUKAWA, Toshio NISHI and Shin-ichi HYODO
    J. Fac. Eng., Univ. Tokyo A-22, 34-35 (1984)

  • ニ過程モデルから見たPSEEとTSEEの類似性
    Hidemi SHIGEKAWA and Shin-ichi HYODO
    京都大学原子炉実験報告 253, 9-10 (1984)

  • Change of Energy-Level Distribution of Photoemission Sources in Al and Zn Caused by Scratching
    Hidemi SHIGEKAWA, Reima IWATSU, Masamichi OKADA and Shin-ichi HYODO
    Jpn. J. Appl. Phys. 22(1), 42-45 (1983)

  • Intensity vs Time Profiles of Photostimulated Exoelectron Emission Sources from Scratched Aluminum
    Hidemi SHIGEKAWA and Shin-ichi HYODO
    Jpn. J. Appl. Phys. 22(10), 1493-1495 (1983)

  • An Improved Method for Determining the Emission Rate and Source Population of PSEE
    Hidemi SHIGEKAWA and Shin-ichi HYODO
    Jpn. J. Appl. Phys. 22(10), 1627 (1983)

  • PSEE from Mechanically Damaged Metals
    Hidemi SHIGEKAWA and Shin-ichi HYODO
    Ionics 73(11), 41-44 (1983)

  • Depth Profiles of Potassium Concentration in Silicon Exposed to Potassium Beams of Very Low Energy
    Yoshinori HIBINO, Hiroyuki TETSUKA, Tomihiro HASHIZUME, Hidemi SHIGEKAWA and Shinichi HYODO
    Shinku 25(8), 574-577 (1982)

  • Storage Effect in Photostimulated Exoelectron Emission Sources from Scratched Aluminum
    Hidemi SHIGEKAWA and Shin-ichi HYODO
    Jpn. J. Appl. Phys. 21(9), 1278-1282 (1982)

  • Mechanical Damages and Exoelectron Emission
    Hidemi SHIGEKAWA and Shin-ichi HYODO
    Junkatsu 27(6), 407-412 (1982)

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